Datasheet 74ACTQ245SC, 74ACTQ245QSCX, 74ACTQ245QSC, 74ACTQ245PC, 74ACTQ245MTCX Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS010236 www.fairchildsemi.com
July 1989 Revised November 1999
74ACQ245 • 74ACTQ245 Quiet Series Octal Bidirectional Transceiver with 3-STATE Inputs/Outputs
74ACQ245 74ACTQ245 Quiet Series Octal Bidirectional Transceiver
with 3-STATE Inputs/Outputs
General Description
The ACQ/ACTQ utilizes Fairchild Quiet Series technol­ogy to guarantee quiet output switching and improve dynamic threshold perf ormance. FACT Quiet Series fe a­tures GTO output control and undershoot corrector in addition to a split ground bus for superior performance.
Features
ICC and IOZ reduced by 5 0%
Guaranteed simultaneous switching noise level and
dynamic threshold performan ce
Guaranteed pin-to-pin skew AC performance
Improved latch-up immunity
3-STATE outputs drive bus lines or buffer memory
address registers
Outputs source/sink 24 mA
Faster prop delays than the standard ACT245
Ordering Code:
Device also available in Tape and Reel. Specify by appending s uffix let te r “X” to the ordering code.
FACT, Qui et Series , FACT Quiet Series, an d GTO are trademarks of Fairchild Semiconductor Corporation.
Order Number Package Number Package Description
74ACQ245SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body 74ACQ245SJ M20D 20-Lead Small Outline Package (SOP) EIAJ TYPE II, 5.3mm Wide 74ACQ245PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide 74ACTQ245SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body 74ACTQ245SJ M20D 20-Lead Small Outline Package (SOP) EIAJ TYPE II, 5.3mm Wide 74ACTQ245QSC MQA20 20-Lead Quarter Size Outline Packag e (Q SOP ), JED EC MO -13 7, 0.15 0 Wide 74ACTQ245MSA MSA20 20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide 74ACTQ245MTC MTC20 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide 74ACTQ245PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74ACQ245 74ACTQ245
Connection Diagram
Logic Symbols
IEEE/IEC
Pin Descriptions
Tr uth Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
Pin Names Description
OE Output Enable Input T/R
Transmit/Receive Input
A
0–A7
Side A 3-STATE Inputs or 3-STATE Outputs
B
0–B7
Side B 3-STATE Inputs or 3-STATE Outputs
Inputs
Outputs
OE
T/R
L L Bus B Data to Bus A L H Bus A Data to Bus B
H X HIGH-Z State
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74ACQ245 74ACTQ245
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute max imum ratings are t hose values bey ond which damage
to the device may occu r. The databook spe cificatio ns shou ld be met, wit h­out exception, to ensure that the system de sign is relia ble over its p ower supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside da t abook specifications.
DC Electrical Characteristics for ACQ
Supply Voltage (VCC) 0.5V to +7.0V DC Input Diode Current (I
IK
)
V
I
= 0.5V 20 mA
V
I
= VCC + 0.5V +20 mA
DC Input Voltage (V
I
) 0.5V to VCC + 0.5V
DC Output Diode Current (I
OK
)
V
O
= 0.5V 20 mA
V
O
= VCC + 0.5V +20 mA
DC Output Voltage (V
O
) 0.5V to VCC + 0.5V
DC Output Source
or Sink Current (I
O
) ±50 mA
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
) ±50 mA
Storage Temperature (T
STG
) 65°C to +150°C
DC Latch-Up Source or
Sink Current ±300 mA
Junction Temperature (T
J
)
PDIP 140°C
Supply Voltage (V
CC
) ACQ 2.0V to 6.0V ACTQ 4.5V to 5.5V
Input Voltage (V
I
)0V to V
CC
Output Voltage (VO)0V to V
CC
Operating Temperature (TA) 40°C to +85°C Minimum Input Edge Rate ∆V/∆t
ACQ Devices V
IN
from 30% to 70% of V
CC
VCC @ 3.0V, 4.5V, 5.5V 125 mV/ ns
Minimum Input Edge Rate ∆V/∆t
ACTQ Devices V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V 125 mV/ns
Symbol Parameter
V
CC
TA = +25°CT
A
= 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 3.0 1.5 2.1 2.1 V
OUT
= 0.1V
Input Voltage 4.5 2.25 3.15 3.15 V or VCC 0.1V
5.5 2.75 3.85 3.85
V
IL
Maximum LOW Level 3.0 1.5 0.9 0.9 V
OUT
= 0.1V
Input Voltage 4.5 2.25 1.35 1.35 V or VCC 0.1V
5.5 2.75 1.65 1.65
V
OH
Minimum HIGH Level 3.0 2.99 2.9 2.9 Output Voltage 4.5 4.49 4.4 4.4 V I
OUT
= 50 µA
5.55.495.4 5.4 VIN = VIL or V
IH
3.0 2.56 2.46 IOH = 12 mA
4.5 3.86 3.76 V I
OH
= 24 mA
5.5 4.86 4.76 I
OH
= 24 mA (Note 2)
V
OL
Maximum LOW Level 3.0 0.002 0.1 0.1 Output Voltage 4.5 0.001 0.1 0.1 V I
OUT
= 50 µA
5.5 0.001 0.1 0.1 VIN = VIL or V
IH
3.0 0.36 0.44 IOL = 12 mA
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 2)
I
IN
Maximum Input
5.5 ±0.1 ±1.0 µAVI = VCC, GND
(Note 4) Leakage Current I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65VMax
I
OHD
Output Current (Note 3) 5.5 −75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent
5.5 4.0 40.0 µA
VIN = V
CC
(Note 4) Supply Current or GND I
OZT
Maximum I/O VI (OE) = VIL, V
IH
Leakage Current 5.5 ±0.3 ±3.0 µAVI = VCC, GND
VO = VCC, GND
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74ACQ245 74ACTQ245
DC Electrical Characteristics for ACQ (Continued)
Note 2: All outputs loaded; thresholds on input assoc iat ed with output under tes t. Note 3: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 4: I
IN
and ICC @ 3.0V are guaranteed to be less than or equa l to th e respective limit @ 5.5V VCC.
Note 5: DIP package . Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V; one output @ GND. Note 7: Max number of Data Inputs (n) switching. (n1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Note 8: All outputs loaded; thresholds on input assoc iat ed with output under tes t. Note 9: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 10: DIP package. Note 11: Max number of outputs defined as (n). n1 Data Inputs are driven 0V to 3V; one outp ut @ GND. Note 12: Max number of Data Inputs (n) switching. (n1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (V
ILD
),
0V to threshold (V
IHD
) f = 1 MHz.
Symbol Parameter
V
CC
TA = +25°CT
A
= 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 5)(Note 6)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 5)(Note 6)
V
IHD
Minimum HIGH Level
5.0 3.1 3.5 V (Note 5)(Note 7)
Dynamic Input Voltage
V
ILD
Maximum LOW Level
5.0 1.9 1.5 V (Note 5)(Note 7)
Dynamic Input Voltage
Symbol Parameter
V
CC
TA = +25°CTA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 4.5 1.5 2.0 2.0
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 2.0 2.0 or V
CC
0.1V
V
IL
Maximum LOW Level 4.5 1.5 0.8 0.8
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 0.8 0.8 or V
CC
0.1V
V
OH
Minimum HIGH Level 4.5 4.49 4.4 4.4
VI
OUT
= 50 µA
Output Voltage 5.5 5.49 5.4 5.4
VIN = VIL or V
IH
4.5 3.86 3.76 V
IOH = 24 mA
5.5 4.86 4.76 IOH = 24 mA (Note 8)
V
OL
Maximum LOW Level 4.5 0.001 0.1 0.1
VI
OUT
= 50 µA
Output Voltage 5.5 0.001 0.1 0.1
VIN = VIL or V
IH
4.5 0.36 0.44 V
IOL = 24 mA
5.5 0.36 0.44 I
OL
= 24 mA (Note 8)
I
IN
Maximum Input Leakage Current 5.5 ±0.1 ±1.0 µAVI = VCC, GND
I
OZT
Maximum 3-STATE
5.5 ±0.3 ±3.0 µA
VI = VIL, V
IH
Leakage Current VO = VCC, GND
I
CCT
Maximum ICC/Input 5.5 0.6 1.5 mA VI = VCC 2.1V
I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note 9) 5.5 −75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent Supply Current 5.5 4.0 40.0 µAVIN = VCC or GND
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 10)(Note 11)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 10)(Note 11)
V
IHD
Minimum HIGH Level Dynamic Input Voltage 5.0 1.9 2.2 V (Note 10)(Note 12)
V
ILD
Maximum LOW Level Dynamic Input Voltage 5.0 1.2 0.8 V (Note 10)(Note 12)
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74ACQ245 74ACTQ245
AC Electrical Characteristics for ACQ
Note 13: Voltage Range 5.0 is 5.0V ± 0.5V
Voltage Range 3.3 is 3.3V ± 0.3V
Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the sam e d evice. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guaranteed by design.
AC Electrical Characteristics for ACTQ
Note 15: Voltage Ran ge 5.0 is 5.0V ± 0.5V Note 16: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the sam e d evice. The
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guaranteed by design.
Capacitance
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 13) Min Typ Max Min Max
t
PHL
Propagation Delay 3.3 2.0 7.5 10.0 2.0 10.5
ns
t
PLH
Data to Output 5.0 1.5 5.0 6.5 1.5 7.0
t
PZL
Output Enable Time 3.3 3.0 8.5 13.0 3.0 13.5
ns
t
PZH
5.0 2.0 6.0 8.5 2.0 9.0
t
PHZ
Output Disable Time 3.3 1.0 8.5 14.5 1.0 15.0
ns
t
PLZ
5.0 1.0 7.5 9.5 1.0 10.0
t
OSHL
Output to Output Skew (Note 14) 3.3 1.0 1.5 1.5
ns
t
OSLH
Data to Output 5.0 0.5 1.0 1.0
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 15) Min Typ Max Min Max
t
PHL
Propagation Delay
5.0 1.5 5.5 7.0 1.5 7.5 ns
t
PLH
Data to Output
t
PZL
, t
PZH
Output Enable Time 5.0 2.0 7.0 9.0 2.0 9.5 ns
t
PHZ
, t
PLZ
Output Disable Time 5.0 1.0 8.0 10.0 1.0 10.5 ns
t
OSHL
Output to Output Skew (Note 16)
5.0 0.5 1.0 1.0 ns
t
OSLH
Data to Output
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF VCC = OPEN
C
I/O
Input/Output Capacitance 15 pF VCC = 5.0V
C
PD
Power Dissipation Capacitance 80.0 pF VCC = 5.0V
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74ACQ245 74ACTQ245
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω.
2. Deskew the HFS generator so that no two channels have greater than 15 0 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs sw itch simultaneously.
3. Terminate all inputs and outputs to ens ure pro per load ­ing of the outputs a nd that the input levels a re at the correct voltage.
4. Set the HFS ge nerato r to togg le all bu t one out put at a frequency of 1 MHz. Greater fre quencies will increa se DUT heating and effect the results of the measure­ment.
5. Set the HFS gene rator input lev els at 0V LOW a nd 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope.
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note 17: V
OHV
and V
OLP
are measured with res pect to ground referenc e.
Note 18: Input pulses have the followin g characteristics: f = 1MHz, t
r
=
3ns, t
f
= 3 ns, skew < 150 ps.
V
OLP/VOLV
and V
OHP/VOHV
:
Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the gr ound pin. Monitor th e o utp ut volt­ages using a 50 coaxi al cable p lugg ed into a standa rd SMB type connector on the te st fixture. Do not use an active FET probe.
Measure V
OLP
and V
OLV
on the quiet output du ring the
worst case transition for active and enable Measure V
OHP
and V
OHV
on the quiet output during the worst
case active and enable transition.
Verify that the GND reference recor ded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
V
ILD
and V
IHD
:
Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connec tor on the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level , V
IL
, until the
output begins to oscillate or steps ou t a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
Next decrease the input HIGH voltage level, V
IH
, until
the output begins to oscillate or step s out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
Verify that the GND reference recor ded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
FIGURE 2. Simultaneous Switching Test Circuit
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74ACQ245 74ACTQ245
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body
Package Number M20B
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74ACQ245 74ACTQ245
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
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74ACQ245 74ACTQ245
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide
Package Number MQA20
20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide
Package Num b er MSA20
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74ACQ245 74ACTQ245
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Package Number MTC20
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74ACQ245 74ACTQ245 Quiet Series Octal Bidirectional Transceiver with 3-STATE Inputs/Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described , no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are dev ic es or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provide d in the labe l ing, can be re a­sonably expected to result in a significant injury to the user.
2. A critical compo nent in any com ponen t of a life s upp ort device or system whose failure to perform can be rea­sonably expected to cause the failure of the l ife support device or system, or to affect its safety or effectiveness.
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