8-bit bus interface latch with set and reset
(3-State)
LOGIC SYMBOL (IEEE/IEC)
&
1
2
23
14
11
13
3
4
5
6
7
8
9
10
EN
S2
R
C1
21D
22
21
20
19
18
17
16
15
SA00260
LOGIC SYMBOL
13
LE
14
PRE
11
MR
1
OE0
2OE1
23OE2
74ABT845
345678910
D0 D1 D2 D3 D4 D5 D6 D7
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
22 21 20 19 18 17 16 15
SA00259
FUNCTION TABLE
OUTPU
TS
OEnPR
E
INPUTS
MRLEDnQn
LLXXXHPreset
LHLXXLClear
LLHHHHH
LLHHH
H
HLH
↓
↓
l
h
L
H
L
H
HXXXXZHigh impedance
LHHLXNCHold
OPERATING
MODE
Transparent
Latched
LOGIC DIAGRAM
PRE
MR
D0
14
11
3
D
LQ
D1
4
PPPPPPPP
D
CCCCCCCC
LQ
D2
5
D
LQ
H = High voltage level
h = High voltage level one set-up time prior to the High-to-Low LE
transition
L = Low voltage level
l = Low voltage level one set-up time prior to the High-to-Low LE
transition
NC= No change
X = Don’t care
Z = High impedance “off” state
↓ = High-to-Low transition
D3
6
D
LQ
D4
7
D
LQ
D5
8
D
LQ
D6
9
D
LQ
D7
10
D
LQ
1995 Sep 06
OE0
OE
OE2
13
LE
1
2
1
23
Q0
22
Q1
21
Q2
20
Q3
19
Q4
18
Q5
17
16
Q6
15
Q7
SA00261
2
Page 3
Philips Semiconductors Product specification
8-bit bus interface latch with set and reset
(3-State)
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
I
V
I
V
I
OK
OUT
OUT
T
DC supply voltage–0.5 to +7.0V
CC
DC input diode currentVI < 0–18mA
IK
DC input voltage
I
DC output diode currentVO < 0–50mA
DC output voltage
DC output currentoutput in Low state128mA
Storage temperature range–65 to 150°C
stg
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
High–level output voltageVCC = 5.0V; IOH = –3mA; VI = VIL or V
OH
VCC = 4.5V; IOH = –32mA; VI = VIL or V
Low–level output voltageVCC = 4.5V; IOL = 64mA; VI = VIL or V
OL
Power-up output low
3
voltage
I
Input leakage currentVCC = 5.5V; VI = GND or 5.5V±0.01±1.0±1.0µA
I
Power-off leakage currentVCC = 0.0V; VO or V
Power-up/down
3-state output current
4
VCC = 5.5V; IO = 1mA; VI = GND or V
4.5V±5.0±100±100µA
≤
I
VCC = 2.1V; VO = 0.5V; VOE = V
VI = GND or V
CC
3-State output High currentVCC = 5.5V; VO = 2.7V; VI = VIL or V
3-State output Low currentVCC = 5.5V; VO = 0.5V; VI = VIL or V
Output High leakage currentVCC = 5.5V; VO = 5.5V; VI = GND or V
I
O
Output current
1
VCC = 5.5V; VO = 2.5V–50–80–180–50–180mA
VCC = 5.5V; Outputs High, VI = GND or V
Quiescent supply currentVCC = 5.5V; Outputs Low, VI = GND or V
CC;
IH
IH
IH
IH
CC
IH
IH
CC
CC
CC
VCC = 5.5V; Outputs 3-State;
= GND or V
V
Additional supply current per
CC
input pin
2
I
VCC = 5.5V; one input at 3.4V,
other inputs at V
CC
or GND
CC
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
4. This parameter is valid for any V
transition time of up to 100µsec is permitted.
between 0V and 2.1V with a transition time of up to 10msec. For VCC = 2.1V to VCC = 5V 10%, a
CC
= +25°C
amb
MinTypMaxMinMax
2.52.92.5V
3.03.43.0V
2.02.42.0V
0.420.550.55V
0.130.550.55V
±5.0±50±50µA
5.05050µ A
–5.0–50–50µA
5.05050µ A
0.5250250µA
243030mA
0.5250250µA
0.51.51.5mA
74ABT845
T
= –40°C
amb
to +85°C
UNIT
1995 Sep 06
4
Page 5
Philips Semiconductors Product specification
8-bit bus interface latch with set and reset
(3-State)