Datasheet 74ABT374APW, 74ABT374AN, 74ABT374ADB, 74ABT374AD Datasheet (Philips)

Page 1
Philips Semiconductors Product specification
Octal D-type flip-flop; positive-edge trigger (3-State)
FEA TURES
•8-bit positive edge triggered register
•Output capability: +64mA/–32mA
•Latch-up protection exceeds 500mA per Jedec Std 17
•ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
•Power-up 3-State
•Power-up reset
•Live insertion/extraction permitted
QUICK REFERENCE DAT A
SYMBOL PARAMETER
C
t
PLH
t
PHL
C
OUT
I
CCZ
IN
Propagation delay CP to Qn
Input capacitance VI = 0V or V Output capacitance Outputs disabled; VO = 0V or V Total supply current Outputs disabled; VCC =5.5V 110 µA
CL = 50pF; VCC = 5V
DESCRIPTION
The 74ABT374A high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive.
The 74ABT374A is an 8-bit, edge triggered register coupled to eight 3-State output buffers. The two sections of the device are controlled independently by the clock (CP) and Output Enable (OE gates.
The register is fully edge triggered. The state of each D input, one set-up time before the Low-to-High clock transition, is transferred to the corresponding flip-flop’s Q output.
The 3-State output buffers are designed to drive heavily loaded 3-State buses, MOS memories, or MOS microprocessors. The active-Low Output Enable (OE independent of the clock operation.
When OE is High, the outputs are in the High-impedance “OFF” state, which means they will neither drive nor load the bus.
T
is Low, the stored data appears at the outputs. When OE
CONDITIONS = 25°C; GND = 0V
amb
CC
CC
74ABT374A
) control
) controls all eight 3-State buffers
TYPICAL UNIT
3.4
3.8 4 pF 7 pF
ns
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
20-Pin Plastic DIP –40°C to +85°C 74ABT374A N 74ABT374A N SOT146-1 20-Pin plastic SO –40°C to +85°C 74ABT374A D 74ABT374A D SOT163-1 20-Pin Plastic SSOP Type II –40°C to +85°C 74ABT374A DB 74ABT374A DB SOT339-1 20-Pin Plastic TSSOP Type I –40°C to +85°C 74ABT374A PW 74ABT374APW DH SOT360-1
PIN CONFIGURA TION
1
OE
2
Q0
3
D0
4
D1
5
Q1
6
Q2
7
D2
8
D3
9
Q3 Q4
10 11
GND
20
V
CC
Q7
19
D7
18
D6
17
Q6
16
Q5
15
D5
14
D4
13 12
CP
SA00110
PIN DESCRIPTION
PIN
NUMBER
1 OE Output enable input (active-Low)
3, 4, 7, 8,
13, 14, 17,
18
2, 5, 6, 9,
12, 15, 16,
19 11 CP Clock pulse input (active rising edge) 10 GND Ground (0V) 20 V
SYMBOL FUNCTION
D0-D7 Data inputs
Q0-Q7 Data outputs
Positive supply voltage
CC
1995 Sep 06 853-1448 15704
1
Page 2
Philips Semiconductors Product specification
INTERNAL
OPERATING MODE
Latch
Disabl
Octal D-type flip-flop; positive-edge trigger (3-State)
LOGIC SYMBOL
3 4 7 8 13 14 1817
D0 D1 D2 D3 D4 D5 D6 D7
CP
11
OE
1
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
2 5 6 9 12 15 16 19
SA00111
FUNCTION TABLE
INPUTS
OE CP Dn
INTERNAL REGISTER
L ↑ l L L L ↑ h H H
L ↑ X NC NC Hold H ↑ X NC Z H ↑ Dn Dn Z
H = High voltage level h = High voltage level one set-up time prior to the Low-to-High clock transition L = Low voltage level l = Low voltage level one set-up time prior to the Low-to-High clock transition NC= No change X = Don’t care Z = High impedance “off” state ↑ = Low-to-High clock transition
= not a Low-to-High clock transition
↑
OUTPUTS
Q0 – Q7
LOGIC SYMBOL (IEEE/IEC)
and read register
e outputs
74ABT374A
1
11
32 45 76
89 13 12 14 15 17 16 18 19
EN C1
1D
SA00112
LOGIC DIAGRAM
D0
11
CP
1
OE
1995 Sep 06
D1
3 4 7 8 13 14 17 18
D
CP Q
Q0
D
CP Q
2 5 6 9 12 15 16 19
D2
D
CP Q
Q1 Q2 Q3 Q4 Q5 Q6 Q7
D3
D
CP Q
D4
D
CP Q
D5
D
CP Q
D6
D
CP Q
D7
2
D
CP Q
SA00113
Page 3
Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
Octal D-type flip-flop; positive-edge trigger (3-State)
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
I
V
I V
I
OK OUT
OUT
T
CC IK
stg
DC supply voltage –0.5 to +7.0 V DC input diode current VI < 0 –18 mA DC input voltage
I
DC output diode current VO < 0 –50 mA DC output voltage DC output current output in Low state 128 mA Storage temperature range –65 to 150 °C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
PARAMETER CONDITIONS RATING UNIT
3
3
RECOMMENDED OPERATING CONDITIONS
V
CC
V V V I
OH
I
OL
∆t/∆v Input transition rise or fall rate 0 10 ns/V
T
amb
DC supply voltage 4.5 5.5 V Input voltage 0 V
I
High-level input voltage 2.0 V
IH
Low-level input voltage 0.8 V
IL
High-level output current –32 mA Low-level output current 64 mA
Operating free-air temperature range –40 +85 °C
1, 2
–1.2 to +7.0 V
output in Off or High state –0.5 to +5.5 V
LIMITS
MIN MAX
74ABT374A
CC
V
1995 Sep 06
3
Page 4
Philips Semiconductors Product specification
Octal D-type flip-flop; positive-edge trigger (3-State)
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER TEST CONDITIONS T
MIN TYP MAX MIN MAX
V
V
V
V
I
OFF
IPU/I
I
OZH
I
OZL
I
CEX
I
CCH
I
CCL
I
CCZ
∆I
Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V
IK
VCC = 4.5V; IOH = –3mA; VI = VIL or V
High-level output voltage VCC = 5.0V; IOH = –3mA; VI = VIL or V
OH
VCC = 4.5V; IOH = –32mA; VI = VIL or V
Low-level output voltage VCC = 4.5V; IOL = 64mA; VI = VIL or V
OL
Power-up output low voltage3VCC = 5.5V; IO = 1mA; VI = GND or V
RST
I
Input leakage current VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA
I
IH
IH
IH
IH
CC
Power-off leakage current VCC = 0.0V; VO or VI ≤ 4.5V ±5.0 ±100 ±100 µA Power-up/down 3-State
PD
output current 3-State output High current VCC = 5.5V; VO = 2.7V; VI = VIL or V
3-State output Low current VCC = 5.5V; VO = 0.5V; VI = VIL or V Output High leakage current VCC = 5.5V; VO = 0.5V; VI = GND or V
I
O
Output current
1
Quiescent supply current VCC = 5.5V; Outputs Low, VI = GND or V
VCC = 0.0V; IO = 1mA; VI = GND or VCC;
= Don’t Care
V
OE
IH
IH
CC
VCC = 5.5V; VO = 2.5V –50 –100 –180 –50 –180 mA VCC = 5.5V; Outputs High, VI = GND or V
CC
CC
VCC = 5.5V; Outputs 3–State;
= GND or V
V
Additional supply current per
CC
input pin
2
I
VCC = 5.5V; one input at 3.4V, other inputs at V
CC
or GND
CC
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
= +25°C
amb
2.5 2.9 2.5 V
3.0 3.4 3.0 V
2.0 2.4 2.0 V
0.42 0.55 0.55 V
0.13 0.55 0.55 V
±5.0 ±50 ±50 µA
5.0 50 50 µA
–5.0 –50 –50 µA
5.0 50 50 µA
110 250 250 µA
24 30 30 mA
110 250 250 µA
0.5 1.5 1.5 mA
74ABT374A
T
= –40°C
amb
to +85°C
UNIT
AC CHARACTERISTICS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500Ω
SYMBOL PARAMETER WAVEFORM
f
MAX
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
1995 Sep 06
Maximum clock frequency 1 200 300 200 ns Propagation delay
CP to Qn Output enable time
to High and Low level Output disable time
from High and Low level
1 3
4 3
4
LIMITS
T
T
amb
V
= +25oC = +5.0V
CC
amb
= +5.0V ±0.5V
V
CC
Min Typ Max Min Max
1.7
2.0
1.2
2.2
1.8
1.5
3.4
3.8
3.5
4.3
3.6
3.0
4.5
4.9
4.5
5.4
4.7
4.1
1.7
2.0
1.2
2.2
1.8
1.5
4
= -40 to
o
+85
C
5.1
5.2
5.4
6.2
5.2
4.3
UNIT
ns
ns
ns
Page 5
Philips Semiconductors Product specification
Octal D-type flip-flop; positive-edge trigger (3-State)
AC SETUP REQUIREMENTS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500Ω
SYMBOL PARAMETER WAVEFORM
ts(H)
(L)
t
s
th(H)
(L)
t
h
tw(H)
(L)
t
w
AC WAVEFORMS
VM = 1.5V, VIN = GND to 3.0V
Setup time, High or Low Dn to CP
Hold time, High or Low Dn to CP
CP pulse width High or Low
CP
VM VM VM
2
2
1
1/f
MAX
LIMITS
T
amb
V
CC
= +25oC = +5.0V
T
= -40 to +85oC
amb
= +5.0V ±0.5V
V
CC
Min Typ Min
1.5
1.2
1.0
1.0
2.0
2.8
OE
0.6
0.3
–0.3 –0.5
0.8
1.0
1.5
1.2
1.0
1.0
2.0
2.8
V
M
V
M
74ABT374A
UNIT
ns
ns
ns
tw(H) tw(L)
Qn
t
PHL
VM VM
t
PLH
SA00056
Waveform 1. Propagation Delay, Clock Input to Output, Clock
Pulse Width, and Maximum Clock Frequency
V
Dn
t
(H) th(H) ts(L) th(L)
s
CP
NOTE: The shaded areas indicate when the input is permitted to change for predictable output performance.
V
M
M
V
M
V
V
M
M
V
M
SA00107
Waveform 2. Data Setup and Hold Times
Qn
t
PZH
V
t
PHZ
M
VOH–0.3V
0V
SA00066
Waveform 3. 3-State Output Enable Time to High Level and
Output Disable Time from High Level
OE
Qn
V
M
t
PZL
V
M
t
PLZ
V
M
VOL+0.3V
0V
SA00067
Waveform 4. 3-State Output Enable Time to Low Level and
Output Disable Time from Low Level
1995 Sep 06
5
Page 6
Philips Semiconductors Product specification
Octal D-type flip-flop; positive-edge trigger (3-State)
TEST CIRCUIT AND WAVEFORM
V
CC
R
OUT
L
R
L
of
PULSE
GENERATOR
V
IN
R
D.U.T.
T
V
OUT
C
L
Test Circuit for 3-State Outputs
SWITCH POSITION
TEST SWITCH
t t
PLZ PZL
closed closed
All other open
DEFINITIONS
RL = Load resistor; see AC CHARACTERISTICS for value.
= Load capacitance includes jig and probe capacitance;
C
L
see AC CHARACTERISTICS for value.
= Termination resistance should be equal to Z
R
T
pulse generators.
74ABT374A
t
90%
7.0V NEGATIVE
PULSE
POSITIVE PULSE
10%
V
M
10% 10%
t
THL
t
TLH
90% 90%
V
M
Input Pulse Definition
INPUT PULSE REQUIREMENTS
FAMILY
Amplitude Rep. Rate t
74ABT 3.0V 1MHz 500ns 2.5ns 2.5ns
W
(tF)
(tR)t
t
W
90%
V
M
V
M
10%
VM = 1.5V
t
W
R
t
TLH
THL
AMP (V)
0V
(tR)
(tF)
AMP (V)
0V
t
F
SA00012
1995 Sep 06
6
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