The 2SK3304 is N-Channel MOS FET device that features a
Low gate charge and excellent switching characteristics, and
designed for high voltage applications such as switching
power supply.
CHARACTERISTICSSYMBOLTEST CONDITIONSMIN.TYP. MAX. UNIT
2SK3304
Drain Leakage CurrentI
Gate to Source Leakage CurrentI
Gate to Source Cut-off VoltageV
DSS
VDS = 900 V, VGS = 0 V100
GSS
VGS = ±30 V, VDS = 0 V±100nA
GS(off)VDS
= 10 V, ID = 1.0 mA2.53.5V
Forward Transfer Admittance| yfs |VDS = 20 V, ID = 4.0 A2.54.7S
Drain to Source On-state Resi stanceR
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Turn-on Delay Timet
Rise Timet
Turn-off Delay Timet
Fall Timet
Total Gate ChargeQ
Gate to Source ChargeQ
Gate to Drain ChargeQ
Body Diode Forward VoltageV
Reverse Recovery Timet
Reverse Recovery ChargeQ
DS(on)VGS
iss
VDS = 10 V
V
oss
f = 1 MHz
rss
d(on)
VDD = 150 V
D
I
r
V
d(off)
R
f
G
VDD = 450 V
V
GS
D
I
GD
F(S-D) IF
rr
IF = 7.0 A, VGS = 0 V
di/dt = 50 A/
rr
= 10 V, ID = 4.0 A1.62.0
1300pF
GS
= 0 V
240pF
55pF
20ns
= 4.0 A
GS(on)
= 10 V
G
= 10
RL ≅ 36
Ω,
Ω
44ns
73ns
45ns
44nC
GS
= 10 V
= 7.0 A
6nC
28nC
= 7.0 A, VGS = 0 V1.0V
2.4
s
µ
13.5
A
µ
Ω
s
µ
C
µ
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
L
V
DD
PG.
RG = 25 Ω
50 Ω
VGS = 20 → 0 V
BV
DSS
I
AS
V
I
D
V
DD
DS
Starting T
ch
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
PG.
IG = 2 mA
50 Ω
R
L
V
DD
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
R
G
PG.
GS
V
0
τ = 1 s
Duty Cycle ≤ 1 %
R
V
DD
τ
µ
GS
V
Wave Form
I
D
Wave Form
V
GS
10 %
0
90 %
I
D
10 %
0
t
d(on)
r
t
on
t
90 %
V
GS
(on)
90 %
I
D
10 %
t
d(off)
t
f
t
off
2
Data Sheet D13992EJ1V0DS00
Page 3
TYPICAL CHARACTERISTICS (TA = 25 °C)
2SK3304
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
2040 6080 100 120 140 160
C
- Case Temperature - °C
T
FORWARD BIAS SAFE OPERATING AREA
100
I
D(pulse)
I
D(DC)
=
10
DS(on)
R
(at V
1
- Drain Current - A
D
I
TC = 25
Single Pulse
0.1
1101000100
7 A
Limited
= 10 V)
GS
Power Dissipation Limited
˚C
DS
- Drain to Source Voltage - V
V
100
= 21 A
10
ms
ms
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
140
120
100
80
60
40
- Total Power Dissipation - W
T
20
P
0
2040 6080 100 120 140 160
C
- Case Temperature - °C
T
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
10
P
W
=100
µs
1
ms
8
6
VGS =
20 V
VGS =
10 V
VGS =
6 V
4
- Drain Current - A
D
I
2
Pulsed
0
4
DS
V
8
- Drain to Source Voltage - V
1620
12
FORWARD TRANSFER CHARACTERISTICS
100
TA = 125˚C
10
75˚C
25˚C
−25˚C
1
- Drain Current - A
D
I
0.1
0.01
01015
5
GS
- Gate to Source Voltage - V
V
Pulsed
Data Sheet D13992EJ1V0DS00
3
Page 4
1000
2SK3304
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
10
1
0.1
0.01
- Transient Thermal Resistance - ˚C/W
th(t)
r
0.001
0.0001
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
100
TA = −25˚C
10
1
| - Forward Transfer Admittance - S
fs
y
|
0.1
25˚C
75˚C
125˚C
10.1
D
- Drain Current - A
I
0.0010.010.11101001000
R
th(ch-A)
= 41.7 ˚C
R
th(ch-C)
= 0.96 ˚C
TC = 25˚C
Single Pulse
PW - Pulse Width - s
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
5.0
4.0
3.0
2.0
ID = 7
ID = 4
1.0
VDS = 20
V
Pulsed
10
100
- Drain to Source On-state Resistance - Ω
0.0
0 5 10 15 20 25
DS(on)
R
GS
- Gate to Source Voltage - V
V
Pulsed
A
A
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
8.0
6.0
Pulsed
VGS = 10
V
GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
5.0
V
DS
ID = 1.0 mA
4.0
= 10 V
3.0
4.0
2.0
2.0
- Drain to Source On-state Resistance - Ω
0.0
DS(on)
R
I
4
10.010.1
D
- Drain Current - A
10100
Data Sheet D13992EJ1V0DS00
1.0
- Gate to Source Cut-off Voltage - V
GS(off)
0.0
V
−50
0
50100
ch
- Channel Temperature - ˚C
T
150
Page 5
2SK3304
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
5.0
4.0
3.0
2.0
1.0
- Drain to Source On-state Resistance - Ω
0.0
DS(on)
R
−50
0
ch
- Channel Temperature - ˚C
T
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
100
50
10000
1000
100
10
Ciss, Coss, Crss - Capacitance - pF
1
1
101001000
DS
- Drain to Source Voltage - V
V
VGS = 10 V
ID = 4.0 A
150
VGS = 0 V
f = 1
MHz
C
C
C
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
100
Pulsed
10
1
VGS = 10 V
0.5
VGS = 0 V
1.0
1.5
- Diode Forward Current - A
SD
I
0.1
0.0
SD
- Source to Drain Voltage - V
V
SWITCHING CHARACTERISTICS
1000
iss
100
- Switching Time - ns
oss
rss
f
, t
d(off)
, t
r
, t
d(on)
t
t
f
t
d(off)
t
d(on)
10
VDD = 150 V
V
GS
1
0.1
t
r
110100
D
- Drain Current - A
I
R
G
= 10 V
= 10 Ω
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
10000
1000
100
- Reverse Recovery Time - ns
rr
t
10
0.1
110100
F
- Drain Current - A
I
di/dt = 50 A /
GS
=
0 V
V
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
800
I
D
600
400
VDD = 450 V
300 V
150 V
= 7.0 A
14
12
V
GS
10
8
6
200
- Drain to Source Voltage - V
µ
s
DS
V
0
V
DS
10203060
G
- Gate Charge - nC
Q
4050
4
- Gate to Source Voltage - V
GS
2
V
0
Data Sheet D13992EJ1V0DS00
5
Page 6
2SK3304
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
100
10
IAS = 7.0 A
E
AS
=
147
1
DD
= 150 V
V
GS
= 20 V → 0 V
V
- Single Avalanche Current - A
G
= 25 Ω
R
AS
I
Starting Tch = 25˚C
0.1
0.00010.0010.010.1
L - Inductive Load - H
mJ
SINGLE AVALANCHE ENERGY vs
STARTING CHANNEL TEMPERATURE
150
EAS = 147 mJ
125
100
75
50
25
- Single Avalanche Energy - mJ
AS
E
0
2550
Starting T
75100
ch
- Starting Channel Temperature - ˚C
VDD = 150 V
R
G
= 25 Ω
V
GS
= 20 V → 0 V
D
(peak) = I
I
125150
AS
175
6
Data Sheet D13992EJ1V0DS00
Page 7
PACKAGE DRAWING (Unit : mm)
TO-3P (MP-88)EQUIVALENT CIRCUIT
2SK3304
Drain
Body
Diode
Source
19 MIN.20.5 MAX.
Remark
15.7 MAX.
1.0 TYP.5.0 TYP.3.4 MAX.
1
5.45 TYP.5.45 TYP.
4
23
3.2±0.2
18.7±0.44.5±0.2
1: Gate
2: Drain
3: Source
4: Fin (Drain)
4.7 MAX.
1.5 TYP.
Gate
7.0 TYP.
2.8±0.11.0±0.20.6±0.12.2±0.2
Strong electric field, when exposed to this device, cause destruction of the gate oxide and ultimately
degrade the device operation. Steps must be taken to stop generation of static electricity as much as
possible, and quickly dissipate it once, when it has occurred.
Data Sheet D13992EJ1V0DS00
7
Page 8
2SK3304
•
The information in this document is current as of June, 2000. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
•
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•
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•
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parties arising from the use of these circuits, software and information.
•
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
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semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
•
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The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4
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