Datasheet 74ABT241PW, 74ABT241N, 74ABT241DB, 74ABT241D Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
74ABT241
Octal buffer/line driver (3-State)
Product specification 1998 Jan 16 Supersedes data of 1996 Sep 25 IC23 Data Handbook
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74ABT241Octal buffer/line driver (3-State)
FEA TURES
Octal bus interface
3-State buffers
Power-up 3-State
Output capability: +64mA/–32mA
DESCRIPTION
The 74ABT241 high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive.
The 74ABT241 device is an octal buffer that is ideal for driving bus lines. The device features two Output Enables (1OE controlling four of the 3-State outputs.
, 2OE), each
Latch-up protection exceeds 500mA per Jedec Std 17
ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
Inputs are disabled during 3-State mode
QUICK REFERENCE DATA
SYMBOL PARAMETER
C
t
PLH
t
PHL
C
I
CCZ
IN
OUT
Propagation delay An to Yn
CL = 50pF; VCC = 5V
Input capacitance VI = 0V or V Output capacitance Outputs disabled; V Total supply current Outputs disabled; VCC = 5.5V 50 µA
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
20-Pin Plastic DIP –40°C to +85°C 74ABT241 N 74ABT241 N SOT146-1 20-Pin plastic SO –40°C to +85°C 74ABT241 D 74ABT241 D SOT163-1 20-Pin Plastic SSOP Type II –40°C to +85°C 74ABT241 DB 74ABT241 DB SOT339-1 20-Pin Plastic TSSOP Type I –40°C to +85°C 74ABT241 PW 74ABT241PW DH SOT360-1
CONDITIONS
T
= 25°C; GND = 0V
amb
CC
= 0V or V
O
CC
TYPICAL UNIT
2.6
2.7 3 pF 7 pF
ns
PIN CONFIGURATION
PIN DESCRIPTION
PIN NUMBER SYMBOL NAME AND FUNCTION
2, 4, 6, 8 1A0 – 1A3 Data inputs
1
1OE
2
1A0
3
2Y0
4
1A1
5
2Y1
6
1A2
7
2Y2
8
1A3
9
2Y3 1Y3
10 11
GND
1998 Jan 16 853–1456 18867
20
V 2OE
19
1Y0
18
2A0
17
1Y1
16
2A1
15
1Y2
14
2A2
13 12
2A3
SA00038
CC
17, 15, 13, 11 2A0 – 2A3 Data inputs
18, 16, 14, 12 1Y0 – 1Y3 Data outputs
3, 5, 7, 9 2Y0 – 2Y3 Data outputs
1, 19 1OE, 2OE Output enables
10 GND Ground (0V) 20 V
CC
2
Positive supply voltage
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
LOGIC SYMBOL (IEEE/IEC)
1
EN
2 18 4 16
6 14 812
19
EN
17 3 15 5 13 7 11 9
SA00040
LOGIC SYMBOL
1A0
2
1A1
4
1A2
6
1A3
8
1OE
1
2A0
17
2A1
15
2A2
13
2A3
11
2OE
19
1Y0
1Y1
1Y2
1Y3
2Y0
2Y1
2Y2
2Y3
SA00039
18
16
14
12
3
5
7
9
FUNCTION TABLE
INPUTS OUTPUTS
1OE 1An 2OE 2An 1Yn 2Yn
L L H L L L L H H H H H
H X L X Z Z
H =High voltage level L =Low voltage level X = Don’t care Z =High impedance ”off” state
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
CC
I
IK
V
I
I
OK
V
OUT
I
OUT
T
stg
DC supply voltage –0.5 to +7.0 V DC input diode current VI < 0 –18 mA DC input voltage DC output diode current VO < 0 –50 mA DC output voltage DC output current output in Low state 128 mA Storage temperature range –65 to 150 °C
PARAMETER CONDITIONS RATING UNIT
3
3
1, 2
–1.2 to +7.0 V
output in Off or High state –0.5 to +5.5 V
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jan 16
3
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS UNIT
Min Max
V
CC
V V V I
OH
I
OL
t/v Input transition rise or fall rate 0 5 ns/V
T
amb
DC ELECTRICAL CHARACTERISTICS
SYMBOL PARAMETER TEST CONDITIONS T
V
IK
V
OH
V
OL
I
I
OFF
IPU/I
I
OZH
I
OZL
I
CEX
I
O
I
CCH
I
CCL
I
CCZ
I
CC
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. This parameter is valid for any V transition time of up to 100 µsec is permitted.
DC supply voltage 4.5 5.5 V Input voltage 0 V
I
High-level input voltage 2.0 V
IH
Low-level Input voltage 0.8 V
IL
CC
High-level output current –32 mA Low-level output current 64 mA
Operating free-air temperature range –40 +85 °C
LIMITS
T
amb
= +25°C
amb
to +85°C
Min Typ Max Min Max
Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V
VCC = 4.5V; IOH = –3mA; VI = VIL or V
High-level output voltage VCC = 5.0V; IOH = –3mA; VI = VIL or V
VCC = 4.5V; IOH = –32mA; VI = VIL or V Low-level output voltage VCC = 4.5V; IOL = 64mA; VI = VIL or V Input leakage current VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA
I
IH
IH
IH
IH
2.5 2.9 2.5 V
3.0 3.4 3.0 V
2.0 2.4 2.0 V
0.42 0.55 0.55 V
Power-off leakage current VCC = 0.0V; VI or VO 4.5V ±5.0 ±100 ±100 µA Power-up/down 3-State
PD
output current
3
3-State output High current VCC = 5.5V; VO = 2.7V; VI = VIL or V 3-State output Low current VCC = 5.5V; VO = 0.5V; VI = VIL or V Output High leakage current VCC = 5.5V; VO = 5.5V; VI = GND or V Output current
1
Quiescent supply current VCC = 5.5V; Outputs Low, VI = GND or V
Additional supply current per input pin
2
CC
VCC = 2.0V; VO = 0.5V; VI = GND or VCC;
VOE = VCC; VOE = GND
IH
IH
CC
±5.0 ±50 ±50 µA
5.0 50 50 µA
–5.0 –50 –50 µA
5.0 50 50 µA VCC = 5.5V; VO = 2.5V –50 –100 –180 –50 –180 mA VCC = 5.5V; Outputs High, VI = GND or V
CC
CC
VCC = 5.5V; Outputs 3–State; VI = GND or V
CC
Outputs enabled, one input at 3.4V , other inputs at V
or GND; VCC = 5.5V
CC
Outputs 3-State, one data input at 3.4V , other inputs at VCC or GND; VCC = 5.5V
Outputs 3-State, one enable input at 3.4V , other inputs at VCC or GND; VCC = 5.5V
50 250 250 µA 24 30 30 mA
50 250 250 µA
0.5 1.5 1.5 mA
50 250 250 µA
0.5 1.5 1.5 mA
between 0V and 2.1V with a transition time of up to 10msec. For VCC = 2.1V to VCC = 5V  10%, a
= –40°C
V
UNIT
1998 Jan 16
4
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
AC CHARACTERISTICS
GND = 0V; tR = tF = 2.5ns; CL = 50pF, RL = 500
LIMITS
T
SYMBOL PARAMETER WAVEFORM
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Propagation delay An to Yn
Output enable time to High and Low level
Output disable time from High and Low level
1
2
2
AC WAVEFORMS
VM = 1.5V, VIN = GND to 3.0V
= +25°C
amb
VCC = +5.0V
Min Typ Max Min Max
1.0
1.0
1.1
1.3
1.6
1.0
2.6
2.7
3.2
4.3
3.6
2.6
4.1
4.2
6.3
5.8
6.1
5.4
T
= –40°C to +85°C
amb
VCC = +5.0V ±0.5V
1.0
1.0
1.1
1.3
1.6
1.0
4.6
4.6
6.8
6.8
7.1
5.9
UNIT
ns
ns
ns
INPUT
OUTPUT
1.5V
t
PLH
1.5V 1.5V
Waveform 1. W aveforms Showing the Input (An)
to Output (Yn) Propagation Delays
TEST CIRCUIT AND WAVEFORMS
From Output Under Test
C
L
= 50 pF
500
500
Load Circuit
1.5V
S1
3 V
0 V
t
PHL
V
OH
V
OL
SA00028
OE INPUT OE INPUT
Yn OUTPUT
Yn OUTPUT
V
M
t
PZL
V
M
t
PZH
V
M
V
M
t
PLZ
t
PHZ
3.5V
V
OL
V
OL
V
OH
V
OH
+ 0.3V
– 0.3V
0V
SA00041
Waveform 2. Waveforms Showing the 3–State Output
Enable and Disable Times
7 V
Open
GND
DEFINITIONS
C
1998 Jan 16
TEST S1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
= Load capacitance includes jig and probe capacitance;
L
see AC CHARACTERISTICS for value.
open
7 V
open
SA00012
5
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
DIP20: plastic dual in-line package; 20 leads (300 mil) SOT146-1
1998 Jan 16
6
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
SO20: plastic small outline package; 20 leads; body width 7.5 mm SOT163-1
1998 Jan 16
7
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
SSOP20: plastic shrink small outline package; 20 leads; body width 5.3 mm SOT339-1
1998 Jan 16
8
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
TSSOP20: plastic thin shrink small outline package; 20 leads; body width 4.4 mm SOT360-1
1998 Jan 16
9
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Philips Semiconductors Product specification
74ABT241Octal buffer/line driver (3-State)
Data sheet status
Data sheet status
Objective specification
Preliminary specification
Product specification
Product status
Development
Qualification
Production
Definition
This data sheet contains the design target or goal specifications for product development. Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make chages at any time without notice in order to improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product.
[1]
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook. Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified.
Philips Semiconductors 811 East Arques Avenue P.O. Box 3409 Sunnyvale, California 94088–3409 Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print code Date of release: 05-96 Document order number: 3997-750-03464
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yyyy mmm dd
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