Datasheet 48LC8M8A2 Datasheet

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SDRAM
SYNCHRONOUS DRAM
FEATURES
• PC66-, PC100-, and PC133-compliant
• Fully synchronous; all signals registered on positive edge of system clock
• Internal pipelined operation; column address can be changed every clock cycle
• Internal banks for hiding row access/precharge
• Programmable burst lengths: 1, 2, 4, 8, or full page
• Auto Precharge, includes CONCURRENT AUTO PRECHARGE, and Auto Refresh Modes
• Self Refresh Modes: standard and low power
• 64ms, 4,096-cycle refresh
• LVTTL-compatible inputs and outputs
• Single +3.3V ±0.3V power supply
OPTIONS MARKING
• Configurations
16 Meg x 4 (4 Meg x 4 x 4 banks) 16M4
8 Meg x 8 (2 Meg x 8 x 4 banks) 8M8 4 Meg x 16 (1 Meg x 16 x 4 banks) 4M16
• WRITE Recovery (tWR)
t
WR = “2 CLK”
• Plastic Package – OCPL 54-pin TSOP II (400 mil) TG
• Timing (Cycle Time) 10ns @ CL = 2 (PC100) -8E
7.5ns @ CL = 3 (PC133) -75
7.5ns @ CL = 2 (PC133) -7E 6ns @ CL = 3 (PC133, x16 Only) -6
• Self Refresh Standard None Low Power L
1
2
A2
3, 4,5
MT48LC16M4A2 – 4 Meg x 4 x 4 banks MT48LC8M8A2 – 2 Meg x 8 x 4 banks MT48LC4M16A2 – 1 Meg x 16 x 4 banks
For the latest data sheet, please refer to the Micron Web site: www.micron.com/dramds
PIN ASSIGNMENT (Top View)
54-Pin TSOP
x8x16 x16x8 x4x4
-
-
-
-
NC NC
DQ0
NC NC
NC
DQ1
NC NC
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
DQ0
NC
DQ1
NC
DQ2
NC
DQ3
NC NC
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
DQML
V
DQ0
V
DD
DQ1 DQ2
VssQ
DQ3 DQ4
V
DD
DQ5 DQ6
VssQ
DQ7
V
WE# CAS# RAS#
CS#
BA0 BA1 A10
V
A0 A1 A2 A3
DD
1 2 3
Q
4 5 6 7 8 9
Q
10 11 12 13 14
DD
15 16 17 18 19 20 21 22 23 24 25 26 27
DD
54
Vss
53
DQ15
52
VssQ
51
DQ14
50
DQ13
49
V
DD
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28
Q
DQ12 DQ11
VssQ
DQ10 DQ9
V
DD
Q
DQ8
Vss NC DQMH CLK CKE NC
A11 A9 A8 A7 A6 A5 A4
Vss
Note: The # symbol indicates signal is active LOW. A dash (–)
indicates x8 and x4 pin function is same as x16 pin function.
16 Meg x 4 8 Meg x 8 4 Meg x 16
Configuration 4 Meg x 4 x 4 banks 2 Meg x 8 x 4 banks 1 Meg x 16 x 4 banks Refresh Count 4K 4K 4K Row Addressing 4K (A0-A11) 4K (A0-A11) 4K (A0-A11) Bank Addressing 4 (BA0, BA1) 4 (BA0, BA1) 4 (BA0, BA1) Column Addressing 1K (A0-A9) 512 (A0-A8) 256 (A0-A7)
DQ7
-
NC
DQ6
-
NC
DQ5
-
NC
DQ4
-
NC
-
-
DQM
-
-
-
-
-
-
-
-
-
-
-
NC
-
NC
DQ3
-
NC NC
-
NC
DQ2
-
NC
-
-
DQM
-
-
-
-
-
-
-
-
-
-
-
KEY TIMING PARAMETERS
• Operating Temperature Range Commercial (0°C to +70°C) None Industrial (-40°C to +85°C) IT
NOTE: 1. Refer to Micron Technical Note: TN-48-05.
2. Off-center parting line.
3. Consult Micron for availability.
4. Not recommended for new designs.
5. Shown for PC100 compatibility.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
Part Number Example:
MT48LC8M8A2TG-75
SPEED CLOCK ACCESS TIME SETUP HOLD
GRADE FREQUENCY CL = 2* CL = 3* TIME TIME
3
-6 166 MHz – 5.5ns 1.5ns 1ns
-7E 143 MHz – 5.4ns 1.5ns 0.8ns
-75 133 MHz – 5.4ns 1.5ns 0.8ns
-7E 133 MHz 5.4ns – 1.5ns 0.8ns
3, 4, 5
-8E
125 MHz – 6ns 2ns 1ns
-75 100 MHz 6ns – 1.5ns 0.8ns
3, 4, 5
-8E
* CL = CAS (READ) latency
100 MHz 6ns – 2ns 1ns
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SDRAM
64Mb SDRAM PART NUMBERS
PART NUMBER ARCHITECTURE
MT48LC16M4A2TG 16 Meg x 4 MT48LC8M8A2TG 8 Meg x 8 MT48LC4M16A2TG 4 Meg x 16
GENERAL DESCRIPTION
The Micron® 64Mb SDRAM is a high-speed CMOS, dynamic random-access memory containing 67,108,864 bits. It is internally configured as a quad­bank DRAM with a synchronous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the x4’s 16,777,216-bit banks is orga­nized as 4,096 rows by 1,024 columns by 4 bits. Each of the x8’s 16,777,216-bit banks is organized as 4,096 rows by 512 columns by 8 bits. Each of the x16’s 16,777,216­bit banks is organized as 4,096 rows by 256 columns by 16 bits.
Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and con­tinue for a programmed number of locations in a pro­grammed sequence. Accesses begin with the registration of an ACTIVE command, which is then fol­lowed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0, BA1 select the bank; A0-A11 select the row). The ad-
dress bits registered coincident with the READ or WRITE command are used to select the starting column loca­tion for the burst access.
The SDRAM provides for programmable READ or WRITE burst lengths of 1, 2, 4, or 8 locations, or the full page, with a burst terminate option. An auto precharge function may be enabled to provide a self­timed row precharge that is initiated at the end of the burst sequence.
The 64Mb SDRAM uses an internal pipelined architecture to achieve high-speed operation. This architecture is compatible with the 2n rule of prefetch architectures, but it also allows the column address to be changed on every clock cycle to achieve a high­speed, fully random access. Precharging one bank while accessing one of the other three banks will hide the precharge cycles and provide seamless, high­speed, random-access operation.
The 64Mb SDRAM is designed to operate in 3.3V memory systems. An auto refresh mode is provided, along with a power-saving, power-down mode. All inputs and outputs are LVTTL-compatible.
SDRAMs offer substantial advances in DRAM oper­ating performance, including the ability to synchro­nously burst data at a high data rate with automatic column-address generation, the ability to interleave between internal banks in order to hide precharge time and the capability to randomly change column addresses on each clock cycle during a burst access.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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TABLE OF CONTENTS
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64Mb: x4, x8, x16
SDRAM
Functional Block Diagram –16 Meg x 4 ................ 4
Functional Block Diagram – 8 Meg x 8 ................ 5
Functional Block Diagram – 4 Meg x 16 .............. 6
Pin Descriptions ........................................................ 7
Functional Description ........................................... 8
Initialization......................................................... 8
Register Definition............................................... 8
Mode Register ................................................. 8
Burst Length .............................................. 8
Burst Type.................................................. 9
CAS Latency .............................................. 10
Operating Mode ........................................ 10
Write Burst Mode...................................... 10
Commands ........................................................... 11
Truth Table 1 (Commands and DQM Operation) ....... 11
Command Inhibit .......................................... 12
No Operation (NOP) ...................................... 12
Load Mode Register ........................................ 12
Active............................................................... 12
Read ................................................................. 12
Write................................................................ 12
Precharge......................................................... 12
Auto Precharge ............................................... 12
Burst Terminate .............................................. 12
Auto Refresh ................................................... 13
Self Refresh...................................................... 13
Operation ............................................................. 14
Bank/Row Activation ..................................... 14
Reads................................................................ 15
Writes .............................................................. 21
Precharge......................................................... 23
Power-Down ................................................... 23
Clock Suspend ................................................ 24
Burst Read/Single Write ................................. 24
Concurrent Auto Precharge .......................... 25
Truth Table 2 (CKE)................................................... 27
Truth Table 3 (Current State, Same Bank)................... 28
Truth Table 4 (Current State, Different Bank) ............. 30
Absolute Maximum Ratings .................................... 32
DC Electrical Characteristics
and Operating Conditions ..................................... 32
DD Specifications and Conditions.......................... 32
I
Capacitance ............................................................... 33
Electrical Characteristics and Recommended
Operating Conditions (Timing Table) ........... 34
Timing Waveforms
Initialize and Load Mode Register ..................... 36
Power-Down Mode ............................................ 37
Clock Suspend Mode .......................................... 38
Auto Refresh Mode ............................................. 39
Self Refresh Mode ................................................ 40
Reads
Read – Without Auto Precharge .................. 41
Read – With Auto Precharge ........................ 42
Single Read – Without Auto Precharge ....... 43
Single Read – With Auto Precharge ............. 4 4
Alternating Bank Read Accesses.................... 45
Read – Full-Page Burst ................................... 46
Read – DQM Operation ................................ 47
Writes
Write – Without Auto Precharge ................. 48
Write – With Auto Precharge ....................... 49
Single Write – Without Auto Precharge ...... 50
Single Write – With Auto Precharge ............ 51
Alternating Bank Write Accesses................... 52
Write – Full-Page Burst .................................. 53
Write – DQM Operation ............................... 54
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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WE#
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CAS#
RAS#
CKE CLK
CS#
CONTROL
LOGIC
DECODE
COMMAND
MODE REGISTER
12
REFRESH
COUNTER
12
FUNCTIONAL BLOCK DIAGRAM
16 Meg x 4 SDRAM
BANK2
BANK1
12
ROW-
ADDRESS
MUX
BANK0
12
ROW-
ADDRESS
LATCH
&
DECODER
4096
BANK0
MEMORY
ARRAY
(4,096 x 1,024 x 4)
SENSE AMPLIFIERS
4096
BANK3
64Mb: x4, x8, x16
SDRAM
1 1
DATA
OUTPUT
4
REGISTER
DQM
A0-A11,
BA0, BA1
2
ADDRESS
14
REGISTER
2
10
BANK
CONTROL
LOGIC
COLUMN-
ADDRESS
COUNTER/
LATCH
10
I/O GATING DQM MASK LOGIC READ DATA LATCH
WRITE DRIVERS
1024
(x4)
COLUMN
DECODER
4
DATA INPUT
4
REGISTER
DQ0-DQ3
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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CAS#
RAS#
CKE CLK
CS#
CONTROL
LOGIC
DECODE
COMMAND
MODE REGISTER
12
REFRESH
COUNTER
12
FUNCTIONAL BLOCK DIAGRAM
8 Meg x 8 SDRAM
BANK2
BANK1
12
ROW-
ADDRESS
MUX
BANK0
12
ROW-
ADDRESS
LATCH
&
DECODER
4096
BANK0
MEMORY
ARRAY
(4,096 x 512 x 8)
SENSE AMPLIFIERS
4096
BANK3
64Mb: x4, x8, x16
SDRAM
1 1
DATA
OUTPUT
8
REGISTER
DQM
A0-A11,
BA0, BA1
2
ADDRESS
14
REGISTER
2
9
BANK
CONTROL
LOGIC
COLUMN­ADDRESS
COUNTER/
LATCH
9
I/O GATING
DQM MASK LOGIC
READ DATA LATCH
WRITE DRIVERS
512
(x8)
COLUMN DECODER
8
DATA INPUT
8
REGISTER
DQ0-DQ7
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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WE#
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CAS#
RAS#
CKE CLK
CS#
CONTROL
LOGIC
DECODE
COMMAND
MODE REGISTER
12
REFRESH
COUNTER
12
FUNCTIONAL BLOCK DIAGRAM
4 Meg x 16 SDRAM
BANK3
BANK2
BANK1
12
ROW-
ADDRESS
MUX
BANK0
12
ROW-
ADDRESS
LATCH
&
DECODER
4096
BANK0
MEMORY
ARRAY
(4,096 x 256 x 16)
SENSE AMPLIFIERS
4096
64Mb: x4, x8, x16
SDRAM
2 2
DATA
OUTPUT
16
REGISTER
DQML, DQMH
A0-A11,
BA0, BA1
2
ADDRESS
14
REGISTER
2
8
BANK
CONTROL
LOGIC
COLUMN­ADDRESS
COUNTER/
LATCH
8
I/O GATING
DQM MASK LOGIC
READ DATA LATCH
WRITE DRIVERS
256
(x16)
COLUMN
DECODER
16
DATA INPUT
16
REGISTER
DQ0-DQ15
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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SDRAM
PIN DESCRIPTIONS
PIN NUMBERS SYMBOL TYPE DESCRIPTION
38 CLK Input Clock: CLK is driven by the system clock. All SDRAM input signals are
sampled on the positive edge of CLK. CLK also increments the internal burst counter and controls the output registers.
37 CKE Input Clock Enable: CKE activates (HIGH) and deactivates (LOW) the CLK
signal. Deactivating the clock provides PRECHARGE POWER-DOWN and SELF REFRESH operation (all banks idle), ACTIVE POWER-DOWN (row active in any bank) or CLOCK SUSPEND operation (burst/access in progress). CKE is synchronous except after the device enters power­down and self refresh modes, where CKE becomes asynchronous until after exiting the same mode. The input buffers, including CLK, are disabled during power-down and self refresh modes, providing low standby power. CKE may be tied HIGH.
19 CS# Input Chip Select: CS# enables (registered LOW) and disables (registered
HIGH) the command decoder. All commands are masked when CS# is registered HIGH. CS# provides for external bank selection on systems with multiple banks. CS# is considered part of the command code.
16, 1 7, 1 8 WE#, CAS#, Input Command Inputs: WE#, CAS#, and RAS# (along with CS#) define the
RAS# command being entered.
39 x4, x8: DQM Input Input/Output Mask: DQM is an input mask signal for write accesses and
an output enable signal for read accesses. Input data is masked when
15, 39 x16: DQML, DQM is sampled HIGH during a WRITE cycle. The output buffers are
DQMH placed in a High-Z state (two-clock latency) when DQM is sampled
HIGH during a READ cycle. On the x4 and x8, DQML (Pin 15) is a NC and DQMH is DQM. On the x16, DQML corresponds to DQ0-DQ7 and DQMH corresponds to DQ8-DQ15. DQML and DQMH are considered same state when referenced as DQM.
20, 21 BA0, BA1 Input Bank Address Inputs: BA0 and BA1 define to which bank the ACTIVE,
READ, WRITE or PRECHARGE command is being applied.
23-26, 29-34, 22, 35 A0-A11 Input Address Inputs: A0-A11 are sampled during the ACTIVE command
(row-address A0-A11) and READ/WRITE command (column-address A0­A9 [x4]; A0-A8 [x8]; A0-A7 [x16]; with A10 defining auto precharge) to select one location out of the memory array in the respective bank. A10 is sampled during a PRECHARGE command to determine if all banks are to be precharged (A10[HIGH]) or bank selected by BA0, BA1 (A1[LOW]). The address inputs also provide the op-code during a LOAD MODE REGISTER command.
2, 4, 5, 7, 8, 10, 11, 13, 42, DQ0-DQ15 x1 6: I/O Data Input/Output: Data bus for x16 (4, 7, 10, 13, 42, 45, 48, and 51 are
44, 45, 47, 48, 50, 51, 53 NCs for x8; and 2, 4, 7, 8, 10, 13, 42, 45, 47, 48, 51, and 53 are NCs for x4).
2, 5, 8, 11, 44, 47, 50, 53 DQ0-DQ7 x8: I/O Data Input/Output: Data bus for x8 (2, 8, 47, 53 are NCs for x4).
5, 11, 44, 50 DQ0-DQ3 x4: I/O Data Input/Output: Data bus for x4.
40 NC – No Connect: These pins should be left unconnected. 36 NC – Address input (A12) for the 256Mb and 512Mb devices
3, 9, 43, 49 VDDQ Supply DQ Power: Isolated DQ power on the die for improved noise immunity.
6, 12, 46, 52 VSSQ Supply DQ Ground: Isolated DQ ground on the die for improved noise
immunity.
1, 14, 27 V
28, 41, 54 V
DD
SS
Supply Power Supply: +3.3V ±0.3V. Supply Ground.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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SDRAM
FUNCTIONAL DESCRIPTION
In general, the 64Mb SDRAMs (4 Meg x 4 x 4 banks, 2 Meg x 8 x 4 banks and 1 Meg x 16 x 4 banks) are quad­bank DRAMs which operate at 3.3V and include a syn­chronous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the x4’s 16,777,216-bit banks is organized as 4,096 rows by 1,024 columns by 4 bits. Each of the x8’s 16,777,216-bit banks is organized as 4,096 rows by 512 columns by 8 bits. Each of the x16’s 16,777,216-bit banks is organized as 4,096 rows by 256 columns by 16 bits.
Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and con­tinue for a programmed number of locations in a pro­grammed sequence. Accesses begin with the registra­tion of an ACTIVE command which is then followed by a READ or WRITE command. The address bits regis­tered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0 and BA1 select the bank, A0-A11 select the row). The address bits (x4: A0-A9; x8: A0-A8; x16: A0-A7) registered coinci­dent with the READ or WRITE command are used to select the starting column location for the burst access.
Prior to normal operation, the SDRAM must be ini­tialized. The following sections provide detailed infor­mation covering device initialization, register defini­tion, command descriptions and device operation.
Initialization
SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined opera­tion. Once power is applied to VDD and VDDQ (simulta­neously) and the clock is stable (stable clock is defined as a signal cycling within timing constraints specified for the clock pin), the SDRAM requires a 100µs delay prior to issuing any command other than a COMMAND INHIBIT or a NOP. Starting at some point during this 100µs period and continuing at least through the end of this period, COMMAND INHIBIT or NOP commands should be applied.
Once the 100µs delay has been satisfied with at least one COMMAND INHIBIT or NOP command hav­ing been applied, a PRECHARGE command should be applied. All banks must be precharged, thereby plac­ing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are complete, the SDRAM is ready for mode register programming. Because the mode register will power up in an unknown state, it should be loaded prior to applying any operational command.
Register Definition
MODE REGISTER
The mode register is used to define the specific mode of operation of the SDRAM. This definition includes the selection of a burst length, a burst type, a CAS latency, an operating mode and a write burst mode, as shown in Figure 1. The mode register is programmed via the LOAD MODE REGISTER command and will re­tain the stored information until it is programmed again or the device loses power.
Mode register bits M0-M2 specify the burst length, M3 specifies the type of burst (sequential or inter­leaved), M4-M6 specify the CAS latency, M7 and M8 specify the operating mode, M9 specifies the WRITE burst mode, and M10 and M11 are reserved for future use.
The mode register must be loaded when all banks are idle, and the controller must wait the specified time before initiating the subsequent operation. Violating either of these requirements will result in unspecified operation.
Burst Length
Read and write accesses to the SDRAM are burst oriented, with the burst length being programmable, as shown in Figure 1. The burst length determines the maximum number of column locations that can be ac­cessed for a given READ or WRITE command. Burst lengths of 1, 2, 4, or 8 locations are available for both the sequential and the interleaved burst types, and a full­page burst is available for the sequential type. The full-page burst is used in conjunction with the BURST TERMINATE command to generate arbitrary burst lengths.
Reserved states should not be used, as unknown operation or incompatibility with future versions may result.
When a READ or WRITE command is issued, a block of columns equal to the burst length is effectively se­lected. All accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely se­lected by A1-A9 (x4), A1-A8 (x8) or A1-A7 (x16) when the burst length is set to two; by A2-A9 (x4), A2-A8 (x8) or A2-A7 (x16) when the burst length is set to four; and by A3-A9 (x4), A3-A8 (x8) or A3-A7 (x16) when the burst length is set to eight. The remaining (least significant) address bit(s) is (are) used to select the starting loca­tion within the block. Full-page bursts wrap within the page if the boundary is reached.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
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SDRAM
Burst Type
Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit M3.
The ordering of accesses within a burst is deter­mined by the burst length, the burst type and the start­ing column address, as shown in Table 1.
Figure 1
Mode Register Definition
A11
11
Reserved* WB
*Should program
M11, M10 = “0, 0”
to ensure compatibility
with future devices.
A10
A9
9
10
Op Mode
A6 A5 A4
A7
654
7
M7
M8
0-0-Defined
A3A8A2A1A0
382
Burst LengthCAS Latency BT
M1
M2
0
0
0
0
1
0
1
0
0
1
0
1
1
1
1
1
M3
0 1
M5
M6
0
0
0
0
1
0
1
0
0
1
0
1
1
1
1
1
M6-M0
-
Address Bus
1
0
Mode Register (Mx)
Burst Length
M0
M3 = 0
0
1
1
2
0
4
1
8
0
Reserved
1
Reserved
0
Reserved
1
Full Page
Burst Type
Sequential
Interleaved
M4
0 1 0 1 0 1 0 1
Operating Mode
Standard Operation All other states reserved
CAS Latency
Reserved Reserved
Reserved Reserved Reserved Reserved
M3 = 1
1 2 4
8 Reserved Reserved Reserved Reserved
2 3
Table 1
Burst Definition
Burst Starting Column Order of Accesses Within a Burst
Length Address Type = Sequential Type = Interleaved
A0
2
4
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
8
0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full n = A0-A9/8/7
Page
(y) (location 0-y)
NOTE: 1. For full-page accesses: y = 1,024 (x4); y = 512 (x8);
y = 256 (x16).
2. For a burst length of two, A1-A9 (x4), A1-A8 (x8), or A1-A7 (x16) select the block-of-two burst; A0 selects the starting column within the block.
3. For a burst length of four, A2-A9 (x4), A2-A8 (x8), or A2-A7 (x16) select the block-of-four burst; A0­A1 select the starting column within the block.
4. For a burst length of eight, A3-A9 (x4), A3-A8 (x8), or A3-A7 (x16) select the block-of-eight burst; A0­A2 select the starting column within the block.
5. For a full-page burst, the full row is selected and A0-A9 (x4), A0-A8 (x8), or A0-A7 (x16) select the starting column.
6. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.
7. For a burst length of one, A0-A9 (x4), A0-A8 (x8), or A0-A7 (x16) select the unique column to be accessed, and mode register bit M3 is ignored.
0 0-1 0-1 1 1-0 1-0
A1 A0
0 0 0-1-2-3 0-1-2-3 0 1 1-2-3-0 1-0-3-2 1 0 2-3-0-1 2-3-0-1 1 1 3-0-1-2 3-2-1-0
Cn, Cn + 1, Cn + 2
Cn + 3, Cn + 4...
…Cn - 1,
Not Supported
Cn…
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M9
0 1
Write Burst Mode
Programmed Burst Length
Single Location Access
9
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SDRAM
CAS Latency
The CAS latency is the delay, in clock cycles, be­tween the registration of a READ command and the availability of the first piece of output data. The la­tency can be set to two or three clocks.
If a READ command is registered at clock edge n, and the latency is m clocks, the data will be available by clock edge n + m. The DQs will start driving as a result of the clock edge one cycle earlier (n + m - 1), and provided that the relevant access times are met, the data will be valid by clock edge n + m. For example, assuming that the clock cycle time is such that all relevant access times are met, if a READ command is registered at T0 and the latency is programmed to two clocks, the DQs will start driving after T1 and the data will be valid by T2, as shown in Figure 2. Table 2 indicates the operating fre­quencies at which each CAS latency setting can be used.
Reserved states should not be used as unknown operation or incompatibility with future versions may result.
Figure 2
CAS Latency
T2T1 T3T0
CLK
COMMAND
DQ
NOPREAD
t
LZ
t
AC
NOP
t
OH
D
OUT
Operating Mode
The normal operating mode is selected by setting M7 and M8 to zero; the other combinations of values for M7 and M8 are reserved for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts.
Test modes and reserved states should not be used because unknown operation or incompatibility with future versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2 applies to both READ and WRITE bursts; when M9 = 1, the programmed burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses.
Table 2
CAS Latency
ALLOWABLE OPERATING
FREQUENCY (MHz)
CAS CAS
SPEED LATENCY = 2 LATENCY = 3
-6 – £ 166
-7E £ 133 £ 143
-75 £ 100 £ 133
-8E £ 100 £ 125
CAS Latency = 2
T2T1 T3T0
CLK
COMMAND
DQ
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NOPREAD
CAS Latency = 3
NOP
t
t
NOP
LZ
AC
t
OH
D
OUT
T4
DON’T CARE
UNDEFINED
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SDRAM
Commands
Truth Table 1 provides a quick reference of available commands. This is followed by a written de­scription of each command. Three additional Truth
TRUTH TABLE 1 – COMMANDS AND DQM OPERATION
(Note: 1)
NAME (FUNCTION) CS# RAS# CAS# WE# DQM ADDR DQs NOTES
COMMAND INHIBIT (NOP) H XXXX X X NO OPERATION (NOP) L H H H X X X ACTIVE (Select bank and activate row) L L H H X Bank/Row X 3 READ (Select bank and column, and start READ burst) L H L H L/H8Bank/Col X 4 WRITE (Select bank and column, and start WRITE burst) L H L L L/H8Bank/Col Valid 4 BURST TERMINATE L H H L X X Active PRECHARGE (Deactivate row in bank or banks) L L H L X Code X 5 AUTO REFRESH or SELF REFRESH L L L H X X X 6, 7
(Enter self refresh mode) LOAD MODE REGISTER L L L L X Op-Code X 2 Write Enable/Output Enable ––––L – Active 8 Write Inhibit/Output High-Z ––––H – High-Z 8
Tables appear following the Operation section; these tables provide current state/next state information.
NOTE: 1. CKE is HIGH for all commands shown except SELF REFRESH.
2. A0-A11 define the op-code written to the mode register.
3. A0-A11 provide row address, and BA0, BA1 determine which bank is made active.
4. A0-A9 (x4), A0-A8 (x8), or A0-A7 (x16) provide column address; A10 (HIGH) enables the auto precharge feature (nonpersistent), while A10 (LOW) disables the auto precharge feature; BA0, BA1 determine which bank is being read from or written to.
5. A10 (LOW): BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are “Don’t Care.”
6. This command is AUTO REFRESH if CKE is (HIGH), SELF REFRESH if CKE is LOW.
7. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE.
8. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay).
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COMMAND INHIBIT
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The COMMAND INHIBIT function prevents new commands from being executed by the SDRAM, re­gardless of whether the CLK signal is enabled. The SDRAM is effectively deselected. Operations already in progress are not affected.
NO OPERATION (NOP)
The NO OPERATION (NOP) command is used to perform a NOP to an SDRAM which is selected (CS# is LOW). This prevents unwanted commands from being registered during idle or wait states. Operations already in progress are not affected.
LOAD MODE REGISTER
The mode register is loaded via inputs A0-A11. See mode register heading in the Register Definition section. The LOAD MODE REGISTER command can only be is­sued when all banks are idle, and a subsequent execut­able command cannot be issued until tMRD is met.
ACTIVE
The ACTIVE command is used to open (or activate) a row in a particular bank for a subsequent access. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-A11 selects the row. This row remains active (or open) for accesses until a PRECHARGE command is issued to that bank. A PRECHARGE command must be issued before open­ing a different row in the same bank.
READ
The READ command is used to initiate a burst read access to an active row. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-A9 (x4), A0-A8 (x8), or A0-A7 (x16) selects the starting column location. The value on input A10 de­termines whether or not auto precharge is used. If auto precharge is selected, the row being accessed will be precharged at the end of the READ burst; if auto precharge is not selected, the row will remain open for subsequent accesses. Read data appears on the DQs subject to the logic level on the DQM inputs two clocks earlier. If a given DQM signal was registered HIGH, the corresponding DQs will be High-Z two clocks later; if the DQM signal was registered LOW, the DQs will pro­vide valid data.
64Mb: x4, x8, x16
SDRAM
precharge is selected, the row being accessed will be precharged at the end of the WRITE burst; if auto precharge is not selected, the row will remain open for subsequent accesses. Input data appearing on the DQs is written to the memory array subject to the DQM in­put logic level appearing coincident with the data. If a given DQM signal is registered LOW, the correspond­ing data will be written to memory; if the DQM signal is registered HIGH, the corresponding data inputs will be ignored, and a WRITE will not be executed to that byte/column location.
PRECHARGE
The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks. The bank(s) will be available for a subsequent row access a specified time (tRP) after the PRECHARGE command is issued. Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs BA0, BA1 select the bank. Otherwise BA0, BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or WRITE commands being issued to that bank.
AUTO PRECHARGE
Auto precharge is a feature which performs the same individual-bank PRECHARGE function de­scribed above, without requiring an explicit command. This is accomplished by using A10 to enable auto precharge in conjunction with a specific READ or WRITE command. A precharge of the bank/row that is ad­dressed with the READ or WRITE command is auto­matically performed upon completion of the READ or WRITE burst, except in the full-page burst mode, where auto precharge does not apply. Auto precharge is non­persistent in that it is either enabled or disabled for each individual READ or WRITE command.
Auto precharge ensures that the precharge is initi­ated at the earliest valid stage within a burst. The user must not issue another command to the same bank until the precharge time (tRP) is completed. This is determined as if an explicit PRECHARGE command was issued at the earliest possible time, as described for each burst type in the Operation section of this data sheet.
WRITE
The WRITE command is used to initiate a burst write access to an active row. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-A9 (x4), A0-A8 (x8), or A0-A7 (x16) selects the starting column location. The value on input A10 de­termines whether or not auto precharge is used. If auto
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BURST TERMINATE
The BURST TERMINATE command is used to trun­cate either fixed-length or full-page bursts. The most recently registered READ or WRITE command prior to the BURST TERMINATE command will be truncated, as shown in the Operation section of this data sheet.
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AUTO REFRESH
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AUTO REFRESH is used during normal operation of the SDRAM and is analagous to CAS#-BEFORE-RAS# (CBR) REFRESH in conventional DRAMs. This com­mand is nonpersistent, so it must be issued each time a refresh is required. All active banks must be PRECHARGED prior to issuing an AUTO REFRESH com­mand. The AUTO REFRESH command should not be issued until the minimum tRP has been met after the PRECHARGE command as shown in the operation sec­tion.
The addressing is generated by the internal refresh controller. This makes the address bits “Don’t Care” during an AUTO REFRESH command. The 64Mb SDRAM requires 4,096 AUTO REFRESH cycles every 64ms (tREF), regardless of width option. Providing a distributed AUTO REFRESH command every 15.625µs will meet the refresh requirement and ensure that each row is refreshed. Alternatively, 4,096 AUTO REFRESH commands can be issued in a burst at the minimum cycle rate (tRC), once every 64ms.
SELF REFRESH
The SELF REFRESH command can be used to retain data in the SDRAM, even if the rest of the system is powered down. When in the self refresh mode, the
64Mb: x4, x8, x16
SDRAM
SDRAM retains data without external clocking. The SELF REFRESH command is initiated like an AUTO REFRESH command except CKE is disabled (LOW). Once the SELF REFRESH command is registered, all the inputs to the SDRAM become “Don’t Care,” with the exception of CKE, which must remain LOW.
Once self refresh mode is engaged, the SDRAM pro­vides its own internal clocking, causing it to perform its own AUTO REFRESH cycles. The SDRAM must remain in self refresh mode for a minimum period equal to
t
RAS and may remain in self refresh mode for an indefi-
nite period beyond that.
The procedure for exiting self refresh requires a se­quence of commands. First, CLK must be stable (stable clock is defined as a signal cycling within timing con­straints specified for the clock pin) prior to CKE going back HIGH. Once CKE is HIGH, the SDRAM must have NOP commands issued (a minimum of two clocks) for
t
XSR, because time is required for the completion of
any internal refresh in progress.
Upon exiting the self refresh mode, AUTO REFRESH commands must be issued every 15.625µs or less as both SELF REFRESH and AUTO REFRESH utilize the row refresh counter.
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SDRAM
Operation
BANK/ROW ACTIVATION
Before any READ or WRITE commands can be is­sued to a bank within the SDRAM, a row in that bank must be “opened.” This is accomplished via the AC­TIVE command, which selects both the bank and the row to be activated (see Figure 3).
After opening a row (issuing an ACTIVE command), a READ or WRITE command may be issued to that row, subject to the tRCD specification. tRCD (MIN) should be divided by the clock period and rounded up to the next whole number to determine the earliest clock edge after the ACTIVE command on which a READ or WRITE command can be entered. For example, a tRCD specifi­cation of 20ns with a 125 MHz clock (8ns period) results in 2.5 clocks, rounded to 3. This is reflected in Figure 4, which covers any case where 2 < tRCD (MIN)/tCK £ 3. (The same procedure is used to convert other specifi­cation limits from time units to clock cycles).
A subsequent ACTIVE command to a different row in the same bank can only be issued after the previous active row has been “closed” (precharged). The mini­mum time interval between successive ACTIVE com­mands to the same bank is defined by tRC.
A subsequent ACTIVE command to another bank can be issued while the first bank is being accessed, which results in a reduction of total row-access over­head. The minimum time interval between successive ACTIVE commands to different banks is defined by
t
RRD.
Figure 3
Activating a Specific Row in a
Specific Bank
CLK
CKE
CS#
RAS#
CAS#
WE#
A0–A10, A11
BA0, BA1
HIGH
ADDRESS
ADDRESS
ROW
BANK
Figure 4
Example: Meeting tRCD (MIN) When 2 < tRCD (MIN)/tCK < 3
T2T1 T3T0
CLK
COMMAND
NOPACTIVE
t
RCD
NOP
READ or
WRITE
DON’T CARE
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14
T4
Page 15
READs
CLK
DQ
T2T1 T3T0
CAS Latency = 3
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
T4
NOP
DON’T CARE
UNDEFINED
CLK
DQ
T2T1 T3T0
CAS Latency = 2
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
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READ bursts are initiated with a READ command, as shown in Figure 5.
The starting column and bank addresses are pro­vided with the READ command, and auto precharge is either enabled or disabled for that burst access. If auto precharge is enabled, the row being accessed is precharged at the completion of the burst. For the ge­neric READ commands used in the following illustra­tions, auto precharge is disabled.
During READ bursts, the valid data-out element from the starting column address will be available fol­lowing the CAS latency after the READ command. Each subsequent data-out element will be valid by the next positive clock edge. Figure 6 shows general timing for each possible CAS latency setting.
64Mb: x4, x8, x16
SDRAM
Upon completion of a burst, assuming no other com­mands have been initiated, the DQs will go High-Z. A full-page burst will continue until terminated. (At the end of the page, it will wrap to column 0 and continue.)
Data from any READ burst may be truncated with a subsequent READ command, and data from a fixed­length READ burst may be immediately followed by data from a READ command. In either case, a continu­ous flow of data can be maintained. The first data ele­ment from the new burst follows either the last ele­ment of a completed burst or the last desired data ele­ment of a longer burst which is being truncated. The new READ command should be issued x cycles
CLK
CKE
CS#
RAS#
CAS#
WE#
A0-A9: x4 A0-A8: x8 A0-A7: x16
A11: x4
A9, A11: x8
A8, A9, A11: x16
A10
BA0,1
Figure 5
READ Command
HIGH
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
COLUMN
ADDRESS
BANK
ADDRESS
Figure 6
CAS Latency
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SDRAM
before the clock edge at which the last desired data element is valid, where x equals the CAS latency minus one. This is shown in Figure 7 for CAS latencies of two and three; data element n + 3 is either the last of a burst of four or the last desired of a longer burst. The 64Mb SDRAM uses a pipelined architecture and therefore
Figure 7
Consecutive READ Bursts
T2T1 T4T3 T6T5T0
CLK
COMMAND
ADDRESS
DQ
READ NOP NOP NOP NOP
BANK,
COL n
NOP
D
OUT
n
does not require the 2n rule associated with a prefetch architecture. A READ command can be initiated on any clock cycle following a previous READ command. Full­speed random read accesses can be performed to the same bank, as shown in Figure 8, or each subsequent READ may be performed to a different bank.
READ
X = 1 cycle
BANK, COL b
D
D
OUT
n + 1
OUT
n + 2
OUT
D n + 3
D
OUT
b
CAS Latency = 2
T2T1 T4T3 T6T5T0
CLK
COMMAND
ADDRESS
DQ
READ NOP NOP NOP NOP
BANK,
COL n
CAS Latency = 3
NOP
D
OUT
n
NOTE: Each READ command may be to any bank. DQM is LOW.
READ
X = 2 cycles
BANK, COL b
D
OUT
n + 1
OUT
D
n + 2
TRANSITIONING DATA
OUT
D
n + 3
DON’T CARE
T7
NOP
OUT
D
b
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CLK
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64Mb: x4, x8, x16
SDRAM
Figure 8
Random READ Accesses
T2T1 T4T3 T5T0
COMMAND
ADDRESS
DQ
CLK
COMMAND
ADDRESS
DQ
READ NOP
BANK,
COL n
CAS Latency = 2
READ READ READ NOP
BANK,
COL a
BANK,
COL x
BANK,
COL m
OUT
D
OUT
n
D
OUT
a
D
x
OUT
D
m
T2T1 T4T3 T6T5T0
READ NOP NOP
BANK,
COL n
READ
BANK,
COL a
READ READ NOP
BANK, COL x
BANK, COL m
OUT
D
OUT
n
D
a
D
OUT
x
OUT
D
m
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CAS Latency = 3
TRANSITIONING DATA
NOTE: Each READ command may be to any bank. DQM is LOW.
17
DON’T CARE
Page 18
64Mb: x4, x8, x16
DON’T CARE
READ NOP NOPNOP NOP
DQM
CLK
DQ
D
OUT
n
T2T1 T4T3T0
COMMAND
ADDRESS
BANK,
COL n
WRITE
DIN b
BANK, COL b
T5
DS
t
HZ
t
NOTE: A CAS latency of three is used for illustration. The
READ command
may be to any bank, and the WRITE command may be to any bank.
TRANSITIONING DATA
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SDRAM
Data from any READ burst may be truncated with a subsequent WRITE command, and data from a fixed­length READ burst may be immediately followed by data from a WRITE command (subject to bus turn­around limitations). The WRITE burst may be initiated on the clock edge immediately following the last (or last desired) data element from the READ burst, provided that I/O contention can be avoided. In a given system design, there may be a possibility that the device driv­ing the input data will go Low-Z before the SDRAM DQs go High-Z. In this case, at least a single-cycle delay should occur between the last read data and the WRITE command.
The DQM input is used to avoid I/O contention, as shown in Figures 9 and 10. The DQM signal must be asserted (HIGH) at least two clocks prior to the WRITE command (DQM latency is two clocks for output
Figure 9
READ to WRITE
T2T1 T4T3T0
CLK
buffers) to suppress data-out from the READ. Once the WRITE command is registered, the DQs will go High-Z (or remain High-Z), regardless of the state of the DQM signal, provided the DQM was active on the clock just prior to the WRITE command that truncated the READ command. If not, the second WRITE will be an invalid WRITE. For example, if DQM was LOW during T4 in Figure 10, then the WRITEs at T5 and T7 would be valid, while the WRITE at T6 would be invalid.
The DQM signal must be de-asserted prior to the WRITE command (DQM latency is zero clocks for input buffers) to ensure that the written data is not masked. Figure 9 shows the case where the clock frequency al­lows for bus contention to be avoided without adding a NOP cycle, and Figure 10 shows the case where the additional NOP is needed.
Figure 10
READ to WRITE With
Extra Clock Cycle
DQM
COMMAND
ADDRESS
NOTE: A CAS latency of three is used for illustration. The
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READ NOP NOP
BANK, COL n
DQ
TRANSITIONING DATA
command may be to any bank, and the WRITE command may be to any bank. If a burst of one is used, then DQM is not required.
NOP
t
CK
t
HZ
D
OUT
n
DON’T CARE
WRITE
BANK,
COL b
DIN b
t
DS
READ
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SDRAM
A fixed-length READ burst may be followed by, or truncated with, a PRECHARGE command to the same bank (provided that auto precharge was not acti­vated), and a full-page burst may be truncated with a PRECHARGE command to the same bank. The PRECHARGE command should be issued x cycles be­fore the clock edge at which the last desired data ele­ment is valid, where x equals the CAS latency minus one. This is shown in Figure 11 for each possible CAS latency; data element n + 3 is either the last of a burst of
Figure 11
READ to PRECHARGE
T2T1 T4T3 T6T5T0
CLK
COMMAND
ADDRESS
READ NOP NOP NOP NOPNOP
BANK a,
COL n
four or the last desired of a longer burst. Following the PRECHARGE command, a subsequent command to the same bank cannot be issued until tRP is met. Note that part of the row precharge time is hidden during the access of the last data element(s).
In the case of a fixed-length burst being executed to completion, a PRECHARGE command issued at the optimum time (as described above) provides the same operation that would result from the same fixed-length burst with auto precharge. The disadvantage of the
T7
t
RP
PRECHARGE
X = 1 cycle
BANK
(a or all)
ACTIVE
BANK a,
ROW
DQ
CLK
COMMAND
ADDRESS
READ NOP NOP NOP NOPNOP
BANK a,
COL n
DQ
NOTE: DQM is LOW.
CAS Latency = 2
CAS Latency = 3
D
D
n
OUT
OUT
D
n + 1
OUT
n + 2
T2T1 T4T3 T6T5T0
PRECHARGE
BANK
(a or all)
D
n
OUT
OUT
D
n + 1
TRANSITIONING DATA
D
n + 3
X = 2 cycles
D n + 2
OUT
OUT
T7
t
RP
ACTIVE
BANK a,
ROW
OUT
D
n + 3
DON’T CARE
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SDRAM
PRECHARGE command is that it requires that the com­mand and address buses be available at the appropri­ate time to issue the command; the advantage of the PRECHARGE command is that it can be used to trun­cate fixed-length or full-page bursts.
Full-page READ bursts can be truncated with the BURST TERMINATE command, and fixed-length READ bursts may be truncated with a BURST TERMINATE
Figure 12
Terminating a READ Burst
T2T1 T4T3 T6T5T0
CLK
COMMAND
ADDRESS
READ NOP NOP NOP
BANK, COL n
NOP
command, provided that auto precharge was not acti­vated. The BURST TERMINATE command should be issued x cycles before the clock edge at which the last desired data element is valid, where x equals the CAS latency minus one. This is shown in Figure 12 for each possible CAS latency; data element n + 3 is the last desired data element of a longer burst.
BURST
TERMINATE
X = 1 cycle
NOP
DQ
CLK
COMMAND
ADDRESS
DQ
NOTE: DQM is LOW.
OUT
CAS Latency = 2
D
OUT
n
OUT
D
n + 1
D n + 2
OUT
D n + 3
T2T1 T4T3 T6T5T0
D
OUT
n
BURST
TERMINATE
OUT
D n + 1
X = 2 cycles
D
n + 2
OUT
READ NOP NOP NOP NOP
BANK, COL n
CAS Latency = 3
NOP
TRANSITIONING DATA
D
OUT
n + 3
DON’T CARE
T7
NOP
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WRITEs
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WRITE bursts are initiated with a WRITE command, as shown in Figure 13.
The starting column and bank addresses are provided with the WRITE command, and auto precharge is either enabled or disabled for that access. If auto precharge is enabled, the row being accessed is precharged at the completion of the burst. For the ge­neric WRITE commands used in the following illustra­tions, auto precharge is disabled.
During WRITE bursts, the first valid data-in ele­ment will be registered coincident with the WRITE com­mand. Subsequent data elements will be registered on each successive positive clock edge. Upon completion of a fixed-length burst, assuming no other commands have been initiated, the DQs will remain High-Z and any additional input data will be ignored (see Figure
14). A full-page burst will continue until terminated. (At the end of the page, it will wrap to column 0 and continue.)
Data for any WRITE burst may be truncated with a subsequent WRITE command, and data for a fixed­length WRITE burst may be immediately followed by data for a WRITE command. The new WRITE command can be issued on any clock following the previous WRITE command, and the data provided coincident with the new command applies to the new command.
64Mb: x4, x8, x16
SDRAM
An example is shown in Figure 15. Data n + 1 is either the last of a burst of two or the last desired of a longer burst. The 64Mb SDRAM uses a pipelined architecture and therefore does not require the 2n rule associated with a prefetch architecture. A WRITE command can be initiated on any clock cycle following a previous WRITE command. Full-speed random write accesses within a page can be performed to the same bank, as shown in Figure 16, or each subsequent WRITE may be performed to a different bank.
Figure 14
WRITE Burst
T2T1 T3T0
CLK
COMMAND
ADDRESS
DQ
WRITE
BANK,
COL n
D
IN
n
NOP NOP
IN
D
n + 1
NOP
CLK
CKE
CS#
RAS#
CAS#
WE#
A0-A9: x4 A0-A8: x8 A0-A7: x16
A11: x4
A9, A11: x8
A8, A9, A11: x16
A10
BA0,1
Figure 13
WRITE Command
HIGH
COLUMN ADDRESS
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
BANK
ADDRESS
TRANSITIONING DATA
NOTE: Burst length = 2. DQM is LOW.
DON’T CARE
Figure 15
WRITE to WRITE
T2T1T0
CLK
COMMAND
ADDRESS
DQ
BANK,
COL n
IN
D
n
TRANSITIONING DATA
NOTE: DQM is LOW. Each WRITE command may
be to any bank.
NOPWRITE WRITE
BANK, COL b
D
n + 1
IN
D
b
DON’T CARE
IN
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21
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Data for any WRITE burst may be truncated with a
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subsequent READ command, and data for a fixed­length WRITE burst may be immediately followed by a subsequent READ command. Once the READ com­mand is registered, the data inputs will be ignored, and WRITEs will not be executed. An example is shown in Figure 17. Data n + 1 is either the last of a burst of two or the last desired of a longer burst.
Data for a fixed-length WRITE burst may be fol­lowed by, or truncated with, a PRECHARGE command to the same bank (provided that auto precharge was not activated), and a full-page WRITE burst may be truncated with a PRECHARGE command to the same bank. The PRECHARGE command should be issued
Figure 16
Random WRITE Cycles
T2T1 T3T0
CLK
64Mb: x4, x8, x16
SDRAM
t
WR after the clock edge at which the last desired input data element is registered. The auto precharge mode requires a tWR of at least one clock plus time, regardless of frequency. In addition, when truncating a WRITE burst, the DQM signal must be used to mask input data for the clock edge prior to, and the clock edge coinci­dent with, the PRECHARGE command. An example is shown in Figure 18. Data n + 1 is either the last of a burst of two or the last desired of a longer burst. Following the PRECHARGE command, a subsequent command to the same bank cannot be issued until
In the case of a fixed-length burst being executed to completion, a PRECHARGE command issued at the optimum time (as described above) provides the same operation that would result from the same fixed-length burst with auto precharge. The disadvantage of the PRECHARGE command is that it requires that the com­mand and address buses be available at the appropri­ate time to issue the command; the advantage of the PRECHARGE command is that it can be used to trun­cate fixed-length or full-page bursts.
t
RP is met.
CLK
COMMAND
ADDRESS
DQ
COMMAND
ADDRESS
DQ
BANK, COL n
D
IN
n
WRITE
BANK, COL n
D
IN
n
WRITE
BANK,
COL a
D
IN
a
WRITE WRITE
BANK, COL x
IN
D
x
TRANSITIONING DATA
Figure 17
WRITE to READ
T2T1 T3T0
NOPWRITE
D
n + 1
READ NOP NOP
BANK, COL b
IN
TRANSITIONING DATA
BANK, COL m
IN
D
m
DON’T CARE
T4 T5
NOP
D
OUT
b
DON’T CARE
OUT
D b + 1
Figure 18
WRITE to PRECHARGE
T2T1 T4T3T0
CLK
t
WR @ tCLK ≥ 15ns
DQM
t
RP
NOPWRITE
n + 1
NOPWRITE
n + 1
PRECHARGE
BANK
(a or all)
t
WR
D
IN
NOP
PRECHARGE
BANK
(a or all)
t
D
IN
WR
TRANSITIONING DATA
COMMAND
DQ
DQM
DQ
BANK a,
COL n
D
IN
n
BANK a,
COL n
D
IN
n
ADDRESS
t
WR = tCLK < 15ns
COMMAND
ADDRESS
NOTE: DQM could remain LOW in this example if the WRITE burst is a fixed length of two.
T5
T6
NOPNOP
ACTIVE
BANK a,
t
RP
ROW
NOPNOP
DON’T CARE
NOP
ACTIVE
BANK a,
ROW
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22
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64Mb: x4, x8, x16
DON’T CARE
t
RAS
t
RCD
t
RC
All banks idle
Input buffers gated off
Exit power-down mode.
()(
)
()(
)
()(
)
t
CKS
> t
CKS
COMMAND
NOP ACTIVE
Enter power-down mode.
NOP
CLK
CKE
()(
)
()(
)
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SDRAM
Fixed-length or full-page WRITE bursts can be trun­cated with the BURST TERMINATE command. When truncating a WRITE burst, the input data applied coin­cident with the BURST TERMINATE command will be ignored. The last data written (provided that DQM is LOW at that time) will be the input data applied one clock previous to the BURST TERMINATE command. This is shown in Figure 19, where data n is the last desired data element of a longer burst.
Figure 19
Terminating a WRITE Burst
T2T1T0
CLK
COMMAND
ADDRESS
NOTE: DQMs are LOW.
WRITE
BANK, COL n
DQ
TRANSITIONING DATA
BURST
TERMINATE
DIN
n
NEXT
COMMAND
(ADDRESS)
(DATA)
DON’T CARE
Figure 20
PRECHARGE Command
PRECHARGE
The PRECHARGE command (Figure 20) is used to deactivate the open row in a particular bank or the open row in all banks. The bank(s) will be available for
t
a subsequent row access some specified time (
RP) af­ter the PRECHARGE command is issued. Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs BA0, BA1 select the bank. When all banks are to be precharged, inputs BA0, BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or WRITE commands being issued to that bank.
POWER-DOWN
Power-down occurs if CKE is registered LOW coinci­dent with a NOP or COMMAND INHIBIT when no ac­cesses are in progress. If power-down occurs when all banks are idle, this mode is referred to as precharge power-down; if power-down occurs when there is a row active in any bank, this mode is referred to as active power-down. Entering power-down deactivates the in­put and output buffers, excluding CKE, for maximum power savings while in standby. The device may not remain in the power-down state longer than the re­fresh period (64ms) since no refresh operations are performed in this mode.
The power-down state is exited by registering a NOP or COMMAND INHIBIT and CKE HIGH at the desired clock edge (meeting
t
CKS). See Figure 21.
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CLK
CKE
HIGH
CS#
RAS#
CAS#
WE#
A0-A9
A10
BA0,1
All Banks
Bank Selected
BANK
ADDRESS
Figure 21
Power-Down
23
Page 24
CLOCK SUSPEND
DON’T CARE
CLK
DQ
D
OUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP
BANK,
COL n
NOP
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
NOTE: For this example, CAS latency = 2, burst length = 4 or greater, and
DQM is LOW.
CKE
INTERNAL
CLOCK
NOP
TRANSITIONING DATA
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The clock suspend mode occurs when a column ac­cess/burst is in progress and CKE is registered LOW. In the clock suspend mode, the internal clock is deacti­vated, “freezing” the synchronous logic.
For each positive clock edge on which CKE is sampled LOW, the next internal positive clock edge is suspended. Any command or data present on the in­put pins at the time of a suspended internal clock edge is ignored; any data present on the DQ pins remains driven; and burst counters are not incremented, as long as the clock is suspended. (See examples in Figures 22 and 23.)
64Mb: x4, x8, x16
SDRAM
Clock suspend mode is exited by registering CKE HIGH; the internal clock and related operation will re­sume on the subsequent positive clock edge.
BURST READ/SINGLE WRITE
The burst read/single write mode is entered by pro­gramming the write burst mode bit (M9) in the mode register to a logic 1. In this mode, all WRITE commands result in the access of a single column location (burst of one), regardless of the programmed burst length. READ commands access columns according to the pro­grammed burst length and sequence, just as in the normal mode of operation (M9 = 0).
Figure 22
Clock Suspend During WRITE Burst
T2T1 T4T3 T5T0
CLK
CKE
INTERNAL
CLOCK
IN
D
n + 1
DON’T CARE
NOPNOP
D
n + 2
IN
COMMAND
ADDRESS
D
WRITE
NOP
BANK, COL n
IN
IN
D
n
TRANSITIONING DATA
Figure 23
Clock Suspend During READ Burst
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24
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CONCURRENT AUTO PRECHARGE
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An access command (READ or WRITE) to another bank while an access command with auto precharge enabled is executing is not allowed by SDRAMs, unless the SDRAM supports CONCURRENT AUTO PRECHARGE. Micron SDRAMs support CONCURRENT AUTO PRECHARGE. Four cases where CONCURRENT AUTO PRECHARGE occurs are defined below.
READ with Auto Precharge
1. Interrupted by a READ (with or without auto
precharge): A READ to bank m will interrupt a READ
Figure 24
READ With Auto Precharge Interrupted by a READ
64Mb: x4, x8, x16
SDRAM
on bank n, CAS latency later. The PRECHARGE to bank n will begin when the READ to bank m is regis­tered (Figure 24).
2. Interrupted by a WRITE (with or without auto precharge): A WRITE to bank m will interrupt a READ on bank n when registered. DQM should be used two clocks prior to the WRITE command to prevent bus contention. The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Figure 25).
T2T1 T4T3 T6T5T0
T7
CLK
COMMAND
Internal States
ADDRESS
NOTE: DQM is LOW.
BANK n
BANK m
DQ
READ - AP
BANK n
Page Active READ with Burst of 4 Interrupt Burst, Precharge
Page Active READ with Burst of 4
BANK n,
COL a
CAS Latency = 3 (BANK n)
READ - AP
BANK m
BANK m,
COL d
CAS Latency = 3 (BANK m)
TRANSITIONING DATA
NOP
t
RP - BANK n
D
OUT
a
NOP NOPNOPNOP
OUT
D a + 1
NOP
Idle
t
RP - BANK m
Precharge
D
OUT
D
OUT
d
d + 1
DON’T CARE
Figure 25
READ With Auto Precharge Interrupted by a WRITE
COMMAND
Internal States
CLK
BANK n
BANK m
T2T1 T4T3 T6T5T0
READ - AP
BANK n
Page
READ with Burst of 4 Interrupt Burst, Precharge
Active
Page Active WRITE with Burst of 4
NOP
WRITE - AP
BANK m
t
RP -
BANK
T7
NOPNOPNOPNOP
NOP
t
n
WR -
Write-Back
Idle
BANK
m
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DQM
BANK n,
COL a
1
ADDRESS
DQ
CAS Latency = 3 (BANK n)
NOTE: 1. DQM is HIGH at T2 to prevent D
OUT
BANK m,
COL d
D
OUT
D
a
IN
d
-a+1 from contending with DIN-d at T4.
25
D
d + 1
IN
IN
D
D
d + 2
d + 3
IN
DON’T CARETRANSITIONING DATA
Page 26
WRITE with Auto Precharge
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3. Interrupted by a READ (with or without auto precharge): A READ to bank m will interrupt a WRITE on bank n when registered, with the data-out appear­ing CAS latency later. The PRECHARGE to bank n will begin after tWR is met, where tWR begins when the READ to bank m is registered. The last valid WRITE to bank n will be data-in register ed one clock prior to the READ to bank m (Figure 26).
Figure 26
WRITE With Auto Precharge Interrupted by a READ
T2T1 T4T3 T6T5T0
CLK
64Mb: x4, x8, x16
SDRAM
4. Interrupted by a WRITE (with or without auto precharge): A WRITE to bank m will interrupt a WRITE on bank n when registered. The PRECHARGE to bank n will begin after the WRITE to bank m is registered. The last valid data WRITE to bank n will be data registered one clock prior to a WRITE to bank m (Figure 27).
t
WR is met, where tWR begins when
T7
COMMAND
Internal States
NOTE: 1. DQM is LOW.
BANK n
BANK m
ADDRESS
DQ
WRITE - AP
BANK n
Page Active WRITE with Burst of 4 Interrupt Burst, Write-Back Precharge
Page Active READ with Burst of 4
BANK n,
COL a
D
IN
a
a + 1
READ - AP
BANK m
t
WR - BANK n
BANK m,
COL d
D
IN
CAS Latency = 3 (BANK m)
NOPNOPNOPNOP
t
RP - BANK n
NOP NOP
D
TRANSITIONING DATA
Figure 27
WRITE With Auto Precharge Interrupted by a WRITE
T2T1 T4T3 T6T5T0
CLK
Internal States
COMMAND
BANK n
BANK m
WRITE - AP
BANK n
Page Active WRITE with Burst of 4 Interrupt Burst, Write-Back Precharge
Page Active WRITE with Burst of 4
NOP
WRITE - AP
BANK m
t
WR - BANK n
NOPNOPNOPNOP
OUT
d
t
RP - BANK n
t
RP - BANK m
D
OUT
d + 1
DON’T CARE
T7
NOP
t
WR - BANK m
Write-Back
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ADDRESS
DQ
NOTE: 1. DQM is LOW.
BANK n,
COL a
D
IN
a
D
a + 1
BANK m,
COL d
D
IN
D
IN
a + 2
IN
d
TRANSITIONING DATA
D
d + 1
IN
D
d + 2
IN
D
d + 3
IN
DON’T CARE
26
Page 27
TRUTH TABLE 2 – CKE
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(Notes: 1-4)
64Mb: x4, x8, x16
SDRAM
CKE
n-1
CKE
CURRENT STATE COMMAND
n
n
ACTION
n
L L Power-Down X Maintain Power-Down
Self Refresh X Maintain Self Refresh
Clock Suspend X Maintain Clock Suspend
L H Power-Down COMMAND INHIBIT or NOP Exit Power-Down 5
Self Refresh COMMAND INHIBIT or NOP Exit Self Refresh 6
Clock Suspend X Exit Clock Suspend 7
H L All Banks Idle COMMAND INHIBIT or NOP Power-Down Entry
All Banks Idle AUTO REFRESH Self Refresh Entry
Reading or Writing VALID Clock Suspend Entry
H H See Truth Table 3
NOTE: 1. CKEn is the logic state of CKE at clock edge n; CKE
2. Current state is the state of the SDRAM immediately prior to clock edge n.
3. COMMANDn is the command registered at clock edge n, and ACTIONn is a result of COMMANDn.
4. All states and sequences not shown are illegal or reserved.
5. Exiting power-down at clock edge n will put the device in the all banks idle state in time for clock edge n + 1 (provided that tCKS is met).
6. Exiting self refresh at clock edge n will put the device in the all banks idle state once tXSR is met. COMMAND INHIBIT or NOP commands should be issued on any clock edges occurring during the tXSR period. A minimum of two NOP commands must be provided during tXSR period.
7. After exiting clock suspend at clock edge n, the device will resume operation and recognize the next command at clock edge n + 1.
was the state of CKE at the previous clock edge.
n-1
NOTES
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27
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SDRAM
TRUTH TABLE 3 – CURRENT STATE BANK n, COMMAND TO BANK n
(Notes: 1-6; notes appear below and on next page)
CURRENT STATE CS# RAS#CAS# WE# COMMAND (ACTION) NOTES
Any H X X X COMMAND INHIBIT (NOP/Continue previous operation)
L H H H NO OPERATION (NOP/Continue previous operation) L L H H ACTIVE (Select and activate row)
Idle L L L H AUTO REFRESH 7
LLLLLOAD MODE REGISTER 7 L L H L PRECHARGE 11 L H L H READ (Select column and start READ burst) 10
Row Active L H L L WRITE (Select column and start WRITE burst) 10
L L H L PRECHARGE (Deactivate row in bank or banks) 8
Read L H L H READ (Select column and start new READ burst) 10
(Auto L H L L WRITE (Select column and start WRITE burst) 10
Precharge L L H L PRECHARGE (Truncate READ burst, start PRECHARGE) 8
Disabled) L H H L BURST TERMINATE 9
Write L H L H READ (Select column and start READ burst) 10 (Auto L H L L WRITE (Select column and start new WRITE burst) 10
Precharge L L H L PRECHARGE (Truncate WRITE burst, start PRECHARGE) 8
Disabled) L H H L BURST TERMINATE 9
NOTE: 1. This table applies when CKE
met (if the previous state was self refresh).
2. This table is bank-specific, except where noted; i.e., the current state is for a specific bank and the commands shown are those allowed to be issued to that bank when in that state. Exceptions are covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and tRP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and
Re a d : A READ burst has been initiated, with auto precharge disabled, and has not yet terminated
Write: A WR ITE burst has been initiated, with auto precharge disabled, and has not yet termi-
4. The following states must not be interrupted by a command issued to the same bank. COMMAND INHIBIT or NOP commands, or allowable commands to the other bank should be issued on any clock edge occurring during these states. Allowable commands to the other bank are determined by its current state and Truth Table 3, and according to Truth Table 4.
Precharging: Starts with registration of a PRECHARGE command and ends when tRP is met. Once tRP is
Row Activating: Starts with registration of an ACTIVE command and ends when tRCD is met. Once tRCD is
Read w/Auto
Precharge Enabled: Starts with registration of a READ command with auto precharge enabled and ends when
Write w/Auto
Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled and ends when
was HIGH and CKEn is HIGH (see Truth Table 2) and after tXSR has been
n-1
no register accesses are in progress. or been terminated. nated or been terminated.
met, the bank will be in the idle state. met, the bank will be in the row active state.
t
RP has been met. Once tRP is met, the bank will be in the idle state.
t
RP has been met. Once tRP is met, the bank will be in the idle state.
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(Continued on next page)
28
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NOTE (continued):
5. The following states must not be interrupted by any executable command; COMMAND INHIBIT or NOP commands must be applied on each positive clock edge during these states.
Refreshing: Starts with registration of an AUTO REFRESH command and ends when
is met, the SDRAM will be in the all banks idle state.
Accessing Mode
Register: Starts with registration of a LOAD MODE REGISTER command and ends when
been met. Once
Precharging All: Starts with registration of a PRECHARGE ALL command and ends when tRP is met. Once tRP
is met, all banks will be in the idle state.
6. All states and sequences not shown are illegal or reserved.
7. Not bank-specific; requires that all banks are idle.
8. May or may not be bank-specific; if all banks are to be precharged, all must be in a valid state for precharging.
9. Not bank-specific; BURST TERMINATE affects the most recent READ or WRITE burst, regardless of bank.
10. READs or WRITEs listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto precharge disabled.
11. Does not affect the state of the bank and acts as a NOP to that bank.
t
MRD is met, the SDRAM will be in the all banks idle state.
SDRAM
t
RC is met. Once tRC
t
MRD has
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29
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SDRAM
TRUTH TABLE 4 – CURRENT STATE BANK n, COMMAND TO BANK m
(Notes: 1-6; notes appear below and on next page)
CURRENT STATE CS# RAS# CAS# WE# COMMAND (ACTION) NOTES
Any H X X X COMMAND INHIBIT (NOP/Continue previous operation)
L H H H NO OPERATION (NOP/Continue previous operation)
Idle XXXXAny Command Otherwise Allowed to Bank m
Row L L H H ACTIVE (Select and activate row)
Activating, L H L H READ (Select column and start READ burst) 7
Active, or L H L L WRITE (Select column and start WRITE burst) 7
Precharging L L H L PRECHARGE
Read L L H H ACTIVE (Select and activate row)
(Auto L H L H READ (Select column and start new READ burst) 7, 10
Precharge L H L L WRITE (Select column and start WRITE burst) 7, 11
Disabled) L L H L PRECHARGE 9
Write L L H H ACTIVE (Select and activate row)
(Auto L H L H READ (Select column and start READ burst) 7, 12
Precharge L H L L WRITE (Select column and start new WRITE burst) 7, 13
Disabled) L L H L PRECHARGE 9
Read L L H H ACTIVE (Select and activate row)
(With Auto L H L H READ (Select column and start new READ burst) 7, 8, 14
Precharge) L H L L WRITE (Select column and start WRITE burst) 7, 8, 15
L L H L PRECHARGE 9
Write L L H H ACTIVE (Select and activate row)
(With Auto L H L H READ (Select column and start READ burst) 7, 8, 16
Precharge) L H L L WRITE (Select column and start new WRITE burst) 7, 8, 17
L L H L PRECHARGE 9
NOTE: 1. This table applies when CKE
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was HIGH and CKEn is HIGH (see Truth Table 2) and after tXSR has been met (if the
previous state was self refresh).
2. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands shown are those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are covered in the notes below.
3. Current state definitions:
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and
Read w/Auto
Precharge Enabled: Starts with registration of a READ command with auto precharge enabled, and ends when
Write w/Auto
Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled, and ends when
n-1
Idle: The bank has been precharged, and tRP has been met.
no register accesses are in progress.
Re a d : A READ burst has been initiated, with auto precharge disabled, and has not yet terminated
or been terminated.
Write: A WR IT E b urst has been initiated, with auto precharge disabled, and has not yet
terminated or been terminated.
t
RP has been met. Once tRP is met, the bank will be in the idle state.
t
RP has been met. Once tRP is met, the bank will be in the idle state.
(Continued on next page)
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NOTE (continued):
4. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.
5. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state only.
6. All states and sequences not shown are illegal or reserved.
7. READs or WRITEs to bank m listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto precharge disabled.
8. CONCURRENT AUTO PRECHARGE: Bank n will initiate the auto precharge command when its burst has been interrupted by bank m’s burst.
9. Burst in bank n continues as initiated.
10. For a READ without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency later (Figure 7).
11. For a READ without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered (Figures 9 and 10). DQM should be used one clock prior to the WRITE command to prevent bus contention.
12. For a WRITE without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered (Figure 17), with the data-out appearing CAS latency later. The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.
13. For a WRITE without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered (Figure 15). The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.
14. For a READ with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency later. The PRECHARGE to bank n will begin when the READ to bank m is registered (Figure 24).
15. For a READ with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered. DQM should be used two clocks prior to the WRITE command to prevent bus contention. The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Figure 25).
16. For a WRITE with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered, with the data-out appearing CAS latency later. The PRECHARGE to bank n will begin after will be data-in registered one clock prior to the READ to bank m (Figure 26).
17. For a WRITE with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered. The PRECHARGE to bank n will begin after tWR is met, where tWR begins when the WRITE to bank m is registered. The last valid WRITE to bank n will be data registered one clock prior to the WRITE to bank m (Figure 27).
t
WR is met, where tWR begins when the READ to bank m is registered. The last valid WRITE to bank n
SDRAM
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
31
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64Mb: x4, x8, x16
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SDRAM
ABSOLUTE MAXIMUM RATINGS*
Voltage on VDD, VDDQ Supply
Relative to VSS ............................................ -1V to +4.6V
Voltage on Inputs, NC or I/O Pins
Relative to V
Operating Temperature,
T
(commercial) ......................................0°C to +70°C
A
Operating Temperature,
SS ............................................ -1V to +4.6V
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
TA (extended; IT parts)...................... -40°C to +85°C
Storage Temperature (plastic) ............ -55°C to +150°C
Power Dissipation ........................................................ 1W
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1, 5, 6; notes appear on page 35); VDD, VDDQ = +3.3V ±0.3V
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
Supply Voltage VDD, VDDQ 3 3.6 V Input High Voltage: Logic 1; All inputs VIH 2VDD + 0.3 V 22 Input Low Voltage: Logic 0; All inputs VIL -0.3 0.8 V 22 Input Leakage Current:
Any input 0V £ VIN £ VDD II -5 5 µA (All other pins not under test = 0V)
Output Leakage Current: DQs are disabled; 0V £ VOUT £ VDDQIOZ -5 5 µ A Output Levels: VOH 2.4 – V
Output High Voltage (IOUT = -4mA) Output Low Voltage (IOUT = 4mA) VOL – 0.4 V
IDD SPECIFICATIONS AND CONDITIONS
(Notes: 1, 5, 6, 11, 13; notes appear on page 35) ; VDD, VDDQ = +3.3V ±0.3V
MAX
PARAMETER/CONDITION
Operating Current: Active Mode; IDD1 150 125 115 95 mA 3, 18, Burst = 2; READ or WRITE; tRC >= tRC (MIN) 19, 32
Standby Current: Power-Down Mode; All banks idle; IDD2 2 222 mA32 CKE = LOW
Standby Current: Active Mode; IDD3 60 45 45 35 mA 3, 12, CKE = HIGH; CS# = HIGH; All banks active after tRCD met; 19, 32 No accesses in progress
Operating Current: Burst Mode; Page burst; IDD4 180 150 140 120 m A 3, 18, READ or WRITE; All banks active 19, 32
Auto Refresh Current:
t
RFC = tRFC (MIN) IDD5 250 230 210 190 m A 3, 12,
CKE = HIGH; CS# = HIGH 18, 19,
t
RFC = 15.625µs IDD6 3 3 3 3 32, 33 Self Refresh Current: Standard IDD 7 1 111 mA 4 CKE £ 0.2V Low power (L) 0.5 0.5 0.5 0.5
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
32
SYMBOL
-6 -7E -75 -8E UNITS NOTES
Page 33
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CAPACITANCE
(Note: 2; notes appear on page 35)
PARAMETER SYMBOL M I N MAX UNITS NOTES
Input Capacitance: CLK CI1 2.5 3.5 pF 29 Input Capacitance: All other input-only pins CI2 2.5 3.8 pF 30 Input/Output Capacitance: DQs CIO 4.0 6.0 pF 31
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(Notes: 5, 6, 8, 9, 11; notes appear on page 35); VDD, VDDQ = +3.3V ±0.3V
AC CHARACTERISTICS -6 -7E -75 -8E PARAMETER SYMBOL MIN MAX MIN MA X MIN MAX MIN MA X UNITS NOTES
Access time from CLK (pos. edge) CL = 3tAC(3) 5.5 5.4 5.4 6 ns 27
CL = 2tAC(2) – 5.4 6 6 ns Address hold time Address setup time CLK high-level width CLK low-level width Clock cycle time CL = 3tCK(3) 6 7 7.5 8 ns 23
CL = 2tCK(2) – 7.5 10 10 ns 23 CKE hold time CKE setup time CS#, RAS#, CAS#, WE#, DQM hold time CS#, RAS#, CAS#, WE#, DQM setup time Data-in hold time Data-in setup time Data-out high-impedance time CL = 3tHZ(3) 5.5 5.4 5.4 6 ns 10
CL = 2tHZ(2) – 5.4 6 6 ns 10 Data-out low-impedance time Data-out hold time (load) Data-out hold time (no load) ACTIVE to PRECHARGE command ACTIVE to ACTIVE command period ACTIVE to READ or WRITE delay Refresh period (4,096 rows) AUTO REFRESH period PRECHARGE command period ACTIVE bank a to ACTIVE bank b command Transition time WRITE recovery time
Exit SELF REFRESH to ACTIVE command
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
LZ1111ns
t
OH2333ns
t
OH
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
REF 64 64 64 64 ms
t
RFC 60 66 66 70 ns
t
RP 18 15 20 20 ns
t
RRD 12 14 15 20 ns
t
t
WR 1 CLK + 1 CLK + 1 CLK + 1 CLK + – 24
1.8 1.8 1.8 1.8 ns 28
N
T 0.3 1.2 0.3 1.2 0.3 1.2 0.3 1.2 ns 7
6ns 7ns 7.5ns 7n s
12 14 15 15 ns 25
t
XSR 70 67 75 80 ns 20
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
33
Page 34
AC FUNCTIONAL CHARACTERISTICS
www.DataSheet4U.com
(Notes: 5, 6, 7, 8, 9, 11; notes appear on page 35) VDD, VDDQ = +3.3V ±0.3V
64Mb: x4, x8, x16
SDRAM
PARAMETER SYMBOL -6 -7E -75 -8E UNITS NOTES
READ/WRITE command to READ/WRITE command CKE to clock disable or power-down entry mode CKE to clock enable or power-down exit setup mode
t
CCD 1 1 1 1
t
CKED 1 1 1 1
t
PED 1 1 1 1 DQM to input data delay tDQD 0 0 0 0 DQM to data mask during WRITEs tDQM 0 0 0 0 DQM to data high-impedance during READs tDQZ 2 2 2 2 WRITE command to input data delay Data-in to ACTIVE command Data-in to PRECHARGE command Last data-in to burst STOP command Last data-in to new READ/WRITE command Last data-in to PRECHARGE command LOAD MODE REGISTER command to ACTIVE or REFRESH command
t
DWD 0 0 0 0
t
DAL 5 4 5 4
t
DPL 2 2 2 2
t
BDL 1 1 1 1
t
CDL 1 1 1 1
t
RDL 2 2 2 2
t
MRD 2 2 2 2
Data-out to high-impedance from PRECHARGE command CL = 3tROH(3) 3 3 3 3
t
CL = 2
ROH(2) 2 2 2 2
t
CK 17
t
CK 14
t
CK 14
t
CK 17
t
CK 17
t
CK 17
t
CK 17
t
CK 15, 21
t
CK 16, 21
t
CK 17
t
CK 17
t
CK 16, 21
t
CK 26
t
CK 17
t
CK 17
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
34
Page 35
NOTES
www.DataSheet4U.com
1. All voltages referenced to VSS.
2. This parameter is sampled. VDD, VDDQ = +3.3V; f = 1 MHz, TA = 25°C; pin under test biased at 1.4V.
DD is dependent on output loading and cycle rates.
3. I Specified values are obtained with minimum cycle time and the outputs open.
4. Enables on-chip refresh and address counters.
5. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature range (0°C £ TA £ +70°C and
-40°C £ T
6. An initial pause of 100µs is required after power­up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VDD and VDDQ must be powered up simultaneously. VSS and VSSQ must be at same potential.) The two AUTO REFRESH command wake-ups should be repeated any time the tREF refresh requirement is exceeded.
7. AC characteristics assume tT = 1ns.
8. In addition to meeting the transition rate specifi­cation, the clock and CKE must transit between VIH and VIL (or between VIL and VIH) in a monotonic manner.
9. Outputs measured at 1.5V with equivalent load:
10.tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid data element will meet
t
OH before going High-Z.
11. AC timing and IDD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V crossover point. If the input transition time is longer than 1 ns, then the timing is referenced at VIL (MAX) and VIH (MIN) and no longer at the 1.5V crossover point. CLK should always be 1.5V referenced to crossover. Re­fer to Micron Technical Note TN-48-09
12. Other input signals are allowed to transition no more than once every two clocks and are otherwise at valid VIH or VIL levels.
£ +85°C for IT parts) is ensured.
A
Q
50pF
64Mb: x4, x8, x16
SDRAM
13. IDD specifications are tested after the device is prop­erly initialized.
14. Timing actually specified by tCKS; clock(s) speci­fied as a reference only at minimum cycle rate.
15. Timing actually specified by tWR plus tRP; clock(s) specified as a reference only at minimum cycle rate.
16. Timing actually specified by tWR.
17. Required clocks are specified by JEDEC function­ality and are not dependent on any timing param­eter.
18. The IDD current will increase or decrease propor­tionally according to the amount of frequency al­teration for the test condition.
19. Address transitions average one transition every two clocks.
20. CLK must be toggled a minimum of two times dur­ing this period.
21. Based on tCK = 10ns for -8E , tCK=7.5ns for -75 and -7E, tCK = 6ns for -6.
22. VIH overshoot: VIH (MAX) = VDDQ + 2V for a pulse width £ 3ns, and the pulse width cannot be greater than one third of the cycle rate. VIL undershoot: VIL (MIN) = -2V for a pulse width £ 3ns.
23. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during ac­cess or precharge states (READ, WRITE, including
t
WR, and PRECHARGE commands). CKE may be
used to reduce the data rate.
24. Auto precharge mode only. The precharge timing budget (tRP) begins 6ns/7ns/7.5ns/7ns after the first clock delay, after the last WRITE is executed.
25. Precharge mode only.
26. JEDEC and PC100 specify three clocks.
27.tAC for -75/-7E at CL = 3 with no load is 4.6ns and is guaranteed by design.
28. Parameter guaranteed by design.
29. PC100 specifies a maximum of 4pF.
30. PC100 specifies a maximum of 5pF.
31. PC100 specifies a maximum of 6.5pF.
32. For -8E, CL = 2 and tCK = 10ns; for -75, CL = 3 and
t
CK = 7.5ns; for -7E, CL = 2 and tCK = 7.5ns; for -6,
CL = 3 and tCK = 6ns.
33. CKE is HIGH during refresh command period
t
RFC (MIN) else CKE is LOW. The IDD6 limit is actu­ally a nominal value and does not result in a fail value.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
35
Page 36
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
()(
)
t
CKS
()(
)
()(
)
t
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
T = 100µs
MIN
INITIALIZE AND LOAD MODE REGISTER
T0 T1 Tn + 1 To + 1 Tp + 1 Tp + 2 Tp + 3
CMS
NOP
t
CKH
t
CMH
High-Z
t
CK
t
CMS
PRECHARGE NOP
ALL BANKS
SINGLE BANK
BANKS
ALL
t
CMH
t
RP
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
t
CMS
t
CMH
AUTO
REFRESH
t
CH
t
RFC
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
t
CL
AUTO
REFRESH
t
RFC
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
1
LOAD MODE
REGISTER
t
t
AH
AS
CODE
t
t
AH
AS
CODE
t
MRD
NOP
ACTIVENOP NOPNOP
ROW
ROW
BANK
Power-up:
DD
and
V CLK stable
Precharge all banks
AUTO REFRESH
AUTO REFRESH
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
*CAS latency indicated in parentheses.
NOTE: 1. If CS# is HIGH at clock HIGH time, all commands applied are NOP.
2. The mode register may be loaded prior to the AUTO REFRESH cycles if desired.
3. JEDEC and PC100 specify three clocks.
4. Outputs are guaranteed High-Z after command is issued.
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
MRD
t
RFC 60 66 66 70 ns
t
RP 18 15 20 20 ns
Program Mode Register
2, 3, 4
DON’T CARE
-6 -7E -75 -8E
3
22 2 2tCK
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
36
Page 37
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
Precharge all
active banks
POWER-DOWN MODE
T0 T1 T2 Tn + 1 Tn + 2
t
t
CKH
CKS
t
t
CMH
CMS
PRECHARGE NOP NOP ACTIVENOP
ALL BANKS
SINGLE BANK
t
t
AH
AS
BANK(S)
High-Z
t
CK
Two clock cycles
t
CL
t
CKS
t
CH
Input buffers gated off while in
1
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
t
CKS
power-down mode All banks idle, enter power-down mode
Exit power-down mode
All banks idle
ROW
ROW
BANK
TIMING PARAMETERS
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
*CAS latency indicated in parentheses. NOTE: 1. Violating refresh requirements during power-down may result in a loss of data.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
-6 -7E -75 -8E
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
37
DON’T CARE
Page 38
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
HZ
m + 1
1
NOPNOP NOP NOPNOPREAD WRITE
COLUMN e
BANK
t
DS
DIN e
2
t
DH
CLOCK SUSPEND MODE
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
t
CKS
t
CMS
t
AS
COLUMN m
t
AS
t
AS
BANK
t
CKH
t
CMH
t
AH
t
AH
t
AH
t
CK
t
CMS
2
t
CMH
t
CL
t
CKStCKH
t
LZ
t
CH
t
AC
t
AC
t
OH
D
OUT
m
D
OUT
NOP
DIN e + 1
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
t
t
LZ1111 ns
t
OH2333 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 2, the CAS latency = 3, and auto precharge is disabled.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
-6 -7E -75 -8E
DON’T CARE
UNDEFINED
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
38
Page 39
AUTO REFRESH MODE
www.DataSheet4U.com
64Mb: x4, x8, x16
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
T0 T1 T2 Tn + 1 To + 1
t
CK
t
t
CKH
CKS
t
t
CMS
CMH
ALL BANKS
SINGLE BANK
t
t
AH
AS
BANK(S)
NOP
t
CH
AUTO
REFRESH
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
()(
)
)
()(
()(
)
)
()(
)
()(
)
t
CL
AUTO
REFRESH
()(
)
()(
)
()(
)
()(
)
NOPNOP
NOPNOPPRECHARGE
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
ACTIVE
ROW
ROW
BANK
DQ
High-Z
t
RP
t
RFC
()(
)
1
t
RFC
()(
)
1
Precharge all
active banks
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
RFC 60 66 66 70 ns
t
RP 18 15 20 20 ns
*CAS latency indicated in parentheses.
NOTE: 1. Each AUTO REFRESH command performs a refresh cycle. Back-to-back commands are not required.
-6 -7E -75 -8E
DON’T CARE
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
39
Page 40
CLK
www.DataSheet4U.com
CKE
COMMAND
DQM/
DQML, DQMH
64Mb: x4, x8, x16
SELF REFRESH MODE
T0 T1 T2 Tn + 1 To + 1 To + 2
t
CK
t
t
CKH
CKS
t
t
CMS
CMH
PRECHARGE NOP NOP
t
CH
t
CL
t
CKS
AUTO
REFRESH
t
≥
RAS(MIN)
()(
()(
()(
()(
()(
)
()(
)
1
()(
)
)
)
)
)
()(
)
()(
)
()(
)
()(
)
()(
)
or COMMAND
INHIBIT
()(
)
()(
)
()(
)
SDRAM
AUTO
REFRESH
A0-A9, A11
ALL BANKS
A10
SINGLE BANK
tt
AH
AS
BA0, BA1
DQ
BANK(S)
High-Z
Precharge all
active banks
t
RP
Enter self refresh mode
CLK stable prior to exiting
self refresh mode
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
()(
)
()(
)
()(
()(
)
)
()(
()(
)
)
()(
)
()(
)
()(
)
t
XSR
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
2
Exit self refresh mode
(Restart refresh time base)
DON’T CARE
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RP 18 15 20 20 ns
t
XSR 70 67 75 80 ns
*CAS latency indicated in parentheses.
NOTES: 1. No maximum time limit for Self Refresh mode. tRAS(MAX) applies to non-Self Refresh mode.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
2.tXSR requires minimum of two clocks regardless of frequency and timing.
40
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64Mb: x4, x8, x16
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SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
READ – WITHOUT AUTO PRECHARGE
T0 T1 T2 T3 T4 T5 T6 T7 T8
t
CKS
t
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CK
t
CKH
CMH
t
AH
t
AH
t
AH
t
RCD CAS Latency
t
RAS
t
RC
t
CL
t
CMS
COLUMN m
DISABLE AUTO PRECHARGE
t
CH
t
CMH
2
BANK BANK(S) BANK
NOPNOP NOPACTIVE NOP READ NOP ACTIVE
t
AC
t
AC
t
LZ
t
OH
DOUT m
OUT
t
AC
t
OH
m+1
1
PRECHARGE
ALL BANKS
SINGLE BANKS
t
AC
t
OH
D
OUT
m+2D
t
RP
t
OH
D
OUT
m+3
t
HZ
ROW
ROW
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
HZ(3) 5.5 5.4 5.4 6 ns
t
HZ(2) – 5.4 6 6 ns
t
LZ1111ns
t
OH2333ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4, the CAS latency = 2, and the READ burst is followed by a “manual” PRECHARGE.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
-6 -7E -75 -8E
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
41
Page 42
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
READ – WITH AUTO PRECHARGE
T0 T1 T2 T4T3 T5 T6 T7 T8
t
CKS
t
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CKH
CMH
t
AH
t
AH
t
AH
t t
t
RCD RAS
RC
t
CK
t
CL
t
CMS
COLUMN m
ENABLE AUTO PRECHARGE
t
BANK
t
CH
CMH
2
CAS Latency
NOPNOP NOPACTIVE NOP READ NOP ACTIVENOP
t
AC
t
AC
t
LZ
t
OH
D
OUT
m
OUT
t
OH
m + 1
1
t
AC
t
AC
t
OH
D
OUT
m + 2D
t
RP
t
OH
D
OUT
m + 3
t
HZ
ROW
ROW
BANK
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4, and the CAS latency = 2.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
HZ(3) 5.5 5.4 5.4 6 ns
t
HZ(2) – 5.4 6 6 ns
t
LZ1111ns
t
OH2333ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
DON’T CARE UNDEFINED
-6 -7E -75 -8E
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
42
Page 43
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
SINGLE READ – WITHOUT AUTO PRECHARGE
T0 T1 T2 T3 T4 T5 T6 T7 T8
t
CKS
t
t
CMS
ACTIVE NOP READ ACTIVE NOP
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CK
t
CKH
CMH
t
AH
t
AH
t
AH
t
RCD CAS Latency
t
RAS
t
RC
t
CL
t
CMS
COLUMN m
DISABLE AUTO PRECHARGE
t
CMH
BANK
t
CH
2
NOP
t
3
PRECHARGE
ALL BANKS
SINGLE BANKS
BANK(S)
t
AC
LZ
t
OH
D
OUT
m
t
HZ
t
RP
NOPNOP
1
ROW
ROW
BANK
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
HZ(3) 5.5 5.4 5.4 6 ns
t
HZ(2) – 5.4 6 6 ns
t
LZ1111ns
t
OH2333ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 1, the CAS latency = 2, and the READ burst is followed by a “manual” PRECHARGE.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
3. PRECHARGE command not allowed else tRAS would be violated.
-6 -7E -75 -8E
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
43
Page 44
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMU
A0-A9, A11
A10
BA0, BA1
DQ
SINGLE READ – WITH AUTO PRECHARGE
T0 T1 T2 T4T3 T5 T6 T7 T8
t
CKS
t
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CKH
CMH
t
AH
t
AH
t
AH
t
RCD
t
CK
t
CL
t
CH
2
2
NOP
t
CMS
COLUMN m
ENABLE AUTO PRECHARGE
READACTIVE NOP NOP
t
CMH
3
BANK
CAS Latency
NOP
t
AC
1
ACTIVENOP
ROW
ROW
BANK
t
OH
D
OUT
m
t
HZ
NOP
t
RAS
t
RC
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 1, and the CAS latency = 2.
2. READ command not allowed or tRAS would be violated.
3. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
HZ(3) 5.5 5.4 5.4 6 ns
t
HZ(2) – 5.4 6 6 ns
t
LZ1111ns
t
OH2333ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
RP
-6 -7E -75 -8E
DON’T CARE UNDEFINED
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
44
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64Mb: x4, x8, x16
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SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
ALTERNATING BANK READ ACCESSES
T0 T1 T2 T4T3 T5 T6 T7 T8
t
CKS
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK 0 BANK 0 BANK 3 BANK 3
t
CKH
t
CMH
t
AH
t
AH
t
AH
t
RCD - BANK 0
t
RAS - BANK 0
t
RC - BANK 0
t
RRD
t
CK
t
CL
t
CMS
COLUMN m
ENABLE AUTO PRECHARGE
t
CH
t
CMH
2
CAS Latency - BANK 0
NOP NOPACTIVE NOP READ NOP ACTIVE
t
AC
t
LZ
ACTIVE
ROW
ROW
t
D
OUT
t
AC
OH
m
t
RCD - BANK 3
ENABLE AUTO PRECHARGE
t
AC
t
OH
OUT
m + 1
1
READ
2
COLUMN b
t
AC
t
OH
D
OUT
m + 2D
CAS Latency - BANK 3
t
AC
t
OH
D
OUT
m + 3
t
RP - BANK 0
ROW
ROW
BANK 0
t
AC
t
OH
D
OUT
b
t
RCD - BANK 0
DON’T CARE UNDEFINED
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
LZ1111ns
t
OH2333ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
RRD 12 14 15 20 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4, and the CAS latency = 2.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
45
-6 -7E -75 -8E
Page 46
64Mb: x4, x8, x16
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SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
READ – FULL-PAGE BURST
T0 T1 T2 T4T3 T5 T6 Tn + 1 Tn + 2 Tn + 3 Tn + 4
t
CKS
t
CMS
AS
ROW
AS
ROW
AS
BANK
t
CL
t
CKH
t
CMH
tAHt
tAHt
tAHt
t
RCD CAS Latency
t
CK
t
CH
t
t
CMS
CMH
COLUMN m
BANK
NOPNOP NOPACTIVE NOP READ NOP BURST TERMNOP NOP
2
t
t
AC
t
LZ
AC
t
OH
D
OUT
m
256 (x16) locations within same row 512 (x8) locations within same row
1,024 (x4) locations within same row
t
AC
t
OH
D
OUT
m+1
Full-page burst does not self-terminate.
Can use BURST TERMINATE command.
1
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
t
AC
()(
)
t
OH
()(
)
D
OUT
m+2
()(
)
Full page completed
NOP
t
AC
t
OH
D
OUT
m-1
t
AC
t
OH
D
OUT
m
3
t
OH
D
OUT
m+1
t
HZ
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
t
t
LZ1111 ns
t
OH2333 ns
t
RCD 18 15 20 20 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the CAS latency = 2.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
3. Page left open; no
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
t
RP.
46
-6 -7E -75 -8E
Page 47
64Mb: x4, x8, x16
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SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
READ – DQM OPERATION
T0 T1 T2 T4T3 T5 T6 T7 T8
t
t
CKS
t
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CK
CKH
CMH
t
AH
t
AH
t
AH
t
RCD CAS Latency
t
CL
t
CMS
COLUMN m
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
t
BANK
t
CH
CMH
2
NOPNOP NOPACTIVE NOP READ NOPNOP NOP
t
AC
t
LZ
t
D
OH
OUT
t
m
HZ
1
t
t
AC
t
LZ
AC
t
OH
OUT
m + 2
t
OH
D
OUT
m + 3D
t
HZ
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AC(3) 5.5 5.4 5.4 6 ns
t
AC(2) – 5.4 6 6 ns
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4, and the CAS latency = 2.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
t
t
LZ1111 ns
t
OH2333 ns
t
RCD 18 15 20 20 ns
DON’T CARE
UNDEFINED
-6 -7E -75 -8E
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
47
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64Mb: x4, x8, x16
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SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
ALL BANKS
SINGLE BANK
2
t
WR
1
t
RP
WRITE – WITHOUT AUTO PRECHARGE
T0 T1 T2 T4T3 T5 T6 T7 T8
t
t
CKS
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
CKH
t
CMH
t
AH
t
AH
t
AH
t
RCD
t
RAS
t
RC
t
CK
t
CL
t
CH
NOPNOP NOPACTIVE NOP WRITE NOPPRECHARGE ACTIVE
t
t
CMS
CMH
3
COLUMN m
DISABLE AUTO PRECHARGE
BANK BANK BANK
t
t
DH
DS
DIN m
DH
DS
DIN m + 1 DIN m + 2 DIN m + 3
t
t
t
t
DH
DS
t
t
DH
DS
ROW
ROW
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RAS 42 120,000 37 120,000 44 120,000 50 120,000 ns
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
WR 12 14 15 15 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4, and the WRITE burst is followed by a “manual” PRECHARGE.
2. 15ns is required between <DIN m> and the PRECHARGE command, regardless of frequency.
3. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
-6 -7E -75 -8E
DON’T CARE
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
48
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64Mb: x4, x8, x16
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SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
WRITE – WITH AUTO PRECHARGE
T0 T1 T2 T4T3 T5 T6 T7 T8 T9
t
CKS
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CKH
t
CMH
t
t
t
AH
AH
AH
t
RCD
t
RAS
t
RC
t
CK
t
CL
t
CH
NOPNOP NOPACTIVE NOP WRITE NOP ACTIVE
t
t
CMS
CMH
2
COLUMN m
ENABLE AUTO PRECHARGE
BANK BANK
t
t
DH
DS
DIN m
DH
DS
DIN m + 1 DIN m + 2 DIN m + 3
t
t
t
t
DH
DS
t
t
DH
DS
t
WR
1
NOP NOP
t
RP
ROW
ROW
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
*CAS latency indicated in parentheses. NOTE: 1. For this example, the burst length = 4.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
DON’T CARE
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RAS 42
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
WR 1 CLK 1 CLK 1 CLK 1 CLK –
120,000
37
+ 6ns + 7ns
120,000
44
+ 7.5ns
120,000
50
+ 7ns
120,000
ns
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
49
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64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
SINGLE WRITE – WITHOUT AUTO PRECHARGE
T0 T1 T2 T4T3 T5 T6 T7 T8
t
CKS
t
CMS
ACTIVE NOP WRITE NOP
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CKH
t
CMH
t
AH
t
AH
t
AH
t
RCD
t
RAS
t
RC
t
CK
t
CL
t
CH
t
t
CMS
CMH
DS
BANK
DIN m
t
DH
t
3
WR
2
COLUMN m
DISABLE AUTO PRECHARGE
t
4
NOP
4
PRECHARGE ACTIVE NOP
ALL BANKS
SINGLE BANK
BANK BANK
NOP
1
ROW
t
RP
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RAS 42
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
WR 12 14 15 15 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 1, and the WRITE burst is followed by a “manual” PRECHARGE.
2. 15ns is required between <DIN m> and the PRECHARGE command, regardless of frequency.
3. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
4. PRECHARGE command not allowed else tRAS would be violated.
-6 -7E -75 -8E
120,000
37
120,000
44
120,000
DON’T CARE
50
120,000
ns
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
50
Page 51
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
SINGLE WRITE – WITH AUTO PRECHARGE
T0 T1 T2 T4T3 T5 T6 T7 T8 T9
t
CKS
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
t
CKH
t
CMH
t
t
t
AH
AH
AH
t t t
RCD RAS RC
t
CK
t
CL
t
CH
3
NOP
3
3
NOP
t
CMS
COLUMN m
ENABLE AUTO PRECHARGE
t
2
t
WR
NOPACTIVE NOP
NOP NOP
WRITE
t
CMH
BANK BANK
t
DH
DS
DIN m
1
ACTIVE
ROW
ROW
t
RP
NOP
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
*CAS latency indicated in parentheses. NOTE: 1. For this example, the burst length = 1.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
3. WRITE command not allowed else tRAS would be violated.
DON’T CARE
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RAS 42
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
WR 1 CLK 1 CLK 1 CLK 1 CLK –
120,000
37
+ 6ns + 7ns
120,000
44
+ 7.5ns
120,000
50
+ 7ns
120,000
ns
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
51
Page 52
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
ALTERNATING BANK WRITE ACCESSES
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
t
CKS
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK 0 BANK 0 BANK 1
t
CKH
t
CMH
t
AH
t
AH
t
AH
t t
t t
t
CK
RCD - BANK 0 RAS - BANK 0
RC - BANK 0 RRD
t
CL
t
CH
t
t
CMS
CMH
2
COLUMN m
ENABLE AUTO PRECHARGE
t
t
DS
DIN m
DH
t
DS
NOP NOPACTIVE NOP WRITE NOP NOP ACTIVE
t
DH
DIN m + 1 DIN m + 2 DIN m + 3
ACTIVE WRITE
ROW
ENABLE AUTO PRECHARGE
ROW
t
t
DH
DS
t
RCD - BANK 1
t
t
DS
DH
t
WR - BANK 0
t
COLUMN b
BANK 1
DS
DIN b
t
1
2
t
t
DH
DS
DIN b + 1 DIN b + 3 t
RP - BANK 0
DH
t
DS
DIN b + 2
t
DH
t
DS
ROW
ROW
BANK 0
t
DH
t
RCD - BANK 0
t
WR - BANK 1
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
DON’T CARE
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RAS 42
t
RC 60 60 66 70 ns
t
RCD 18 15 20 20 ns
t
RP 18 15 20 20 ns
t
RRD 12 14 15 20 ns
t
WR 1 CLK 1 CLK 1 CLK 1 CLK –
120,000
37
+ 6ns + 7ns
120,000
44
+ 7.5ns
120,000
50
+ 7ns
120,000
ns
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
52
Page 53
WRITE – FULL-PAGE BURST
www.DataSheet4U.com
64Mb: x4, x8, x16
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
T0 T1 T2 T3 T4 T5 Tn + 1 Tn + 2 Tn + 3
t
t
CKS
t
CMS
t
AS
ROW
t
AS
ROW
t
AS
BANK
CKH
t
CMH
t
AH
t
AH
t
AH
t
RCD
t
CL
t
CH
t
CK
t
CMS
COLUMN m
BANK
t
DS
DIN m
t
CMH
t
DH
NOPNOP NOPACTIVE NOP WRITE BURST TERMNOP NOP
1
t
t
DH
DS
t
t
DH
DS
DIN m + 1 DIN m + 2 DIN m + 3
256 (x16) locations within same row 512 (x8) locations within same row 1,024 (x4) locations within same row
t
DS
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
t
DH
()(
)
()(
)
t
DS
DIN m - 1
t
DH
t
t
DH
DS
Full-page burst does not self-terminate. Can use BURST TERMINATE command to stop.
2, 3
Full page completed
DON’T CARE
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RCD 18 15 20 20 ns
*CAS latency indicated in parentheses. NOTE: 1. x16: A8, A9 and A11 = “Don’t Care”
x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
2.tWR must be satisfied prior to PRECHARGE command.
3. Page left open; no tRP.
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
53
-6 -7E -75 -8E
Page 54
64Mb: x4, x8, x16
www.DataSheet4U.com
SDRAM
CLK
CKE
COMMAND
DQM /
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
WRITE – DQM OPERATION
1
T0 T1 T2 T3 T4 T5 T6 T7
t
CL
t
CH
t
t
CMS
CMH
BANK
t
DIN m
2
DH
COLUMN m
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
t
DS
NOPNOP NOPACTIVE NOP WRITE NOPNOP
t
t
DS
DIN m + 2
t
DH
t
DS
DIN m + 3
DH
t
CKS
t
CMS
t
t
t
AS
AS
AS
t
t
t
ROW
t
ROW
t
BANK
CKH
CMH
AH
AH
AH
t
CK
t
RCD
TIMING PARAMETERS
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
AH 1 0.8 0.8 1 ns
t
AS 1.5 1.5 1.5 2 ns
t
CH 2.5 2.5 2.5 3 ns
t
CL 2.5 2.5 2.5 3 ns
t
CK(3) 6 7 7.5 8 ns
t
CK(2) – 7.5 10 10 ns
t
CKH 1 0.8 0.8 1 ns
*CAS latency indicated in parentheses.
NOTE: 1. For this example, the burst length = 4.
2. x16: A8, A9 and A11 = “Don’t Care” x8: A9 and A11 = “Don’t Care” x4: A11 = “Don’t Care”
DON’T CARE
-6 -7E -75 -8E
SYMBOL* MIN MAX MIN MAX MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 1.5 2 ns
t
CMH 1 0.8 0.8 1 ns
t
CMS 1.5 1.5 1.5 2 ns
t
DH 1 0.8 0.8 1 ns
t
DS 1.5 1.5 1.5 2 ns
t
RCD 18 15 20 20 ns
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
54
Page 55
54-PIN PLASTIC TSOP (400 mil)
www.DataSheet4U.com
64Mb: x4, x8, x16
SDRAM
.80 TYP
PIN #1 ID
22.22 ±.08
R .75 (2X)
.375 ±.075 TYP
R 1.00 (2X)
1.2 MAX
2.80
.71 .10 (2X)
10.16 ±.08
11.76 ±.20
.10
.15
+.03
-.02
SEE DETAIL A
+.10
.10
-.05
.25
.50 ±.10
.80 TYP
NOTE: 1. All dimensions in millimeters.
2. Package width and length do not include mold protrusion; allowable mold protrusion is 0.25mm per side.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: [email protected], Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron, the M logo, and the Micron logo are trademarks and/or service marks of Micron Technology, Inc.
DETAIL A
64Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 64MSDRAM_F.p65 – Rev. F; Pub. 1/03 ©2003, Micron Technology, Inc.
55
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