•RAD-PAK® technology radiation-hardened against natural
space radiation
• Total dose hardness:
- > 50 Krad (Si), depending upon space mission
• Excellent Single Event Effects:
- SEL
: > 110 MeV/mg/cm
TH
- SEUTH: > 110 MeV/mg/cm
• Package: 28-pin RAD-PAK® flat pack
• Guaranteed on-resistance matching between channels:
< 5
Ω max
• Low on-resistance < 100
• Guaranteed flat on-resistance over specified signal range:
7
Ω max
• Guaranteed Charge Injection: < 10 pC
•I
•I
• ESD Protection > 2000V
• Single-supply operation (+4.5V to +30V)
• Bipolar-supply operation (±4.5V to ±20V)
• Low power consumption, < 1.25 mW
• Rail-to-rail signal handling
• TTL/CMOS-logic compatible
Leakage < 2.5 nA at +85°C
NO(OFF)
COM(OFF)
Leakage < 20 nA at +85°C
2
2
Ω max
Maxwell Technologies’ 306 high-performance, high-precision,
monolithic, CMOS analog multiplexer features a greater than
50 krad (Si) total dose tolerance, depending upon space mission. The patented radiation-hardened R
incorporates radiation shielding in the microcircuit package.
Using Maxwell’s radiation hardened R
nology, this single-ended 1-of-16 device offers very low (less
than 100
between channels and remains flat over the specified analog
signal range. The 306 also offers low leakage over temperature and fast switching speeds. The 306 operates with a single
+4.5V to +30V supply, or bipolar ±4.5V to ± 20V supplies,
while retaining TTL/CMOS- logic input compatibility and fast
switching.
Maxwell Technologies' patented Rad-Pak packaging technology incorporates radiation shielding in the microcircuit package. It eliminates the need for box shielding while providing
the required radiation shielding for a lifetime in orbit or a space
mission.In a GEO orbit, Rad-Pak provides greater than 50
krad (Si) total radiation dose tolerance, dependent upon space
mission. This product is available with packaging and screening up to Class S.
. On-resistance match between channels and flatness are guaranteed only with specified volt-
(MIN)
ages. Flatness is defined as the difference between the maximum and minimum value of on-resistance as measured at the
extremes of the specified analog signal range.
4. Leakage parameters are 100% tested at the maximum rated hot temperature and guaranteed by correlation at +25°C.
5. Off isolation = 20log V
1000543
COM/VNO
, where V
= output and VNO = input to off switch.
COM
12.20.01 Rev 5
All data sheets are subject to change without notice
Important Notice:
These data sheets are created using the chip manufacturers published specifications. Maxwell Technologies verifies
functionality by testing key parameters either by 100% testing, sample testing or characterization.
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.
306
Memory
1000543
12.20.01 Rev 5
All data sheets are subject to change without notice