Datasheet 74ACTQ240SJ, 74ACTQ240SCX, 74ACTQ240SC, 74ACTQ240QSCX, 74ACTQ240QSC Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS010234 www.fairchildsemi.com
July 1989 Revised November 1999
74ACQ240 • 74ACTQ240 Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs
74ACQ240 74ACTQ240 Quiet Series Octal Buffer/Line Driver
with 3-STA TE Outputs
General Description
Features
ICC and IOZ reduced by 5 0%
Guaranteed simultaneous switching noise level and
dynamic threshold performan ce
Guarante ed pin-to-pin skew AC performance
Improved latch-up immunity
Inverting 3-STATE outputs drive bus lines or buffer
memory address registers
Outputs source/sink 24 mA
Faster prop delays than the standard ACT240
Ordering Code:
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Connection Diagram Pin Descriptions
FACT, Qui et Series , FACT Quiet Series, an d GTO are trademarks of Fairchild Semiconductor Corporation.
Order Number Package Number Package Description
74ACQ240SC M20B 20-Lead Small Outline Integrated Circuit (SOIC)JEDEC MS-013, 0.300 Wide Body 74ACQ240SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ACQ240PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide 74ACTQ240SC M20B 20-Lead Small Outline Integrated Circuit (SOIC)JEDEC MS-013, 0.300 Wide Body 74ACTQ240SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ACTQ240QSC MQA20 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide
Pin Names Description
OE
1
, OE
2
3-STATE Output Enable Inputs
I
0–I7
Inputs
O
0–O7
Outputs
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74ACQ240 74ACTQ240
Logic Symbol
IEEE/IEC
Truth Tables
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance
Inputs Outputs
OE
1
I
n
(Pins 12, 14, 16, 18)
LL H LH L
HX Z
Inputs Outputs
OE
2
I
n
(Pins 3, 5, 7, 9)
L L H LH L HX Z
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74ACQ240 74ACTQ240
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute max imum rating s are those va lues beyon d w hich damage
to the device may occu r. The databook spe cificatio ns shou ld be met, wit h­out exception, to ensure that the system de sign is relia ble over its p ower supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specificat ions.
DC Electrical Characteristics for ACQ
Supply Voltage (VCC) 0.5V to +7.0V DC Input Diode Current (I
IK
)
V
I
= 0.5V 20 mA
V
I
= VCC + 0.5V +20 mA
DC Input Voltage (V
I
) 0.5V to VCC + 0.5V
DC Output Diode Current (I
OK
)
V
O
= 0.5V 20 mA
V
O
= VCC + 0.5V +20 mA
DC Output Voltage (V
O
) 0.5V to VCC + 0.5V
DC Output S ource
or Sink Current (I
O
) ±50 mA
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
) ±50 mA
Storage Temperature (T
STG
) 65°C to +150°C
DC Latch-Up Source or
Sink Current ±300 mA
Junction Temperature (T
J
)
PDIP 140°C
Supply Voltage (V
CC
) ACQ 2.0V to 6.0V ACTQ 4.5V to 5.5V Input Voltage (V
I
)0V to V
CC
Output Voltage (VO)0V to V
CC
Operating Temperature (TA) 40°C to +85°C Minimum Input Edge Rate ∆V/∆t
ACQ Devices V
IN
from 30% to 70% of V
CC
VCC @ 3.0V, 4.5V, 5.5V 125 mV/ns
Minimum Input Edge Rate ∆V/∆t
ACTQ Devices V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V 125 mV/ns
Symbol Parameter
V
CC
TA = +25°C TA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 3.0 1.5 2.1 2.1 V
OUT
= 0.1V
Input Voltage 4.5 2.25 3.15 3.15 V or VCC 0.1V
5.5 2.75 3.85 3.85
V
IL
Maximum LOW Level 3.0 1.5 0.9 0.9 V
OUT
= 0.1V
Input Voltage 4.5 2.25 1.35 1.35 V or VCC 0.1V
5.5 2.75 1.65 1.65
V
OH
Minimum HIGH Level 3.0 2.99 2.9 2.9 Output Voltage 4.5 4.49 4.4 4.4 V I
OUT
= 50 µA
5.55.495.4 5.4 VIN = V
IL
or V
IH
3.0 2.56 2.46 IOH = 12 mA
4.5 3.86 3.76 V I
OH
= 24 mA
5.5 4.86 4.76 I
OH
= 24 mA (Note 2)
V
OL
Maximum LOW Level 3.0 0.002 0.1 0.1 Output Voltage 4.5 0.001 0.1 0.1 V I
OUT
= 50 µA
5.5 0.001 0.1 0.1 VIN = VIL or V
IH
3.0 0.36 0.44 IOL = 12 mA
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 2)
I
IN
Maximum Input
5.5 ±0.1 ±1.0 µAVI = VCC, GND
(Note 4) Leakage Current I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note3) 5.5 −75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent
5.5 4.0 40.0 µAVIN = VCC or GND
(Note 4) Supply Current I
OZ
Maximum 3-STATE
5.5 ±0.25 ±2.5 µA
VI (OE) = VIL, V
IH
Leakage Current VI = VCC, GND
VO = VCC, GND
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74ACQ240 74ACTQ240
DC Electrical Characteristics for ACQ (Continued)
Note 2: All outputs loaded; thresholds on input assoc iat ed with output under tes t. Note 3: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 4: I
IN
and ICC @ 3.0V are guaranteed to be less than or equa l to th e respective limit @ 5.5V VCC.
Note 5: Plastic DIP package. Note 6: Max number of output s d ef ined as (n). Data inputs ar e driven 0V to 5V. One output @ GND. Note 7: Max number of data inputs (n) switching. (n 1) inputs switching 0V to 5V (AC Q). Input-under-test switching: 5V to threshol d (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Note 8: All outputs loaded; thresholds on input assoc iat ed with output under tes t. Note 9: Maximum test duratio n 2. 0 ms, one output loaded at a time. Note 10: Plastic DI P package. Note 11: Max number of Data Inpu ts defined as (n). n1 Data In puts are driven 0V to 3V. One Data Input @ V
IN
= GND.
Note 12: Max number of Data Inputs (n) switching. (n1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
Symbol Parameter
V
CC
TA = +25°C TA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 5)(Note 6)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 5)(Note 6)
V
IHD
Minimum HIGH Level Dynamic Input Voltage 5.0 3.1 3.5 V (Note 5)(Note 7)
V
ILD
Maximum LOW Level Dynamic Input Voltage 5.0 1.9 1.5 V (Note 5)(Note 7)
Symbol Parameter
V
CC
TA = +25°C TA = 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 4.5 1.5 2.0 2.0
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 2.0 2.0 or VCC 0.1V
V
IL
Maximum LOW Level 4.5 1.5 0.8 0.8
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 0.8 0.8 or V
CC
0.1V
V
OH
Minimum HIGH Level 4.5 4.49 4.4 4.4
VI
OUT
= 50 µA
Output Voltage 5.5 5.49 5.4 5.4
VIN = VIL or V
IH
4.5 3.86 3.76 V IOH = 24 mA
5.5 4.86 4.76 I
OH
= 24 mA (Note 8)
V
OL
Maximum LOW Level 4.5 0.001 0.1 0.1
VI
OUT
= 50 µA
Output Voltage 5.5 0.001 0.1 0.1
VIN = VIL or V
IH
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 8)
I
IN
Maximum Input Leakage Current 5.5 ±0.1 ±1.0 µAVI = VCC, GND
I
OZ
Maximum 3-STATE
5.5 ±0.25 ±2.5 µA
VI = VIL, V
IH
Leakage Current VO = VCC, GND
I
CCT
Maximum ICC/Input 5.5 0.6 1.5 mA VI = VCC 2.1V
I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note 9) 5.5 75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent Supply Current 5.5 4.0 40.0 µAVIN = VCC or GND
V
OLP
Quiet Output Maximum
5.0 1.1 1.5 V
Figure 1, Figure 2
Dynamic V
OL
(Note 10)(Note 11)
V
OLV
Quiet Output Minimum
5.0 0.6 1.2 V
Figure 1, Figure 2
Dynamic V
OL
(Note 10)(Note 11)
V
IHD
Minimum HIGH Level Dynamic Input Voltage 5.0 1.9 2.2 V (Note 10)(Note 12)
V
ILD
Maximum LOW Level Dynamic Input Voltage 5.0 1.2 0.8 V (Note 10)(Note 12)
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74ACQ240 74ACTQ240
AC Electrical Characteristics for ACQ
Note 13: Voltage Ran ge 5.0 is 5.0V ± 0.5V
Voltage Range 3.3 is 3.3 ± 0.3V. Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the sam e d evice. The
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guarantee d by design.
AC Electrical Characteristics for ACTQ
Note 15: Voltage Ran ge 5.0 is 5.0V ± 0.5V Note 16: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the sam e d evice. The
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
). Parameter guarantee d by design.
Capacitance
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 13) Min Typ Max Min Max
t
PHL
Propagation Delay 3.3 2.0 7.0 10.0 2.0 10.5
ns
t
PLH
Data to Output 5.0 1.5 5.0 6.5 1.5 7.0
t
PZL
Output Enable Time 3.3 2.5 8.0 12.0 2.5 12.5
ns
t
PZH
5.0 1.5 5.5 8.0 1.5 8.5
t
PHZ
Output Disable Time 3.3 1.0 8.5 13.5 1.0 14.0
ns
t
PLZ
5.0 1.0 6.0 9.0 1.0 9.5
t
OSHL
Output to Output Skew 3.3 1.0 1.5 1.5
ns
t
OSLH
Data to Output (Note 14) 5.0 0.5 1.0 1.0
V
CC
TA = +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF CL = 50 pF
Units
(Note 15) Min Typ Max Min Max
t
PHL
Propagation Delay
5.0 1.5 5.5 7.0 1.5 7.5 ns
t
PLH
Data to Output
t
PZL
, t
PZH
Output Enable Time 5.0 1.5 6.5 8.5 1.5 9.0 ns
t
PHZ
, t
PLZ
Output Disable Time 5.0 1.0 7.0 9.5 1.0 10.0 ns
t
OSHL
Output to Output Skew
5.0 0.5 1.0 1.0 ns
t
OSLH
Data to Output (Note 16)
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF VCC = OPEN
C
PD
Power Dissipation Capacitance 70 pF VCC = 5.0V
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74ACQ240 74ACTQ240
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF, 500.
2. Deskew the HFS generator so that no two channels have greater than 15 0 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs sw itch simultaneously.
3. Terminate all inputs and outputs to ens ure pro per load ­ing of the outputs a nd that the input levels a re at the correct voltage.
4. Set the HFS ge nerato r to togg le all bu t one out put at a frequency of 1 MHz. Greater fre quencies will increa se DUT heating and affect the results of the measure­ment.
5. Set the HFS gene rator input lev els at 0V LOW a nd 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope.
Note 17: V
OHV
and V
OLP
are measured with res pect to ground referenc e.
Note 18: Input pulses have the followin g characteristics: f = 1MHz, t
r
=
3ns, t
f
= 3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
V
OLP/VOLV
and V
OHP/V OHV
:
Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the gr ound pin. Monitor th e o utp ut volt­ages using a 50 coaxi al cable p lugg ed into a standa rd SMB type connector on the te st fixture. Do not use an active FET probe.
Measure V
OLP
and V
OLV
on the quiet output du ring the
worst case transition for active and enable. Measure V
OHP
and V
OHV
on the quiet output during the worst
case active and enable transition.
Verify t hat the GND reference recorded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
V
ILD
and V
IHD
:
Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connec tor on the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level , V
IL
, until the
output begins to oscillate or steps ou t a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
Next decrease the input HIGH voltage level, V
IH
, until
the output begins to oscillate or step s out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
Verify t hat the GND reference recorded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.
FIGURE 2. Simultaneous Switching Test Circuit
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74ACQ240 74ACTQ240
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body
Package Number M20B
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74ACQ240 74ACTQ240
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
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74ACQ240 74ACTQ240
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide
Package Number MQA20
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74ACQ240 74ACTQ240 Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component in any compon ent of a lif e supp ort device or system whose failure t o perform can be rea­sonably expected to ca use the failure of the life supp ort device or system, or to affect its safety or effectiveness.
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