Datasheet 74ACTQ543SPC, 74ACTQ543SCX, 74ACTQ543SC, 74ACTQ543QSCX, 74ACTQ543QSC Datasheet (Fairchild Semiconductor)

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© 2000 Fairchild Semiconductor Corporation DS010154 www.fairchildsemi.com
January 1990 Revised August 2000
74ACQ543• 74ACTQ543 Quiet Series
Octal Registered Transceiver with 3-STATE Outputs
74ACQ543 74ACTQ543 Quiet Series
with 3-STATE Outputs
General Description
The ACQ/ACTQ543 is a non-inverting octal transceiver containing two sets of D-type registe rs for temporary stor­age of data flowing in either direction. Separate Latch Enable and Output Enable inputs are provided for each register to permit i ndependent input and output control in either direction of data flow.
The ACQ/ACTQ utilizes Fairchild Quiet Series
technol-
ogy to guarantee quiet output switching and improved dynamic threshold performa nce FACT Quiet Series
fea-
tures GTO
output control and undershoot corrector in
addition to a split ground bus for superior performance.
Features
Guaranteed simultaneous switching noise level and dynamic threshold performan ce
Guarante ed pin-to-pin skew AC performance
8-bit octal latched transceiver
Separate controls for data flow in each direction
Back-to-back registers for storage
Outputs source/sink 24 mA
300 mil slim PDIP/SOIC
Ordering Code:
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the order code.
Connection Diagram Pin Descriptions
FACT, Qui et Series , FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation.
Order Number Package Number Package Description
74ACQ543SC M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74ACQ543SPC N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide 74ACTQ543SC M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74ACTQ543QSC MQA24 24-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide 74ACTQ543SPC N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Pin Names Description
OEAB
A-to-B Output Enable Input (Active LOW)
OEBA
B-to-A Output Enable Input (Active LOW)
CEAB
A-to-B Enable Input (Active LOW)
CEBA
B-to-A Enable Input (Active LOW)
LEAB
A-to-B Latch Enable Input (Active LOW)
LEBA
B-to-A Latch Enable Input (Active LOW)
A
0–A7
A-to-B Data Inputs or B-to-A 3-STATE Output s
B
0–B7
B-to-A Data Inputs or A-to-B 3-STATE Output s
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74ACQ543 74ACTQ543
Logic Symbols
IEEE/IEC
Functional Description
The ACQ/ACTQ543 contains two sets of eight D-type latches, with separate input and output controls fo r each set. For data flow from A to B, for example, the A-to-B Enable (CEAB
) input must be LOW in order to enter data
from A
0–A7
or take data from B0–B7, as indicated in the
Data I/O Control Table. With CEAB
LOW, a LOW signal on
the A-to-B Latch Enable (LEAB
) input makes the A-to-B latches transparent; a sub seq uen t L OW-to-HI GH tr an sition of the LEAB
signal puts the A latches in the storag e mode and their outputs no longer ch ange with the A inputs. With CEAB
and OEAB both LOW, the 3-STATE B output buffers are active and reflect the data present at the output of the A latches. Control of data flow from B to A is similar, but using the CEBA
, LEBA and OEBA inputs
Data I/O Control Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial A-to-B data flow shown ; B-to-A flow control is the sam e, except using CEBA
, LEBA and OEBA
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
Inputs
Latch Status Output Buffers
CEAB
LEAB OEAB
H X X Latched H igh Z
X H X Latched L L X Transparent XXH High Z LXL Driving
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74ACQ543 74ACTQ543
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute max imum rating s are those values beyon d w hich damage
to the device may occu r. The databook spe cificatio ns shou ld be met, wit h­out exception, to ensure that the system de sign is relia ble over its p ower supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specific at ions.
DC Electrical Characteristics for ACQ
Supply Voltage (VCC) 0.5V to +7.0V DC Input Diode Current (I
IK
)
V
I
= 0.5V 20 mA
V
I
= VCC + 0.5V +20 mA
DC Input Voltage (V
I
) 0.5V to VCC + 0.5V
DC Output Diode Current (I
OK
)
V
O
= 0.5V 20 mA
V
O
= VCC + 0.5V +20 mA
DC Output Voltage (V
O
) 0.5V to VCC + 0.5V
DC Output S ource
or Sink Current (I
O
) ± 50 mA
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
) ± 50 mA
Storage Temperature (T
STG
) 65°C to +150°C
DC Latch-up Source or
Sink Current ± 300 mA
Junction Temperature (T
J
)
PDIP 140
°C
Supply Voltage V
CC
ACQ 2.0V to 6.0V ACTQ 4.5V to 5.5V
Input Voltage (V
I
)0V to V
CC
Output Voltage (VO)0V to V
CC
Operating Temperature (TA) 40°C to +85°C Minimum Input Edge Rate
V/t
ACQ Devices V
IN
from 30% to 70% of V
CC
VCC @3.0V, 4.5V, 5.5V 125 mV/ns
Minimum Input Edge Rate
V/t
ACTQ Devices V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V 125 mV/ns
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 3.0 1.5 2.1 2.1 V
OUT
= 0.1V
Input Voltage 4.5 2.25 3.15 3.15 V or V
CC
0.1V
5.5 2.75 3.85 3.85
V
IL
Maximum LOW Level 3.0 1.5 0.9 0.9 V
OUT
= 0.1V
Input Voltage 4.5 2.25 1.35 1.35 V or V
CC
0.1V
5.5 2.75 1.65 1.65
V
OH
Minimum HIGH Level 3.0 2.99 2.9 2.9 Output Voltage 4.5 4.49 4.4 4.4 V I
OUT
= 50 µA
5.5 5.49 5.4 5.4 V
IN
= VIL or V
IH
3.0 2.56 2.46 IOH = 12 mA
4.5 3.86 3.76 V IOH = 24 mA
5.5 4.86 4.76 IOH = 24 mA (Note 2)
V
OL
Maximum LOW Level 3.0 0.002 0.1 0.1 Output Voltage 4.5 0.001 0.1 0.1 V I
OUT
= 50 µA
5.5 0.001 0.1 0.1 VIN = VIL or V
IH
3.0 0.36 0.44 IOL = 12 mA
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 2)
I
IN
Maximum Input
5.5 ± 0.1 ± 1.0 µA
VI = VCC,
(Note 4) Leakage Current GND I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note 3) 5.5 75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent
5.5 8.0 80.0 µA
VIN = V
CC
(Note 4) Supply Current or GND I
OZT
Maximum I/O VI (OE) = VIL, V
IH
Leakage Current 5.5 ± 0.6 ± 6.0 µAVI = VCC, GND
VO = VCC, GND
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74ACQ543 74ACTQ543
DC Electrical Characteristics for ACQ (Continued)
Note 2: Maximum of 8 out puts loaded; thresholds on input associated with output under test. Note 3: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 4: I
IN
and ICC @ 3.0V are guaranteed to be less than or equa l to th e respective limit @ 5.5V VCC.
Note 5: Plastic DIP package. Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND. Note 7: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Note 8: Maximum of 8 out puts loaded; thresholds on input associated with output under test. Note 9: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 10: DIP package Note 11: Max number of ou t puts defined as (n). (n1) Data Inputs are driven 0V to 3V, one output @ GND. Note 12: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to th res hold (V
ILD
),
0V to threshold (V
IHD
), f =1 MHz.
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figures 1, 2
Maximum Dynamic V
OL
(Note 5)(Note 6)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figures 1, 2
Minimum Dynamic V
OL
(Note 5)(Note 6)
V
IHD
Minimum HIGH Level
5.0 3.1 3.5 V (Note 5)(Note 7)
Dynamic Input Voltage
V
ILD
Maximum LOW Level
5.0 1.9 1.5 V (Note 5)(Note 7)
Dynamic Input Voltage
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 4.5 1.5 2.0 2.0
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 2.0 2.0 or VCC 0.1V
V
IL
Maximum LOW Level 4.5 1.5 0.8 0.8
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 0.8 0.8 or VCC 0.1V
V
OH
Minimum HIGH Level 4.5 4.49 4.4 4.4
VI
OUT
= 50 µA
Output Voltage 5.5 5.49 5.4 5.4
VIN = VIL or V
IH
4.5 3.86 3.76 V IOH = 24 mA
5.5 4.86 4.76 IOH = 24 mA (Note 8)
V
OL
Maximum LOW Level 4.5 0.001 0.1 0.1
VI
OUT
= 50 µA
Output Voltage 5.5 0.001 0.1 0.1
VIN= VILor V
IH
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 I
OL
= 24 mA (Note 8)
I
IN
Maximum Input Leakage Current 5.5 ± 0.1 ± 1.0 µAVI = VCC, GND
I
OZT
Maximum I/O
5.5 ±0.6 6.0 µA
V
(OE) = VIL
, V
IH
Leakage Current VO = VCC, GND
I
CCT
Maximum ICC/Input 5.5 0.6 1.5 mA VI = VCC 2.1V
I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note 9) 5.5 −75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent Supply Current 5.5 8.0 80.0 µAVIN = VCC or GND
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figures 1, 2
Maximum Dynamic V
OL
(Note 10)(Note 11)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figures 1, 2
Minimum Dynamic V
OL
(Note 10)(Note 11)
V
IHD
Minimum HIGH Level Dynamic Input Voltage
5.0 1.9 2.2 V (Note 10)(Note 12)
V
ILD
Maximum LOW Level Dynamic Input Voltage
5.0 1.2 0.8 V (Note 10)(Note 12)
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74ACQ543 74ACTQ543
AC Electrical Characteristics for AC
Note 13: Voltage Ran ge 5.0 is 5.0V ± 0.5V
Voltage Range 3.3 is 3.3V ± 0.3V Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged dev ice .
The specification applies to an y outputs switching i n the same direction , either HIG H-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guaranteed by
design. Not tested.
AC Operating Requirements for AC
Note 15: Voltage Ran ge 5.0 is 5.0V ± 0.5V
Voltage Range 3.3 is 3.0V ± 0.3V
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 13) Min Typ Max Min Max
t
PLH
Propagation Delay 3.3 1.5 8.0 11.0 1.5 11.5
t
PHL
Transparent Mode 5.0 1.5 5.0 7.0 1.5 7.5 ns An to Bn or Bn to A
n
t
PLH
Propagation Delay 3.3 1.5 9.0 12.5 1.5 13.0 ns
t
PHL
LEBA, LEAB to An, B
n
5.0 1.5 6.0 8.0 1.5 8.5
t
PZH
Output Enable Time
t
PZL
OEBA or OEAB to An or B
n
3.3 1.5 10.5 15.0 1.5 15.5 ns
CEBA
or CEAB to An or B
n
5.0 1.5 7.0 9.5 1.5 10.0
t
PHZ
Output Disable Time
nst
PLZ
OEBA or OEAB to An or B
n
3.3 1.0 8.0 11.0 1.0 11.5
CEBA
or CEAB to An or B
n
5.0 1.0 5.0 7.0 1.0 7.5
t
OSHL
Output to Output 3.3 1.0 1.5 1.5
ns
t
OSLH
Skew (Note 14) 5.0 0.5 1.0 1.0
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
CL = 50 pF CL = 50 pF
Units
(Note 15) Typ Guaranteed Minimum
t
S
Setup Time, HIGH or LOW 3.3 3.0 3.0 ns A
n
or Bn to LEBA or LEAB 5.0
t
H
Hold Time, HIGH or LOW 3.3 1.5 1.5 ns An or Bn to LEBA or LEAB 5.0
t
W
Latch Enable 3.3 4.0 4.0 ns Pulse Width, LOW 5.0
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74ACQ543 74ACTQ543
AC Electrical Characteristics for ACTQ
Note 16: Voltage Range 5.0 is 5.0V ± 0.5V Note 17: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device.
The specificatio n applies to any outp uts switchin g in the s ame direct ion, either H IGH-to-L OW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guara nteed by
design. Not tested.
AC Operating Requirements for ACTQ
Note 18: Voltage Range 5.0 is 5.0V ± 0.5V
Capacitance
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 16) Min Typ Max Min Max
t
PLH
Propagation Delay
t
PHL
Transparent Mode 5.0 1.5 5.5 7.5 1.5 8.0 ns An to Bn or Bn to A
n
t
PLH
Propagation Delay
t
PHL
LEBA, LEAB 5.0 1.5 6.5 8.5 1.5 9.0 ns to An, B
n
t
PZH
Output Enable Time
t
PZL
OEBA or OEAB to An or B
n
5.0 1.5 8.0 10.0 1.5 10.5 ns
CEBA or CEAB to An or B
n
t
PHZ
Output Disable Time
t
PLZ
OEBA or OEAB to An or B
n
5.0 1.0 5.5 7.5 1.0 8.0 ns
CEBA or CEAB to An or B
n
t
OSHL
Output to Output
5.0 0.5 1.0 1.0 ns
t
OSLH
Skew (Note 17)
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 18) Typ Guaranteed Minimum
t
S
Setup Time, HIGH or LOW
5.0 3.0 3.0 ns
A
n
or Bn to LEBA or LEAB
t
S
Hold Time, HIGH or LOW
5.0 1.5 1.5 ns
A
n
or Bn to LEBA or LEAB
t
W
Latch Enable
5.0 4.0 4.0 ns
Pulse Width, LOW
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF VCC = OPEN
C
PD
Power Dissipation Capacitance 70.0 pF VCC = 5.0V
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74ACQ543 74ACTQ543
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF, 500
Ω.
2. Deskew the HFS generat or so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously.
3. Terminate all inputs and outputs to ensure proper load­ing of the outputs and that the input levels are at the correct voltage.
4. Set the HFS generator to toggle all but on e outpu t at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measure­ment.
5. Set the HFS gen erator input le vels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope.
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note 19: V
OHV
and V
OLP
are measured with respect to ground reference.
Note 20: Input pulses have the following characteristics: f = 1 MHz, t
r
= 3ns, tf = 3 ns, skew < 150 ps.
V
OLP/VOLV
and V
OHP/VOHV
:
Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will us ually be the furthest from th e g rou nd pin . Monitor the output vol t­ages using a 50
coaxial cable plugged into a sta ndard
SMB type connector on the test fixture. Do not use an active FET probe.
Measure V
OLP
and V
OLV
on the quiet output du ring the
worst case transition for active and enable. Measure V
OHP
and V
OHV
on the quiet output during the worst
case active and enable transition.
Verify that the G ND reference recorded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
V
ILD
and V
IHD
:
Monitor one of the switching outputs using a 50
coaxial
cable plugged into a st andard SMB type connector on the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate or steps o ut a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
Next decrease the input HIGH voltage level, V
IH
, until
the output begins to osci llate or steps o ut a m in o f 2 ns . Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
Verify that the G ND reference recorded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability on the measurements.
FIGURE 2. Simultaneous Switching Test Circuit
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74ACQ543 74ACTQ543
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M24B
24-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide
Package Number MQA24
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74ACQ543 74ACTQ543 Quiet Series
Octal Registered Transceiver with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N24C
Fairchild does not assume any responsibility for use of any circuitry described , no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are dev ic es or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provide d in the labe l ing, can be re a­sonably expected to result in a significant injury to the user.
2. A critical compo nent in any com ponen t of a life s upp ort device or system whose failure to perform can be rea­sonably expected to cause the failure of the l ife support device or system, or to affect its safety or effectiveness.
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