Datasheet 4AK18 Datasheet (HIT)

Page 1
4AK18
Silicon N-Channel Power MOS FET Array
Application
High speed power switching
Features
Low on-resistance
R
0.38 , VGS = 10 V, ID = 1 A
DS(on)
R
0.53 , VGS = 4 V, ID = 1 A
DS(on)
Capable of 4 V gate drive
Low drive current
High speed switching
High density mounting
Suitable for motor driver, solenoid driver and lamp driver
Page 2
4AK18
Outline
SP-10
3 D
4
2 G
1 S
G
Absolute Maximum Ratings (Ta = 25°C) (1 Unit)
5 D
6
G
7 D
8
G
1
2
9 D
S 10
3
4
5
6
7
8
9
1, 10. Source 2, 4, 6, 8. Gate 3, 5, 7, 9. Drain
10
Item Symbol Rating Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body to drain diode reverse drain current I
DSS
GSS
D
D(pulse)
DR
1
*
60 V ±20 V
2.5 A 10 A
2.5 A Channel dissipation Pch (Tc = 25°C)*228 W Channel dissipation Pch*
2
4W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Notes: 1. PW 10 µs, duty cycle 1%
2. 4 devices operation
2
Page 3
Electrical Characteristics (Ta = 25°C) (1 Unit)
Item Symbol Min Typ Max Unit Test conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source leak current I Zero gate voltage drain current I Gate to source cutoff voltage V Static drain to source on state
R
GSS
DSS
GS(off)
DS(on)
resistance
Forward transfer admittance |yfs| 1.2 2.0 S ID = 1 A
Input capacitance Ciss 240 pF VDS = 10 V Output capacitance Coss 115 pF VGS = 0 Reverse transfer capacitance Crss 35 pF f = 1 MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body to drain diode forward
V
d(on)
r
d(off)
f
DF
voltage Body to drain diode reverse
t
rr
recovery time Note: 1. Pulse Test
60 V ID = 10 mA, VGS = 0
±20 V IG = ±100 µA, VDS = 0
——±10 µAVGS = ±16 V, VDS = 0 — 100 µAVDS = 50 V, VGS = 0
1.0 2.0 V ID = 1 mA, VDS = 10 V — 0.25 0.38 ID = 1 A
V
= 10 V*
GS
0.40 0.53 ID = 1 A
V
= 4 V*
GS
V
= 10 V*
DS
—4 —nsI
= 1 A
D
1
1
1
15 ns VGS = 10 V — 80 ns RL = 30 —40—ns — 1.0 V IF = 2 A, VGS = 0
70 ns IF = 2 A, VGS = 0
dIF/dt = 50 A/µs
4AK18
3
Page 4
4AK18
Maximum Channel Dissipation Curve
6
Condition : Channel Dissipation of each die is identical
5
4
3
4 Device Operation 3 Device Operation
2 Device Operation 1 Device Operation
2
1
Channel Dissipation Pch (W)
0 50 100 150
1257525
Ambient Temperature Ta (°C)
Maximum Safe Operation Area
100
30
(A)
D
10
10 µs
100 µs
3
1.0
Operation in this area
Drain Current I
0.3
is limited by R
Ta = 25°C
DS (on)
PW = 10 ms (1 shot)
1 ms
DC Operation
(T
C
= 25°C)
0.1 0.3 1.0 3 10 30 100 Drain to Source Voltage V
DS
(V)
Maximum Channel Dissipation Curve
30
Condition : Channel Dissipation of each die is identical
4 Device Operation 3 Device Operation
20
2 Device Operation 1 Device Operation
10
Channel Dissipation Pch (W)
0 50 100 150
Case Temperature T
(°C)
C
1257525
Typical Output Characteristics
5
10 V
4
(A)
D
3
2
Drain Current I
1
5 V
4 V
3.5 V
2.5 V
Pulse Test
3 V
VGS = 2 V
0
0
Drain to Source Voltage V
6
DS
842 10
(V)
4
Page 5
Typical Transfer Characteristics
5
–25°C
VDS = 10 V
4
Pulse Test
(A)
D
3
TC= 25°C
2
Drain Current I
1
3
0
Gate to Source Voltage V
42105
(V)
GS
75°C
Drain to Source Saturation Voltage
vs. Gate to Source Voltage
2.0
1.6
1.2
(V)
DS (on)
0.8
V
0.4
Drain to Source Saturation Voltage
0
Gate to Source Voltage V
4AK18
Pulse Test
5 A
2 A
ID = 1 A
6
842010
(V)
GS
Static Drain to Source on State
Resistance vs. Drain Current
5
Pulse Test
2
1.0
()
0.5
DS (on)
R
0.2
VGS = 4 V
0.1
0.05
Static Drain to Source on State Resistance
0.2 Drain Current I
2
51.00.5 20
(A)
D
10 V
10
Static Drain to Source on State
Resistance vs. Temperature
1.0
Pulse Test
0.8
ID = 2 A
0.6
()
DS (on)
0.4
R
0.2
0
Static Drain to Source on State Resistance
–40
VGS = 4 V
VGS = 10 V
Case Temperature T
80
1 A
1 A, 2 A
120400
(°C)
C
5 A
160
5
Page 6
4AK18
10
5
2
1.0
0.5
0.2
Forward Transfer Admittance yfs (S)
0.1
0.05 0.1 0.2
1000
300
100
30
Forward Transfer Admittance
vs. Drain Current
VDS = 10 V Pulse Test
–25°C
TC = 25°C
75°C
1.0
0.5
Drain Current I
D
(A)
Typical Capacitance vs. Drain to Source Voltage
VGS = 0 f = 1 MHz
Ciss
Coss
Crss
Body to Drain Diode Reverse
Recovery Time
500
di/dt = 50 A/µs, Ta = 25°C
200
(ns)
rr
VGS = 0 Pulse Test
100
50
20 10
Reverse Recovery Time t
5
2
5
0.2 0.5 2
1.0
Reverse Drain Current I
5
10
20
(A)
DR
Dynamic Input Characteristics
100
(V)
DS
80
60
40
V
DS
VDD = 50 V
VDD = 50 V
25 V 10 V
V
GS
20
16
12
8
(V)
GS
Capacitance C (pF)
3
1
01020
Drain to Source Voltage VDS (V)
6
301040
50
20
Drain to Source Voltage V
02 6
25 V 10 V
4
Gate Charge Qg (nc)
ID = 2 A
8
4
Gate to Source Voltage V
10
Page 7
100
Switching Characteristics
50
20
10
5
Switching Time t (ns)
2
VGS = 10 V VDD = 30 V PW = 2µs, duty < 1 %
1
0.05 0.1 0.5
0.2
Drain Current I
t
f
t
d (off)
1.0
D
t
d (on)
(A)
4AK18
Reverse Drain Current vs.
Source to Drain Voltage
5
Pulse Test
4
(A)
DR
t
r
2
1
Reverse Drain Current I
0 0.4 1.2
5
2
3
10 V 15 V
5 V
VGS = 0, –5 V
0.8
Source to Drain Voltage V
1.6
SD
2.0
(V)
7
Page 8
Unit: mm
26.5 ± 0.3
1.82 2.54 1.4
1234
56
8910
7
10.0 ± 0.310.5 ± 0.5
2.5
0.55 ± 0.1
4.0 ± 0.2
1.5 ± 0.2
0.55
Hitachi Code JEDEC EIAJ Weight
(reference value)
+0.1 –0.06
SP-10 — —
2.9 g
Page 9
Cautions
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4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
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