Datasheet 4AK15 Datasheet (HIT)

Page 1
4AK15
Silicon N-Channel Power MOS FET Array
Application
High speed power switching
Features
• Low on-resistance
R
≤ 0.07 , VGS = 10 V, ID = 8 A
DS(on)
R
≤ 0.095 , VGS = 4 V, ID = 8 A
DS(on)
• Capable of 4 V gate drive
• Low drive current
• High speed switching
• High density mounting
• Suitable for motor driver, solenoid driver and lamp driver
Page 2
4AK15
Outline
SP-10
3 D
4
2 G
1 S
G
Absolute Maximum Ratings (Ta = 25°C) (1 Unit)
5 D
6
G
7 D
8
G
1
2
9 D
S 10
3
4
5
6
7
8
9
1, 10. Source 2, 4, 6, 8. Gate 3, 5, 7, 9. Drain
10
Item Symbol Rating Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body to drain diode reverse drain current I
DSS
GSS
D
D(pulse)
DR
1
*
±60 V ±20 V
8A 32 A
8A Channel dissipation Pch (Tc = 25°C)*228 W Channel dissipation Pch*
2
4W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1%
2. 4 devices operation
2
Page 3
Electrical Characteristics (Ta = 25°C) (1 Unit)
Item Symbol Min Typ Max Unit Test conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source leak current I Zero gate voltage drain current I Gate to source cutoff voltage V Static drain to source on state
R
GSS
DSS
GS(off)
DS(on)
resistance
Forward transfer admittance |yfs| 7 12 — S ID = 8 A
Input capacitance Ciss — 860 — pF VDS = 10 V Output capacitance Coss — 450 — pF VGS = 0 Reverse transfer capacitance Crss — 140 — pF f = 1 MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body to drain diode forward
V
d(on)
r
d(off)
f
DF
voltage Body to drain diode reverse
t
rr
recovery time Note: 1. Pulse test
60 — — V ID = 10 mA, VGS = 0
±20 — — V IG = ±100 µA, VDS = 0
——±10 µAVGS = ±16 V, VDS = 0 — — 250 µAVDS = 50 V, VGS = 0
1.0 — 2.0 V ID = 1 mA, VDS = 10 V — 0.055 0.07 Ω ID = 8 A
V
= 10 V*
GS
— 0.075 0.095 Ω ID = 8 A
V
= 4 V*
GS
V
= 10 V*
DS
1
1
1
— 10 — ns ID = 8 A — 70 — ns VGS = 10 V — 180 — ns RL = 3.75 Ω — 120 — ns — 1.05 — V IF = 8 A, VGS = 0
— 110 — ns IF = 8 A, VGS = 0
dIF/dt = 50 A/µs
4AK15
3
Page 4
4AK15
Maximum Channel Dissipation Curve
6
Condition : Channel Dissipation of each die is identical
5
4 Device Operation 3 Device Operation
4
2 Device Operation 1 Device Operation
3
2
1
Channel Dissipation Pch (W)
25 50 75 100 125 1500
Ambient Temperature Ta (°C)
Maximum Safe Operation Area
50
(A)
D
20 10
5
Operation in this area
is limited by R
DS (on)
PW = 10 ms (1 Shot)
DC Operation (T
2
1.0
0.5
Drain Current I
0.2 Ta = 25°C
0.1
0.05
0.1 0.3 3 30
1.0 10 100
Drain to Source Voltage V
1 ms
C
= 25°C)
10 µs
100 µs
(V)
DS
Maximum Channel Dissipation Curve
30
Condition : Channel Dissipation of each die is identical
20
10
Channel Dissipation Pch (W)
25 50 75 100 125 1500
Case Temperature T
Typical Output Characteristics
20
10 V
4 V
5 V
(A)
D
16
12
8
Drain Current I
4
0
0
VGS = 2.5 V
Drain to Source Voltage V
4 Device Operation 3 Device Operation 2 Device Operation 1 Device Operation
(°C)
C
Pulse Test
3.5 V
3.0 V
6
842 10
(V)
DS
4
Page 5
Typical Transfer Characteristics
20
VDS = 10 V
16
Pulse Test
(A)
D
12
8
Drain Current I
4
75°C
–25°C
TC= 25°C
0
Gate to Source Voltage V
3
GS
Drain to Source Saturation Voltage
vs. Gate to Source Voltage
2.0
1.6
1.2
(V)
DS (on)
0.8
V
0.4
Drain to Source Saturation Voltage
42105
(V)
0
Gate to Source Voltage V
4AK15
Pulse Test
20 A
10 A
ID = 5 A
6
842010
(V)
GS
Static Drain to Source on State
Resistance vs. Drain Current
0.5
0.2
Pulse Test
VGS = 4 V
0.1
(Ω)
10 V
0.05
DS (on)
R
0.02
0.01
0.005
Static Drain to Source on State Resistance
1
Drain Current I
10
2052 100
(A)
D
50
Static Drain to Source on State
Resistance vs. Temperature
0.20
Pulse Test
0.16
ID = 10 A
0.12
(Ω)
5 A
VGS = 4 V
DS (on)
0.08
R
0.04
0
Static Drain to Source on State Resistance
–40
VGS = 10 V
Case Temperature T
80
20 A
(°C)
C
5 A
10 A
120400
160
5
Page 6
4AK15
Forward Transfer Admittance
50
VDS = 10 V Pulse Test
20
10
5
2
1.0
Forward Transfer Admittance yfs (S)
0.5
0.2 0.5 1.0 Drain Current I
Typical Capacitance vs. Drain to Source Voltage
10000
3000
1000
300
100
Capacitance C (pF)
30
10
01020
Drain to Source Voltage VDS (V)
vs. Drain Current
–25°C
TC = 25°C
2
(A)
D
Ciss
Coss
Crss
30
75°C
5
VGS = 0 f = 1MHz
40
10
20
50
Body to Drain Diode Reverse
Recovery Time
1000
di/dt = 50 A/µs, Ta = 25°C VGS = 0 Pulse Test
(ns)
rr
500
200
100
50
20
Reverse Recovery Time t
10
0.5 1.0 5 Reverse Drain Current I
Dynamic Input Characteristics
100
(V)
80
DS
VDD = 50 V
25 V
60
V
DS
10 V
40
20
Drain to Source Voltage V
08 24
VDD = 50 V 25 V 10 V
16
Gate Charge Qg (nc)
V
GS
ID = 15 A
10220
DR
32
(A)
50
20
(V)
16
GS
12
8
4
Gate to Source Voltage V
0
40
6
Page 7
500
200
100
Switching Characteristics
t
d (off)
t
f
(A)
DR
20
16
12
Reverse Drain Current vs.
Source to Drain Voltage
Pulse Test
10 V
15 V
4AK15
50
20
Switching Time t (ns)
10
5
0.2 0.5 1.0 Drain Current I
t
r
D
5
(A)
•
•
10
VGS = 10 V VDD = 30 V PW = 2µs, duty < 1 %
t
d (on)
2
20
8
5 V
4
Reverse Drain Current I
0 0.4 1.2
0.8
Source to Drain Voltage V
VGS = 0, – 5 V
1.6
SD
2.0
(V)
7
Page 8
Unit: mm
26.5 ± 0.3
1.82 2.54 1.4
1234
56
8910
7
10.0 ± 0.310.5 ± 0.5
2.5
0.55 ± 0.1
4.0 ± 0.2
1.5 ± 0.2
0.55
Hitachi Code JEDEC EIAJ Weight
(reference value)
+0.1 –0.06
SP-10 — —
2.9 g
Page 9
Cautions
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4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
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