The 2SK3305 is N-Channel DMOS FET device that features a
low gate charge and excellent switching characteristics, and
designed for high voltage applications such as switching power
supply, AC adapter.
CHARACTERISTICSSYMBOLTEST CONDITIONSMIN.TYP. MAX. UNIT
2SK3305
Drain Leakage CurrentI
Gate to Source Leakage CurrentI
Gate to Source Cut-off VoltageV
DSS
VDS = 500 V, VGS = 0 V100
GSS
VGS = ±30 V, VDS = 0 V
GS(off)VDS
= 10 V, ID = 1 mA2.53.5V
100nA
±
Forward Transfer Admittance| yfs |VDS = 10 V, ID = 2.5 A1.03.0S
Drain to Source On-state Resi stanceR
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Turn-on Delay Timet
Rise Timet
Turn-off Delay Timet
Fall Timet
Total Gate ChargeQ
Gate to Source ChargeQ
Gate to Drain ChargeQ
Body Diode Forward VoltageV
Reverse Recovery Timet
Reverse Recovery ChargeQ
DS(on)VGS
iss
oss
rss
d(on)
r
d(off)
f
G
GS
GD
F(S-D)IF
rr
rr
= 10 V, ID = 2.5 A1.31.5
VDS = 10 V, VGS = 0 V, f = 1 MHz
VDD = 150 V, ID = 2.5 A, V
G
R
= 10
RL = 60
Ω,
VDD = 400 V, VGS = 10 V, ID = 5.0 A
= 5.0 A, VGS = 0 V0.9V
IF = 5.0 A, VGS = 0 V, di/dt = 50 A /
700pF
115pF
6pF
GS(on)
= 10 V,
Ω
16ns
3ns
33ns
5.5ns
13nC
4nC
4.5nC
s
µ
0.6
3.3
A
µ
Ω
s
µ
C
µ
TEST CIRCUIT 1 AVALANCHE CAPABILITY
PG.
VGS = 20 → 0 V
V
G
R
DD
= 25 Ω
50 Ω
I
D
D.U.T.
I
AS
BV
DSS
V
DS
Starting T
L
DD
V
ch
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
I
G
PG.
= 2 mA
50 Ω
R
L
V
DD
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
R
PG.
V
GS
0
τ
τ = 1 µs
Duty Cycle ≤ 1 %
G
V
V
GS
Wave Form
I
D
Wave Form
GS
10 %
0
I
D
10 %10
0
t
d(on)
V
90
%
I
trt
t
on
GS(on)
D
d(off)tf
%
90
90
%
%
t
off
L
R
V
DD
2
Data Sheet D14003EJ1V0DS00
TYPICAL CHARACTERISTICS (TA = 25°C)
2SK3305
Figure1. DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
02080
4060100 120 140 160
T
c
- Case Temperature - ˚C
Figure3. FORWARD BIAS SAFE OPERATING AREA
100
PW = 10 µs
I
D (pulse)
10
R
DS (on)
Limited
I
D (DC)
Power Dissipation Limited
100 µs
1ms
10 ms
Figure2. TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
100
80
60
40
20
- Total Power Dissipation - W
T
P
20406080 100 120 140 160
0
c
- Case Temperature - ˚C
T
Figure4. DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
10
8
VGS = 20 V
6
Pulsed
10 V
8.0 V
1
- Drain Current - A
D
I
Tc = 25 ˚C
Single Pulse
0.1
1
V
Figure5. DRAIN CURRENT vs.
GATE TO SOURCE VOLTAGE
1000
100
10
1
0.1
- Drain Current - A
D
I
0.01
0.001
0
GS
V
101001000
DS
- Drain to Source Voltage - V
Pulsed
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
51015
- Gate to Source Voltage - V
4
ID - Drain Current - A
2
0
DS - Drain to Source Voltage - V
V
VGS = 6.0 V
481216
Data Sheet D14003EJ1V0DS00
3
Figure6. TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
2SK3305
100
10
1
0.1
0.01
rth(t) - Transient Thermal Resistance - ˚C/W
0.0001 0.0010.010.11101001000
Figure7. FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
10
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
1
0.1
I - Forward Transfer Admittance - S
fs
Iy
0.01
0.01
110
ID - Drain Current - A
VDS = 10 V
Pulsed
PW - Pulse Width - s
1000.1
R
th(ch-A) = 62.5 ˚C/W
Rth(ch-C) = 1.67 ˚C/W
Tc = 25 ˚C
Single Pulse
Figure8. DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
4.0
3.0
ID = 5.0 A
2.0
ID = 2.5 A
1.0
- Drain to Source On-state Resistance - Ω
DS(on)
R
0.0
101520
V
GS
- Gate to Source Voltage - V
Pulsed
2505
Figure9. DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
3.0
Pulsed
Figure10. GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
4.0
V
DS
= 10 V
I
D
= 1 mA
3.0
2.0
2.0
1.0
1.0
- Gate to Source Cut-off Voltage - V
- Drain to Source On-state Resistance - Ω
0
DS(on)
0.110
R
1
I
D
- Drain Current - A
4
100
Data Sheet D14003EJ1V0DS00
GS(off)
0.0
V
–50050100150200
Tch - Channel Temperature - ˚C
2SK3305
Figure11. DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
3.0
ID = 5.0 A
2.0
ID = 2.5 A
1.0
- Drain to Source On-state Resistance - Ω
0.0
DS(on)
–50050100150
R
T
ch
- Channel Temperature - ˚C
VGS = 10 V
Figure13. CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
10000
VGS = 0 V
f = 1.0 MHz
C
1000
100
- Capacitance - pF
10
rss
, C
oss
1
, C
iss
C
iss
C
oss
C
rss
0.1
11001000
10
DS
- Drain to Source Voltage - V
V
Figure15. REVERSE RECOVERY TIME vs.
DRAIN CURRENT
2000
1800
di/dt = 100 A/µs
GS
= 0 V
V
1600
1400
1200
1000
800
600
400
- Reverse Recovery Time - ns
rr
200
t
0
0.110100
1
IF - Drain Current - A
Figure12. SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
100
Pulsed
10
1
VGS = 10 V
VGS = 0 V
0.1
- Diode Forward Current - A
SD
I
0.01
0.5
V
SD
- Source to Drain Voltage - V
1.00.0
1.5
Figure14. SWITCHING CHARACTERISTICS
100
10
- Switching Time - ns
f
, t
1
d(off)
, t
r
, t
d(on)
t
0.1
0.1100
110
D
- Drain Current - A
I
t
r
t
d(off)
t
d(on)
t
f
DD
= 150 V
V
V
GS
= 10 V
RG = 10 Ω
Figure16. DYNAMIC INPUT/OUTPUT CHARACTERISTICS
800
ID = 5.0 A
700
600
VDD = 400 V
250 V
500
125 V
400
300
200
V
- Drain to Source Voltage - V
100
DS
V
DS
V
GS
14
12
10
8
6
4
2
4281061214
QG - Gate Charge - nC
- Gate to Source Voltage - V
GS
V
Data Sheet D14003EJ1V0DS00
5
2SK3305
Figure17. SINGLE AVALANCHE ENERGY vs
STARTING CHANNEL TEMPERATURE
150
125
100
EAS = 125 mJ
D(peak)
= I
I
RG = 25 Ω
VGS = 20 V → 0 V
V
DD
= 150 V
75
50
25
- Single Avalanche Energy - mJ
AS
E
0
25
5075100125
Starting T
ch
- Starting Channel Temperature - ˚C
AS
150175
Figure18. SINGLE AVALANCHE CURRENT vs
INDUCTIVE LOAD
100
RG = 25 Ω
VDD = 150 V
VGS = 20 V → 0 V
Starting Tch = 25 ˚C
10
IAS = 5.0 A
1
IAS - Single Avalanche Current - A
0.1
100 µ
1 m10 m
L - Inductive Load - H
E
AS
= 125 mJ
100 m
6
Data Sheet D14003EJ1V0DS00
PACKAGE DRAWINGS (Unit: mm)
2SK3305
1) TO-220AB (MP-25)
10.6 MAX.
1
10.0
2 3
3.0±0.3
4
1.3±0.2
0.75±0.1
2.54 TYP.
φ
3.6±0.2
5.9 MIN.6.0 MAX.
2.54 TYP.
15.5 MAX.12.7 MIN.
0.5±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
4.8 MAX.
1.3±0.2
2.8±0.2
2) TO-262 (MP-25 Fin Cut)
(10)
4
2 3
1
1.3±0.2
0.75±0.3
2.54 TYP.2.54 TYP.
1.0±0.5
8.5±0.2
12.7 MIN.
4.8 MAX.
0.5±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
1.3±0.2
2.8±0.2
3) TO-263 (MP-25ZJ)
(10.0)
4
1.0±0.5
1.4±0.2
0.7±0.2
2.54 TYP.2.54 TYP.
Remark
123
Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately
degrade the device operation. Steps must be taken to stop generation of static electricity as much as
possible, and quickly dissipate it once, when it has occurred.
8.5±0.2
5.7±0.4
2.8±0.2
4.8 MAX.
(0.5R)
(0.8R)
1.Gate
2.Drain
3.Source
4.Fin (Drain)
1.3±0.2
0.5±0.2
EQUIVALENT CIRCUIT
Drain (D)
Body
Gate (G)
Source (S)
Diode
Data Sheet D14003EJ1V0DS00
7
2SK3305
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8
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