Philips Semiconductors Product specification
74ABT377AOctal D-type flip-flop with enable
1997 Feb 26
5
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL PARAMETER TEST CONDITIONS T
amb
= +25°C
T
amb
= –40°C
to +85°C
UNIT
MIN TYP MAX MIN MAX
V
IK
Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V
VCC = 4.5V; IOH = –3mA; VI = VIL or V
IH
2.5 2.9 2.5 V
V
OH
High–level output voltage VCC = 5.0V; IOH = –3mA; VI = VIL or V
IH
3.0 3.4 3.0 V
VCC = 4.5V; IOH = –32mA; VI = VIL or V
IH
2.0 2.4 2.0 V
V
OL
Low-level output voltage VCC = 4.5V; IOL = 64mA; VI = VIL or V
IH
0.42 0.55 0.55 V
V
RST
Power-up output low
voltage
3
VCC = 5.5V; IO = 1mA; VI = GND or V
CC
0.13 0.55 0.55 V
I
I
Input leakage current VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA
I
OFF
Power-off leakage current VCC = 0.0V; V
O
or VI ≤ 4.5V ±5.0 ±100 ±100 µA
I
CEX
Output High leakage current VCC = 5.5V; V
O
= 5.5V; VI = GND or V
CC
5.0 50 50 µA
I
O
Output current
1
VCC = 5.5V; VO = 2.5V –50 –100 –180 –50 –180 mA
I
CCH
Quiescent supply current VCC = 5.5V; Outputs High, VI = GND or V
CC
0.5 250 250 µA
I
CCL
VCC = 5.5V; Outputs Low , VI = GND or V
CC
24 30 30 mA
∆I
CC
Additional supply current per
input pin
2
VCC = 5.5V; one input at 3.4V,
other inputs at V
CC
or GND
0.5 1.5 1.5 mA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
AC CHARACTERISTICS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500Ω
LIMITS
1
SYMBOL PARAMETER WAVEFORM
T
amb
= +25oC
V
CC
= +5.0V
T
amb
= -40 to
+85
o
C
V
CC
= +5.0V +0.5V
UNIT
MIN TYP MAX MIN MAX
f
MAX
Maximum clock frequency 1 150 250 150 MHz
t
PLH
t
PHL
Propagation delay
CP to Qn
1
1.8
2.2
3.1
3.6
4.0
4.7
1.8
2.2
4.8
4.9
ns
NOTE:
1. Limits may vary among suppliers.