Datasheet 74AHCT1G79, 74AHC1G79 Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
DATA SH EET
74AHC1G79; 74AHCT1G79
Single D-type flip-flop; positive-edge trigger
Product specification File under Integrated Circuits, IC06
1999 May 18
Page 2
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
FEATURES
• Symmetrical output impedance
• High noise immunity
• ESD protection:
HBM EIA/JESD22-A114-A exceeds 2000 V; MM EIA/JESD22-A115-A exceeds 200 V
• Low power dissipation
• Balanced propagation delays
• Very small 5 pin package
• Output capability: standard.
DESCRIPTION
The 74AHC1G/AHCT1G79 is a high-speed Si-gate CMOS device.
The 74AHC1G/AHCT1G79 provides a single positive-edge triggered D-type flip-flop.
Information on the data input is transferred to the Q output on the LOW-to-HIGH transition of the clock pulse. The D input must be stable one set-up time prior to the LOW-to-HIGH clock transition for predictable operation.
FUNCTION TABLE
See note 1.
QUICK REFERENCE DATA
GND = 0 V; T
=25°C; tr=tf≤3.0 ns.
amb
SYMBOL PARAMETER CONDITIONS
t
PHL/tPLH
propagation delay CP to Q
C
I
C
PD
input capacitance 1.5 1.5 pF power dissipation
capacitance
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
2
× fi+(CL×V
CC
fi= input frequency in MHz; fo= output frequency in MHz; CL= output load capacitance in pF; VCC= supply voltage in V.
2. The condition is VI= GND to VCC.
PINNING
PIN SYMBOL DESCRIPTION
1 D data input 2 CP clock pulse input 3 GND ground (0 V) 4 Q data output 5V
CL=15pF; VCC=5V
notes 1 and 2; CL=50pF; f = 1 Mhz
2
CC
CC
74AHC1G79;
74AHCT1G79
TYPICAL
UNIT
AHC1G AHCT1G
3.5 3.5 ns
15 16 pF
× fo) where:
DC supply voltage
INPUTS OUTPUT
CP D Q+1
↑ LL ↑HH
LX Q
Note
1. H = HIGH voltage level; L = LOW voltage level; ↑ = LOW-to-HIGH CP transition; X = don’t care; Q + 1 = state after the next
LOW-to-HIGH CP transition.
Page 3
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
ORDERING AND PACKAGE INFORMATION
PACKAGES
TYPE NUMBER
74AHC1G79GW 74AHCT1G79GW 5 SC-88A plastic SOT353 CP
page
CP
GND
D
1 2
79
3
MNA439
TEMPERATURE
RANGE
−40 to +85 °C
V
5
CC
Q
4
page
PINS PACKAGE MATERIAL CODE MARKING
5 SC-88A plastic SOT353 AP
1CPD4Q
2
MNA440
page
14 2
MNA441
Fig.1 Pin configuration.
handbook, full pagewidth
CP
Fig.2 Logic symbol.
C C
C
D
TG
C
C
TG
C
TG
C
C
C
TG
C
Fig.3 IEC logic symbol.
Q
MNA442
Fig.4 Logic diagram.
Page 4
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER CONDITIONS
V
CC
V
I
V
O
T
amb
DC supply voltage 2.0 5.0 5.5 4.5 5.0 5.5 V input voltage 0 − 5.5 0 − 5.5 V output voltage 0 − V operating ambient
temperature range
see DC and AC characteristics per device
, tf (∆t/∆f) input rise and fall times
t
r
except for Schmitt-trigger inputs
VCC= 3.3 V ±0.3 V −−100 −−− ns/V V
=5V±0.5 V −−20 −−20
CC
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134); voltages are referenced to GND (ground = 0 V).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CC
V
I
I
IK
I
OK
I
O
I
CC
T
stg
P
D
DC supply voltage −0.5 +7.0 V input voltage range −0.5 +7.0 V DC input diode current VI< −0.5 −−20 mA DC output diode current VO< −0.5 or VO>VCC+ 0.5 V; note 1 −±20 mA DC output source or sink current −0.5V<VO<VCC+ 0.5 V −±25 mA DC VCC or GND current −±75 mA storage temperature −65 +150 °C power dissipation per package temperature range: −40 to +85 °C;
note 2
74AHC1G 74AHCT1G
MIN. TYP. MAX. MIN. TYP. MAX.
0 − V
CC
CC
V
−40 +25 +85 −40 +25 +85 °C
− 200 mW
UNIT
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. Above 55 °C the value of PD derates linearly with 2.5 mW/K.
Page 5
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
DC CHARACTERISTICS Family 74AHC1G
Over recommended operating conditions; voltage are referenced to GND (ground = 0 V).
SYMBOL PARAMETER
V
IH
HIGH-level input voltage
V
IL
V
OH
LOW-level input voltage 2.0 −− 0.5 − 0.5 V
HIGH-level output voltage; all outputs
HIGH-level output voltage
V
OL
LOW-level output voltage; all outputs
LOW-level output voltage
I
I
I
CC
input leakage current VI=VCCor GND 5.5 −− 0.1 − 1.0 µA quiescent supply
current
C
I
input capacitance − 1.5 10 − 10 pF
TEST CONDITIONS T
OTHER VCC (V)
MIN. TYP. MAX. MIN. MAX.
2.0 1.5 −−1.5 − V
3.0 2.1 −−2.1 −
5.5 3.85 −−3.85 −
3.0 −− 0.9 − 0.9
5.5 −− 1.65 − 1.65
VI=VIHor VIL; IO= −50 µA
2.0 1.9 2.0 − 1.9 − V
3.0 2.9 3.0 − 2.9 −
4.5 4.4 4.5 − 4.4 −
V
I=VIH
or VIL;
3.0 2.58 −−2.48 − V
IO= −4.0 mA V
I=VIH
or VIL;
4.5 3.94 −−3.8 −
IO= −8.0 mA VI=VIHor VIL;
IO=50µA
2.0 − 0 0.1 − 0.1 V
3.0 − 0 0.1 − 0.1
4.5 − 0 0.1 − 0.1
V
I=VIH
or VIL;
3.0 −− 0.36 − 0.44 V
IO=4mA V
I=VIH
or VIL;
4.5 −− 0.36 − 0.44
IO=8mA
VI=VCCor GND;
5.5 −− 1.0 − 10 µA
IO=0
amb
25 −40 to +85
74AHC1G79;
74AHCT1G79
(°C)
UNIT
Page 6
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
Family 74AHCT1G
Over recommended operating conditions; voltage are referenced to GND (ground = 0 V).
TEST CONDITIONS T
SYMBOL PARAMETER
V
IH
V
IL
V
OH
HIGH-level input voltage 4.5 to 5.5 2.0 −− 2.0 − V LOW-level input voltage 4.5 to 5.5 −−0.8 − 0.8 V HIGH-level output
voltage; all outputs HIGH-level output
voltage
V
OL
LOW-level output voltage; all outputs
LOW-level output voltage V
I I
∆I
I CC
CC
input leakage current VI=VIHor V quiescent supply current VI=VCCor GND;
additional quiescent supply current per input pin
C
I
input capacitance − 1.5 10 − 10 pF
OTHER VCC (V)
VI=VIHor VIL; IO= −50 µA
V
I=VIH
or VIL;
IO= −8.0 mA VI=VIHor VIL;
IO=50µA
or VIL;
I=VIH
IO=8mA
IL
IO=0 VI= 3.4 V
other inputs at VCCor GND; IO=0
MIN. TYP. MAX. MIN. MAX.
4.5 4.4 4.5 − 4.4 − V
4.5 3.94 −− 3.8 − V
4.5 − 0 0.1 − 0.1 V
4.5 −−0.36 − 0.44 V
5.5 −−0.1 − 1.0 µA
5.5 −−1.0 − 10 µA
5.5 −−1.35 − 1.5 mA
25 −40 to +85
74AHC1G79;
74AHCT1G79
(°C)
amb
UNIT
Page 7
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
AC CHARACTERISTICS Type 74AHC1G79
GND = 0 V; t
SYMBOL PARAMETER
t
PHL/tPLH
t
su
t
h
t
W
f
max
≤3.0 ns.
r=tf
TEST CONDITIONS T
propagation delay CP to Q
WAVEFORMS C
see Figs 5 and 6 15 pF 3.0 to 3.6 − 4.9
L
50 pF 3.0 to 3.6 − 6.9 15 pF 4.5 to 5.5 − 3.5
50 pF 4.5 to 5.5 − 5.1 set-up time D to CP 4.5 to 5.5 3.0 1.0 − 3.0 − ns hold time D to CP 4.5 to 5.5 +2.0 −1.0 − 0 − ns clock pulse width
HIGH or LOW maximum clock
pulse frequency
74AHC1G79;
74AHCT1G79
(°C)
amb
VCC (V)
25 −40 to +85
MIN. TYP. MAX. MIN. MAX.
(1)
8.4 1.0 9.8 ns
(1)
12.0 1.0 14.0 ns
(2)
5.6 1.0 7.0 ns
(2)
8.0 1.0 10.0 ns
4.5 to 5.5 3.0 −− 3.0 − ns
4.5 to 5.5 90 −− 90 − MHz
UNIT
Notes
1. Typical values at V
CC
= 3.3 V.
2. Typical values at VCC= 5.0 V.
Type 74AHCT1G79
GND = 0 V; tr=tf≤3.0 ns.
SYMBOL PARAMETER
t
PHL/tPLH
propagation delay CP to Q
t
su
t
h
t
W
set-up time D to CP 4.5to5.5 3.0 1.0 − 3.0 − ns hold time D to CP 4.5to5.5 +2.0 −1.0 − 0 − ns clock pulse width
HIGH or LOW
f
max
maximum clock pulse frequency
Note
1. Typical values at V
CC
= 5.0 V.
TEST CONDITIONS T
WAVEFORMS C
L
VCC (V)
MIN. TYP. MAX. MIN. MAX.
see Figs 5 and 6 15 pF 4.5 to 5.5 − 3.5
50 pF 4.5 to 5.5 − 5.0
4.5 to 5.5 3.0 −−3.0 − ns
4.5 to 5.5 90 −−90 − MHz
(°C)
amb
25 −40 to +85
(1)
5.0 1.0 6.0 ns
(1)
8.0 1.0 10.0 ns
UNIT
Page 8
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
AC WAVEFORMS
handbook, full pagewidth
D INPUT
CP INPUT
Q OUTPUT
FAMILY
AHC1G GND to V
VI INPUT
REQUIREMENTS
CC
AHCT1G GND to 3.0 V 1.5 V 50% V
V
I
GND
V
I
V
M
GND
V
OH
V
OL
V
M
INPUT
V
OUTPUT
50% VCC50% V
t
PHL
V
M
M
CC CC
74AHC1G79;
74AHCT1G79
V
M
t
PLH
V
M
MNA443
Fig.5 The clock pulse (CP) to output (Q) propagation delays.
handbook, halfpage
V
PULSE
GENERATOR
Definitions for test circuit: CL= load capacitance including jig and probe capacitance (see Chapter“AC characteristics”). RT= termination resistance should be equal to the output impedance Z0 of the pulse generator.
I
V
CC
V
D.U.T.
R
T
O
C
L
MNA101
Fig.6 Load circuitry for switching times.
Page 9
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
PACKAGE OUTLINE
Plastic surface mounted package; 5 leads SOT353
D
y
E
H
E
AB
45
X
v M
A
132
e
1
DIMENSIONS (mm are the original dimensions)
A
UNIT
mm
A
1.1
0.8
max
0.1
1
b
p
0.30
0.25
0.20
0.10
b
p
e
cD
2.2
1.8
A
wBM
0 1 2 mm
scale
E
1.35
1.15
(2)
1.3
e
0.65
H
E
1
2.2
0.45
2.0
0.15
e
A
1
detail X
L
Qywv
p
0.25
0.15
0.2 0.10.2
Q
L
p
c
OUTLINE VERSION
SOT353
IEC JEDEC EIAJ
REFERENCES
EUROPEAN
PROJECTION
ISSUE DATE
97-02-28SC-88A
Page 10
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
SOLDERING Introduction to soldering surface mount packages
This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in
“Data Handbook IC26; Integrated Circuit Packages”
our (document order number 9398 652 90011).
There is no soldering method that is ideal for all surface mount IC packages. Wave soldering is not always suitable for surface mount ICs, or for printed-circuit boards with high population densities. In these situations reflow soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example, infrared/convection heating in a conveyor type oven. Throughput times (preheating, soldering and cooling) vary between 100 and 200 seconds depending on heating method.
Typical reflow peak temperatures range from 215 to 250 °C. The top-surface temperature of the packages should preferable be kept below 230 °C.
74AHC1G79;
74AHCT1G79
• Use a double-wave soldering method comprising a turbulent wave with high upward pressure followed by a smooth laminar wave.
• For packages with leads on two sides and a pitch (e): – larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the printed-circuit board.
The footprint must incorporate solder thieves at the downstream end.
• For packages with leads on four sides, the footprint must be placed at a 45° angle to the transport direction of the printed-circuit board. The footprint must incorporate solder thieves downstream and at the side corners.
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Typical dwell time is 4 seconds at 250 °C. A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Manual soldering
Wave soldering
Conventional single wave soldering is not recommended for surface mount devices (SMDs) or printed-circuit boards with a high component density, as solder bridging and non-wetting can present major problems.
To overcome these problems the double-wave soldering method was specifically developed.
If wave soldering is used the following conditions must be observed for optimal results:
Fix the component by first soldering two diagonally-opposite end leads. Use a low voltage (24 V or less) soldering iron applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C.
When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
1999 May 18 10
Page 11
Philips Semiconductors Product specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
Suitability of surface mount IC packages for wave and reflow soldering methods
PACKAGE
BGA, SQFP not suitable suitable HLQFP, HSQFP, HSOP, HTSSOP, SMS not suitable
(3)
PLCC LQFP, QFP, TQFP not recommended SSOP, TSSOP, VSO not recommended
Notes
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
, SO, SOJ suitable suitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
“Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”
WAVE REFLOW
(2)
(3)(4) (5)
SOLDERING METHOD
(1)
suitable
suitable suitable
.
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
1999 May 18 11
Page 12
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1999 64
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands 245002/00/01/pp12 Date of release: 1999 May 18 Document order number: 9397 750 05983
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