The 74AC16244 is an advanced high-speed
CMOS 16-BIT BUS BUFFER (3-STATE) fabricated with sub-micron silicon gate and double-layer
metal wiring C
Any nG
BUFFERS. Output Enable inputs (nG
together give full 16 bit operation.
When nG
nG
is HIGH, the output are in high impedance
state.
The device is designed to be used with 3-state
memory address drivers, etc.
= 28% VCC(MIN.)
PHL
2
MOS tecnology.
output con trolgoverns four BUS
)tied
is LO W, the outputs are enabled. When
74AC16244
16-BIT BUS BUFFER
TSSOP
ORDER CODES
PACKAGETUBET & R
TSSOP74AC16244TTR
PIN CO NNECTION
1/9February 2003
Page 2
74AC16244
INPUT AND OUTP UT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
11G
2, 3, 5, 61Y1 to 1Y4 Data Outputs
8, 9, 11, 122Y1 to 2Y4 Data Outputs
13, 14, 16, 17 3Y1 to 3Y4 Data Outputs
19, 20, 22, 23 4Y1 to 4Y4 Data Outputs
244G
253G
30, 29, 27, 26 4A1 to 4A4 Data Outputs
36, 35, 33, 32 3A1 to 3A4 Data Outputs
41, 40, 38, 37 2A1 to 2A4 Data Outputs
47, 46, 44, 43 1A1 to 1A4 Data Outputs
482G
4, 10, 15, 21,
28, 34, 39, 45
7, 18, 31, 42
GNDGround (0V)
V
CC
Output Enable Input
Output Enable Input
Output Enable Input
Output Enable Input
Positive Supply Voltage
TRUTH TABLE
INPUTSOUTPUT
G
LLL
LHH
HXZ
X : Don’t Care
Z : High Impedance
AnYn
IEC LOGIC SYMBOLS
2/9
Page 3
74AC16244
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
V
T
dt/dvInput Rise and Fall Time (note 1) V
1) VINfrom30% to 70%of V
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage-0.5 to VCC+ 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCCor Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage
CC
Input Voltage0 to V
I
Output Voltage0 to V
O
Operating Temperature
op
= 3.0, 4.5 or 5.5
CC
CC
-0.5 to +7.0V
-0.5 to +7.0V
± 20mA
± 50mA
± 50mA
± 400mA
-65 to +150°C
300°C
2to6V
CC
CC
-55 to 125°C
0 to 8ns/V
V
V
V
3/9
Page 4
74AC16244
DC SPECIFICATIONS
SymbolParameter
V
V
V
I
High Level Input
IH
Voltage
V
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
Input Leakage
I
I
Current
High Impedance
I
OZ
Output Leakage
Current
Quiescent Supply
CC
Current
Test ConditionValue
=25°C
T
V
CC
(V)
3.0
5.53.852.753.853.85
3.0
5.52.751.651.651.65
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
5.5
5.5
= 0.1 V or
V
O
V
-0.1V
CC
V
= 0.1 V or
O
V
-0.1V
CC
IO=-50 µA
=-50 µA
I
O
=-50 µA
I
O
=-12 mA
I
O
=-24 mA
I
O
=-24 mA
I
O
IO=50 µA
=50 µA
I
O
I
=50 µA
O
=12 mA
I
O
=24 mA
I
O
I=VIH
or GND
or V
IL
V
I=VCC
V
VO=VCCor GND
V
I=VCC
or GND
A
Min.Typ. Max.Min.Max. Min. Max.
2.11.52.12.1
1.50.90.90.9
2.92.992.92.9
4.44.494.44.4
5.45.495.45.4
2.562.462.46
3.863.763.76
4.864.764.76
0.0020.10.10.1
0.0010.10.10.1
0.0010.10.10.1
-40 to 85°C -55 to 125°C
0.360.440.44
0.360.440.44
± 0.1± 1± 1µA
± 0.5± 5± 5µA
88080µA
Unit
V4.53.152.253.153.15
V4.52.251.351.351.35
V
V
AC ELECTRICAL C HARACTERISTICS (C
Test ConditionValue
SymbolParameter
t
PLHtPHL
Propagation Delay
Time
AtoY
t
PZLtPZH
t
PLZtPHZ
(*) Voltagerange is3.3V ± 0.3V
(**) Voltage range is 5.0V ± 0.5V
Output Enable
Time
Output Disable
Time
4/9
3.3
5.0
3.3
5.0
3.3
5.0
V
(V)
CC
(*)
(**)
(*)
(**)
(*)
(**)
C
(pF)
L
=50pF,RL= 500 Ω, Input tr=tf= 3n)
L
= 25°C
T
A
-40 to 85°C -55 to 125°C
Min.Typ. Max.Min.Max. Min. Max.
68.511.511.5
4.57.09.09.0
810.514.014.0
5.58.010.010.0
7.39.011.511.5
5.58.014.014.0
Unit
ns
ns
ns
Page 5
74AC16244
CAPACITIVE CHARACTERISTICS
Test ConditionValue
= 25°C
SymbolParameter
C
C
C
Input Capacitance
IN
Output
OUT
Capacitance
Power Dissipation
PD
Capacitance
V
(V)
5.0
CC
= 10MHz
f
IN
T
A
Min.Typ. Max.Min.Max. Min. Max.
7101010pF
14pF
25pF
(note 1)
1) CPDis defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
Latch)
TEST CIRCUIT
-40 to 85°C -55 to 125°C
CC(opr)=CPDxVCCxfIN+ICC
Unit
/16(per
TESTSWITCH
t
PLH,tPHL
t
PZL,tPLZ
t
PZH,tPHZ
CL= 50 pF or equivalent (includes jig and probe capacitance)
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use o f suc h inf ormat ion n or f or an y infr ingeme nt of paten ts or oth er ri gh ts of third part ies whic h may resul t f rom
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco