•Latch-up protection exceeds 500mA per Jedec Std 17
•ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
•Power-up 3-State
•Power-up reset
•Live insertion/extraction permitted
QUICK REFERENCE DAT A
SYMBOLPARAMETER
C
t
PLH
t
PHL
C
OUT
I
CCZ
IN
Propagation delay
CP to Qn
Input capacitanceVI = 0V or V
Output capacitanceOutputs disabled; VO = 0V or V
Total supply currentOutputs disabled; VCC =5.5V110µA
CL = 50pF; VCC = 5V
DESCRIPTION
The 74ABT374A high-performance BiCMOS device combines low
static and dynamic power dissipation with high speed and high
output drive.
The 74ABT374A is an 8-bit, edge triggered register coupled to eight
3-State output buffers. The two sections of the device are controlled
independently by the clock (CP) and Output Enable (OE
gates.
The register is fully edge triggered. The state of each D input, one
set-up time before the Low-to-High clock transition, is transferred to
the corresponding flip-flop’s Q output.
The 3-State output buffers are designed to drive heavily loaded
3-State buses, MOS memories, or MOS microprocessors. The
active-Low Output Enable (OE
independent of the clock operation.
When OE
is High, the outputs are in the High-impedance “OFF” state, which
means they will neither drive nor load the bus.
T
is Low, the stored data appears at the outputs. When OE
CONDITIONS
= 25°C; GND = 0V
amb
CC
CC
74ABT374A
) control
) controls all eight 3-State buffers
TYPICALUNIT
3.4
3.8
4pF
7pF
ns
ORDERING INFORMATION
PACKAGESTEMPERATURE RANGE OUTSIDE NORTH AMERICANORTH AMERICADWG NUMBER
20-Pin Plastic DIP–40°C to +85°C74ABT374A N74ABT374A NSOT146-1
20-Pin plastic SO–40°C to +85°C74ABT374A D74ABT374A DSOT163-1
20-Pin Plastic SSOP Type II–40°C to +85°C74ABT374A DB74ABT374A DBSOT339-1
20-Pin Plastic TSSOP Type I–40°C to +85°C74ABT374A PW74ABT374APW DHSOT360-1
H = High voltage level
h = High voltage level one set-up time prior to the Low-to-High clock transition
L = Low voltage level
l = Low voltage level one set-up time prior to the Low-to-High clock transition
NC= No change
X = Don’t care
Z = High impedance “off” state
↑ = Low-to-High clock transition
DC supply voltage–0.5 to +7.0V
DC input diode currentVI < 0–18mA
DC input voltage
I
DC output diode currentVO < 0–50mA
DC output voltage
DC output currentoutput in Low state128mA
Storage temperature range–65 to 150°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.