Datasheet 74AHCT259, 74AHC259 Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
DATA SH EET
74AHC259; 74AHCT259
8-bit addressable latch
Product specification File under Integrated Circuits, IC06
2000 Mar 14
Page 2
8-bit addressable latch
FEATURES
• ESD protection: HBM EIA/JESD22-A114-A exceeds 2000 V MM EIA/JESD22-A115-A exceeds 200 V CDM EIA/JESD22-C101 exceeds 1000 V
• Balanced propagation delays
• All inputs have Schmitt-trigger actions
• Combines demultiplexer and 8-bit latch
• Serial-to-parallel capability
• Output from each storage bit available
• Random (addressable) data entry
• Easily expandable
• Common reset input
• Useful as a 3-to-8 active HIGH decoder
• Inputs accept voltages higher than V
• For AHC only: operates with CMOS input levels
• For AHCT only: operates with TTL input levels
• Specified from −40 to +85 °C and from −40 to +125 °C.
CC
74AHC259;
74AHCT259
DESCRIPTION
The 74AHC/AHCT259 are high-speed Si-gate CMOS devices and are pin compatible with Low power Schottky TTL (LSTTL). They are specified in compliance with JEDEC standard No. 7A.
The 74AHC/AHCT259 are high-speed 8-bit addressable latches designedfor general purpose storage applications in digital systems. The ‘259’ are multifunctional devices capable of storing single-line data in eight addressable latches, and also 3-to-8 decoder and demultiplexer, with active HIGH outputs (Q0 to Q7), functions are available.
The ‘259’ also incorporates an active LOW common reset (MR) for resetting all latches as well as an active LOW enable input (LE).
The ‘259’ has four modes of operation as shown in the mode select table. Inthe addressable latchmode, data on the data line (D) is written into the addressed latch. The addressed latch will follow the data input with all non­addressed latches remaining in their previous states. In the memory mode, all latches remain in their previous states and are unaffected by the data or address inputs.
In the 3-to-8 decoding or demultiplexing mode, the addressed output follows the state of the (D) input with all other outputs in the LOW state. In the reset mode all outputs are LOW and unaffected by the address (A0 to A2) and data (D) input. When operating the ‘259’ as an address latch, changing more than one bit of the address could impose a transient-wrong address. Therefore, this should only be done while in the memory mode.
The mode select table summarizes the operations of the ‘259’.
2000 Mar 14 2
Page 3
8-bit addressable latch
QUICK REFERENCE DATA
GND = 0 V; T
SYMBOL PARAMETER CONDITIONS
t
PHL/tPLH
C
I
C
O
C
PD
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V fi= input frequency in MHz; fo= output frequency in MHz; ∑ (CL× V CL= output load capacitance in pF; VCC= supply voltage in Volts.
2. The condition is VI= GND to VCC.
=25°C; tr=tf≤3.0 ns.
amb
propagation delay
DtoQn C
= 15 pF; VCC= 5 V 4.1 4.1 ns
L
An to Qn 5.3 5.5 ns LE to Qn 4.3 4.3 ns
MR to Qn 3.9 3.9 ns input capacitance VI=VCCor GND 3.0 3.0 pF output capacitance 4.0 4.0 pF power dissipation capacitance CL= 50 pF; f = 1 MHz; notes 1 and 2 13 17 pF
2
× fi+ ∑ (CL× V
CC
2
× fo) = sum of outputs;
CC
2
× fo) where:
CC
74AHC259;
74AHCT259
TYPICAL
UNIT
AHC AHCT
2000 Mar 14 3
Page 4
8-bit addressable latch
74AHC259;
74AHCT259
FUNCTION TABLE
See note 1.
OPERATING MODE
MR LEDA0A1A2Q0Q1Q2Q3Q4Q5Q6Q7
reset L H XXXX LLLLLLLL
demultiplexer (active HIGH 8-channel)
LL
decoder (when D = H)
memory (do nothing) H H XXXXq
addressable latch H L
INPUTS OUTPUTS
dLLLQ=dLLLLLLL dHLLLQ=dLLLLLL dLHLLLQ=dLLLLL dHHLLLLQ=dLLLL dLLHLLLLQ=dLLL dHLHLLLLLQ=dLL dLHHLLLLLLQ=dL dHHHLLLLLLLQ=d
q1q2q3q4q5q6q
0
dLLLQ=dq dHLLq0Q=d q dLHLq0q1Q=d q dHHLq0q1q2Q=d q dLLHq0q1q2q3Q=d q dHLHq0q1q2q3q4Q=d q
q2q3q4q5q6q
1
q
2
q
3
q
3
q
4 4 4
5
q
5
q
5 5
q
6
q
6
q
6
q
6 6
dLHHq0q1q2q3q4q5Q=d q
7 7
q
7
q
7
q
7
q
7
q
7 7
HHHHq0q1q2q3q4q5q6Q=d
Note
1. H = HIGH voltage level; L = LOW voltage level; X = don’t care; d = HIGH or LOW data one set-up time prior to the LOW-to-HIGH LE transition; q = lower case letters indicate the state of the referenced output established during the last cycle in which it was
addressed or cleared.
ORDERING INFORMATION
PACKAGES
TYPE NUMBER
TEMPERATURE
RANGE
PINS PACKAGE MATERIAL CODE
74AHC259D −40 to +125 °C 16 SO plastic SOT109-1 74AHC259PW 16 TSSOP plastic SOT403-1 74AHCT259D 16 SO plastic SOT109-1 74AHCT259PW 16 TSSOP plastic SOT403-1
2000 Mar 14 4
Page 5
8-bit addressable latch
PINNING
PIN SYMBOL DESCRIPTION
1, 2 and 3 A0, A1 and A2 address input 4, 5, 6, 7, 9, 10, 11 and 12 Q0 to Q7 latch outputs 8 GND ground (0 V) 13 D data input 14 15 16 V
handbook, halfpage
A0
A1 A2
Q0
Q1 Q2 Q3
GND
1 2 3 4
259
5 6 7 8
MNA574
LE latch enable input (active LOW) MR conditional reset input (active LOW)
CC
V
16
CC
15
MR
14
LE D
13 12
Q7
11
Q6 Q5
10
Q4
9
handbook, halfpage
DC supply voltage
LE
13
D
1
A0
2
A1
3
A2
MR
74AHC259;
74AHCT259
14
4
Q0
5
Q1
6
Q2
7
Q3
9
Q4
10
Q5
11
Q6
12
Q7
15
MNA573
Fig.1 Pin configuration.
2000 Mar 14 5
Fig.2 Logic symbol.
Page 6
8-bit addressable latch
handbook, halfpage
1 2 3
13
Z9
15
G8
14
G10
DX
0
0
G
7
2
9,10D
0
1 2 3 4 5 6 7
74AHC259;
74AHCT259
handbook, halfpage
A0
C10
1
8R
MNA572
4
5 6 7
9 10 11 12
1
A1
2 3
14 15 13
A2
LE MR D
1-of-8
DECODER
8 LATCHES
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
MNA571
4 5 6 7
9 10 11 12
Fig.3 IEC logic symbol.
OPERATING MODE SELECT TABLE
LE MR MODE
L H addressable latch
H H memory
L L active HIGH 8-channel demultiplexer
H L reset
Note
1. H = HIGH voltage level; L = LOW voltage level.
Fig.4 Functional diagram.
2000 Mar 14 6
Page 7
8-bit addressable latch
74AHC259;
74AHCT259
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER CONDITIONS
V
CC
V
I
V
O
T
amb
DC supply voltage 2.0 5.0 5.5 4.5 5.0 5.5 V input voltage 0 − 5.5 0 − 5.5 V output voltage 0 − V operating ambient temperature see DC and AC
characteristics per device
t
, t
r
f
input rise and fall ratios (∆t/∆f) VCC= 3.3 ±0.3 V −−100 −−−ns/V
=5±0.5 V −−20 −−20 ns/V
V
CC
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referencedto GND (ground = 0 V).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CC
V
I
I
IK
I
OK
I
O
I
CC
T
stg
P
D
DC supply voltage −0.5 +7.0 V input voltage −0.5 +7.0 V DC input diode current VI< −0.5 V; note 1 −−20 mA DC output clamping diode current VO< −0.5 Vor VO>VCC+ 0.5 V; note 1 −±20 mA DC output sink current −0.5V<VO<VCC+ 0.5 V −±25 mA DC VCC or GND current −±75 mA storage temperature −65 +150 °C power dissipation per package for temperature range: −40 to +125 °C; note 2 − 500 mW
74AHC 74AHCT
UNIT
MIN. TYP. MAX. MIN. TYP. MAX.
0 − V
CC
CC
V
−40 +25 +85 −40 +25 +85 °C
−40 +25 +125 −40 +25 +125 °C
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. For SO packages: above 70 °C the value of P
derates linearly with 8 mW/K.
D
For TSSOP packages: above 60 °C the value of PDderates linearly with 5.5 mW/K.
2000 Mar 14 7
Page 8
8-bit addressable latch
DC CHARACTERISTICS 74AHC family
Over recommended operating conditions; voltages are referenced to GND (ground=0V).
amb
(°C)
SYMBOL PARAMETER
V
IH
HIGH-level input voltage
V
IL
LOW-level input voltage
V
OH
HIGH-level output voltage
V
OL
LOW-level output voltage
I
I
input leakage current
I
OZ
3-state output OFF-state current
I
CC
quiescent supply current
C
I
input capacitance −−310−10 − 10 pF
TEST CONDITIONS T
25 −40 to +85 −40 to +125
OTHER VCC(V)
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
2.0 1.5 −−1.5 − 1.5 − V
3.0 2.1 −−2.1 − 2.1 − V
5.5 3.85 −−3.85 − 3.85 − V
2.0 −− 0.5 − 0.5 − 0.5 V
3.0 −− 0.9 − 0.9 − 0.9 V
5.5 −− 1.65 − 1.65 − 1.65 V
VI=VIHor VIL; IO= −50 µA
2.0 1.9 2.0 − 1.9 − 1.9 − V
3.0 2.9 3.0 − 2.9 − 2.9 − V
4.5 4.4 4.5 − 4.4 − 4.4 − V
V
I=VIH
or VIL;
3.0 2.58 −−2.48 − 2.40 − V
IO= −4.0 mA V
I=VIH
or VIL;
4.5 3.94 −−3.8 − 3.70 − V
IO= −8.0 mA VI=VIHor VIL;
IO=50µA
2.0 − 0 0.1 − 0.1 − 0.1 V
3.0 − 0 0.1 − 0.1 − 0.1 V
4.5 − 0 0.1 − 0.1 − 0.1 V
V
I=VIH
or VIL;
3.0 −− 0.36 − 0.44 − 0.55 V
IO= 4.0 mA V
I=VIH
or VIL;
4.5 −− 0.36 − 0.44 − 0.55 V
IO= 8.0 mA VI=VCCor GND 5.5 −− 0.1 − 1.0 − 2.0 µA
VI=VIHor VIL;
5.5 −− ±0.25 −±2.5 −±10.0 µA
VO=VCCor GND VI=VCCor GND;
5.5 −− 4.0 − 40 − 80 µA
IO=0
74AHC259;
74AHCT259
UNIT
2000 Mar 14 8
Page 9
8-bit addressable latch
74AHCT family
Over recommended operating conditions; voltages are referenced to GND (ground=0V).
SYMBOL PARAMETER
V
IH
HIGH-level input voltage
V
IL
LOW-level input voltage
V
OH
HIGH-level output voltage
V
OL
LOW-level output voltage
I
I
input leakage current
I
OZ
3-state output OFF-state current
I
CC
quiescent supply current
∆I
CC
additional quiescent supply current per input pin
C
I
input capacitance −−310−10 − 10 pF
TEST CONDITIONS T
25 −40 to +85 −40 to +125
OTHER VCC(V)
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
4.5 to 5.5 2.0 −−2.0 − 2.0 − V
4.5 to 5.5 −− 0.8 − 0.8 − 0.8 V
VI=VIHor VIL;
4.5 4.4 4.5 − 4.4 − 4.4 − V
IO= −50 µA V
I=VIH
or VIL;
4.5 3.94 −−3.8 − 3.70 − V
IO= −8.0 mA VI=VIHor VIL;
4.5 − 0 0.1 − 0.1 − 0.1 V
IO=50µA V
I=VIH
or VIL;
4.5 −− 0.36 − 0.44 − 0.55 V
IO= 8.0 mA VI=VIHor V
VI=VIHor VIL;
5.5 −− 0.1 − 1.0 − 2.0 µA
IL
5.5 −− ±0.25 −±2.5 −±10.0 µA VO=VCCor GND per input pin; other inputs at VCCor GND; IO=0
VI=VCCor GND;
5.5 −− 4.0 − 40 − 80 µA IO=0
VI=VCC− 2.1 V
4.5 to 5.5 −− 1.35 − 1.5 − 1.5 mA other inputs at VCCor GND; IO=0
amb
(°C)
74AHC259;
74AHCT259
UNIT
2000 Mar 14 9
Page 10
8-bit addressable latch
AC CHARACTERISTICS Type 74AHC259
GND = 0 V; tr=tf≤3.0 ns.
SYMBOL PARAMETER
VCC= 3.0 to 3.6 V; note 1
t
PHL/tPLH
t
PHL
t
PHL/tPLH
t
PHL
t
W
t
su
t
h
propagation delay DtoQn
propagation delay An to Qn
propagation delay LE to Qn
propagation delay MR to Qn
propagation delay DtoQn
propagation delay An to Qn
propagation delay LE to Qn
propagation delay MR to Qn
LE pulse width HIGH or LOW
MR pulse width LOW
set-up time DtoLE, An to LE
hold time D to LE, An to LE
74AHC259;
74AHCT259
TEST CONDITIONS T
25 −40 to +85 −40 to +125
WAVEFORMS C
L
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
see Figs 5 and 11 15 pF − 5.8 11.5 1.0 13.5 1.0 15.0 ns
see Figs 6 and 11 − 7.5 14.5 1.0 17.0 1.0 18.5 ns
see Figs 7 and 11 − 6.2 12.0 1.0 14.0 1.0 15.2 ns
see Figs 8 and 11 − 5.4 10.5 1.0 12.5 1.0 13.5 ns
see Figs 5 and 11 50 pF − 7.3 14.5 1.0 17.0 1.0 18.5 ns
see Figs 6 and 11 − 9.1 18.0 1.0 21.0 1.0 23.0 ns
see Figs 7 and 11 − 7.7 15.5 1.0 17.5 1.0 19.0 ns
see Figs 8 and 11 − 7.0 13.5 1.0 15.5 1.0 17.0 ns
see Figs 7 and 11 5.0 −−5.0 − 5.0 − ns
see Figs 8 and 11 5.0 −−5.0 − 5.0 − ns
see Figs 9,
4.0 −−4.0 − 4.0 − ns
10 and 11 see Figs 9 and 11 1.0 −−1.0 − 1.0 − ns
amb
(°C)
UNIT
2000 Mar 14 10
Page 11
8-bit addressable latch
SYMBOL PARAMETER
= 4.5 to 5.5 V; note 2
V
CC
t
PHL/tPLH
t
PHL
t
PHL/tPLH
t
PHL
t
W
t
su
t
h
propagation delay DtoQn
propagation delay An to Qn
propagation delay LE to Qn
propagation delay MR to Qn
propagation delay DtoQn
propagation delay An to Qn
propagation delay LE to Qn
propagation delay MR to Qn
LE pulse width HIGH or LOW
MR pulse width LOW
set-up time DtoLE, An to LE
hold time D to LE, An to LE
74AHC259;
74AHCT259
TEST CONDITIONS T
25 −40 to +85 −40 to +125
WAVEFORMS C
L
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
see Figs 5 and 11 15 pF − 4.1 7.5 1.0 9.0 1.0 10.0 ns
see Figs 6 and 11 − 5.3 9.5 1.0 11.5 1.0 12.5 ns
see Figs 7 and 11 − 4.3 8.0 1.0 9.5 1.0 10.5 ns
see Figs 8 and 11 − 3.9 7.0 1.0 8.5 1.0 9.5 ns
see Figs 5 and 11 50 pF − 5.3 9.5 1.0 11.0 1.0 12.0 ns
see Figs 6 and 11 − 6.5 11.5 1.0 13.5 1.0 15.0 ns
see Figs 7 and 11 − 5.5 10.0 1.0 11.5 1.0 12.5 ns
see Figs 8 and 11 − 5.1 9.0 1.0 10.5 1.0 11.5 ns
see Figs 7 and 11 5.0 −−5.0 − 5.0 − ns
see Figs 8 and 11 5.0 −−5.0 − 5.0 − ns
see Figs 9,
4.0 −−4.0 − 4.0 − ns
10 and 11 see Figs 9 and 11 1.0 −−1.0 − 1.0 − ns
amb
(°C)
UNIT
Notes
1. Typical values at VCC= 3.3 V.
2. Typical values at VCC= 5.0 V.
2000 Mar 14 11
Page 12
8-bit addressable latch
Type 74AHCT259
GND = 0 V; tr=tf≤3.0 ns.
SYMBOL PARAMETER
VCC= 4.5 to 5.5 V; note 1
t
PHL/tPLH
t
PHL
t
PHL/tPLH
t
PHL
t
W
t
su
t
h
propagationdelay DtoQn
propagationdelay An to Qn
propagationdelay LE to Qn
propagationdelay MR to Qn
propagationdelay DtoQn
propagationdelay An to Qn
propagationdelay LE to Qn
propagationdelay MR to Qn
LE pulse width HIGH or LOW
MR pulse width LOW
set-up time DtoLE, An to LE
holdtimeD to LE, An to LE
74AHC259;
74AHCT259
TEST CONDITIONS T
25 −40 to +85 −40 to +125
WAVEFORMS C
L
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
see Figs 5 and 11 15 pF − 4.1 7.5 1.0 9.0 1.0 10.0 ns
see Figs 6 and 11 − 5.5 9.5 1.0 11.5 1.0 12.5 ns
see Figs 7 and 11 − 4.3 8.0 1.0 9.5 1.0 10.4 ns
see Figs 8 and 11 − 3.9 7.0 1.0 8.5 1.0 9.5 ns
see Figs 5 and 11 50 pF − 5.4 9.5 1.0 11.0 1.0 12.0 ns
see Figs 6 and 11 − 6.6 12.0 1.0 14.0 1.0 15.5 ns
see Figs 7 and 11 − 5.5 10.0 1.0 12.0 1.0 13.0 ns
see Figs 8 and 11 − 5.1 9.0 1.0 10.5 1.0 11.5 ns
see Figs 7 and 11 5.0 −−5.0 − 5.0 − ns
see Figs 8 and 11 5.0 −−5.0 − 5.0 − ns
see Figs 9,
4.0 −−4.0 − 4.0 − ns
10 and 11 see Figs 9 and 11 1.0 −−1.0 − 1.0 − ns
amb
(°C)
UNIT
Note
1. Typical values at V
CC
= 5.0 V.
2000 Mar 14 12
Page 13
8-bit addressable latch
AC WAVEFORMS
D input
V
CC
(1)
V
M
GND
t
PHL
V
OH
V
V
OL
VI INPUT
REQUIREMENTS
CC
(2)
M
(1)
V
M
INPUT
50% V
CC
handbook, halfpage
Qn output
FAMILY
AHC GND to V AHCT GND to 3.0 V 1.5 V 50% V
t
PLH
MNA569
(2)
V
M
OUTPUT
50% V
CC CC
74AHC259;
74AHCT259
handbook, halfpage
An input
Qn output
FAMILY
AHC GND to V AHCT GND to 3.0 V 1.5 V 50% V
V
CC
(1)
V
M
GND
t
PHL
V
OH
V
OL
VI INPUT
REQUIREMENTS
CC
(2)
V
M
(1)
V
M
INPUT
50% V
CC
OUTPUT
50% V
t
MNA568
V
M
PLH
(2)
CC CC
Fig.5 The data input (D) to output (Qn)
propagation delays.
handbook, full pagewidth
FAMILY
REQUIREMENTS
AHC GND to V
D input
LE input
Qn output
VI INPUT
CC
V
CC
GND
V
CC
GND
V
OH
V
OL
V
M
INPUT
50% V
(1)
CC
AHCT GND to 3.0 V 1.5 V 50% V
(1)
V
M
t
W
t
PHL
(2)
V
M
OUTPUT
50% V
CC CC
Fig.6 The address input (An) to output (Qn)
propagation delays.
t
PLH
(2)
V
M
MNA570
Fig.7 The enable input (LE) to output (Qn) propagation delays, the enable input pulse width.
2000 Mar 14 13
Page 14
8-bit addressable latch 74AHC259; 74AHCT259
handbook, halfpage
MR input
Qn output
FAMILY
AHC GND to V
V
CC
V
M
GND
V
OH
V
OL
VI INPUT
REQUIREMENTS
CC
(1)
t
PHL
t
W
V
INPUT
50% V
(2)
V
M
(1)
M
OUTPUT
50% V
CC
AHCT GND to 3.0 V 1.5 V 50% V
Fig.8 The conditional reset input (MR) to output
(Qn) propagation delays.
MNA548
V
M
(2)
CC CC
An input
LE input
FAMILY
V
CC
V
GND
t
su
V
CC
GND
VI INPUT
REQUIREMENTS
(1)
ADDRESS STABLE
M
(1)
V
M
CC
V
M
INPUT
50% V
(1)
CC
t
h
handbook, halfpage
The shaded areas indicate whenthe inputis permittedto changefor predictable output performance.
AHC GND to V AHCT GND to 3.0 V 1.5 V
Fig.9 The address set-up and hold time for
An inputs to LE input.
MNA550
handbook, full pagewidth
FAMILY
REQUIREMENTS
AHC GND to V
LE input
Qn output
VI INPUT
CC
V
CC
GND
V
CC
D input
GND
V
OH
V
OL
(1)
V
M
INPUT
50% VCC50% V
AHCT GND to 3.0 V 1.5 V 50% V
Fig.10 The data set-up and hold time for D input to LE input.
(2)
V
M
OUTPUT
CC CC
(1)
V
M
t
su
t
h
(1)
V
M
(2)
V
M
The shaded areas indicate when the input is permitted to change for predictable output performance.
t
su
t
h
Q = DQ = D
MNA549
2000 Mar 14 14
Page 15
8-bit addressable latch
handbook, full pagewidth
GENERATOR
TEST S1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
open V
CC
GND
S1
V
CC
V
CC
V
PULSE
I
Definitions for test circuit. CL= load capacitance including jig and probe capacitance (See Chapter “AC characteristics”). RT= termination resistance should be equal to the output impedance Zo of the pulse generator.
D.U.T.
R
T
V
O
1000 Ω
C
L
MNA219
open GND
74AHC259;
74AHCT259
Fig.11 Load circuitry for switching times.
2000 Mar 14 15
Page 16
8-bit addressable latch
PACKAGE OUTLINES
SO16: plastic small outline package; 16 leads; body width 3.9 mm
D
c
y
Z
16
9
74AHC259;
74AHCT259
SOT109-1
E
H
E
A
X
v M
A
pin 1 index
1
e
0 2.5 5 mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
mm
inches
Note
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
A
A1A2A3b
max.
0.25
1.75
0.10
0.010
0.069
0.004
1.45
1.25
0.057
0.049
0.25
0.01
p
0.49
0.36
0.019
0.014
0.25
0.19
0.0100
0.0075
(1)E(1) (1)
cD
10.0
9.8
0.39
0.38
8
b
p
scale
eHELLpQZywv θ
4.0
1.27
3.8
0.16
0.050
0.15
w M
6.2
5.8
0.244
0.228
A
2
1.05
0.041
Q
A
1
detail X
1.0
0.7
0.4
0.6
0.028
0.039
0.020
0.016
(A )
L
p
L
0.25 0.1
0.25
0.01
0.01 0.004
A
3
θ
0.7
0.3
0.028
0.012
o
8
o
0
OUTLINE
VERSION
SOT109-1
IEC JEDEC EIAJ
076E07 MS-012
REFERENCES
2000 Mar 14 16
EUROPEAN
PROJECTION
ISSUE DATE
97-05-22 99-12-27
Page 17
8-bit addressable latch
TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4.4 mm
E
H
E
16
D
c
y
Z
9
74AHC259;
74AHCT259
A
X
v M
A
SOT403-1
pin 1 index
18
w M
b
e
DIMENSIONS (mm are the original dimensions)
UNIT A
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
A
max.
mm
1.10
OUTLINE
VERSION
SOT403-1 MO-153
0.15
0.05
A2A
1
0.95
0.80
IEC JEDEC EIAJ
0.25
b
3
p
0.30
0.19
p
0 2.5 5 mm
scale
(1)E(2) (1)
cD
0.2
5.1
4.5
0.1
REFERENCES
4.9
4.3
0.65
eHELLpQZywv θ
A
6.6
6.2
Q
(A )
2
A
1
L
L
detail X
0.75
0.4
0.50
0.3
EUROPEAN
PROJECTION
3
A
θ
p
0.13 0.10.21.0
0.40
0.06
ISSUE DATE
95-04-04 99-12-27
o
8
o
0
2000 Mar 14 17
Page 18
8-bit addressable latch
SOLDERING Introduction to soldering surface mount packages
Thistext gives averybrief insighttoa complex technology. A more in-depth account of soldering ICs can be found in our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011). There is no soldering method that is ideal for all surface
mount IC packages.Wave solderingis notalways suitable for surface mount ICs, or for printed-circuit boards with high population densities. In these situations reflow soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied tothe printed-circuitboardby screenprinting,stencilling or pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example, infrared/convection heating in a conveyor type oven. Throughput times (preheating, soldering and cooling) vary between 100 and 200 seconds depending on heating method.
Typical reflow peak temperatures range from 215 to 250 °C. The top-surface temperature of the packages should preferable be kept below 230 °C.
Wave soldering
Conventional single wave soldering is not recommended forsurface mount devices(SMDs)or printed-circuit boards with a high component density, as solder bridging and non-wetting can present major problems.
To overcome these problems the double-wave soldering method was specifically developed.
74AHC259;
74AHCT259
If wave soldering is used the following conditions must be observed for optimal results:
• Use a double-wave soldering method comprising a turbulent wavewith high upwardpressure followed bya smooth laminar wave.
• For packages with leads on two sides and a pitch (e): – larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the printed-circuit board.
The footprint must incorporate solder thieves at the downstream end.
• Forpackages with leadsonfour sides, thefootprintmust be placedat a 45° angle to the transportdirection of the printed-circuit board. The footprint must incorporate solder thieves downstream and at the side corners.
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Typical dwell time is 4 seconds at 250 °C. A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two diagonally-opposite end leads. Use a lowvoltage (24 V or less) soldering iron applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C.
When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
2000 Mar 14 18
Page 19
8-bit addressable latch
74AHC259;
74AHCT259
Suitability of surface mount IC packages for wave and reflow soldering methods
PACKAGE
BGA, LFBGA, SQFP, TFBGA not suitable suitable HLQFP, HSQFP, HSOP, HTQFP, HTSSOP, SMS not suitable
(3)
PLCC LQFP, QFP, TQFP not recommended SSOP, TSSOP, VSO not recommended
Notes
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is onlysuitable for SSOP and TSSOPpackages with a pitch (e)equal to or larger than0.65 mm; it is
, SO, SOJ suitable suitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
“Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”
WAVE REFLOW
(2)
SOLDERING METHOD
suitable
(3)(4) (5)
suitable suitable
(1)
.
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting valuesgiven are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
2000 Mar 14 19
Page 20
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For all other countries apply to: Philips Semiconductors, International Marketing & Sales Communications, Building BE-p, P.O. Box 218, 5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
© Philips Electronics N.V. SCA All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
2000
Internet: http://www.semiconductors.philips.com
69
Printed in The Netherlands 613507/01/pp20 Date of release: 2000 Mar 14 Document order number: 9397 750 06821
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