The AC157 is an high-speed CMOS QUAD
2-CHANNELMULTIPLEXER fabricatedwith
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology. It is ideal for low
powerapplications maintaininghighspeed
operation similar to equivalent Bipolar Schottky
TTL.
=4 ns(TYP.)atVCC=5V
PD
=28%VCC(MIN.)
74AC157
PRELIMINARY DATA
B
(Plastic Package)
(Micro Package)
ORDERCODES:
74AC157B74AC157M
It consists of four 2-input digital multiplexers with
common select and strobe inputs. It is a
non-inverting multiplexer. When the STROBE
input is held high selection of data is inhibit and
all the outputs become low. The SELECT
decoding determines whether the A or B inputs
get routed to their correspondingY outputs.
All inputs and outputs are equipped with
protectioncircuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
M
PINCONNECTION ANDIEC LOGICSYMBOLS
May 1997
1/9
Page 2
74AC157
INPUTAND OUTPUT EQUIVALENTCIRCUIT
PIN DESCRIPTION
PI N NoSYM B O LNAME A ND FUNCTI ON
1SELECTCommon Data Select Input
2,5, 11, 141Ato4AData Inputs From
Source A
3,6, 10, 131Bto4BData Inputs From
Source B
4,7, 9,121Yto4YMultiplexer Outputs
15STROBEStrobe Input
8GNDGround (0V)
16V
CC
Positive Supply Voltage
TRUTH TABLE
INPUTOUTPUT
ST RO B ESE L ECTABY
HXXXL
LLLXL
LLHXH
LHXLL
LHXHH
X:”H”or”L”
LOGICDIAGRAM
2/9
Page 3
74AC157
ABSOLUTE MAXIMUMRATING
Symb o lParame t erValueUnit
V
V
V
I
I
OK
I
orI
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition is not implied.
RECOMMENDED OPERATINGCONDITIONS
Symb o lParame t erVal u eUni t
V
V
V
T
dt/dvInput Rise and Fall Time V
1) VINfrom30% to70%of V
Supply Voltage-0.5to+7V
CC
DC Input Voltage-0.5toVCC+0.5V
I
DC Output Voltage-0.5toVCC+0.5V
O
DC Input Diode Current± 20mA
IK
DC Output Diode Current± 20mA
DC Output Current± 50mA
O
DC VCCor Ground Current± 200mA
GND
Storage Temperature-65to+150
stg
Lead Temperature (10 sec)300
L
Supply Voltage2to6V
CC
Input Voltage0toV
I
Output Voltage0toV
O
Operating Temperature:-40to+85
op
= 3.0, 4.5 or 5.5 V(note 1)8ns/V
CC
CC
CC
CC
o
C
o
C
V
V
o
C
3/9
Page 4
74AC157
DC SPECIFICATIONS
SymbolParameterTest Condition sValueUnit
V
CC
(V)
High Level Input Voltage3.0VO=0.1 Vor
V
IH
4.53.152.253.15
=25oC-40to85
T
A
Min.Ty p. Max. Min. Max.
2.11.52.1
V
-0.1 V
CC
o
C
5.53.852.753.85
Low Level Input Voltage3.0VO=0.1 Vor
V
IL
4.52.251.351.35
-0.1 V
V
CC
1.50.90.9
5.52.751.651.65
High Level Output
V
OH
Voltage
Low Level Output
V
OL
Voltage
Input Leakage Current
I
I
Quiescent Supply
I
CC
3.0
4.5I
5.5I
3.0I
V
I
V
IH
V
4.5I
5.5I
3.0
4.5I
5.5I
3.0I
V
I
V
IH
V
4.5I
5.5I
5.5
IO=-50µA2.92.992.9
(*)
or
IL
=-50µA4.44.494.4
O
=
=-50µA5.45.495.4
O
=-12 mA2.562.46
O
=-24 mA3.863.76
O
=-24 mA4.864.76
O
IO=50µA0.0020.1 0.1
(*)
=
or
IL
=50µA0.0010.1 0.1
O
=50µA0.0010.1 0.1
O
=12mA0.360.44
O
=24mA0.360.44
O
=24mA0.360.44
O
VI=VCCorGND±0.1±1µA
5.5VI=VCCorGND880µA
Current
Dynamic Output Current
I
OLD
(note 1, 2)
I
OHD
1) Maximum test duration 2ms, one output loaded at time
2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50 Ω.
5.5V
=1.65 Vmax75mA
OLD
V
=3.85Vmin-75mA
OHD
V
V
V
V
4/9
Page 5
AC ELECTRICAL CHARACTERISTICS (CL= 50 pF, RL=500 Ω, Inputtr=tf=3ns)
74AC157
SymbolParameterTest Cond iti onValueUnit
o
C
ns
ns
ns
t
Propagation Delay Time
PLH
t
SELECT to Y
PHL
Propagation Delay Time
t
PLH
STROBE to Y
t
PHL
Propagation Delay Time
t
PLH
t
A, B to Y
PHL
(*) Voltagerange is3.3V± 0.3V
(**) Voltage range is5V± 0.5V
V
(V)
3.3
5.0
3.3
5.0
3.3
5.0
CC
=25oC-40to85
T
A
Min.Ty p. Max. Min. Max.
(*)
(**)
(*)
(**)
(*)
(**)
1.56.511.01.512.0
1.55.08.51.59.5
1.56.511.01.512.0
1.55.59.01.510.0
1.55.08.01.59.0
1.54.06.51.57.0
CAPACITIVE CHARACTERISTICS
SymbolParameterTest Condition sValueUnit
T
V
CC
(V)
Input Capacitance5.04pF
C
IN
Power Dissipation
C
PD
5.0TBDpF
=25oC-40to85
A
Min.Ty p. Max. Min. Max.
Capacitance (note 1)
1) CPDis defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to
Test Circuit). Average operating current can be obtained by the following equation. I
(opr) = CPD• VCC• fIN+ICC/n (per circuit)
CC
o
C
TEST CIRCUIT
5/9
Page 6
74AC157
WAVEFORM 1: PROPAGATIONDELAYS FOR INVERTING CONDITIONS
WAVEFORM 2: PROPAGATIONDELAYS FOR NON-INVERTING CONDITIONS
6/9
Page 7
Plastic DIP-16 (0.25) MECHANICALDATA
74AC157
DIM.
MIN.TYP.MAX.MIN.TYP.MAX.
a10.510.020
B0.771.650.0300.065
b0.50.020
b10.250.010
D200.787
E8.50.335
e2.540.100
e317.780.700
F7.10.280
I5.10.201
L3.30.130
Z1.270.050
mminch
P001C
7/9
Page 8
74AC157
SO-16 MECHANICAL DATA
DIM.
MIN.TYP.MAX.MIN.TYP.MAX.
A1.750.068
a10.10.20.0040.007
a21.650.064
b0.350.460.0130.018
b10.190.250.0070.010
C0.50.019
c145 (typ.)
D9.8100.3850.393
E5.86.20.2280.244
e1.270.050
e38.890.350
F3.84.00.1490.157
G4.65.30.1810.208
L0.51.270.0190.050
M0.620.024
S8 (max.)
mminch
8/9
P013H
Page 9
74AC157
Information furnished is believedtobe accurateand reliable.However,SGS-THOMSON Microelectronics assumes no responsability for the
consequencesof use of such information nor for any infringement of patentsor other rights of third parties whichmay resultsfrom its use. No
licenseis grantedby implication or otherwise underany patent or patentrights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes andreplacesall informationpreviouslysupplied.
SGS-THOMSONMicroelectronics productsarenotauthorizedfor useascritical components inlifesupportdevices or systems withoutexpress
writtenapproval of SGS-THOMSON Microelectonics.
1997 SGS-THOMSONMicroelectronics - Printedin Italy - All Rights Reserved
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