Datasheet 5962R8769901SDA, 5962R8769901SCA, 5962R8769901S2A, 5962R8769901BDA, 5962R8769901BCA Datasheet (NSC)

...
Page 1
54AC00•54ACT00 Quad 2-Input NAND Gate
General Description
The ’AC/’ACT00 contains four 2-input NAND gates.
Features
n ICCreduced by 50
%
n Outputs source/sink 24 mA n ’ACT00 has TTL-compatible inputs n Standard Microcircuit Drawing (SMD)
— ’AC00: 5962-87549 — ’ACT00: 5962-87699
Logic Symbol
Pin Names Description
A
n,Bn
Inputs
O
n
Outputs
Connection Diagrams
FACT®is a registered trademark of Fairchild Semiconductor Corporation.
IEEE/IEC
DS100257-1
Pin Assignment for
DIP and Flatpak
DS100257-3
Pin Assignment
for LCC
DS100257-2
August 1998
54AC00
54ACT00 Quad 2-Input NAND Gate
© 1998 National Semiconductor Corporation DS100257 www.national.com
Page 2
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Supply Voltage (V
) −0.5V to +7.0V
DC Input Diode Current (I
IK
)
V
I
=
−0.5V −20 mA
V
I
=
V
+ 0.5V +20 mA
DC Input Voltage (V
I
) −0.5V to VCC+ 0.5V
DC Output Diode Current (I
OK
)
V
O
=
−0.5V −20 mA
V
O
=
V
+ 0.5V +20 mA
DC Output Voltage (V
O
) −0.5V to VCC+ 0.5V
DC Output Source
or Sink Current (I
O
)
±
50 mA
DC V
or Ground Current
per Output Pin (I
or I
GND
)
±
50 mA
Storage Temperature (T
STG
) −65˚C to +150˚C
Junction Temperature (T
J
)
CDIP 175˚C
Recommended Operating Conditions
Supply Voltage (VCC)
’AC 2.0V to 6.0V ’ACT 4.5V to 5.5V
Input Voltage (V
I
) 0VtoV
Output Voltage (VO) 0VtoV
Operating Temperature (TA)
54AC/ACT −55˚C to +125˚C
Minimum Input Edge Rate (V/t)
’AC Devices V
IN
from 30%to 70%of V
V
@
3.3V, 4.5V, 5.5V 125 mV/ns
Minimum Input Edge Rate (V/t)
’ACT Devices V
IN
from 0.8V to 2.0V
V
@
4.5V, 5.5V 125 mV/ns
Note 1: Absolutemaximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recom­mend operation of FACT
®
circuits outside databook specifications.
DC Characteristics for ’AC Family Devices
54AC
Symbol Parameter V
T
A
=
Units Conditions
(V) −55˚C to +125˚C
Guaranteed Limits
V
IH
Minimum High Level 3.0 2.1 V
OUT
=
0.1V
Input Voltage 4.5 3.15 V or V
− 0.1V
5.5 3.85
V
IL
Maximum Low Level 3.0 0.9 V
OUT
=
0.1V
Input Voltage 4.5 1.35 V or V
− 0.1V
5.5 1.65
V
OH
Minimum High Level 3.0 2.9 I
OUT
=
−50 µA
Output Voltage 4.5 4.4 V
5.5 5.4 (Note 2)
V
IN
=
V
IL
or V
IH
3.0 2.4 IOH= −12 mA
4.5 3.7 V I
OH
= −24 mA
5.5 4.7 I
OH
= −24 mA
V
OL
Maximum Low Level 3.0 0.1 I
OUT
=
50 µA
Output Voltage 4.5 0.1 V
5.5 0.1 (Note 2)
V
IN
=
V
IL
or V
IH
3.0 0.5 IOL=12mA
4.5 0.5 V I
OL
=24mA
5.5 0.5 I
OL
=24mA
I
IN
Maximum Input 5.5
±
1.0 µA V
I
=
V
, GND
Leakage Current
I
OLD
Minimum Dynamic Output Current (Note 4)
5.5 50 mA V
OLD
=
1.65V Max
I
OHD
5.5 −50 mA V
OHD
=
3.85V Min
I
Maximum Quiescent 5.5 40.0 µA V
IN
=
V
www.national.com 2
Page 3
DC Characteristics for ’AC Family Devices (Continued)
54AC
Symbol Parameter V
T
A
=
Units Conditions
(V) −55˚C to +125˚C
Guaranteed Limits
Supply Current or GND
Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: I
IN
and I
@
3.0V are guaranteed to be less than or equal to the respective limit@5.5V VCC.
I
for 54AC@25˚C is identical to 74AC@25˚C.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: I
IN
and I
@
3.0V are guaranteed to be less than or equal to the respective limit@5.5V VCC.
I
for 54AC@25˚C is identical to 74AC@25˚C.
DC Characteristics for ’ACT Family Devices
54ACT
Symbol Parameter V
T
A
=
Units Conditions
(V) −55˚C to +125˚C
Guaranteed Limits
V
IH
Minimum High Level 4.5 2.0 V V
OUT
=
0.1V
Input Voltage 5.5 2.0 or V
− 0.1V
V
IL
Maximum Low Level 4.5 0.8 V V
OUT
=
0.1V
Input Voltage 5.5 0.8 or V
− 0.1V
V
OH
Minimum High Level 4.5 4.4 V I
OUT
=
−50 µA
Output Voltage 5.5 5.4
(Note 6) V
IN
=
V
IL
or V
IH
4.5 3.70 V IOH= −24 mA
5.5 4.70 I
OH
= −24 mA
V
OL
Maximum Low Level 4.5 0.1 V I
OUT
=
50 µA
Output Voltage 5.5 0.1
(Note 6) V
IN
=
V
IL
or V
IH
4.5 0.50 V IOL=24mA
5.5 0.50 I
OL
=24mA
I
IN
Maximum Input 5.5
±
1.0 µA V
I
=
V
, GND
Leakage Current
I
CCT
Maximum 5.5 1.6 mA V
I
=
V
− 2.1V
I
/Input
I
OLD
Minimum Dynamic Output Current (Note 7)
5.5 50 mA V
OLD
=
1.65V Max
I
OHD
5.5 −50 mA V
OHD
=
3.85V Min
I
Maximum Quiescent 5.5 40.0 µA V
IN
=
V
Supply Current or GND
Note 6: All outputs loaded; thresholds on input associated with output under test. Note 7: Maximum test duration 2.0 ms, one output loaded at a time. Note 8: I
for 54ACT@25˚C is identical to 74ACT@25˚C.
www.national.com3
Page 4
AC Electrical Characteristics
54AC
V
T
A
=
−55˚C Fig.
Symbol Parameter (V) to +125˚C Units No.
(Note 9) C
L
=
50 pF
Min Max
t
PLH
Propagation Delay 3.3 1.0 11.0 ns
5.0 1.5 8.5
t
PHL
Propagation Delay 3.3 1.0 9.0 ns
5.0 1.5 7.0
Note 9: Voltage Range 3.3 is 3.3V±0.3V Voltage Range 5.0 is 5.0V
±
0.5V
AC Electrical Characteristics
54ACT
V
T
A
=
−55˚C Fig.
Symbol Parameter (V) to +125˚C Units No.
(Note 10) C
L
=
50 pF
Min Max
t
PLH
Propagation Delay 5.0 1.5 9.5 ns
t
PHL
Propagation Delay 5.0 1.5 8.0 ns
Note 10: Voltage Range 5.0 is 5.0V±0.5V
Capacitance
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF V
=
Open
C
PD
Power Dissipation 30.0 pF V
=
5.0V
Capacitance
www.national.com 4
Page 5
Physical Dimensions inches (millimeters) unless otherwise noted
20 Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
14 Lead Ceramic Dual-In-Line Package (D)
NS Package Number J14A
www.national.com5
Page 6
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE­VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI­CONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or sys­tems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose fail­ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user.
2. A critical component in any component of a life support device or system whose failure to perform can be rea­sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
National Semiconductor Corporation
Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: support@nsc.com
www.national.com
National Semiconductor Europe
Fax: +49 (0) 1 80-530 85 86
Email: europe.support@nsc.com Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80-532 78 32 Français Tel: +49 (0) 1 80-532 93 58 Italiano Tel: +49 (0) 1 80-534 16 80
National Semiconductor Asia Pacific Customer Response Group
Tel: 65-2544466 Fax: 65-2504466 Email: sea.support@nsc.com
National Semiconductor Japan Ltd.
Tel: 81-3-5639-7560 Fax: 81-3-5639-7507
14 Lead Ceramic Flatpak (F)
NS Package Number W14B
54AC00
54ACT00 Quad 2-Input NAND Gate
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
Loading...