Dual D-type flip-flop with set and
reset; positive-edge trigger
Product specification
Supersedes data of 1999 Aug 05
File under Integrated Circuits, IC06
1999 Sep 23
Page 2
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
FEATURES
• ESD protection:
HBM EIA/JESD22-A114-A
exceeds 2000 V
MM EIA/JESD22-A115-A
exceeds 200 V
• Balanced propagation delays
• Inputsacceptsvoltageshigherthan
V
CC
• For AHC only:
operates with CMOS input levels
• For AHCT only:
operates with TTL input levels
• Output capability: standard
• ICC category: flip-flops
• Specified from
−40 to +85 and +125 °C.
DESCRIPTION
The 74AHC/AHCT74 are high-speed
Si-gate CMOS devices and are pin
compatible with low power Schottky
TTL (LSTTL). They are specified in
compliance with JEDEC standard
No. 7A.
The 74AHC/AHCT74 dual
positive-edge triggered, D-type
flip-flops with individual data (D)
inputs,clock (CP)inputs,set (SD)and
reset (RD) inputs; also
complementary Q and Q outputs.
The set and reset are asynchronous
active LOW inputs and operate
independently of the clock input.
Information on the data input is
transferred to the Q output on the
LOW-to-HIGH transition of the clock
pulse. The D inputs must be stable
one set-up time prior to the
LOW-to-HIGH clock transition for
predictable operation.
Schmitt-trigger action in the clock
input makes the circuit highly tolerant
to slower clock rise and fall times.
QUICK REFERENCE DATA
GND = 0 V; T
=25°C; tr=tf≤3.0 ns.
amb
SYMBOLPARAMETERCONDITIONS
t
PHL/tPLH
propagation delayCL= 15 pF;
nCP to nQ, n
n
SD,nRDto nQ, nQ3.73.7ns
f
max
C
C
I
PD
max. clock frequency130100MHz
input capacitanceVI=VCCor GND 4.04.0pF
power dissipation
capacitance
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
CC
fi= input frequency in MHz; fo= output frequency in MHz;
∑ (CL× V
2
× fo) = sum of outputs;
CC
CL= output load capacitance in pF;
VCC= supply voltage in Volts.
2. The condition is VI= GND to VCC.
FUNCTION TABLES
Table 1 See note 1
S
n
D
nR
LHXXHL
HLXXLH
LLXXHH
Table 2 See note 1
S
n
D
nR
HH↑LLH
HH↑HHL
Note to Tables 1 and 2
1. H = HIGH voltage level;
L = LOW voltage level;
X = don’t care;
↑ = LOW-to-HIGH CP transition;
= state after the next LOW-to-HIGH CP transition.
Q
n+1
74AHC74; 74AHCT74
TYPICAL
AHC AHCT
Q3.73.3ns
2
× fi+ ∑ (CL× V
INPUTOUTPUT
D
INPUTOUTPUT
D
VCC=5V
CL= 50 pF;
1216pF
f = 1 MHz;
notes 1 and 2
2
× fo) where:
CC
nCPnDnQnQ
nCPnDnQ
n+1
nQ
UNIT
n+1
1999 Sep 232
Page 3
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
74AHC74; 74AHCT74
positive-edge trigger
ORDERING INFORMATION
OUTSIDE
NORTH
AMERICA
NORTH AMERICA
TEMPERATURE
RANGE
PINSPACKAGEMATERIALCODE
74AHC74D74AHC74D−40 to +85 °C14SOplasticSOT108-1
74AHC74PW74AHC74PW DH14TSSOPplasticSOT402-1
74AHCT74D74AHCT74D14SOplasticSOT108-1
74AHCT74PW74AHCT74PW DH14TSSOPplasticSOT402-1
PINNING
PINSYMBOLDESCRIPTION
1 and 131
RDand 2R
D
asynchronous reset-direct input (active LOW)
2 and 121D and 2Ddata inputs
3 and 111CPand 2CPclock input (LOW-to-HIGH, edge-triggered)
4 and 101
SDand 2S
D
asynchronous set-direct input (active LOW)
5 and 91Q and 2Qtrue flip-flop outputs
6 and 81
Q and 2Qcomplement flip-flop outputs
7GNDground (0 V)
14V
CC
DC supply voltage
PACKAGE
handbook, halfpage
1R
1D
1CP
1S
1Q
1Q
GND
1
D
2
3
4
D
74
5
6
7
MNA417
14
V
CC
13
2R
D
12
2D
11
2CP
2S
10
D
9
2Q
8
2Q
Fig.1 Pin configuration.
1999 Sep 233
handbook, halfpage
410
2S
1S
D
D
S
D
FF
R
D
2R
D
113
Q
Q
D
1Q
2Q
1Q
2Q
MNA418
2
1D
2D
1CP
2CP
D
CP
1R
12
3
11
Fig.2 Logic diagram.
5
9
6
8
Page 4
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
handbook, halfpage
4
S
3
C1
2
1D
1
R
10
S
11
C1
12
1D
13
R
MNA419
5
6
9
8
handbook, halfpage
74AHC74; 74AHCT74
1S
D
4
S
D
1D
2
D
1CP
CP
3
1R
D
1
2S
D
10
2D
12
11
13
2CP
2R
D
CP
D
1Q
Q
5
FF
1Q
6
Q
R
D
S
D
2Q
9
Q
FF
2Q
8
Q
R
D
MNA420
handbook, full pagewidth
D
R
D
S
D
CP
Fig.3 IEC logic symbol.
C
C
C
C
Fig.4 Functional diagram.
C
C
C
C
C
C
MNA421
Q
Q
Fig.5 Logic diagram (one flip-flop).
1999 Sep 234
Page 5
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
74AHC74; 74AHCT74
positive-edge trigger
RECOMMENDED OPERATING CONDITIONS
SYMBOLPARAMETERCONDITIONS
V
CC
V
I
V
O
T
amb
DC supply voltage2.05.05.54.55.05.5V
input voltage0−5.50−5.5V
output voltage0−V
operating ambient temperaturesee DC and AC
characteristics per
device
t
(∆t/∆f) input rise and fall ratesVCC= 3.3 V ±0.3 V −−100−−−ns/V
r,tf
=5V±0.5 V−−20−−20
V
CC
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134); voltages are referenced to GND (ground= 0 V).
SYMBOLPARAMETERCONDITIONSMIN. MAX. UNIT
V
CC
V
I
I
IK
I
OK
I
O
I
CC
T
stg
P
D
DC supply voltage−0.5+7.0V
input voltage−0.5+7.0V
DC input diode currentVI< −0.5 V; note 1−−20mA
DC output diode currentVO< −0.5 Vor VO>VCC+ 0.5 V; note 1−±20mA
DC output source or sink current −0.5V<VO<VCC+ 0.5 V−±25mA
DC VCC or GND current−±75mA
storage temperature−65+150 °C
power dissipation per packagefor temperature range: −40 to +85 °C; note 2−500mW
74AHC74AHCT
UNIT
MIN.TYP. MAX. MIN.TYP. MAX.
0−V
CC
CC
V
−40+25+85−40+25+85°C
−40+25+125 −40+25+125 °C
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. For SO packages: above 70 °C the value of P
derates linearly with 8 mW/K.
D
For TSSOP packages: above 60 °C the value of PDderates linearly with 5.5 mW/K.
1999 Sep 235
Page 6
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
74AHC74; 74AHCT74
positive-edge trigger
DC CHARACTERISTICS
74AHC family
Over recommended operating conditions; voltage are referenced to GND (ground = 0 V).
SYMBOLPARAMETER
V
IH
HIGH-level input
voltage
V
IL
LOW-level input
voltage
V
OH
HIGH-level output
voltage; all
outputs
HIGH-level output
voltage
V
OL
LOW-level output
voltage; all
outputs
LOW-level output
voltage
I
I
input leakage
current
I
OZ
3-state output
OFF current
I
CC
quiescent supply
current
C
I
input capacitance−−310−10−10pF
TEST CONDITIONST
25−40 to +85−40 to +125
OTHERVCC(V)
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
2.01.5−−1.5−1.5−V
3.02.1−−2.1−2.1−
5.53.85 −−3.85 −3.85 −
2.0−− 0.5−0.5−0.5V
3.0−− 0.9−0.9−0.9
5.5−− 1.65−1.65−1.65
VI=VIHor VIL;
IO= −50 µA
2.01.92.0−1.9−1.9−V
3.02.93.0−2.9−2.9−
4.54.44.5−4.4−4.4−
V
I=VIH
or VIL;
3.02.58 −−2.48 −2.40 −V
IO= −4.0 mA
V
I=VIH
or VIL;
4.53.94 −−3.8−3.70 −
IO= −8.0 mA
VI=VIHor VIL;
IO=50µA
2.0−00.1−0.1−0.1V
3.0−00.1−0.1−0.1
4.5−00.1−0.1−0.1
V
I=VIH
or VIL;
3.0−− 0.36−0.44−0.55V
IO=4mA
V
I=VIH
or VIL;
4.5−− 0.36−0.44−0.55
IO=8mA
VI=VCCor GND5.5−− 0.1−1.0−2.0µA
VI=VIHor VIL;
5.5−− ±0.25 −±2.5−±10.0 µA
VO=VCCor GND
VI=VCCor GND;
5.5−− 2.0−20−40µA
IO=0
amb
(°C)
UNIT
1999 Sep 236
Page 7
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
74AHC74; 74AHCT74
positive-edge trigger
74AHCT family
Over recommended operating conditions; voltage are referenced to GND (ground = 0 V).
SYMBOLPARAMETER
V
IH
HIGH-level input
voltage
V
IL
LOW-level input
voltage
V
OH
HIGH-level output
voltage; all
outputs
HIGH-level output
voltage
V
OL
LOW-level output
voltage; all
outputs
LOW-level output
voltage
I
I
input leakage
current
I
OZ
3-state output
OFF current
I
CC
quiescent supply
current
∆I
CC
additional
quiescent supply
current per input
pin
C
I
input capacitance−−310−10−10pF
TEST CONDITIONST
25−40 to +85 −40 to +125
OTHERVCC(V)
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
4.5 to 5.5 2.0−−2.0−2.0−V
4.5 to 5.5 −− 0.8−0.8−0.8V
VI=VIHor VIL;
4.54.44.5−4.4−4.4−V
IO= −50 µA
V
I=VIH
or VIL;
4.53.94 −−3.8−3.70 −V
IO= −8.0 mA
VI=VIHor VIL;
4.5−00.1−0.1−0.1V
IO=50µA
V
I=VIH
or VIL;
4.5−− 0.36−0.44−0.55V
IO=8mA
VI=VIHor V
VI=VIHor VIL;
5.5−− 0.1−1.0−2.0µA
IL
5.5−− ±0.25 −±2.5−±10.0 µA
VO=VCCor GND
per input pin;
other inputs at
VCCor GND;
IO=0
VI=VCCor GND;
5.5−− 2.0−20−40µA
IO=0
VI=VCC− 2.1 V
4.5 to 5.5 −− 1.35−1.5−1.5mA
other inputs at
VCCor GND;
IO=0
amb
(°C)
UNIT
1999 Sep 237
Page 8
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
AC CHARACTERISTICS
Type 74AHC74
GND = 0 V; tr=tf≤3.0 ns.
TEST CONDITIONST
SYMBOLPARAMETER
VCC= 3.0 to 3.6 V; note 1
t
PHL/tPLH
propagation delay
nCP to nQ, nQ
propagation delay
n
SDnRDto nQ, nQ
f
max
maximum clock
pulse frequency
t
PHL/tPLH
propagation delay
nCP to nQ, nQ
propagation delay
n
SDnRDto nQ, nQ
t
W
clock pulse width
HIGH or LOW
set or reset pulse
width LOW
t
rem
removaltime set or
reset
t
su
set-up time
nD to nCP
t
h
hold time
nD to nCP
f
max
maximum clock
pulse frequency
WAVEFORMSC
see Figs 6 and 815 pF −5.211.91.014.01.015.0ns
see Figs 7 and 8−5.412.31.014.51.015.5ns
see Figs 6 and 850 pF −7.415.41.017.51.019.5ns
see Figs 7 and 8−7.715.81.018.01.020.0ns
see Figs 6 and 86.0−−7.0−7.0−ns
see Figs 7 and 86.0−−7.0−7.0−ns
see Figs 6 and 86.0−−7.0−7.0−ns
74AHC74; 74AHCT74
(°C)
amb
25−40 to +85−40 to +125
L
MIN.TYP.MAX. MIN. MAX. MIN. MAX.
80125−45−45−ns
5.0−−5.0−5.0−ns
0.5−−0.5−0.5−ns
5075−70−70−ns
UNIT
1999 Sep 238
Page 9
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
TEST CONDITIONST
SYMBOLPARAMETER
V
= 4.5 to 5.5 V; note 2
CC
t
PHL/tPLH
propagation delay
nCP to nQ, nQ
propagation delay
n
SDnRDto nQ, nQ
f
max
maximum clock
pulse frequency
t
PHL/tPLH
propagation delay
nCP to nQ, n
Q
propagation delay
n
SDto nQ, nQ
t
W
clock pulse width
HIGH or LOW
set or reset pulse
width LOW
t
rem
removaltime set or
reset
t
su
set-up time
nD to nCP
t
h
hold time
nD to nCP
f
max
maximum clock
pulse frequency
WAVEFORMSC
see Figs 6 and 815 pF −3.77.31.08.51.09.5ns
see Figs 7 and 8−3.77.71.09.01.010.0ns
see Figs 6 and 850 pF −5.29.31.010.51.012.0ns
see Figs 7 and 8−5.39.71.011.01.012.5ns
see Figs 6 and 85.0−−5.0−5.0−ns
see Figs 7 and 85.0−−5.0−5.0−ns
see Figs 6 and 85.0−−5.0−5.0−ns
74AHC74; 74AHCT74
(°C)
amb
25−40 to +85−40 to +125
L
MIN.TYP.MAX. MIN. MAX. MIN. MAX.
130170−110−110−ns
3.0−−3.0−3.0−ns
0.5−−0.5−0.5−ns
90115−75−75−ns
UNIT
Notes
1. Typical values at VCC= 3.3 V.
2. Typical values at VCC= 5.0 V.
1999 Sep 239
Page 10
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
Type 74AHCT74
GND = 0 V; tr=tf≤3.0 ns.
TEST CONDITIONST
SYMBOLPARAMETER
VCC= 4.5 to 5.5 V; note 1
t
PHL/tPLH
propagation delay
nCP to nQ, nQ
propagation delay
SDnRDto nQ, nQ
n
f
max
maximum clock
pulse frequency
t
PHL/tPLH
propagation delay
nCP to nQ, nQ
propagation delay
SDnRDto nQ, nQ
n
t
W
clock pulse width
HIGH or LOW
t
W(st)(rst)
set or reset pulse
width LOW
t
rem
removaltime set or
reset
t
su
set-up time
nD to nCP
t
h
hold time
nD to nCP
f
max
maximum clock
pulse frequency
WAVEFORMSC
see Figs 6 and 815 pF −3.37.81.09.01.010.0ns
see Figs 7 and 8−3.710.41.012.01.013.0ns
see Figs 6 and 850 pF −4.88.81.010.01.011.0ns
see Figs 7 and 8−5.311.41.013.01.014.5ns
see Figs 6 and 85.0−−5.0−5.0−ns
see Figs 7 and 85.0−−5.0−5.0−ns
see Figs 6 and 85.0−−5.0−5.0−ns
74AHC74; 74AHCT74
(°C)
amb
25−40 to +85−40 to +125
L
MIN.TYP.MAX. MIN. MAX. MIN. MAX.
100160−80−80−ns
3.5−−3.5−3.5−ns
0−−0−0−ns
80140−65−65−ns
UNIT
Note
1. Typical values at V
CC
= 5.0 V.
1999 Sep 2310
Page 11
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
AC WAVEFORMS
GND
GND
V
OH
V
OL
V
OH
V
OL
V
I
(1)
V
M
t
su
V
I
t
PLH
handbook, full pagewidth
nD INPUT
nCP INPUT
nQ OUTPUT
nQ OUTPUT
74AHC74; 74AHCT74
t
h
1/f
max
(1)
V
M
t
W
t
PHL
(1)
V
M
(1)
V
M
t
t
su
PHL
t
h
t
PLH
MNA422
FAMILY
VI INPUT
REQUIREMENTS
AHCGND to V
CC
V
M
INPUT
50% V
(1)
CC
AHCTGND to 3.0 V1.5 V50% V
The shaded areas indicate when the input is permitted to change for predictable output performance.
(1)
V
M
OUTPUT
50% V
CC
CC
Fig.6The clock (nCP) to output (nQ, nQ) propagation delays, the clock pulse width, the nD to nCP set-up, the
nCP to nD hold times, the output transition times and the maximum clock pulse frequency.
1999 Sep 2311
Page 12
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
GND
GND
GND
V
OH
V
OL
V
OH
V
OL
V
I
V
I
(1)
V
M
t
W
V
I
t
PLH
(1)
V
M
(1)
V
M
t
PHL
handbook, full pagewidth
nCP INPUT
nSD INPUT
nRD INPUT
nQ OUTPUT
nQ OUTPUT
74AHC74; 74AHCT74
(1)
V
M
t
rem
t
W
(1)
V
M
t
PHL
t
PLH
MNA423
FAMILY
VI INPUT
REQUIREMENTS
AHCGND to V
CC
V
M
INPUT
50% V
(1)
CC
AHCTGND to 3.0 V1.5 V50% V
(1)
V
M
OUTPUT
50% V
CC
CC
Fig.7The set (nSD) and reset (nRD) input to output (nQ, nQ) propagation delays, the set and reset pulse widths
and the nRDto nCP removal time.
1999 Sep 2312
Page 13
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
handbook, full pagewidth
V
V
I
R
D.U.T.
T
TESTS
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
open
V
CC
GND
PULSE
GENERATOR
1
CC
74AHC74; 74AHCT74
S1
V
CC
open
GND
C
1000 Ω
L
MNA183
V
O
Fig.8 Load circuitry for switching times.
1999 Sep 2313
Page 14
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
PACKAGE OUTLINES
SO14: plastic small outline package; 14 leads; body width 3.9 mm
D
c
y
Z
14
8
74AHC74; 74AHCT74
E
H
E
A
X
v M
A
SOT108-1
pin 1 index
b
4.0
3.8
0.16
0.15
7
w M
p
scale
eHELLpQZywv θ
1.27
0.050
1
e
02.55 mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
mm
inches
Note
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
A
max.
1.75
0.069
A
1
0.25
0.10
0.010
0.004
A2A
1.45
1.25
0.057
0.049
0.25
0.01
b
3
p
0.49
0.25
0.36
0.19
0.019
0.0100
0.014
0.0075
(1)E(1)
cD
8.75
8.55
0.35
0.34
6.2
5.8
0.244
0.228
A
2
1.05
0.041
Q
A
1
detail X
1.0
0.7
0.4
0.6
0.028
0.039
0.024
0.016
(A )
L
p
L
0.25
0.010.004
A
3
θ
0.250.1
0.01
(1)
0.7
0.3
0.028
0.012
o
8
o
0
OUTLINE
VERSION
SOT108-1
IEC JEDEC EIAJ
076E06S MS-012AB
REFERENCES
1999 Sep 2314
EUROPEAN
PROJECTION
ISSUE DATE
95-01-23
97-05-22
Page 15
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
74AHC74; 74AHCT74
positive-edge trigger
TSSOP14: plastic thin shrink small outline package; 14 leads; body width 4.4 mm
E
H
E
14
D
c
y
Z
8
SOT402-1
A
X
v M
A
pin 1 index
17
w M
b
e
DIMENSIONS (mm are the original dimensions)
UNITA1A2A
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
A
max.
0.15
mm
1.10
OUTLINE
VERSION
SOT402-1 MO-153
0.05
0.95
0.80
IEC JEDEC EIAJ
0.25
b
3
p
0.30
0.19
p
02.55 mm
scale
(1)E(2)(1)
cD
0.2
5.1
0.1
4.9
REFERENCES
eHELLpQZywv θ
4.5
0.65
4.3
A
6.6
6.2
Q
(A )
2
A
1
L
L
detail X
0.75
0.4
0.50
0.3
EUROPEAN
PROJECTION
3
A
θ
p
0.130.10.21.0
0.72
0.38
ISSUE DATE
94-07-12
95-04-04
o
8
o
0
1999 Sep 2315
Page 16
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
SOLDERING
Introduction to soldering surface mount packages
Thistext gives a verybriefinsight to a complextechnology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages.Wave soldering isnot alwayssuitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
tothe printed-circuit boardbyscreen printing, stencillingor
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating,soldering andcooling) vary
between 100 and 200 seconds depending on heating
method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
Wave soldering
Conventional single wave soldering is not recommended
forsurfacemount devices (SMDs)orprinted-circuitboards
with a high component density, as solder bridging and
non-wetting can present major problems.
To overcome these problems the double-wave soldering
method was specifically developed.
74AHC74; 74AHCT74
If wave soldering is used the following conditions must be
observed for optimal results:
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• Forpackageswith leads onfoursides,the footprint must
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement andbefore soldering,the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
1999 Sep 2316
Page 17
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
74AHC74; 74AHCT74
positive-edge trigger
Suitability of surface mount IC packages for wave and reflow soldering methods
PACKAGE
BGA, SQFPnot suitablesuitable
HLQFP, HSQFP, HSOP, HTSSOP, SMS not suitable
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is only suitable forSSOP andTSSOP packages with a pitch (e) equal to or larger than0.65 mm; it is
, SO, SOJsuitablesuitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1999 Sep 2317
Page 18
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
NOTES
74AHC74; 74AHCT74
1999 Sep 2318
Page 19
Philips SemiconductorsProduct specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
NOTES
74AHC74; 74AHCT74
1999 Sep 2319
Page 20
Philips Semiconductors – a w orldwide compan y
Argentina: see South America
Australia: 3 Figtree Drive, HOMEBUSH, NSW 2140,
Indonesia: PTPhilips Development Corporation,SemiconductorsDivision,
Gedung Philips, Jl. Buncit Raya Kav.99-100, JAKARTA 12510,
Tel. +62 21 794 0040 ext. 2501, Fax. +62 21 794 0080
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 62 5344, Fax.+381 11 63 5777
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
1999
Internet: http://www.semiconductors.philips.com
68
Printed in The Netherlands545002/02/pp20 Date of release: 1999 Sep 23Document order number: 9397 750 06291
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