Datasheet 2SK3349 Datasheet (HIT)

Page 1
Silicon N Channel MOS FET
High Speed Switching
Features
Low on-resistance
RDS = 2.8 typ. (at VGS = 4 V , ID = 25 mA) RDS = 4.8 typ. (at VGS = 2.5 V , ID = 10 mA)
2.5 V gate drive device
Small package (SMPAK)
Outline
2SK3349
ADE-208-804 (Z)
1st.Edition.
June 1999
SMPAK
G
3
1
2
D
1. Source
2. Gate
3. Drain
S
Page 2
2SK3349
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note1
Note 2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10 µs, duty cycle 1%
2. Value on the alumina ceramic board (12.5x20x0.7 mm)
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source leak current I Zero gate voltege drain
GSS
I
DSS
current Gate to source cutoff voltage V Static drain to source on state R resistance R
GS(off)
DS(on)
DS(on)
Forward transfer admittance |yfs|5685—mSI Input capacitance Ciss 6 pF VDS = 10 V Output capacitance Coss 7 pF VGS = 0 Reverse transfer capacitance Crss 1.2 pF f = 1 MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t
d(on)
r
d(off)
f
Note: 3. Pulse test
4. Marking is DN
20——V I
±10——V I
——±5 µAV ——1 µAV
0.8 1.8 V ID = 10 µA, VDS = 5 V — 2.8 3.6 I 4.8 7.2 I
120 ns ID = 25 mA, VGS = 4 V — 450 ns RL = 400 480 ns — 500 ns
20 V ±10 V 50 mA 200 mA 50 mA 100 mW
= 100 µA, VGS = 0
D
= ±100 µA, VDS = 0
G
= ±8 V, VDS = 0
GS
= 20 V, VGS = 0
DS
= 25 mA,VGS = 4 V
D
= 10 mA,VGS = 2.5 V
D
= 25 mA, VDS = 10 V
D
Note 3
Note 3
Note 3
2
Page 3
Main Characteristics
2SK3349
200
Power vs. Temperature Derating
150
100
50
Channel Dissipation *Pch (mW)
0
50 100 150 200
Ambient Temperature Ta ( °C)
*Value on the alumina ceramic boad.(12.5x20x0.7mm)
Typical Output Characteristics
5 V
0.2 4 V
Pulse Test
3 V
0.16
D
0.12
Maximum Safe Operation Area
5
2
1.0
0.5
D
0.2
0.1
0.05
0.02
0.01
0.005
Drain Current I (A)
0.002
0.001
0.0005
Operation in this area is limited by RDS(on)
0.05
0.1 1.0 10 50
0.2 0.5
Drain to Source Voltage V (V)
Value on the alumina ceramic boad.(12.5x20x0.7mm)
DC Operation
25
DS
PW = 10 ms
(1 shot)
20
Typical Transfer Characteristics
0.2 V = 10 V
DS
Pulse Test
0.16
D
0.12
10 µs
100 µs
1 ms
0.08
Drain Current I (A)
0.04
0
246810
Drain to Source Voltage V (V)
V = 2V
GS
DS
0.08
Drain Current I (A)
0.04
0
75 °C
12345
Gate to Source Voltage V (V)
25 °C
Tc = –25 °C
GS
3
Page 4
2SK3349
Drain to Source Satueation Voltage
vs. Gate to Source Voltage
1.0
0.8
0.6
DS(on)
0.4
V (V)
10m A
0.2
25m A
Drain to Source Saturation Voltage
0
24
6
Gate to Source Voltage V (V)
Static Drain to Source on State
Resistance vs. Temperature
10
8
I = 25m A
()
6
DS(on)
R
4
2
V = 2.5 V
GS
4 V
D
10,25,50m A
Static Drain to Source on State
50
Pulse Test
20
()
10
5
DS(on)
R
2
I = 50mA
D
1.0
0.5
8 10 0.01 0.050.02
GS
Static Drain to Source on State Resistance
0.5 V = 10 V
0.2
|yfs| (mS)
Pulse Teat
0.1
10mA
0.05
0.02
0.01
Resistance vs. Drain Current
Pulse Test
V = 4V
GS
Drain Current I (A)
D
Forward Transfer Admittance
vs. Drain Current
DS
Tc = –25 °C
25 °C
75 °C
2.5 V
0.1
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
4
Pulse Test
Forward Transfer Admittance
0.005
0.001 0.002 0.005 0.1 Drain Current I (A)
D
Page 5
2SK3349
Typical Capacitance
10
vs. Drain to Source Voltage
Ciss
Coss
Crss
1.0
Capacitance C (pF)
V = 0
GS
0.1
f = 1 MHz
048121620
Drain to Source Voltage V (V)
DS
Reverse Drain Current
vs. Source to Drain Voltage
0.2 10 V
10000
Switching Characteristics
1000
100
Switching Time t (ns)
V = 2.5 V, V = 10 V
10
PW = 5 µs, duty < 1 %
Drain Current I (A)
GS
0.05
D
DD
t
d(off)
t
d(on)
t
r
t
f
0.10.020.01
0.16
DR
0.12
5 V
V = 0,-5V
GS
0.08
0.04
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
Pulse Test
SD
5
Page 6
2SK3349
Switching Time Test Circuit Waveforms
Vin Monitor
Vin 4 V
50
D.U.T.
R
L
V
DD
= 10 V
Vout Monitor
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
6
Page 7
Package Dimensions
2SK3349
Unit: mm
0.2
+ 0.1 – 0.05
0.5
1.0 .1.6
0.3
+ 0.1 – 0.1
+ 0.2 – 0.2
0.5
+ 0.1 – 0.05
0.2
+ 0.1 – 0.0.5
0.15
+ 0.1
– 0.1
0.7
+ 0.1
0.8
0.4
– 0.1
0.4
+ 0.2
– 0.2
1.6
0.15
0 ~ 0.1
+ 0.1 – 0.05
Hitachi Code
EIAJ
JEDEC
SMPAK
– –
7
Page 8
2SK3349
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
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Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
8
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