•RAD-PAK® radiation-hardened against natural space radia-
tion
• Total dose hardness:
- > 100 krad (Si), depending upon space mission
• Output ports have equivalent 22external resistors are required
• Support mixed-mode signal operation (5V input and output
voltages with 3.3V V
• Support unregulated battery operation down to 2.7V
•Typical V
T
= 25°C
A
•I
and power-up 3-state support hot insertion
OFF
• Bus hold on data inputs eliminates the need for external
pull-up/pull-down resistors
• Distributed V
speed switching noise
• Flow-through architecture optimizes PCB layout
• Package: 48 pin R
(Output ground bounce) < 0.8V at VCC = 3.3V,
OLP
CC
)
CC
and GND pin configuration minimizes high-
AD-PAK flat pack
Ω series resistors, so no
Logic Diagram
DESCRIPTION:
Maxwell Technologies’ 54LVTH162244 devices are 16-bit buffers and line drivers designed for low-voltage (3.3V) V
ation, but with the capability to provide a TTL interface to a 5V
system environment. These devices can be used as four 4-bit
buffers, two 8-bit buffers, or one 16-bit buffer. These devices
provide true outputs and symmetrical active-low output-enable
(OE
) inputs.
The outputs, which are designed to source or sink up to 12
mA, include equivalent 22shoot and undershoot. Active bus-hold circuitry is provided to
hold unused or floating data inputs at a valid logic level.
Maxwell Technologies' patented R
ogy incorporates radiation shielding in the microcircuit package. It eliminates the need for box shielding while providing
the required radiation shielding for a lifetime in orbit or space
mission. In a GEO orbit, R
krad (Si) radiation dose tolerance. This product is available
with screening up to Class S.
Voltage range applied to any output in the high-impedance or
power-off state
Voltage range applied to any output in the high state
2
2
Current into any output in the low stateI
Current into any output in the high state
3
Input clamp currentI
Output clamp currentI
Operating TemperatureT
Storage Temperature RangeT
Operating Temperature RangeT
CC
V
I
V
O
V
O
O
I
O
(VI < 0)---50mA
IK
(VO < 0)---50mA
OK
A
S
A
1
-0.54.6V
-0.57V
-0.57V
-0.5 to V
CC
0.5V
--30mA
30--mA
-55125°C
-65150
-55125°C
°
C
1. Stresses beyond listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended
operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
2. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
3. This current flows only when the output is in the high state and VO > VCC.
1000607
12.19.01 Rev 1
All data sheets are subject to change without notice
These data sheets are created using the chip manufacturer’s published specifications. Maxwell Technologies verifies
functionality by testing key parameters either by 100% testing, sample testing or characterization.
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.
54LVTH162244
Memory
1000607
12.19.01 Rev 1
All data sheets are subject to change without notice