Datasheet 5962-92054 Datasheet (REVISIONS)

REVISIONS

LTR DESCRIPTION DATE (YR-MO-DA) APPROVED

A Correct notes to tests in table I and figure 1. Update drawing

requirements to MIL-PRF-38534.

01-06-14 Raymond Monnin

REV
SHEET
REV
SHEET
REV STATUS REV AAAAAAAAAAA
OF SHEETS

PMIC N/A PREPARED BY

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS

AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

AMSC N/A

DSCC FORM 2233

APR 97

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

SHEET 1234567891011

Steve L. Duncan

CHECKED BY

Michael C. Jones

DEFENSE SUPPLY CENTER COLUMBUS

POST OFFICE BOX 3990

COLUMBUS, OHIO 43216-5000

http://www.dscc.dla.mil

APPROVED BY

Kendall A. Cottongim

MICROCIRCUIT, HYBRID, LINEAR, 90-VOLT
SYNCHRO TO DIGITAL CONVERTER

DRAWING APPROVAL DATE

93-01-19

REVISION LEVEL

A

SIZE

A

SHEET

CAGE CODE

67268

1 OF 11

5962-92054

5962-E332-01

1. SCOPE

1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.

1.2 PIN. The PIN shall be as shown in the following example:

5962 - 92054 01 H X X

  
  

     

Federal RHA Device Device Case Lead
stock class designator type class outline finish

designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5)
\ / (see 1.2.3)
\/
Drawing number

1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA

levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function Frequency Accuracy 1 LSB BIT/VEL

01 SDC-14612II-112 14-bit, 90 V S/D converter 400 Hz 4 min VEL
02 SDC-14612IIT-112 14-bit, 90 V S/D converter 400 Hz 4 min BIT
03 SDC-14614II-112 14-bit, 90 V S/D converter 60 Hz 4 min VEL
04 SDC-14614IIT-112 14-bit, 90 V S/D converter 60 Hz 4 min BIT
05 SDC-14617II-112 16-bit, 90 V S/D converter 400 Hz 4 min VEL
06 SDC-14617IIT-112 16-bit, 90 V S/D converter 400 Hz 4 min BIT
07 SDC-14619II-112 16-bit, 90 V S/D converter 60 Hz 4 min VEL
08 SDC-14619IIT-112 16-bit, 90 V S/D converter 60 Hz 4 min BIT
09 SDC-14617II-114 16-bit, 90 V S/D converter 400 Hz 2 min VEL
10 SDC-14617IIT -114 16-bit, 90 V S/D converter 400 Hz 2 min BIT
11 SDC-14619II-114 16-bit, 90 V S/D converter 60 Hz 2 min VEL
12 SDC-14619IIT-114 16-bit, 90 V S/D converter 60 Hz 2 min BIT

1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.

All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:

Device class Device performance documentation

K Highest reliability class available. This level is intended for use in space

applications.

H Standard military quality class level. This level is intended for use in applications

where non-space high reliability devices are required.

G Reduced testing version of the standard military quality class. This level uses the

Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C, and D).

E Designates devices which are based upon one of the other classes (K, H, or G)

D Manufacturer specified quality class. Quality level is defined by the manufacturers

internal, QML certified flow. This product may have a limited temperature range.

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STANDARD

with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.

SIZE

A

REVISION LEVEL

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5962-92054

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1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style

X See figure 1 36 Dual-in-line

1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.

1.3 Absolute maximum ratings. 1/

Positive supply voltage (VCC)..................................................... +7.0 V dc

Negative supply voltage (VEE).................................................... -7.0 V dc

Reference input voltage............................................................. 130 V rms

Digital input voltage range......................................................... -0.3 V dc to +7.0 V dc

Power dissipation, TA = +125C (PD) ......................................... 550 mW

Thermal resistance junction-to-case (
Thermal resistance junction-to-ambient (

Storage temperature range........................................................ -65C to +150C

Lead temperature (soldering, 10 seconds)................................ +300C

1.4 Recommended operating conditions.

Positive supply voltage (VCC)..................................................... +4.75 V dc to +5.25 V dc

Negative supply voltage (VEE).................................................... -4.75 V dc to -5.25 V dc

Reference input voltage range................................................... 10 V rms to 130 V rms

Reference input carrier frequency range:

Device types 01, 02, 05, 06, 09, and 10................................. 360 Hz to 5000 Hz

Device types 03, 04, 07, 08, 11, and 12................................. 47 Hz to 1000 Hz

Signal input voltage range......................................................... 81 V rms to 99 V rms

Ambient operating temperature range (TA)................................ -55C to +125C

2. APPLICABLE DOCUMENTS

JC).................................. 8.0C/W

JA)............................. 20C/W

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.

1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

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3. REQUIREMENTS

3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device
class.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.

3.2.3 Block diagram. The block diagram shall be as specified on figure 3.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.

3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked in MIL-HDBK-103 and
QML-38534.

3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.

3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.

3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.

4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.

(2) TA as specified in accordance with table I of method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter

tests prior to burn-in are optional at the discretion of the manufacturer.

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REVISION LEVEL

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SHEET

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TABLE I. Electrical performance characteristics.

LimitsTest Symbol Conditions

Min Max

Unit

-55

C  T

= +5 V dc, VEE = -5 V dc

V

CC

+125

A

C

Group A
subgroups

Device
type

unless otherwise specified

01-04 14Resolution 1/ RES 7,8A,8B

Bits

05-12 16

Output accuracy 2/ AOUT 7,8A,8B

01-04 -4 +4

LSB

05-08 -13 +13
09-12 -7 +7

Accuracy repeatability 2/ 3/ AR 7,8A,8B All -1.0 +1.0 LSB

Reference input voltage

V

IN1

4,5,6 All 10 130 V rms

range 3/

Z

IN1

Single ended 270Reference input

4,5,6 All

k



impedance 3/

Reference input common

Differential

V

CM1

4,5,6 All -200 +200 V pk

540

mode range 3/

Signal input common
mode range 3/

Digital output low voltage
1/

Digital output high voltage
1/

Output leakage current 3/ I

Digital input high voltage 1/ V

See footnotes at end of table.

V

CM2

IN2

Line-to-line 80Signal input impedance 3/ Z

Line-to-ground

V

OL

V

OH

OZ

IOL

IOH

-1.6 mA

0.4 mA

4,5,6 All -180 +180 V pk

4,5,6 All

k



123

1,2,3 All 0.4 V

1,2,3 All 2.8 V

1,2,3 All -60 +60



A

IH

Digital inputs INH, EL, and
EM. VIN = 2.0 V

1,2,3 All pass/

fail

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5962-92054

SHEET

5

TABLE I. Electrical performance characteristics - Continued.

Digital input low voltage 1/ V

Digital input current 1/ I

Inhibit voltage 1/ V

Enable voltage 1/ V

Disable voltage 1/
(high impedance)

LimitsTest Symbol Conditions

Min Max

Unit

-55

C  T

= +5 V dc, VEE = -5 V dc

V

CC

+125

A

C

Group A
subgroups

Device
type

unless otherwise specified

IL

Digital inputs INH, EL, and
EM. VIN = 0.8 V

IN

INH

Internal pull-up 4,5,6 All -10

No digital angles change

1,2,3 All pass/

fail

7,8A,8B All 0.8 V



A

while INH is logic 0 and
analog input is rotating

E

EM controls output bits 1

7,8A,8B All 0.8 V
through 8 and EL controls
output bits 9 through 14 for
device types 01 through 04,
and bits 9 through 16 for
device types 05 through 12.

V

D

EM controls output bits

7,8A,8B All 2.0 V
1 through 8 and EL controls
output bits 9 through 14 for
device types 01 through 04,
and bits 9 through 16 for
device types 05 through 12.

Positive supply voltage I

Negative supply voltage I

Analog velocity output

CC

EE

V

OUT

VCC = +5.25 V 1,2,3 All +17 mA

VEE = -5.25 V 1,2,3 All -17 mA

4/ 7,8A,8B All 3.24 4.00 V

voltage

Bandwidth 1/ BW 7,8A,8B

01,02,

72 134

Hz

05,06,

09,10

03,04,

10 20
07,08,
11,12

1/ These parameters are tested on a go-no-go basis only or in conjunction with other measured parameters and are not

directly testable.
2/ Output accuracy is measured at angles from 0, to 180, in 15 increments, and at 225, 270, and 315.
3/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter

shall be guaranteed to the limits specified in table I for all lots not specifically tested.
4/ Analog output voltage is tested at 8 revolutions per second (rps) for device types 01 and 02, 1 rps for device types 03 and

04, 2 rps for device types 05, 06, 09, and 10, 0.25 rps for device types 07, 08, 11, and 12.

STANDARD

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SIZE

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REVISION LEVEL

A

5962-92054

SHEET

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DSCC FORM 2234
APR 97

Case outline X.

Symbol

A --- 5.33 --- 0.210



b 0.46 TYP 0.018 TYP

D 48.01 48.26 1.890 1.900

D1 43.05 43.31 1.695 1.705

E 19.56 19.81 0.770 0.780
e 2.54 TYP 0.100 TYP

eA 15.11 15.37 0.595 0.605

L 5.84 --- 0.230 --­Q --- 0.38 --- 0.015
S 2.03 2.54 0.080 0.100

S1 2.29 2.79 0.090 0.110

NOTES:

1.

Pin 1 is denoted by the contrasting colored bead and the ESD triangle on the under side.

2. Radius dimensions are in inches.

3. The U.S. government preferred system of measurement is the metric SI. This case outline was designed using inch­pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the
inch-pound units shall rule.

4. Pin number are for reference only.

5. Lead spacing dimensions apply only at seating plane.

Millimeters Inches

Minimum Maximum Minimum Maximum

FIGURE 1. Case outline(s).

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Device

types

01, 03 02, 04 05, 07, 09, 11 06, 08, 10, 12

Case

outline

Terminal

number

1
2
3
4
5
6
7
8

9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36

XXXX

Terminal symbol Terminal symbol Terminal symbol Terminal symbol

S1 A
S2 A
S3 A
No connection
GND
A GND
S1 B
S2 B
S3 B
No connection
V

(-5 V supply)

EE

V

(+5 V supply)

CC

S1 C
S2 C
S3 C
No connection

-REF
+REF
EM C
EL C
VEL C
Bit 1/9
Bit 2/10
Bit 3/11
Bit 4/12
Bit 5/13
Bit 6/14
Bit 7
Bit 8
EL B
EM B
VEL B
INH (inhibit)
EL A
EM A
VEL A

S1 A
S2 A
S3 A
No connection
GND
A GND
S1 B
S2 B
S3 B
No connection
V

(-5 V supply)

EE

V

(+5 V supply)

CC

S1 C
S2 C
S3 C
No connection

-REF
+REF
EM C
EL C
BIT C
Bit 1/9
Bit 2/10
Bit 3/11
Bit 4/12
Bit 5/13
Bit 6/14
Bit 7
Bit 8
EL B
EM B
BIT B
INH (inhibit)
EL A
EM A
BIT A

S1 A
S2 A
S3 A
No connection
GND
A GND
S1 B
S2 B
S3 B
No connection
V

(-5 V supply)

EE

V

(+5 V supply)

CC

S1 C
S2 C
S3 C
No connection

-REF
+REF
EM C
EL C
VEL C
Bit 1/9
Bit 2/10
Bit 3/11
Bit 4/12
Bit 5/13
Bit 6/14
Bit 7/15
Bit 8/16
EL B
EM B
VEL B
INH (inhibit)
EL A
EM A
VEL A

S1 A
S2 A
S3 A
No connection
GND
A GND
S1 B
S2 B
S3 B
No connection
V

(-5 V supply)

EE

V

(+5 V supply)

CC

S1 C
S2 C
S3 C
No connection

-REF
+REF
EM C
EL C
BIT C
Bit 1/9
Bit 2/10
Bit 3/11
Bit 4/12
Bit 5/13
Bit 6/14
Bit 7/15
Bit 8/16
EL B
EM B
BIT B
INH (inhibit)
EL A
EM A
BIT A

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FIGURE 2. Terminal connections.

SIZE

A

REVISION LEVEL

A

5962-92054

SHEET

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NOTE:

1. BIT is not connected on device types 01, 03, 05, 07, 09, and 11. VEL is not connected on device types 02, 04, 06, 08,
10, and 12.

FIGURE 3. Block diagram.

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TABLE II. Electrical test requirements.

MIL-PRF-38534 test requirements Subgroups

(in accordance with

MIL-PRF-38534, group A

test table)

Interim electrical parameters 1,4,7

Final electrical parameters 1*,2,3,4,5,6,7,8A,8B

Group A test requirements 1,2,3,4,5,6,7,8A,8B

Group C end-point electrical
parameters

End-point electrical parameters
for radiation hardness assurance
(RHA) devices

* PDA applies to subgroup 1.

4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance

with MIL-PRF-38534 and as specified herein.

4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 9, 10, and 11 shall be omitted.

4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.

4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test, method 1005 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.

1,2,3,4,5,6,7,8A,8B

Not applicable

(2) TA as specified in accordance with table I of method 1005 of MIL-STD-883.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.

4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.

STANDARD

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5962-92054

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5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-

prepared specification or drawing.

6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished in accordance with MIL-PRF-38534.

6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application

requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone [phone].

6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Post Office Box 3990, Columbus, Ohio 43216-

5000, or telephone [phone].

6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-

103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.

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5962-92054

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STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 01-06-14

Approved sources of supply for SMD 5962-92054 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revisions of MIL-HDBK-103 and QML-38534.

Standard

microcircuit drawing

PIN 1/

5962-9205401HXA
5962-9205401HXA
5962-9205401HXA
5962-9205401HXA
5962-9205401HXC
5962-9205401HXC
5962-9205401HXC
5962-9205401HXC

5962-9205402HXA
5962-9205402HXA
5962-9205402HXA
5962-9205402HXA
5962-9205402HXC
5962-9205402HXC
5962-9205402HXC
5962-9205402HXC

5962-9205403HXA
5962-9205403HXA
5962-9205403HXA
5962-9205403HXA
5962-9205403HXC
5962-9205403HXC
5962-9205403HXC
5962-9205403HXC

5962-9205404HXA
5962-9205404HXA
5962-9205404HXA
5962-9205404HXA
5962-9205404HXC
5962-9205404HXC
5962-9205404HXC
5962-9205404HXC

Vendor

CAGE

number

S7631
19645
S7631
19645
S7631
19645
S7631
19645

S7631
19645
S7631
19645
S7631
19645
S7631
19645

S7631
19645
S7631
19645
S7631
19645
S7631
19645

S7631
19645
S7631
19645
S7631
19645
S7631
19645

Vendor

similar

PIN 2/

SDC-14612II-152
SDC-14612II-152
SDC-14612II-142
SDC-14612II-142
SDC-14612II-132
SDC-14612II-132
SDC-14612II-112
SDC-14612II-112

SDC-14612IIT-152
SDC-14612IIT-152
SDC-14612IIT-142
SDC-14612IIT-142
SDC-14612IIT-132
SDC-14612IIT-132
SDC-14612IIT-112
SDC-14612IIT-112

SDC-14614II-152
SDC-14614II-152
SDC-14614II-142
SDC-14614II-142
SDC-14614II-132
SDC-14614II-132
SDC-14614II-112
SDC-14614II-112

SDC-14614IIT-152
SDC-14614IIT-152
SDC-14614IIT-142
SDC-14614IIT-142
SDC-14614IIT-132
SDC-14614IIT-132
SDC-14614IIT-112
SDC-14614IIT-112

5962-9205405HXA
5962-9205405HXA
5962-9205405HXA
5962-9205405HXA
5962-9205405HXC
5962-9205405HXC
5962-9205405HXC
5962-9205405HXC

See footnotes at end of table.

S7631
19645
S7631
19645
S7631
19645
S7631
19645

1 of 3

SDC-14617II-152
SDC-14617II-152
SDC-14617II-142
SDC-14617II-142
SDC-14617II-132
SDC-14617II-132
SDC-14617II-112
SDC-14617II-112

STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued.

DATE: 01-06-14

Standard

microcircuit drawing

PIN 1/

5962-9205406HXA
5962-9205406HXA
5962-9205406HXA
5962-9205406HXA
5962-9205406HXC
5962-9205406HXC
5962-9205406HXC
5962-9205406HXC

5962-9205407HXA
5962-9205407HXA
5962-9205407HXA
5962-9205407HXA
5962-9205407HXC
5962-9205407HXC
5962-9205407HXC
5962-9205407HXC

5962-9205408HXA
5962-9205408HXA
5962-9205408HXA
5962-9205408HXA
5962-9205408HXC
5962-9205408HXC
5962-9205408HXC
5962-9205408HXC

5962-9205409HXA
5962-9205409HXA
5962-9205409HXA
5962-9205409HXA
5962-9205409HXC
5962-9205409HXC
5962-9205409HXC
5962-9205409HXC

Vendor

CAGE

number

S7631
19645
S7631
19645
S7631
19645
S7631
19645

S7631
19645
S7631
19645
S7631
19645
S7631
19645

S7631
19645
S7631
19645
S7631
19645
S7631

196459

S7631
19645
S7631
19645
S7631
19645
S7631
19645

Vendor

similar

PIN 2/

SDC-14617IIT-152
SDC-14617IIT-152
SDC-14617IIT-142
SDC-14617IIT-142
SDC-14617IIT-132
SDC-14617IIT-132
SDC-14617IIT-112
SDC-14617IIT-112

SDC-14619II-152
SDC-14619II-152
SDC-14619II-142
SDC-14619II-142
SDC-14619II-132
SDC-14619II-132
SDC-14619II-112
SDC-14619II-112

SDC-14619IIT-152
SDC-14619IIT-152
SDC-14619IIT-142
SDC-14619IIT-142
SDC-14619IIT-132
SDC-14619IIT-132
SDC-14619IIT-112
SDC-14619IIT-112

SDC-14617II-154
SDC-14617II-154
SDC-14617II-144
SDC-14617II-144
SDC-14617II-134
SDC-14617II-134
SDC-14617II-114
SDC-14617II-114

5962-9205410HXA
5962-9205410HXA
5962-9205410HXA
5962-9205410HXA
5962-9205410HXC
5962-9205410HXC
5962-9205410HXC
5962-9205410HXC

5962-9205411HXA
5962-9205411HXA
5962-9205411HXA
5962-9205411HXA
5962-9205411HXC
5962-9205411HXC
5962-9205411HXC
5962-9205411HXC

See footnotes at end of table.

S7631
19645
S7631
19645
S7631
19645
S7631
19645

S7631
19645
S7631
19645
S7631
19645
S7631
19645

2 of 3

SDC-14617IIT-154
SDC-14617IIT-154
SDC-14617IIT-144
SDC-14617IIT-144
SDC-14617IIT-134
SDC-14617IIT-134
SDC-14617IIT-114
SDC-14617IIT-114

SDC-14619II-154
SDC-14619II-154
SDC-14619II-144
SDC-14619II-144
SDC-14619II-134
SDC-14619II-134
SDC-14619II-114
SDC-14619II-114

STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued.

DATE: 01-06-14

Standard

microcircuit drawing

PIN 1/

5962-9205412HXA
5962-9205412HXA
5962-9205412HXA
5962-9205412HXA
5962-9205412HXC
5962-9205412HXC
5962-9205412HXC
5962-9205412HXC

1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the

manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its
availability.

2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the

performance requirements of this drawing.

Vendor CAGE Vendor name
number and address

S7631 DDC Ireland, LTD.

19645 Data Device Corporation

Vendor

CAGE

number

S7631
19645
S7631
19645
S7631
19645
S7631
19645

Vendor

similar

PIN 2/

SDC-14619IIT-154
SDC-14619IIT-154
SDC-14619IIT-144
SDC-14619IIT-144
SDC-14619IIT-134
SDC-14619IIT-134
SDC-14619IIT-114
SDC-14619IIT-114

Cork Business & Technology Park
Model Farm Road
Cork, Ireland

105 Wilbur Place

Bohemia, NY 11716-2482

The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.

3 of 3