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54ACTQ827
Quiet Series 10-Bit Buffer/Line Driver with TRI-STATE
®
Outputs
General Description
The ’ACTQ827 10-bit bus buffer provides high performance
bus interface buffering for wide data/addresspaths or buses
carrying parity.The 10-bit buffers have NOR output enables
for maximum control flexibility. The ’ACTQ827 utilizes NSC
Quiet Series technology to guarantee quiet output switching
and improved dynamic threshold performance. FACT Quiet
Series
™
feature GTO™output control and undershoot corrector in addition to a split ground bus for superior performance.
Features
n Guaranteed simultaneous switching noise level and
dynamic threshold performance
n Inputs and outputs on opposite sides of package allow
easy interface with microprocessors
n Improved latch-up immunity
n Outputs source/sink 24 mA
n Functionally and pin-compatible to AMD’s AM29827
n ’ACTQ827 has TTL-compatible inputs
n 4 kV minimum ESD immunity
n Standard Microcircuit Drawing (SMD) 5962-92199
Logic Symbols
Pin Names Description
OE
1
,OE
2
Output Enable
D
0–D9
Data Inputs
O
0–O9
Data Outputs
Connection Diagrams
GTO™is a trademark of National Semiconductor Corporation.
TRI-STATE
®
is a registered trademark of National Semiconductor Corporation.
FACT
®
is a registered trademark of Fairchild Semiconductor Corporation.
FACT Quiet Series
™
is a trademark of Fairchild Semiconductor Corporation.
DS100249-1
IEEE/IEC
DS100249-2
Pin Assignment
for DIP and Flatpak
DS100249-3
Pin Assignment for LCC
DS100249-4
August 1998
54ACTQ827 Quiet Series 10-Bit Buffer/Line Driver with TRI-STATE Outputs
© 1998 National Semiconductor Corporation DS100249 www.national.com
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Functional Description
The ’ACTQ827 line driver is designed to be employed as
memory address driver, clock driver and bus-oriented
transmitter/receiver. The devices have TRI-STATE outputs
controlled by the Output Enable (OE) pins. When the OE is
LOW, the device is transparent. When OE is HIGH, the device is in TRI-STATE mode.
Function Table
Inputs Outputs Function
OE
D
n
O
n
L H H Transparent
L L L Transparent
H X Z High Z
H=HIGH Voltage Level
L=LOW Voltage Level
Z=HIGH Impedance
X=Immaterial
Logic Diagram
DS100249-5
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
CC
) −0.5V to +7.0V
DC Input Diode Current (I
IK
)
V
I
=
−0.5V −20 mA
V
I
=
V
CC
+ 0.5V +20 mA
DC Input Voltage (V
I
) −0.5V to VCC+ 0.5V
DC Output Diode Current (I
OK
)
V
O
=
−0.5V −20 mA
V
O
=
V
CC
+ 0.5V +20 mA
DC Output Voltage (V
O
) −0.5V to VCC+ 0.5V
DC Output Source
or Sink Current (I
O
)
±
50 mA
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
)
±
50 mA
Storage Temperature (T
STG
) −65˚C to +150˚C
DC Latch-Up Source
or Sink Current
±
300 mA
Junction Temperature (T
J
)
CDIP 175˚C
Recommended Operating
Conditions
Supply Voltage (VCC)
’ACTQ 4.5V to 5.5V
Input Voltage (V
I
) 0VtoV
CC
Output Voltage (VO) 0VtoV
CC
Operating Temperature (TA)
54ACTQ −55˚C to +125˚C
Minimum Input Edge Rate ∆V/∆t
’ACTQ Devices
V
IN
from 0.8V to 2.0V
V
CC
@
4.5V, 5.5V 125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recommend operation of FACT
®
circuits outside databook specifications.
Note 2: All commercial packaging is not recommended for applications requiring greater than 2000 temperature cycles from −40˚C to +125˚C.
DC Electrical Characteristics for ’ACTQ Family Devices
Symbol Parameter
V
CC
(V)
54ACTQ
Units ConditionsT
A
=
−55˚C to +125˚C
Guaranteed Limits
V
IH
Minimum High Level 4.5 2.0 V V
OUT
=
0.1V
Input Voltage 5.5 2.0 or V
CC
− 0.1V
V
IL
Maximum Low Level 4.5 0.8 V V
OUT
=
0.1V
Input Voltage 5.5 0.8 or V
CC
− 0.1V
V
OH
Minimum High Level 4.5 4.4 V I
OUT
=
−50 µA
Output Voltage 5.5 5.4
(Note 3)
V
IN
=
V
IL
or V
IH
4.5 3.70 V I
OH
=
−24 mA
5.5 4.70 I
OH
=
−24 mA
V
OL
Maximum Low Level 4.5 0.1 V I
OUT
=
50 µA
Output Voltage 5.5 0.1
(Note 3)
V
IN
=
V
IL
or V
IH
4.5 0.50 V I
OL
=
24 mA
5.5 0.50 I
OL
=
24 mA
I
IN
Maximum Input 5.5
±
1.0 µA V
I
=
V
CC
, GND
Leakage Current
I
OZ
Maximum TRI-STATE 5.5
±
10.0 µA V
I
=
V
IL,VIH
Current V
O
=
V
CC
, GND
I
CCT
Maximum ICC/Input 5.5 1.6 mA V
I
=
V
CC
− 2.1V
I
OLD
(Note 4) Minimum Dynamic 5.5 50 mA V
OLD
=
1.65V Max
I
OHD
Output Current 5.5 −50 mA V
OHD
=
3.85V Min
I
CC
Maximum Quiescent 5.5 160.0 µA V
IN
=
V
CC
Supply Current or GND (Note 5)
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DC Electrical Characteristics for ’ACTQ Family Devices (Continued)
Symbol Parameter
V
CC
(V)
54ACTQ
Units ConditionsT
A
=
−55˚C to +125˚C
Guaranteed Limits
V
OLP
Quiet Output 5.0 1.5 V
Maximum Dynamic V
OL
(Notes 6, 7)
V
OLV
Quiet Output 5.0 −1.2 V
Minimum Dynamic V
OL
(Notes 6, 7)
Note 3: All outputs loaded; thresholds on input associated with output under test.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: I
CC
for 54ACTQ@25˚C is identical to 74ACTQ@25˚C.
Note 6: Plastic DIP package.
Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output
@
GND.
Note 8: Max number of data inputs (n−1) inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V
ILD
), 0V to threshold. (V
IHD
), f=1 MHz.
AC Electrical Characteristics
54ACTQ
V
CC
T
A
=
−55˚C
Symbol Parameter (V) to +125˚C Units
(Note 9) C
L
=
50 pF
Min Max
t
PHL,tPLH
Propagation Delay 5.0 2.0 9.0 ns
Data to Output
t
PZL,tPZH
Output Enable Time 5.0 2.0 12.5 ns
t
PHZ,tPLZ
Output Disable Time 5.0 1.0 9.0 ns
Note 9: Voltage Range 5.0 is 5.0V±0.5V.
Capacitance
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF V
CC
=
OPEN
C
PD
Power Dissipation 82 pF V
CC
=
5.0V
Capacitance
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AC Loading
AC Waveforms
DS100249-9
*Includes jig and probe capacitance
FIGURE 1. Standard AC Test Load
DS100249-10
FIGURE 2. Test Input Signal Levels
Amplitude Rep. Rate t
w
t
r
t
f
3.0V 1 MHz 500 ns 2.5 ns 2.5 ns
FIGURE 3. Test Input Signal Requirements
DS100249-11
FIGURE 4. Propagation Delay Waveforms for
Inverting and Non-Inverting Functions
DS100249-12
FIGURE 5. TRI-STATE Output HIGH and LOW
Enable and Disable Time
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Physical Dimensions inches (millimeters) unless otherwise noted
28-Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E28A
24-Lead Slim (0.300" Wide) Ceramic Dual-In-Line Package (SD)
NS Package Number J24F
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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Corporation
Americas
Tel: 1-800-272-9959
Fax: 1-800-737-7018
Email: support@nsc.com
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Tel: 81-3-5620-6175
Fax: 81-3-5620-6179
24 Lead Ceramic Flatpak (F)
NS Package Number W24C
54ACTQ827 Quiet Series 10-Bit Buffer/Line Driver with TRI-STATE Outputs
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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