Datasheet 74ACTQ573SJX, 74ACTQ573SJ, 74ACTQ573SCX, 74ACTQ573SC, 74ACTQ573QSCX Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS010633 www.fairchildsemi.com
January 1990 Revised November 1999
74ACQ573 • 74ACTQ573 Quiet Series Octal Latch with 3-STATE Outputs
74ACQ573 74ACTQ573 Quiet Series Octal Latch with 3-STAT E Outputs
General Description
The ACQ/ACTQ573 is a high-speed oct al latch with buff­ered common Latch Enable (LE) and buffered common Output Enable (OE
) inputs. The A CQ/ACTQ573 is func­tionally identical to the ACQ/ACT Q373 but with inputs and outputs on opposite sides of th e pa ckag e. T he AC Q/ ACTQ utilizes Fairchild’s Quiet Series technology to guarant ee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to a split ground bus for superior performance.
Features
ICC and IOZ reduced by 5 0%
Guaranteed simultaneous switching noise level and
dynamic threshold performan ce
Guarante ed pin-to-pin skew AC per formance
Improved latch-up immunity
Inputs and outputs on opposit e sides of package allow
easy interface with microprocessors
Outputs source/sink 24 mA
Ordering Code:
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Pin Descriptions
FACT, Qui et Series , FACT Quiet Series, an d GTO are trademarks of Fairchild Semiconductor Corporation
Order Number Package Number Package Description
74ACQ573SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body 74ACQ573SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74ACQ573MTC MTC20 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
74ACQ573PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide 74ACTQ573SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body 74ACTQ573SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ACTQ573QSC MQA20 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO -13 7, 0.15 0 Wide 74ACTQ573PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Pin Names Description
D
0–D7
Data Inputs LE Latch Enable Input OE
3-STATE Output Enable Input O
0–O7
3-STATE Latch Outputs
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74ACQ573 74ACTQ573
Functional Description
The ACQ/ACTQ573 contains eight D-type latches with 3­STATE output buffers. When the Latch Enable (LE) input is HIGH, data on the D
n
inputs enters the latches. In this con-
dition the latches are transparent, i.e., a la tch output will change state each time its D-type input changes. When LE is LOW the latche s store the inf ormation that was prese nt on the D-type inpu ts at setup time prece ding th e HIGH-to­LOW transition of LE . The 3-STATE buffers are controlled by the Output Enable (OE
) input. When OE is LOW, the
buffers are enabled. W hen OE
is HIGH the buffers are i n the high impedance mode but this doe s not interfere with entering new data into the latches.
Tr uth Table
H = HIGH V oltage L = LOW Voltage Z = High Impedance X = Immaterial O
0
= Previous O0 before HIGH-to-LOW transition of Latch Enable
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
Inputs Outputs
OE LE D O
n
LHH H LHL L LLX O
0
HXX Z
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74ACQ573 74ACTQ573
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute max imum ratings are those values beyon d w hich damage
to the device may occu r. The databook spe cificatio ns shou ld be met, wit h­out exception, to ensure that the system de sign is relia ble over its p ower supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specific at ions.
DC Electrical Characteristics for ACQ
Supply Voltage (VCC) 0.5V to +7.0V DC Input Diode Current (I
IK
)
V
I
= 0.5V 20 mA
V
I
= VCC + 0.5V +20 mA
DC Input Voltage (V
I
) 0.5V to VCC + 0.5V
DC Output Diode Current (I
OK
)
V
O
= 0.5V 20 mA
V
O
= VCC + 0.5V +20 mA
DC Output Voltage (V
O
) 0.5V to VCC + 0.5V
DC Output S ource
or Sink Current (I
O
) ±50 mA
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
) ±50 mA
Storage Temperature (T
STG
) 65°C to +150°C
DC Latchup Source
or Sink Current ±300 mA
Junction Temperature (T
J
PDIP 140°C
Supply Voltage (V
CC
) ACQ 2.0V to 6.0V ACTQ 4.5V to 5.5V
Input Voltage (V
I
)0V to V
CC
Output Voltage (VO)0V to V
CC
Operating Temperature (TA) 40°C to +85°C Minimum Input Edge Rate ∆V/∆t
ACQ Devices V
IN
from 30% to 70% of V
CC
VCC @ 3.0V, 4.5V, 5.5V 125 mV/ns
Minimum Input Edge Rate ∆V/∆t
ACTQ Devices V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V 125 mV/ns
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 3.0 1.5 2.1 2.1 V
OUT
= 0.1V
Input Voltage 4.5 2.25 3.15 3.15 V or VCC 0.1V
5.5 2.75 3.85 3.85
V
IL
Maximum LOW Level 3.0 1.5 0.9 0.9 V
OUT
= 0.1V
Input Voltage 4.5 2.25 1.35 1.35 V or VCC 0.1V
5.5 2.75 1.65 1.65
V
OH
Minimum HIGH Level 3.0 2.99 2.9 2.9 Output Voltage 4.5 4.49 4.4 4.4 V I
OUT
= 50 µA
5.55.495.4 5.4 VIN = VIL or V
IH
3.0 2.56 2.46 IOH = 12 mA
4.5 3.86 3.76 V I
OH
= 24 mA
5.5 4.86 4.76 I
OH
= 24 mA (Note 2)
V
OL
Maximum LOW Level 3.0 0.002 0.1 0.1 Output Voltage 4.5 0.001 0.1 0.1 V I
OUT
= 50 µA
5.5 0.001 0.1 0.1 VIN = VIL or V
IH
3.0 0.36 0.44 IOL = 12 mA
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 2)
IIN (Note 4) Maximum Input Leakage Current 5.5 ± 0.1 ± 1.0 µAVI = VCC, GND I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65 V
Max
I
OHD
Output Current (Note 3) 5.5 −75 mA V
OHD
= 3.85 V
Min
ICC (Note 4) Maximum Quiescent Supply Current 5.5 4.0 40.0 µAVIN = VCC or GND I
OZ
Maximum 3- STATE VI (OE) = VIL, V
IH
Leakage Current 5.5 ±0.25 ±2.5 µAVI = VCC, GND
VO = VCC, GND
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 5)(Note 6)
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74ACQ573 74ACTQ573
DC Electrical Characteristics for ACQ (Continued)
Note 2: All outputs loaded; thresholds on input assoc iat ed with output under tes t. Note 3: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 4: I
IN
and ICC @ 3.0V are guaranteed to be less than or equa l to th e respective limit @ 5.5V VCC.
Note 5: Plastic DIP package. Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND. Note 7: Max number of Data Inputs (n) switching. (n 1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Note 8: All outputs loaded; thresholds on input assoc iat ed with output under tes t. Note 9: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 10: Plastic DI P package. Note 11: Max number of outputs defined as (n). Data Inputs are driven 0V to 3V. One output @ GND. Note 12: Max number of data inp ut s (n) s w it c hing. (n 1) inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (V
ILD
),
0V to threshold (V
IHD
), f =1 MHz.
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 5)(Note 6)
V
IHD
Minimum HIGH Level
5.0 3.1 3.5 V (Note 5)(Note 7)
Dynamic Input Voltage
V
ILD
Maximum LOW Level
5.0 1.9 1.5 V (Note 5)(Note 7)
Dynamic Input Voltage
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 4.5 1.5 2.0 2.0
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 2.0 2.0 or VCC 0.1V
V
IL
Maximum LOW Level 4.5 1.5 0.8 0.8
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 0.8 0.8 or V
CC
0.1V
V
OH
Minimum HIGH Level 4.5 4.49 4.4 4.4
VI
OUT
= 50 µA
Output Voltage 5.5 5.49 5.4 5.4
VIN = VIL or V
IH
4.5 3.86 3.76 V IOH = 24 mA
5.5 4.86 4.76 I
OH
= 24 mA (Note 8)
V
OL
Maximum LOW Level 4.5 0.001 0.1 0.1
VI
OUT
= 50 µA
Output Voltage 5.5 0.001 0.1 0.1
VIN = VIL or V
IH
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 8)
I
IN
Maximum Input
5.5 ±0.1 ±1.0 µAV
I
= VCC, GND
Leakage Current
I
OZ
Maximum 3-STATE
5.5 ±0.25 ±2.5 µA
VI = VIL, V
IH
Leakage Current VO = VCC, GND
I
CCT
Maximum ICC/Input 5.5 0.6 1.5 mA VI = VCC 2.1V
I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note 9) 5.5 −75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent Supply Current 5.5 4.0 40.0 µAVIN = VCC or GND
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 10)(Note 11)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 10)(Note 11)
V
IHD
Minimum HIGH Level
5.0 1.9 2.2 V (Note 10)(Note 12)
Dynamic Input Voltage
V
ILD
Maximum LOW Level
5.0 1.2 0.8 V (Note 10)(Note 12)
Dynamic Input Voltage
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74ACQ573 74ACTQ573
AC Electrical Characteristics for ACQ
Note 13: Voltage Ran ge 5.0 is 5.0V ± 0.5V
Voltage Range 3.3 is 3.3V ± 0.3V
Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the sam e d evice. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guarantee d by design.
AC Operating Requirements for ACQ
Note 15: Voltage Range 5.0 is 5.0V ± 0.5V
Voltage Range 3.3 is 3.3V ± 0.3V
AC Electrical Characteristics for ACTQ
Note 16: Voltage Ran ge 5.0 is 5.0V ± 0.5V Note 17: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the sam e d evice. The
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guarantee d by design.
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 13) Min Typ Max Min Max
t
PHL
Propagation Delay 3.3 2.5 8.5 10.5 2.5 11.0
ns
t
PLH
Dn to O
n
5.0 1.5 5.5 7.0 1.5 7.5
t
PLH
Propagation Delay 3 .3 2.5 8.5 12.0 2.5 12.5
ns
t
PHL
LE to O
n
5.0 2.0 6.0 8.0 2.0 8.5
t
PZL
Output Enable Time 3.3 2.5 8.5 13.0 2.5 13.5
ns
t
PZH
5.0 1.5 6.0 8.5 1.5 9.0
t
PHZ
Output Disable Time 3.3 1 .0 9.0 14.5 1.0 15.0
ns
t
PLZ
5.0 1.0 6.0 9.5 1.0 10.0
t
OSHL
Output to Output Skew (Note 14) 3.3 1.0 1.5 1.5
ns
t
OSLH
Dn to O
n
5.0 0.5 1.0 1.0
V
CC
TA = +25°C TA = 40°C to +85°C
Symbol Parameter (V)
CL = 50 pF CL = 50 pF
Units
(Note 15) Typ Guaranteed Minimum
t
S
Setup Time, HIGH or LOW 3.3 0 3.0 3.0
ns
Dn to LE 5.0 0 3.0 3.0
t
H
Hold Time, HIGH or LOW 3.3 0 1.5 1.5
ns
Dn to LE 5.0 0 1.5 1.5
t
W
LE Pulse Width, HIGH 3.3 2.0 4.0 4.0
ns
5.0 2.0 4.0 4.0
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 16) Min Typ Max Min Max
t
PHL
Propagation Delay
5.02.06.57.52.08.0ns
t
PLH
Dnto O
n
t
PLH
Propagation Delay
5.02.57.08.52.59.0ns
t
PHL
LE to O
n
t
PZL
, t
PZH
Output Enable Time 5.0 2.0 7.0 9.0 2.0 9.5 ns
t
PHZ
, t
PLZ
Output Disable Time 5.0 1.0 8.0 10.0 1.0 10.5 ns
t
OSHL
Output to Output Skew (Note 17)
5.0 0.5 1.0 1.0 ns
t
OSLH
Dn to O
n
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74ACQ573 74ACTQ573
AC Operating Requirements for ACTQ
Note 18: Voltage Range 5.0 is 5.0V ± 0.5V
Capacitance
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 18) Typ Guaranteed Minimum
t
S
Setup Time, HIGH or LOW
5.0 0 3.0 3.0 ns
D
n
to LE
t
H
Hold Time, HIGH or LOW
5.0 0 1.5 1.5 ns
D
n
to LE
t
W
LE Pulse Width, HIGH 5.0 2.0 4.0 4.0 ns
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF VCC = OPEN
C
PD
Power Dissipation Capacitance 42.0 pF VCC = 5.0V
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74ACQ573 74ACTQ573
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω.
2. Deskew the HFS ge nerator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously.
3. Terminate all inputs and outputs to ensure proper load­ing of the outputs and that the input levels are the cor­rect voltage.
4. Set the HFS ge nerato r to togg le all bu t one ou tput at a frequency of 1 MHz. Greater frequencies will increase DUT heating and affect the results of the measure­ment.
5. Set the HF S g enera tor in put l evels at 0V LO W a nd 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope.
Note 19: V
OHV
and V
OLP
are measured with respect to ground reference.
Note 20: Input pulses have the following characteristics: f = 1MHz, t
r
= 3ns, tf= 3ns, skew< 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
V
OLP/VOLV
and V
OHP/VOHV
:
Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will us ually be the furthest from th e g rou nd pin . Monitor the output vol t­ages using a 50 coaxial ca ble plug ged i nto a stand ard SMB type connector on the test fixture. Do not use an active FET probe.
Measure V
OLP
and V
OLV
on the quiet output du ring the
worst case transition for active and enable. Measure V
OHP
and V
OHV
on the quiet output during the worst
case active and enable transition.
Verify that the GND reference recorded o n the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
V
ILD
and V
IHD
:
Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a st andard SMB type connector on the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate or steps o ut a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
Next decrease the input HIGH voltage level, V
IH
, until
the output begins to osci llate or steps o ut a m in o f 2 ns . Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
Verify that the GND reference recorded o n the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
FIGURE 2. Simultaneous Switching Test Circuit
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74ACQ573 74ACTQ573
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
Package Number M20B
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74ACQ573 74ACTQ573
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
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74ACQ573 74ACTQ573
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide
Package Number MQA20
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74ACQ573 74ACTQ573
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Thin Shrink Sm all Ou tline Pa ck age (TS SO P), JE DE C MO-153, 4.4mm Wide
Package Number MTC20
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74ACQ573 74ACTQ573 Quiet Series Octal Latch with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life suppor t de vices o r systems a re devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical compon ent i n any compon ent of a lif e supp ort device or system whose failure t o perform can be rea­sonably expected to ca use the failure of the life supp ort device or system, or to affect its safety or effectiveness.
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