Product specification
File under Integrated Circuits, IC06
1999 May 18
Page 2
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
FEATURES
• Symmetrical output impedance
• High noise immunity
• ESD protection:
HBM EIA/JESD22-A114-A
exceeds 2000 V;
MM EIA/JESD22-A115-A
exceeds 200 V
• Low power dissipation
• Balanced propagation delays
• Very small 5 pin package
• Output capability: standard.
DESCRIPTION
The 74AHC1G/AHCT1G79 is a
high-speed Si-gate CMOS device.
The 74AHC1G/AHCT1G79 provides
a single positive-edge triggered
D-type flip-flop.
Information on the data input is
transferred to the Q output on the
LOW-to-HIGH transition of the clock
pulse. The D input must be stable one
set-up time prior to the LOW-to-HIGH
clock transition for predictable
operation.
FUNCTION TABLE
See note 1.
QUICK REFERENCE DATA
GND = 0 V; T
=25°C; tr=tf≤3.0 ns.
amb
SYMBOLPARAMETERCONDITIONS
t
PHL/tPLH
propagation delay
CP to Q
C
I
C
PD
input capacitance1.51.5pF
power dissipation
capacitance
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
2
× fi+(CL×V
CC
fi= input frequency in MHz;
fo= output frequency in MHz;
CL= output load capacitance in pF;
VCC= supply voltage in V.
1. H = HIGH voltage level;
L = LOW voltage level;
↑ = LOW-to-HIGH CP transition;
X = don’t care;
Q + 1 = state after the next
LOW-to-HIGH CP transition.
1999 May 182
Page 3
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
ORDERING AND PACKAGE INFORMATION
PACKAGES
TYPE NUMBER
74AHC1G79GW
74AHCT1G79GW5SC-88AplasticSOT353CP
page
CP
GND
D
1
2
79
3
MNA439
TEMPERATURE
RANGE
−40 to +85 °C
V
5
CC
Q
4
page
PINSPACKAGEMATERIALCODEMARKING
5SC-88AplasticSOT353AP
1CPD4Q
2
MNA440
page
14
2
MNA441
Fig.1 Pin configuration.
handbook, full pagewidth
CP
Fig.2 Logic symbol.
C
C
C
D
TG
C
C
TG
C
TG
C
C
C
TG
C
Fig.3 IEC logic symbol.
Q
MNA442
Fig.4 Logic diagram.
1999 May 183
Page 4
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
RECOMMENDED OPERATING CONDITIONS
SYMBOLPARAMETERCONDITIONS
V
CC
V
I
V
O
T
amb
DC supply voltage2.05.05.54.55.05.5V
input voltage0−5.50−5.5V
output voltage0−V
operating ambient
temperature range
see DC and AC
characteristics per
device
, tf (∆t/∆f)input rise and fall times
t
r
except for
Schmitt-trigger inputs
VCC= 3.3 V ±0.3 V−−100−−− ns/V
V
=5V±0.5 V−−20−−20
CC
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134); voltages are referenced to GND (ground = 0 V).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
CC
V
I
I
IK
I
OK
I
O
I
CC
T
stg
P
D
DC supply voltage−0.5+7.0V
input voltage range−0.5+7.0V
DC input diode currentVI< −0.5−−20mA
DC output diode currentVO< −0.5 or VO>VCC+ 0.5 V; note 1−±20mA
DC output source or sink current−0.5V<VO<VCC+ 0.5 V−±25mA
DC VCC or GND current−±75mA
storage temperature−65+150°C
power dissipation per packagetemperature range: −40 to +85 °C;
note 2
74AHC1G74AHCT1G
MIN.TYP.MAX.MIN.TYP.MAX.
0−V
CC
CC
V
−40+25+85−40+25+85°C
−200mW
UNIT
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. Above 55 °C the value of PD derates linearly with 2.5 mW/K.
1999 May 184
Page 5
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
DC CHARACTERISTICS
Family 74AHC1G
Over recommended operating conditions; voltage are referenced to GND (ground = 0 V).
Over recommended operating conditions; voltage are referenced to GND (ground = 0 V).
TEST CONDITIONST
SYMBOLPARAMETER
V
IH
V
IL
V
OH
HIGH-level input voltage4.5 to 5.52.0−− 2.0−V
LOW-level input voltage4.5 to 5.5−−0.8−0.8V
HIGH-level output
voltage; all outputs
HIGH-level output
voltage
V
OL
LOW-level output
voltage; all outputs
LOW-level output voltage V
I
I
∆I
I
CC
CC
input leakage currentVI=VIHor V
quiescent supply currentVI=VCCor GND;
additional quiescent
supply current per input
pin
C
I
input capacitance−1.510−10pF
OTHERVCC (V)
VI=VIHor VIL;
IO= −50 µA
V
I=VIH
or VIL;
IO= −8.0 mA
VI=VIHor VIL;
IO=50µA
or VIL;
I=VIH
IO=8mA
IL
IO=0
VI= 3.4 V
other inputs at
VCCor GND; IO=0
MIN.TYP.MAX.MIN.MAX.
4.54.44.5−4.4−V
4.53.94−− 3.8−V
4.5−00.1−0.1V
4.5−−0.36−0.44V
5.5−−0.1−1.0µA
5.5−−1.0−10µA
5.5−−1.35−1.5mA
25−40 to +85
74AHC1G79;
74AHCT1G79
(°C)
amb
UNIT
1999 May 186
Page 7
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
AC CHARACTERISTICS
Type 74AHC1G79
GND = 0 V; t
SYMBOLPARAMETER
t
PHL/tPLH
t
su
t
h
t
W
f
max
≤3.0 ns.
r=tf
TEST CONDITIONST
propagation delay
CP to Q
WAVEFORMSC
see Figs 5 and 615 pF 3.0 to 3.6−4.9
L
50 pF 3.0 to 3.6 −6.9
15 pF 4.5 to 5.5 −3.5
50 pF 4.5 to 5.5 −5.1
set-up time D to CP4.5 to 5.5 3.01.0−3.0−ns
hold time D to CP4.5 to 5.5 +2.0 −1.0−0−ns
clock pulse width
HIGH or LOW
maximum clock
pulse frequency
74AHC1G79;
74AHCT1G79
(°C)
amb
VCC (V)
25−40 to +85
MIN.TYP.MAX.MIN.MAX.
(1)
8.41.09.8ns
(1)
12.01.014.0ns
(2)
5.61.07.0ns
(2)
8.01.010.0ns
4.5 to 5.5 3.0−− 3.0−ns
4.5 to 5.5 90−− 90−MHz
UNIT
Notes
1. Typical values at V
CC
= 3.3 V.
2. Typical values at VCC= 5.0 V.
Type 74AHCT1G79
GND = 0 V; tr=tf≤3.0 ns.
SYMBOLPARAMETER
t
PHL/tPLH
propagation delay
CP to Q
t
su
t
h
t
W
set-up time D to CP4.5to5.5 3.01.0−3.0−ns
hold time D to CP4.5to5.5 +2.0 −1.0−0−ns
clock pulse width
HIGH or LOW
f
max
maximum clock
pulse frequency
Note
1. Typical values at V
CC
= 5.0 V.
TEST CONDITIONST
WAVEFORMSC
L
VCC (V)
MIN.TYP.MAX.MIN.MAX.
see Figs 5 and 615 pF 4.5 to 5.5 −3.5
50 pF 4.5 to 5.5 −5.0
4.5 to 5.5 3.0−−3.0−ns
4.5 to 5.5 90−−90−MHz
(°C)
amb
25−40 to +85
(1)
5.01.06.0ns
(1)
8.01.010.0ns
UNIT
1999 May 187
Page 8
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
AC WAVEFORMS
handbook, full pagewidth
D INPUT
CP INPUT
Q OUTPUT
FAMILY
AHC1GGND to V
VI INPUT
REQUIREMENTS
CC
AHCT1GGND to 3.0 V1.5 V50% V
V
I
GND
V
I
V
M
GND
V
OH
V
OL
V
M
INPUT
V
OUTPUT
50% VCC50% V
t
PHL
V
M
M
CC
CC
74AHC1G79;
74AHCT1G79
V
M
t
PLH
V
M
MNA443
Fig.5 The clock pulse (CP) to output (Q) propagation delays.
handbook, halfpage
V
PULSE
GENERATOR
Definitions for test circuit:
CL= load capacitance including jig and probe capacitance (see Chapter“AC characteristics”).
RT= termination resistance should be equal to the output impedance Z0 of the pulse generator.
I
V
CC
V
D.U.T.
R
T
O
C
L
MNA101
Fig.6 Load circuitry for switching times.
1999 May 188
Page 9
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
PACKAGE OUTLINE
Plastic surface mounted package; 5 leadsSOT353
D
y
E
H
E
AB
45
X
v M
A
132
e
1
DIMENSIONS (mm are the original dimensions)
A
UNIT
mm
A
1.1
0.8
max
0.1
1
b
p
0.30
0.25
0.20
0.10
b
p
e
cD
2.2
1.8
A
wBM
012 mm
scale
E
1.35
1.15
(2)
1.3
e
0.65
H
E
1
2.2
0.45
2.0
0.15
e
A
1
detail X
L
Qywv
p
0.25
0.15
0.20.10.2
Q
L
p
c
OUTLINE
VERSION
SOT353
IEC JEDEC EIAJ
REFERENCES
1999 May 189
EUROPEAN
PROJECTION
ISSUE DATE
97-02-28SC-88A
Page 10
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
SOLDERING
Introduction to soldering surface mount packages
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
“Data Handbook IC26; Integrated Circuit Packages”
our
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering is not always suitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 100 and 200 seconds depending on heating
method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
74AHC1G79;
74AHCT1G79
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• For packages with leads on four sides, the footprint must
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Manual soldering
Wave soldering
Conventional single wave soldering is not recommended
for surface mount devices (SMDs) or printed-circuit boards
with a high component density, as solder bridging and
non-wetting can present major problems.
To overcome these problems the double-wave soldering
method was specifically developed.
If wave soldering is used the following conditions must be
observed for optimal results:
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
1999 May 1810
Page 11
Philips SemiconductorsProduct specification
Single D-type flip-flop; positive-edge trigger
74AHC1G79;
74AHCT1G79
Suitability of surface mount IC packages for wave and reflow soldering methods
PACKAGE
BGA, SQFPnot suitablesuitable
HLQFP, HSQFP, HSOP, HTSSOP, SMS not suitable
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
, SO, SOJsuitablesuitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1999 May 1811
Page 12
Philips Semiconductors – a worldwide company
Argentina: see South America
Australia: 34 Waterloo Road, NORTH RYDE, NSW 2113,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 62 5344, Fax.+381 11 63 5777
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
199964
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands245002/00/01/pp12 Date of release: 1999 May 18Document order number: 9397 750 05983
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