Page 1
54ACT16827, 74ACT16827
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS163A – JUNE 1990 – REVISED APRIL 1996
D
Members of the Texas Instruments
Widebus
D
Inputs Are TTL-Voltage Compatible
D
3-State Outputs Drive Bus Lines Directly
D
Flow-Through Architecture Optimizes
Family
PCB Layout
D
Distributed VCC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D
EPIC
(Enhanced-Performance Implanted
CMOS) 1-µm Process
D
500-mA Typical Latch-Up Immunity at
125°C
D
Package Options Include Plastic 300-mil
Shrink Small-Outline (DL) Packages Using
25-mil Center-to-Center Pin Spacings and
380-mil Fine-Pitch Ceramic Flat (WD)
Packages Using 25-mil Center-to-Center
Pin Spacings
description
The ’ACT16827 are noninverting 20-bit buffers
composed of two 10-bit sections with separate
output-enable signals. For either 10-bit buffer
section, the two output-enable (1OE1
or 2OE1 and 2OE2) inputs must both be low for
the corresponding Y outputs to be active. If either
output-enable input is high, the outputs of that
10-bit buffer section are in the high-impedance
state.
The 74ACT16827 is packaged in TI’s shrink
small-outline package, which provides twice the
I/O pin count and functionality of standard
small-outline packages in the same printedcircuit-board area.
and 1OE2
54ACT16827 . . . WD PACKAGE
74ACT16827 . . . DL PACKAGE
1OE1
2OE1
1Y1
1Y2
GND
1Y3
1Y4
V
CC
1Y5
1Y6
1Y7
GND
1Y8
1Y9
1Y10
2Y1
2Y2
2Y3
GND
2Y4
2Y5
2Y6
V
CC
2Y7
2Y8
GND
2Y9
2Y10
(TOP VIEW)
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
30
28
29
1OE2
1A1
1A2
GND
1A3
A14
V
CC
1A5
1A6
1A7
GND
1A8
1A9
1A10
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
CC
2A7
2A8
GND
2A9
2A10
2OE2
The 54ACT16827 is characterized for operation over the full military temperature range of –55°C to 125°C. The
74ACT16827 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each 8-bit section)
INPUTS
OE1 OE2
L L L L
L LH H
H XX Z
X H X Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC and Widebus are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
OUTPUT
A
Y
Copyright 1996, Texas Instruments Incorporated
1
Page 2
54ACT16827, 74ACT16827
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS163A – JUNE 1990 – REVISED APRIL 1996
logic symbol
†
1OE1
1OE2
2OE1
2OE2
1A1
1A2
1A3
1A4
1A5
1A6
1A7
1A8
1A9
1A10
2A1
2A2
2A3
2A4
2A5
2A6
2A7
2A8
2A9
2A10
1
56
28
29
55
54
52
51
49
48
47
45
44
43
42
41
40
38
37
36
34
33
31
30
&
&
EN1
EN2
11
12
10
12
13
14
15
16
17
19
20
21
23
24
26
27
2
1Y1
3
1Y2
5
1Y3
6
1Y4
8
1Y5
9
1Y6
1Y7
1Y8
1Y9
1Y10
2Y1
2Y2
2Y3
2Y4
2Y5
2Y6
2Y7
2Y8
2Y9
2Y10
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
1
1OE1
56
1OE2
55
1A1
To Nine Other Channels To Nine Other Channels
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
2
1Y1
2OE1
2OE2
2A1
28
29
42
15
2Y1
Page 3
UNIT
54ACT16827, 74ACT16827
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS163A – JUNE 1990 – REVISED APRIL 1996
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage range, V
–0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
†
Input voltage range, VI (see Note 1) –0.5 V to VCC + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, VO (see Note 1) –0.5 V to VCC + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or VI > VCC) ±20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VCC) ±50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
(VO = 0 to VCC) 50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
O
Continuous current through VCC or GND ±500 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum package power dissipation at TA = 55°C (in still air) (see Note 2): DL package 1.4 W. . . . . . . . . .
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150_C and a board trace length of 750 mils.
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
recommended operating conditions (see Note 3)
54ACT16827 54ACT16827
MIN NOM MAX MIN NOM MAX
V
V
V
V
V
I
OH
I
OL
∆t/∆v Input transition rise or fall rate 0 10 0 10 ns/V
T
NOTE 3: Unused inputs must be held high or low to prevent them from floating.
Supply voltage 4.5 5 5.5 4.5 5 5.5 V
CC
High-level input voltage 2 2 V
IH
Low-level input voltage 0.8 0.8 V
IL
Input voltage 0 V
I
Output voltage 0 V
O
High-level output current –24 –24 mA
Low-level output current 24 24 mA
Operating free-air temperature –55 125 –40 85 °C
A
CC
CC
0 V
0 V
CC
CC
V
V
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
Page 4
54ACT16827, 74ACT16827
PARAMETER
TEST CONDITIONS
V
UNIT
I
A
I
mA
I
50 µA
I
24 mA
PARAMETER
UNIT
A
Y
ns
OE
Y
ns
OE
Y
ns
CpdPower dissipation capacitance
C
f
pF
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS163A – JUNE 1990 – REVISED APRIL 1996
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
CC
= –50 µ
OH
V
OH
V
OL
I
I
I
OZ
I
CC
‡
∆I
CC
C
i
C
†
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.
‡
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC.
o
= –24
OH
IOH = –75 mA
=
OL
=
OL
IOL = 75 mA
VI = VCC or GND 5.5 V ±0.1 ±1 ±1 µA
VO = VCC or GND 5.5 V ±0.5 ±5 ±5 µA
VI = VCC or GND, IO = 0 5.5 V 8 80 80 µA
One input at 3.4 V ,
Other inputs at VCC or GND
VI = VCC or GND 5 V 4.5 pF
VO = VCC or GND 5 V 16 pF
†
†
4.5 V 4.4 4.4 4.4
5.5 V 5.4 5.4 5.4
4.5 V 3.94 3.8 3.8
5.5 V 4.94 4.8 4.8
5.5 V 3.85 3.85
4.5 V 0.1 0.1 0.1
5.5 V 0.1 0.1 0.1
4.5 V 0.36 0.44 0.44
5.5 V 0.36 0.44 0.44
5.5 V 1.65 1.65
5.5 V 0.9 1 1 mA
TA = 25°C 54ACT16827 74ACT16827
MIN TYP MAX MIN MAX MIN MAX
V
V
switching characteristics over recommended operating free-air temperature range,
V
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
CC
TA = 25°C 54ACT16827 74ACT16827
MIN TYP MAX MIN MAX MIN MAX
3.6 7.4 9.8 3.6 11 3.6 11
2.8 7.4 9.8 2.8 10.8 2.8 10.8
3 7.9 10.4 3 11.7 3 11.7
4 9.6 12.4 4 14 4 14
5.8 9.1 11.3 5.8 12.4 5.8 12.4
5.3 8.5 10.5 5.3 11.5 5.3 11.5
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
FROM TO
(INPUT) (OUTPUT)
operating characteristics, VCC = 5 V, TA = 25°C
PARAMETER TEST CONDITIONS TYP UNIT
p
p
Outputs enabled
Outputs disabled
= 50 pF,
L
p
= 1 MHz
41
10
p
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 5
From Output
Under Test
CL = 50 pF
(see Note A)
PARAMETER MEASUREMENT INFORMATION
2 × V
CC
500 Ω
500 Ω
LOAD CIRCUIT
S1
Open
GND
54ACT16827, 74ACT16827
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS163A – JUNE 1990 – REVISED APRIL 1996
TEST S1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
CC
Input
t
PLH
In-Phase
Output
t
PHL
Out-of-Phase
Output
NOTES: A. CL includes probe and jig capacitance.
B. W aveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
1.5 V 1.5 V
50% V
CC
50% V
CC
VOLTAGE WAVEFORMS
Figure 1. Load Circuit and Voltage Waveforms
t
PHL
50% V
t
PLH
50% V
CC
CC
3 V
0 V
V
V
V
V
OH
OL
OH
OL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
CC
t
PZL
t
PZH
CC
CC
1.5 V
20% V
80% V
1.5 V
t
PLZ
50% V
t
PHZ
50% V
VOLTAGE WAVEFORMS
CC
CC
3 V
0 V
[
V
V
[
V
OL
OH
0 V
CC
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5
Page 6
IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
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that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
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Copyright 1998, Texas Instruments Incorporated
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