Product specification
File under Integrated Circuits, IC06
2000 Mar 14
Page 2
Philips SemiconductorsProduct specification
8-bit addressable latch
FEATURES
• ESD protection:
HBM EIA/JESD22-A114-A exceeds 2000 V
MM EIA/JESD22-A115-A exceeds 200 V
CDM EIA/JESD22-C101 exceeds 1000 V
• Balanced propagation delays
• All inputs have Schmitt-trigger actions
• Combines demultiplexer and 8-bit latch
• Serial-to-parallel capability
• Output from each storage bit available
• Random (addressable) data entry
• Easily expandable
• Common reset input
• Useful as a 3-to-8 active HIGH decoder
• Inputs accept voltages higher than V
• For AHC only: operates with CMOS input levels
• For AHCT only: operates with TTL input levels
• Specified from −40 to +85 °C and from −40 to +125 °C.
CC
74AHC259;
74AHCT259
DESCRIPTION
The 74AHC/AHCT259 are high-speed Si-gate CMOS
devices and are pin compatible with Low power Schottky
TTL (LSTTL). They are specified in compliance with
JEDEC standard No. 7A.
The 74AHC/AHCT259 are high-speed 8-bit addressable
latches designedfor general purpose storage applications
in digital systems. The ‘259’ are multifunctional devices
capable of storing single-line data in eight addressable
latches, and also 3-to-8 decoder and demultiplexer, with
active HIGH outputs (Q0 to Q7), functions are available.
The ‘259’ also incorporates an active LOW common reset
(MR) for resetting all latches as well as an active LOW
enable input (LE).
The ‘259’ has four modes of operation as shown in the
mode select table. Inthe addressable latchmode, data on
the data line (D) is written into the addressed latch. The
addressed latch will follow the data input with all nonaddressed latches remaining in their previous states.
In the memory mode, all latches remain in their previous
states and are unaffected by the data or address inputs.
In the 3-to-8 decoding or demultiplexing mode, the
addressed output follows the state of the (D) input with all
other outputs in the LOW state. In the reset mode all
outputs are LOW and unaffected by the address
(A0 to A2) and data (D) input. When operating the ‘259’ as
an address latch, changing more than one bit of the
address could impose a transient-wrong address.
Therefore, this should only be done while in the memory
mode.
The mode select table summarizes the operations of
the ‘259’.
2000 Mar 142
Page 3
Philips SemiconductorsProduct specification
8-bit addressable latch
QUICK REFERENCE DATA
GND = 0 V; T
SYMBOLPARAMETERCONDITIONS
t
PHL/tPLH
C
I
C
O
C
PD
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
fi= input frequency in MHz;
fo= output frequency in MHz;
∑ (CL× V
CL= output load capacitance in pF;
VCC= supply voltage in Volts.
2. The condition is VI= GND to VCC.
=25°C; tr=tf≤3.0 ns.
amb
propagation delay
DtoQnC
= 15 pF; VCC= 5 V4.14.1ns
L
An to Qn5.35.5ns
LE to Qn4.34.3ns
MR to Qn3.93.9ns
input capacitanceVI=VCCor GND3.03.0pF
output capacitance4.04.0pF
power dissipation capacitanceCL= 50 pF; f = 1 MHz; notes 1 and 21317pF
1. H = HIGH voltage level;
L = LOW voltage level;
X = don’t care;
d = HIGH or LOW data one set-up time prior to the LOW-to-HIGH LE transition;
q = lower case letters indicate the state of the referenced output established during the last cycle in which it was
addressed or cleared.
ORDERING INFORMATION
PACKAGES
TYPE NUMBER
TEMPERATURE
RANGE
PINSPACKAGEMATERIALCODE
74AHC259D−40 to +125 °C16SOplasticSOT109-1
74AHC259PW16TSSOPplasticSOT403-1
74AHCT259D16SOplasticSOT109-1
74AHCT259PW16TSSOPplasticSOT403-1
2000 Mar 144
Page 5
Philips SemiconductorsProduct specification
8-bit addressable latch
PINNING
PINSYMBOLDESCRIPTION
1, 2 and 3A0, A1 and A2address input
4, 5, 6, 7, 9, 10, 11 and 12Q0 to Q7latch outputs
8GNDground (0 V)
13Ddata input
14
15
16V
DC supply voltage2.05.05.54.55.05.5V
input voltage0−5.50−5.5V
output voltage0−V
operating ambient temperaturesee DC and AC
characteristics
per device
t
, t
r
f
input rise and fall ratios (∆t/∆f)VCC= 3.3 ±0.3 V−−100−−−ns/V
=5±0.5 V−−20−−20ns/V
V
CC
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referencedto GND (ground = 0 V).
SYMBOLPARAMETERCONDITIONSMIN. MAX. UNIT
V
CC
V
I
I
IK
I
OK
I
O
I
CC
T
stg
P
D
DC supply voltage−0.5+7.0V
input voltage−0.5+7.0V
DC input diode currentVI< −0.5 V; note 1−−20mA
DC output clamping diode current VO< −0.5 Vor VO>VCC+ 0.5 V; note 1−±20mA
DC output sink current−0.5V<VO<VCC+ 0.5 V−±25mA
DC VCC or GND current−±75mA
storage temperature−65+150°C
power dissipation per packagefor temperature range: −40 to +125 °C; note 2−500mW
74AHC74AHCT
UNIT
MIN.TYP. MAX. MIN.TYP. MAX.
0−V
CC
CC
V
−40+25+85−40+25+85°C
−40+25+125−40+25+125°C
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. For SO packages: above 70 °C the value of P
derates linearly with 8 mW/K.
D
For TSSOP packages: above 60 °C the value of PDderates linearly with 5.5 mW/K.
2000 Mar 147
Page 8
Philips SemiconductorsProduct specification
8-bit addressable latch
DC CHARACTERISTICS
74AHC family
Over recommended operating conditions; voltages are referenced to GND (ground=0V).
amb
(°C)
SYMBOLPARAMETER
V
IH
HIGH-level input
voltage
V
IL
LOW-level input
voltage
V
OH
HIGH-level output
voltage
V
OL
LOW-level output
voltage
I
I
input leakage
current
I
OZ
3-state output
OFF-state current
I
CC
quiescent supply
current
C
I
input capacitance−−310−10−10pF
TEST CONDITIONST
25−40 to +85−40 to +125
OTHERVCC(V)
MIN.TYP.MAX. MIN. MAX. MIN. MAX.
2.01.5−−1.5−1.5−V
3.02.1−−2.1−2.1−V
5.53.85 −−3.85−3.85 −V
2.0−− 0.5−0.5−0.5V
3.0−− 0.9−0.9−0.9V
5.5−− 1.65−1.65−1.65V
VI=VIHor VIL;
IO= −50 µA
2.01.92.0−1.9−1.9−V
3.02.93.0−2.9−2.9−V
4.54.44.5−4.4−4.4−V
V
I=VIH
or VIL;
3.02.58 −−2.48−2.40 −V
IO= −4.0 mA
V
I=VIH
or VIL;
4.53.94 −−3.8−3.70 −V
IO= −8.0 mA
VI=VIHor VIL;
IO=50µA
2.0−00.1−0.1−0.1V
3.0−00.1−0.1−0.1V
4.5−00.1−0.1−0.1V
V
I=VIH
or VIL;
3.0−− 0.36−0.44−0.55V
IO= 4.0 mA
V
I=VIH
or VIL;
4.5−− 0.36−0.44−0.55V
IO= 8.0 mA
VI=VCCor GND5.5−− 0.1−1.0−2.0µA
VI=VIHor VIL;
5.5−− ±0.25 −±2.5−±10.0 µA
VO=VCCor GND
VI=VCCor GND;
5.5−− 4.0−40−80µA
IO=0
74AHC259;
74AHCT259
UNIT
2000 Mar 148
Page 9
Philips SemiconductorsProduct specification
8-bit addressable latch
74AHCT family
Over recommended operating conditions; voltages are referenced to GND (ground=0V).
SYMBOLPARAMETER
V
IH
HIGH-level input
voltage
V
IL
LOW-level input
voltage
V
OH
HIGH-level output
voltage
V
OL
LOW-level output
voltage
I
I
input leakage
current
I
OZ
3-state output
OFF-state current
I
CC
quiescent supply
current
∆I
CC
additional
quiescent supply
current per input
pin
C
I
input capacitance−−310−10−10pF
TEST CONDITIONST
25−40 to +85 −40 to +125
OTHERVCC(V)
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
4.5 to 5.5 2.0−−2.0−2.0−V
4.5 to 5.5 −− 0.8−0.8−0.8V
VI=VIHor VIL;
4.54.44.5−4.4−4.4−V
IO= −50 µA
V
I=VIH
or VIL;
4.53.94 −−3.8−3.70 −V
IO= −8.0 mA
VI=VIHor VIL;
4.5−00.1−0.1−0.1V
IO=50µA
V
I=VIH
or VIL;
4.5−− 0.36−0.44−0.55V
IO= 8.0 mA
VI=VIHor V
VI=VIHor VIL;
5.5−− 0.1−1.0−2.0µA
IL
5.5−− ±0.25 −±2.5−±10.0 µA
VO=VCCor GND
per input pin;
other inputs at
VCCor GND;
IO=0
VI=VCCor GND;
5.5−− 4.0−40−80µA
IO=0
VI=VCC− 2.1 V
4.5 to 5.5 −− 1.35−1.5−1.5mA
other inputs at
VCCor GND;
IO=0
amb
(°C)
74AHC259;
74AHCT259
UNIT
2000 Mar 149
Page 10
Philips SemiconductorsProduct specification
8-bit addressable latch
AC CHARACTERISTICS
Type 74AHC259
GND = 0 V; tr=tf≤3.0 ns.
SYMBOLPARAMETER
VCC= 3.0 to 3.6 V; note 1
t
PHL/tPLH
t
PHL
t
PHL/tPLH
t
PHL
t
W
t
su
t
h
propagation delay
DtoQn
propagation delay
An to Qn
propagation delay
LE to Qn
propagation delay
MR to Qn
propagation delay
DtoQn
propagation delay
An to Qn
propagation delay
LE to Qn
propagation delay
MR to Qn
LE pulse width
HIGH or LOW
MR pulse width
LOW
set-up time
DtoLE, An to LE
hold time D to LE,
An to LE
74AHC259;
74AHCT259
TEST CONDITIONST
25−40 to +85−40 to +125
WAVEFORMSC
L
MIN.TYP.MAX. MIN. MAX.MIN.MAX.
see Figs 5 and 11 15 pF −5.811.51.013.51.015.0ns
see Figs 6 and 11−7.514.51.017.01.018.5ns
see Figs 7 and 11−6.212.01.014.01.015.2ns
see Figs 8 and 11−5.410.51.012.51.013.5ns
see Figs 5 and 11 50 pF −7.314.51.017.01.018.5ns
see Figs 6 and 11−9.118.01.021.01.023.0ns
see Figs 7 and 11−7.715.51.017.51.019.0ns
see Figs 8 and 11−7.013.51.015.51.017.0ns
see Figs 7 and 115.0−−5.0−5.0−ns
see Figs 8 and 115.0−−5.0−5.0−ns
see Figs 9,
4.0−−4.0−4.0−ns
10 and 11
see Figs 9 and 111.0−−1.0−1.0−ns
amb
(°C)
UNIT
2000 Mar 1410
Page 11
Philips SemiconductorsProduct specification
8-bit addressable latch
SYMBOLPARAMETER
= 4.5 to 5.5 V; note 2
V
CC
t
PHL/tPLH
t
PHL
t
PHL/tPLH
t
PHL
t
W
t
su
t
h
propagation delay
DtoQn
propagation delay
An to Qn
propagation delay
LE to Qn
propagation delay
MR to Qn
propagation delay
DtoQn
propagation delay
An to Qn
propagation delay
LE to Qn
propagation delay
MR to Qn
LE pulse width
HIGH or LOW
MR pulse width
LOW
set-up time
DtoLE, An to LE
hold time D to LE,
An to LE
74AHC259;
74AHCT259
TEST CONDITIONST
25−40 to +85−40 to +125
WAVEFORMSC
L
MIN.TYP.MAX. MIN. MAX.MIN.MAX.
see Figs 5 and 11 15 pF −4.17.51.09.01.010.0ns
see Figs 6 and 11−5.39.51.011.51.012.5ns
see Figs 7 and 11−4.38.01.09.51.010.5ns
see Figs 8 and 11−3.97.01.08.51.09.5ns
see Figs 5 and 11 50 pF −5.39.51.011.01.012.0ns
see Figs 6 and 11−6.511.51.013.51.015.0ns
see Figs 7 and 11−5.510.01.011.51.012.5ns
see Figs 8 and 11−5.19.01.010.51.011.5ns
see Figs 7 and 115.0−−5.0−5.0−ns
see Figs 8 and 115.0−−5.0−5.0−ns
see Figs 9,
4.0−−4.0−4.0−ns
10 and 11
see Figs 9 and 111.0−−1.0−1.0−ns
amb
(°C)
UNIT
Notes
1. Typical values at VCC= 3.3 V.
2. Typical values at VCC= 5.0 V.
2000 Mar 1411
Page 12
Philips SemiconductorsProduct specification
8-bit addressable latch
Type 74AHCT259
GND = 0 V; tr=tf≤3.0 ns.
SYMBOLPARAMETER
VCC= 4.5 to 5.5 V; note 1
t
PHL/tPLH
t
PHL
t
PHL/tPLH
t
PHL
t
W
t
su
t
h
propagationdelay
DtoQn
propagationdelay
An to Qn
propagationdelay
LE to Qn
propagationdelay
MR to Qn
propagationdelay
DtoQn
propagationdelay
An to Qn
propagationdelay
LE to Qn
propagationdelay
MR to Qn
LE pulse width
HIGH or LOW
MR pulse width
LOW
set-up time
DtoLE, An to LE
holdtimeD to LE,
An to LE
74AHC259;
74AHCT259
TEST CONDITIONST
25−40 to +85−40 to +125
WAVEFORMSC
L
MIN.TYP.MAX. MIN. MAX.MIN. MAX.
see Figs 5 and 11 15 pF −4.17.51.09.01.010.0ns
see Figs 6 and 11−5.59.51.011.51.012.5ns
see Figs 7 and 11−4.38.01.09.51.010.4ns
see Figs 8 and 11−3.97.01.08.51.09.5ns
see Figs 5 and 11 50 pF −5.49.51.011.01.012.0ns
see Figs 6 and 11−6.612.01.014.01.015.5ns
see Figs 7 and 11−5.510.01.012.01.013.0ns
see Figs 8 and 11−5.19.01.010.51.011.5ns
see Figs 7 and 115.0−−5.0−5.0−ns
see Figs 8 and 115.0−−5.0−5.0−ns
see Figs 9,
4.0−−4.0−4.0−ns
10 and 11
see Figs 9 and 111.0−−1.0−1.0−ns
amb
(°C)
UNIT
Note
1. Typical values at V
CC
= 5.0 V.
2000 Mar 1412
Page 13
Philips SemiconductorsProduct specification
8-bit addressable latch
AC WAVEFORMS
D input
V
CC
(1)
V
M
GND
t
PHL
V
OH
V
V
OL
VI INPUT
REQUIREMENTS
CC
(2)
M
(1)
V
M
INPUT
50% V
CC
handbook, halfpage
Qn output
FAMILY
AHCGND to V
AHCTGND to 3.0 V1.5 V50% V
t
PLH
MNA569
(2)
V
M
OUTPUT
50% V
CC
CC
74AHC259;
74AHCT259
handbook, halfpage
An input
Qn output
FAMILY
AHCGND to V
AHCTGND to 3.0 V1.5 V50% V
V
CC
(1)
V
M
GND
t
PHL
V
OH
V
OL
VI INPUT
REQUIREMENTS
CC
(2)
V
M
(1)
V
M
INPUT
50% V
CC
OUTPUT
50% V
t
MNA568
V
M
PLH
(2)
CC
CC
Fig.5The data input (D) to output (Qn)
propagation delays.
handbook, full pagewidth
FAMILY
REQUIREMENTS
AHCGND to V
D input
LE input
Qn output
VI INPUT
CC
V
CC
GND
V
CC
GND
V
OH
V
OL
V
M
INPUT
50% V
(1)
CC
AHCTGND to 3.0 V1.5 V50% V
(1)
V
M
t
W
t
PHL
(2)
V
M
OUTPUT
50% V
CC
CC
Fig.6The address input (An) to output (Qn)
propagation delays.
t
PLH
(2)
V
M
MNA570
Fig.7 The enable input (LE) to output (Qn) propagation delays, the enable input pulse width.
2000 Mar 1413
Page 14
Philips SemiconductorsProduct specification
8-bit addressable latch74AHC259; 74AHCT259
handbook, halfpage
MR input
Qn output
FAMILY
AHCGND to V
V
CC
V
M
GND
V
OH
V
OL
VI INPUT
REQUIREMENTS
CC
(1)
t
PHL
t
W
V
INPUT
50% V
(2)
V
M
(1)
M
OUTPUT
50% V
CC
AHCTGND to 3.0 V1.5 V50% V
Fig.8The conditional reset input (MR) to output
(Qn) propagation delays.
MNA548
V
M
(2)
CC
CC
An input
LE input
FAMILY
V
CC
V
GND
t
su
V
CC
GND
VI INPUT
REQUIREMENTS
(1)
ADDRESS STABLE
M
(1)
V
M
CC
V
M
INPUT
50% V
(1)
CC
t
h
handbook, halfpage
The shaded areas indicate whenthe inputis permittedto changefor
predictable output performance.
AHCGND to V
AHCTGND to 3.0 V1.5 V
Fig.9The address set-up and hold time for
An inputs to LE input.
MNA550
handbook, full pagewidth
FAMILY
REQUIREMENTS
AHCGND to V
LE input
Qn output
VI INPUT
CC
V
CC
GND
V
CC
D input
GND
V
OH
V
OL
(1)
V
M
INPUT
50% VCC50% V
AHCTGND to 3.0 V1.5 V50% V
Fig.10 The data set-up and hold time for D input to LE input.
(2)
V
M
OUTPUT
CC
CC
(1)
V
M
t
su
t
h
(1)
V
M
(2)
V
M
The shaded areas indicate when the input is permitted to change
for predictable output performance.
t
su
t
h
Q = DQ = D
MNA549
2000 Mar 1414
Page 15
Philips SemiconductorsProduct specification
8-bit addressable latch
handbook, full pagewidth
GENERATOR
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
open
V
CC
GND
S1
V
CC
V
CC
V
PULSE
I
Definitions for test circuit.
CL= load capacitance including jig and probe capacitance (See Chapter “AC characteristics”).
RT= termination resistance should be equal to the output impedance Zo of the pulse generator.
D.U.T.
R
T
V
O
1000 Ω
C
L
MNA219
open
GND
74AHC259;
74AHCT259
Fig.11 Load circuitry for switching times.
2000 Mar 1415
Page 16
Philips SemiconductorsProduct specification
8-bit addressable latch
PACKAGE OUTLINES
SO16: plastic small outline package; 16 leads; body width 3.9 mm
D
c
y
Z
16
9
74AHC259;
74AHCT259
SOT109-1
E
H
E
A
X
v M
A
pin 1 index
1
e
02.55 mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
mm
inches
Note
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
A
A1A2A3b
max.
0.25
1.75
0.10
0.010
0.069
0.004
1.45
1.25
0.057
0.049
0.25
0.01
p
0.49
0.36
0.019
0.014
0.25
0.19
0.0100
0.0075
(1)E(1)(1)
cD
10.0
9.8
0.39
0.38
8
b
p
scale
eHELLpQZywv θ
4.0
1.27
3.8
0.16
0.050
0.15
w M
6.2
5.8
0.244
0.228
A
2
1.05
0.041
Q
A
1
detail X
1.0
0.7
0.4
0.6
0.028
0.039
0.020
0.016
(A )
L
p
L
0.250.1
0.25
0.01
0.010.004
A
3
θ
0.7
0.3
0.028
0.012
o
8
o
0
OUTLINE
VERSION
SOT109-1
IEC JEDEC EIAJ
076E07 MS-012
REFERENCES
2000 Mar 1416
EUROPEAN
PROJECTION
ISSUE DATE
97-05-22
99-12-27
Page 17
Philips SemiconductorsProduct specification
8-bit addressable latch
TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4.4 mm
E
H
E
16
D
c
y
Z
9
74AHC259;
74AHCT259
A
X
v M
A
SOT403-1
pin 1 index
18
w M
b
e
DIMENSIONS (mm are the original dimensions)
UNITA
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
A
max.
mm
1.10
OUTLINE
VERSION
SOT403-1 MO-153
0.15
0.05
A2A
1
0.95
0.80
IEC JEDEC EIAJ
0.25
b
3
p
0.30
0.19
p
02.55 mm
scale
(1)E(2)(1)
cD
0.2
5.1
4.5
0.1
REFERENCES
4.9
4.3
0.65
eHELLpQZywv θ
A
6.6
6.2
Q
(A )
2
A
1
L
L
detail X
0.75
0.4
0.50
0.3
EUROPEAN
PROJECTION
3
A
θ
p
0.130.10.21.0
0.40
0.06
ISSUE DATE
95-04-04
99-12-27
o
8
o
0
2000 Mar 1417
Page 18
Philips SemiconductorsProduct specification
8-bit addressable latch
SOLDERING
Introduction to soldering surface mount packages
Thistext gives averybrief insighttoa complex technology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages.Wave solderingis notalways suitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
tothe printed-circuitboardby screenprinting,stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 100 and 200 seconds depending on heating
method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
Wave soldering
Conventional single wave soldering is not recommended
forsurface mount devices(SMDs)or printed-circuit boards
with a high component density, as solder bridging and
non-wetting can present major problems.
To overcome these problems the double-wave soldering
method was specifically developed.
74AHC259;
74AHCT259
If wave soldering is used the following conditions must be
observed for optimal results:
• Use a double-wave soldering method comprising a
turbulent wavewith high upwardpressure followed bya
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• Forpackages with leadsonfour sides, thefootprintmust
be placedat a 45° angle to the transportdirection of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two
diagonally-opposite end leads. Use a lowvoltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
2000 Mar 1418
Page 19
Philips SemiconductorsProduct specification
8-bit addressable latch
74AHC259;
74AHCT259
Suitability of surface mount IC packages for wave and reflow soldering methods
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is onlysuitable for SSOP and TSSOPpackages with a pitch (e)equal to or larger than0.65 mm; it is
, SO, SOJsuitablesuitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting valuesgiven are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
2000 Mar 1419
Page 20
Philips Semiconductors – a w orldwide compan y
Argentina: see South America
Australia: 3 Figtree Drive, HOMEBUSH, NSW 2140,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 3341 299, Fax.+381 11 3342 553
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
2000
Internet: http://www.semiconductors.philips.com
69
Printed in The Netherlands613507/01/pp20 Date of release: 2000 Mar 14Document order number: 9397 750 06821
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