These four-bit registers contain D-type flip-flops with totempole TRI-STATE outputs, capable of driving highly capacitive or low-impedance loads. The high-impedance state and
increased high-logic-level drive provide these flip-flops with
the capability of driving the bus lines in a bus-organized system without need for interface or pull-up components.
Gated enable inputs are provided for controlling the entry of
data into the flip-flops. When both data-enable inputs are
low, data at the D inputs are loaded into their respective flipflops on the next positive transition of the buffered clock
input. Gate output control inputs are also provided. When
both are low, the normal logic states of the four outputs are
available for driving the loads or bus lines. The outputs are
disabled independently from the level of the clock by a high
logic level at either output control input. The outputs then
present a high impedance and neither load nor drive the bus
line. Detailed operation is given in the function table.
Quad D Registers
É
June 1989
To minimize the possibility that two outputs will attempt to
take a common bus to opposite logic levels, the output control circuitry is designed so that the average output disable
times are shorter than the average output enable times.
Features
Y
TRI-STATE outputs interface directly with system bus
Y
Gated output control lines for enabling or disabling the
outputs
Y
Fully independent clock elminates restrictions for operating in one of two modes:
Parallel load
Do nothing (hold)
Y
For application as bus buffer registers
Y
Typical propagation delay 18 ns
Y
Typical frequency 30 MHz
Y
Typical power dissipation 250 mW
Y
Alternate Military/Aerospace device (54173) is available. Contact a National Semiconductor Sales Office/
Distributor for specifications.
54173/DM54173/DM74173 TRI-STATE Quad D Registers
Connection Diagram
Dual-In-Line Package
Order Number 54173DMQB, 54173FMQB,
DM54173J, DM54173W or DM74173N
See NS Package Number J16A, N16E or W16A
TRI-STATEÉis a registered trademark of National Semiconductor Corporation.
C
1995 National Semiconductor CorporationRRD-B30M105/Printed in U. S. A.
TL/F/6556
TL/F/6556– 1
Function Table
Inputs
Clear Clock
HX XX X L
LL XX XQ
L
u
L
u
L
u
L
u
When either M or N (or both) is (are) high the output is disabled to the
high-impedance state; however, sequential operation of the flip-flops is
not affected.
Hehigh level (steady state)
e
L
low level (steady state)
e
low-to-high level transition
u
e
X
don’t care (any input including transitions)
e
Q
the level of Q before the indicated steady state input conditions were
0
established
Data Enable
G1G2
HXXQ
XHXQ
LLLL
LLHH
Data
D
Output
Q
0
0
0
Page 2
Absolute Maximum Ratings (Note)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage7V
Input Voltage5.5V
Operating Free Air Temperature Range
DM54 and 54
DM740
Storage Temperature Range
b
55§Ctoa125§C
Ctoa70§C
§
b
65§Ctoa150§C
Recommended Operating Conditions
SymbolParameter
V
V
V
I
OH
I
OL
f
CLK
t
W
t
SU
t
H
t
REL
T
CC
IH
IL
A
Supply Voltage4.555.54.7555.25V
High Level Input Voltage22V
Low Level Input Voltage0.80.8V
High Level Output Current
Low Level Output Current1616mA
Clock Frequency (Note 4)025025MHz
Pulse WidthClock2020
(Note 4)
Clear2020
Setup TimeEnable1717
(Note 4)
Data1010
Hold TimeEnable22
(Note 4)
Data1010
Clear Release Time (Note 4)1010ns
Free Air Operating Temperature
MinNomMaxMinNomMax
b
55125070
The ‘‘Absolute Maximum Ratings’’ are those values
Note:
beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The
parametric values defined in the ‘‘Electrical Characteristics’’
table are not guaranteed at the absolute maximum ratings.
The ‘‘Recommended Operating Conditions’’ table will define
the conditions for actual device operation.
DM54173DM74173
b
2
b
5.2mA
Units
ns
ns
ns
C
§
Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted)
SymbolParameterConditionsMin
e
V
I
V
OH
V
OL
I
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
CC
Note 1: All typicals are at V
Note 2: Not more than one output should be shorted at a time.
Note 3: I
input and M input at 4.5V.
Note 4: T
Input Clamp VoltageV
High Level OutputV
VoltageV
Low Level OutputV
VoltageV
Input Current@MaxV
Input Voltage
High Level Input CurrentV
Low Level Input CurrentV
Off-State Output Current with HighV
Level Output Voltage AppliedV
Off-State Output Current with LowV
Level Output Voltage AppliedV
Short CircuitV
Output Current(Note 2)
Supply CurrentV
e
e
5V, T
5V.
25§C.
A
CC
is measured with all outputs open, CLEAR grounded after a momentary connection to 4.5V: N, G1, G2 and all DATA inputs grounded: and the CLOCK
CC
e
A
25§C and V
e
CC
CC
CC
IL
CC
IH
CC
CC
CC
CC
IH
CC
IH
CC
CC
e
e
e
e
eb
Min, I
e
Min, I
Max, V
e
Min, I
Min, V
e
Max, V
e
Max, V
e
Max, V
e
Max, V
Min, V
e
Max, V
Min, V
e
MaxDM54
e
Max (Note 3)5072mA
12 mA
I
e
Max
OH
e
Min
IH
e
Max
OL
e
Max
IL
e
5.5V
I
e
2.4V40mA
I
e
0.4V
I
e
2.4V
O
e
Max
IL
e
0.4V
O
e
Max
IL
DM74
2.4V
b
b
2
Typ
(Note 1)
MaxUnits
b
1.5V
0.4V
1mA
b
1.6mA
40mA
b
40mA
30
30
b
70
b
70
mA
Page 3
Switching Characteristics at V
CC
e
5V and T
e
25§C (See Section 1 for Test Waveforms and Output Load)
A
From (Input)
SymbolParameterTo (Output)C
f
MAX
t
PLH
t
PHL
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Maximum Clock Frequency25MHz
Propagation Delay TimeClock to
Low to High Level OutputOutput
Propagation Delay TimeClock to
High to Low Level OutputOutput
Propagation Delay TimeClear to
High to Low Level OutputOutput
Output Enable TimeOutput Control
to High Level Outputto Q
Output Enable TimeOutput Control
to Low Level Outputto Q
Output Disable TimeOutput Control
from High Level Outputto Q
Output Disable TimeOutput Control
from Low Level Outputto Q
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
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