Datasheet 74ABT544PW, 74ABT544N, 74ABT544DB, 74ABT544D Datasheet (Philips)

Page 1
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
1
June 1, 1993 853–1610 09907
FEATURES
functions in one device
8-bit octal transceiver with D-type latch
Back-to-back registers for storage
Separate controls for data flow in each
direction
Output capability: +64mA/–32mA
Live insertion/extraction permitted
Power-up 3-State
Power-up reset
Latch-up protection exceeds 500mA per
Jedec JC40.2 Std 17
ESD protection exceeds 2000 V per MIL
STD 883 Method 3015 and 200 V per Machine Model
DESCRIPTION
The 74ABT544 high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive.
The 74ABT544 Octal Registered Transceiver contains two sets of D-type latches for temporary storage of data flowing in either direction. Separate Latch Enable (LEAB
,
LEBA
) and Output Enable (OEAB, OEBA) inputs are provided for each register to permit independent control of data transfer in either direction. The outputs are guaranteed to sink 64mA.
FUNCTIONAL DESCRIPTION
The ’ABT544 contains two sets of eight D–type latches, with separate control pins for each set. Using data flow from A to B as an example, when the A-to-B Enable (EAB
)
input and the A-to-B Latch Enable (LEAB
) input are Low the A-to-B path is transparent. A subsequent Low-to-High transition of the LEAB
signal puts the A data into the latches where it is stored and the B outputs no longer change with the A inputs. With EAB
and
OEAB
both Low, the 3-State B output buffers are active and invert the data present at the outputs of the A latches.
Control of data flow from B to A is similar, but using the EBA
, LEBA, and OEBA inputs.
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE ORDER CODE DRAWING NUMBER
24-pin plastic DIP –40°C to +85°C 74ABT544N 0410D 24-pin plastic SOL –40°C to +85°C 74ABT544D 0173D 24-pin plastic SSOP Type II –40°C to +85°C 74ABT544DB 1641A
PIN CONFIGURATION
LOGIC SYMBOL LOGIC SYMBOL (IEEE/IEC)
24 23 22 21 20 19 18 17 16
10 15
9
8
7
6
5
4
3
2
1
V
CC
EBA B0 B1 B2 B3 B4 B5 B6
B7
OEBA
A0
A1 A2 A3
A4
A5 A6
A7
LEBA
2122
B0 B1 B2
1920
B3
3 4 5 6
A0 A1 A2 A3
11
23
1718
B4 B5 B6
1516
B7
7 8 9 10
A4 A5 A6 A7
EAB EBA
3
14
14
12 13
11
LEAB OEAB
EAB
GND
14 LEAB
1 LEBA
13OEAB 2OEBA
11
13
1
23
2
(AB)
(BA)
22
3
4 21
5 20
6 19
7 18
8 17
10 15
9 16
1EN3 G1 1C5 2EN4 G2 2C6
5D
5D
4
Page 2
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
2
PIN DESCRIPTION
PIN NUMBER SYMBOL FUNCTION
14, 1 LEAB / LEBA A to B / B to A Latch Enable input (active-Low)
11, 23 EAB / EBA A to B / B to A Enable input (active-Low)
13, 2 OEAB / OEBA A to B / B to A Output Enable input (active-Low)
3, 4, 5, 6, 7, 8, 9, 10
A0 – A7 Port A, 3-State outputs
22, 21, 20, 19,
18, 17, 16, 15
B0 – B7 Port B, 3-State outputs
12 GND Ground (0V) 24 V
CC
Positive supply voltage
QUICK REFERENCE DATA
SYMBOL PARAMETER
CONDITIONS
T
amb
= 25°C; GND = 0V
TYPICAL UNIT
t
PLH
t
PHL
Propagation delay A
n to Bn or Bn to An
CL = 50pF; VCC = 5V 3.9 ns
C
IN
Input capacitance VI = 0V or V
CC
4 pF
C
I/O
I/O capacitance
Outputs disabled; V
O
= 0V or V
CC
7 pF
I
CCZ
Total supply current Outputs disabled; VCC = 5.5V 110 µA
Page 3
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
3
LOGIC DIAGRAM
D
LE
Q
D
LE
Q
DETAIL A
22
B0
21
B1
4
A1
20
B2
5
A2
19
B3
6
A3
18
B4
7
A4
17
B5
8
A5
16
B6
9
A6
15
B7
10
A7
DETAIL A X 7
13
OEAB
11
EAB
14
LEAB
2
OEBA
23
EBA
1
LEBA
3
A0
FUNCTION TABLE
INPUTS OUTPUTS STATUS
OEXX EXX LEXX An or Bn An or Bn
H X X X Z Disabled X H X X Z Disabled
L L
↑ ↑
L L
h
l
Z Z
Disabled + Latch
L L
L L
↑ ↑
h
l
L
H
Latch + Display
L L
L L
L L
H
L
L
H
Transparent
L L H X NC Hold
H = High voltage level h = High voltage level one set-up time prior to the Low-to-High clock transition L = Low voltage level l = Low voltage level one set-up time prior to the Low-to-High clock transition X = Don’t care = Low-to-High clock transition NC= No change Z = High impedance or “off” state
Page 4
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
4
ABSOLUTE MAXIMUM RATINGS
1, 2
SYMBOL
PARAMETER CONDITIONS RATING UNIT
V
CC
DC supply voltage –0.5 to +7.0 V
I
IK
DC input diode current VI < 0 –18 mA
V
I
DC input voltage
3
–1.2 to +7.0 V
I
OK
DC output diode current VO < 0 –50 mA
V
OUT
DC output voltage
3
output in Off or High state –0.5 to +5.5 V
I
OUT
DC output current output in Low state 128 mA
T
stg
Storage temperature range –65 to 150 °C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS UNIT
Min Max
V
CC
DC supply voltage 4.5 5.5 V
V
I
Input voltage 0 V
CC
V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level Input voltage 0.8 V
I
OH
High-level output current –32 mA
I
OL
Low-level output current 64 mA
t/v Input transition rise or fall rate 0 10 ns/V
T
amb
Operating free-air temperature range –40 +85 °C
Page 5
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
5
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL PARAMETER TEST CONDITIONS T
amb
= +25°C
T
amb
= –40°C
to +85°C
UNIT
Min Typ Max Min Max
V
IK
Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V
VCC = 4.5V; IOH = –3mA; VI = VIL or V
IH
2.5 3.2 2.5 V
V
OH
High-level output voltage VCC = 5.0V; IOH = –3mA; VI = VIL or V
IH
3.0 3.7 3.0 V
VCC = 4.5V; IOH = –32mA; VI = VIL or V
IH
2.0 2.3 2.0 V
V
OL
Low-level output voltage VCC = 4.5V; IOL = 64mA; VI = VIL or V
IH
0.42 0.55 0.55 V
V
RST
Power-up output low voltage
3
VCC = 5.5V; IO = 1mA; VI = GND or V
CC
0.13 0.55 0.55 V
I
I
Input leakage Control pins VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA current Data pins VCC = 5.5V; VI = GND or 5.5V ±5 ±100 ±100 µA
I
OFF
Power-off leakage current VCC = 0.0V; VI or V
O
4.5V ±5.0 ±100 ±100 µA
I
PU/PD
Power-up/down 3-State output current
4
VCC = 2.1V; VO = 0.5V; VI = GND or VCC; V
OE
= Don’t care
±5.0 ±50 ±50 µA
IIH + I
OZH
3-State output High current VCC = 5.5V; VO = 2.7V; VI = VIL or V
IH
5.0 50 50 µA
IIL + I
OZL
3-State output Low current VCC = 5.5V; VO = 0.5V; VI = VIL or V
IH
–5.0 –50 –50 µA
I
CEX
Output high leakage current VCC = 5.5V; VO = 5.5V; VI = GND or V
CC
5.0 50 50 µA
I
O
Output current
1
VCC = 5.5V; VO = 2.5V –50 –65 –180 –50 –180 mA
I
CCH
VCC = 5.5V; Outputs High, VI = GND or V
CC
110 250 250 µA
I
CCL
Quiescent supply current VCC = 5.5V; Outputs Low, VI = GND or V
CC
20 30 30 mA
I
CCZ
VCC = 5.5V; Outputs 3–State; V
I
= GND or V
CC
110 250 250 µA
I
CC
Additional supply current per input pin
2
VCC = 5.5V; one input at 3.4V, other inputs at V
CC
or GND; VCC = 5.5V
0.3 1.5 1.5 mA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip–flops (or latches) after applying the power.
4. This parameter is valid for any V
CC
between 0V and 2.1V, with a transition of 10msec. From VCC = 2.1V to VCC = 5V ± 10%, a transition
time of up to 100µsec is permitted.
Page 6
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
6
AC CHARACTERISTICS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500
LIMITS
SYMBOL PARAMETER WAVEFORM
T
amb
= +25oC
V
CC
= +5.0V
T
amb
= -40 to
+85
o
C
V
CC
= +5.0V ±0.5V
UNIT
Min Typ Max Min Max
t
PLH
t
PHL
Propagation delay An to Bn, Bn to An
2
1.1
1.4
3.6
3.9
5.1
5.4
1.1
1.4
6.1
6.4
ns
t
PLH
t
PHL
Propagation delay LEBA to An, LEAB to Bn
1, 2
1.6
2.1
4.1
4.6
5.6
6.1
1.6
2.1
6.6
7.1
ns
t
PZH
t
PZL
Output enable time OEBA to An, OEAB to Bn
4 5
1.4
2.5
3.9
5.0
5.4
6.5
1.4
2.5
6.4
7.5
ns
t
PHZ
t
PLZ
Output disable time OEBA to An, OEAB to Bn
4 5
2.5
1.0
5.9
5.5
7.4
7.0
3.4
3.0
8.4
8.0
ns
t
PZH
t
PZL
Output enable time EBA to An, EAB to Bn
4 5
1.4
2.5
3.9
5.0
5.4
6.5
1.4
2.5
6.4
7.5
ns
t
PHZ
t
PLZ
Output disable time EBA to An, EAB to Bn
4 5
2.5
1.0
5.9
5.5
7.4
7.0
3.4
3.0
8.4
8.0
ns
AC SETUP REQUIREMENTS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500
LIMITS
SYMBOL PARAMETER WAVEFORM
T
amb
= +25oC
V
CC
= +5.0V
T
amb
= -40 to +85oC
V
CC
= +5.0V ±0.5V
UNIT
Min Typ Min
ts(H) t
s
(L)
Setup time An to LEAB, Bn to LEBA
3
3.0
3.0
1.5
0.6
3.0
3.0
ns
th(H) th(L)
Hold time An to LEAB, Bn to LEBA
3
0.5
0.5
–0.3 –1.3
0.5
0.5
ns
ts(H) t
s
(L)
Setup time An to EAB, Bn to EBA
3
3.0
3.0
1.5
0.6
3.0
3.0
ns
th(H) t
h
(L)
Hold time An to EAB, Bn to EBA
3
0.5
0.5
–0.2 –1.3
0.5
0.5
ns
tw(L) Latch enable pulse width, Low 3 3.5 1.8 3.5 ns
Page 7
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
7
AC WAVEFORMS
VM = 1.5V, VIN = GND to 3.0V
Waveform 1. Propagation Delay For Inverting Output
V
M
An, Bn
V
M
V
M
V
M
V
MVM
LEAB, LEBA
Waveform 3. Data Setup and Hold Times And
Latch Enable Pulse Width
ts(H)
t
h
(H)
t
s
(L)
t
h
(L)
OEAB, OEBA,
EAB
, EBA
V
M
t
PZH
t
PHZ
0V
V
OH
–0.3V
Waveform 4. 3–State Output Enable Time to High Level
and Output Disable Time from High Level
t
PZL
t
PLZ
0V
V
OL
+0.3V
Waveform 5. 3–State Output Enable Time to Low Level
and Output Disable Time from Low Level
V
M
V
M
V
M
V
M
V
M
NOTE: The shaded areas indicate when the input is permitted to change for predictable output performance.
tw(L)
V
IN
V
M
t
PHL
t
PLH
V
M
V
M
V
M
V
OUT
Waveform 2. Propagation Delay For Non–Inverting
Output
V
M
t
PLH
t
PHL
V
M
V
M
V
M
V
IN
V
OUT
An, Bn
OEAB
, OEBA,
EAB
, EBA
An, Bn
Page 8
Philips Semiconductors Advanced BiCMOS Products Product specification
74ABT544
Octal latched transceiver with dual enable, inverting (3-State)
June 1, 1993
8
TEST CIRCUIT AND WAVEFORM
PULSE
GENERATOR
R
T
V
IN
D.U.T
V
OUT
C
L
R
L
V
CC
R
L
7.0V
Test Circuit for 3-State Outputs
V
M
V
M
t
W
AMP (V)
NEGATIVE PULSE
10% 10%
90%
90%
0V
V
M
V
M
t
W
AMP (V)
POSITIVE PULSE
90% 90%
10%
10%
0V
t
THL
(tF)
t
TLH
(tR) t
THL
(tF)
t
TLH
(tR)
VM = 1.5V
Input Pulse Definition
DEFINITIONS
RL = Load resistor; see AC CHARACTERISTICS for value. C
L
= Load capacitance includes jig and probe capacitance;
see AC CHARACTERISTICS for value.
RT = Termination resistance should be equal to Z
OUT
of
pulse generators.
INPUT PULSE REQUIREMENTS
FAMILY
Amplitude Rep. Rate t
W
t
R
t
F
74ABT 3.0V 1MHz 500ns 2.5ns 2.5ns
SWITCH POSITION
TEST SWITCH
t
PLZ
closed
t
PZL
closed
All other open
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