This product is N-Channel MOS Field Effect Transistor
designed for high current switching applications.
FEATURES
• Low On-State Resistance
DS(on)1
R
= 34 mΩ MAX. (VGS = 10 V, ID = 15 A)
DS(on)2
R
= 50 mΩ MAX. (VGS = 4.0 V, ID = 15 A)
iss
• Low C
iss
: C
= 920 pF TYP.
• Built-in Gate Protection Diode
• Isolated TO-220 package
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)
Drain to Source VoltageV
Gate to Source VoltageV
Gate to Source VoltageV
Drain Current (DC)I
Drain Current (Pulse)
Total Power Dissipation (T
Total Power Dissipation (T
Note1
C
= 25°C)P
A
= 25°C)P
Channel TemperatureT
Storage TemperatureT
Single Avalanche Current
Single Avalanche Energy
Note2
Note2
DSS
GSS(AC)
GSS(DC)
D(DC)
D(pulse)
I
T
T
ch
stg
AS
I
AS
E
ORDERING INFORMATION
PART NUMBERPACKAGE
2SK3055
60V
±20V
+20, −10V
±30A
±100A
25W
2.0W
150°C
–55 to +150°C
15A
22.5mJ
Isolated TO-220
Notes 1.
2.
PW ≤ 10
Starting Tch = 25 °C, RG = 25 Ω, VGS = 20 V → 0 V
µ
s, Duty cycle ≤ 1 %
THERMAL RESISTANCE
Channel to CaseR
Channel to AmbientR
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.D13094EJ1V0DS00 (1st edition)
Date Published March 1999 NS CP(K)
Printed in Japan
CHARACTERISTICSSYMBOLTEST CONDITIONSMIN.TYP. MAX. UNIT
2SK3055
Drain to Source On-state Resi stanceR
Gate to Source Cut-off VoltageV
DS(on)1VGS
DS(on)2VGS
R
GS(off)VDS
= 10 V, ID = 15 A2434m
= 4.0 V, ID = 15 A3550m
= 10 V, ID = 1 mA1.01.62.0V
Forward Transfer Admittance| yfs |VDS = 10 V, ID = 15 A8.020S
Drain Leakage CurrentI
Gate to Source Leakage CurrentI
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Turn-on Delay Timet
Rise Timet
Turn-off Delay Timet
Fall Timet
Total Gate ChargeQ
Gate to Source ChargeQ
Gate to Drain ChargeQ
Body Diode Forward VoltageV
Reverse Recovery Timet
Reverse Recovery ChargeQ
DSS
VDS = 60 V, VGS = 0 V10
GSS
VGS = ±20 V, VDS = 0 V±10
iss
VDS = 10 V920pF
oss
VGS = 0 V280pF
rss
f = 1 MHz120pF
d(on)ID
d(off)
F(S-D)IF
= 15 A25ns
r
GS(on)
V
= 10 V300ns
VDD = 30 V70ns
f
RG = 10
G
ID = 30 A25nC
GS
VDD = 48 V3.3nC
GD
V
Ω
GS(on)
= 10 V7.0nC
120ns
= 30 A, VGS = 0 V1.0V
rr
If = 30 A, VGS = 0 V45ns
rr
di/dt = 100 A/µs60nC
µ
µ
Ω
Ω
A
A
TEST CIRCUIT 1 AVALANCHE CAPABILITY
VGS = 20 → 0 V
PG.
V
R
G
DD
= 25 Ω
50 Ω
I
D
D.U.T.
I
AS
BV
DSS
V
DS
Starting T
L
DD
V
ch
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
I
G
PG.
= 2 mA
50 Ω
R
L
V
DD
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
R
PG.
V
GS
0
τ
τ = 1 µs
Duty Cycle ≤ 1 %
G
R
G
= 10 Ω
V
V
GS
Wave Form
I
D
Wave Form
GS
10 %
0
I
D
0
%
90
10 %10
t
d(on)
trt
t
on
V
GS(on)
I
D
d(off)tf
90
%
%
90
%
t
off
R
L
V
DD
2
Data Sheet
D13094EJ1V0DS00
Page 3
TYPICAL CHARACTERISTICS (TA = 25 °C)
2SK3055
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
20406080 100 120 140 160
C - Case Temperature - ˚C
T
FORWARD BIAS SAFE OPERATING AREA
1000
I
100
Limited (V
DS(on)
R
ID
10
- Drain Current - A
D
I
(DC) = 30 A
=10 V)
GS
D(pulse) = 100 A
Power Dissipation Limited
100 ms
DC
10 ms
1 ms
100 µs
PW = 10 µs
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
35
30
25
20
15
10
- Total Power Dissipation - W
5
T
P
0
406080 100 120 140 160
20
C
- Case Temperature - ˚C
T
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
80
60
V
GS
=10 V
40
- Drain Current - A
D
20
I
V
GS
= 4.0 V
TC = 25
˚C
Single Pulse
1
0.1
110100
DS -
Drain to Source Voltage - V
V
FORWARD TRANSFER CHARACTERISTICS
100
10
TA = -25˚C
- Drain Current - A
1
D
I
25˚C
75˚C
125˚C
0.1
20468
GS
- Gate to Source Voltage - V
V
Pulsed
V
DS
= 10 V
Pulsed
0
12 3
DS
- Drain to Source Voltage - V
V
Data Sheet
D13094EJ1V0DS00
3
Page 4
1 000
2SK3055
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
10
1
0.1
- Transient Thermal Resistance - ˚C/W
th(t)
r
0.01
10
µµ
100
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
100
10
TA = 125˚C
75˚C
25˚C
1.0
−25˚C
R
th(ch-A)
= 62.5 ˚C/W
R
th(ch-C)
= 5.0 ˚C/W
TC = 25
˚C
Single Pulse
1 m10 m100 m1101001 000
PW - Pulse Width - s
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
V
DS
=10 V
75
Pulsed
50
D
= 15 A
I
25
Pulsed
| - Forward Transfer Admittance - S
fs
0.1
| y
0.1
1
I
D
- Drain Current - A
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
75
50
V
GS
= 4.0 V
V
GS
25
- Drain to Source On-State Resistance - mΩ
0
0.110
DS(on)
R
= 10 V
I
D
- Drain Current - A
10100
Pulsed
1001000
- Drain to Source On-State Resistance - mΩ
DS(on)
R
0
V
GS
- Gate to Source Voltage - V
10
GATE TO SOURCE CUTOFF VOLTAGE vs.
CHANNEL TEMPERATURE
2.0
1.5
1.0
0.5
- Gate to Source Cutoff Voltage - V
0
GS(off)
V
−50
050100150
T
ch
- Channel Temperature - ˚C
VDS = 10 V
I
D
= 1 mA
20
4
Data Sheet
D13094EJ1V0DS00
Page 5
2SK3055
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
80
60
V
GS
= 4.0 V
40
V
GS
50
= 10 V
100150
VGS = 0 V
f = 1 MHz
20
- Drain to Source On-state Resistance - mΩ
0
DS(on)
R
10 000
- 50
0
ch
- Channel Temperature - ˚C
T
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
1 000
- Capacitance - pF
rss
100
, C
oss
, C
iss
C
10
0.1
110100
DS
- Drain to Source Voltage - V
V
ID = 16 A
Pulsed
C
C
oss
C
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
1000
V
GS
= 0 V
100
V
GS
= 10 V
10
1
- Diode Forward Current - A
SD
I
0.1
0
0.5
1.0
Pulsed
1.5
VSD - Source to Drain Voltage - V
SWITCHING CHARACTERISTICS
10 000
iss
1 000
100
- Switching Time - ns
f
rss
, t
d(off)
, t
r
, t
d(on)
t
10
0.1
D
- Drain Current - A
I
VDD = 30 V
GS
= 10 V
V
G
= 10 Ω
R
t
r
t
f
t
d(off)
t
d(on)
101100
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1000
100
10
- Reverse Recovery Time - ns
rr
t
1
0.1
1.010100
F
- Drain Current - A
I
di/dt = 100 A/µs
GS
= 0 V
V
Data Sheet
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
80
60
40
20
- Drain to Source Voltage - V
DS
V
0
D13094EJ1V0DS00
V
DD
= 48 V
30 V
12 V
V
DS
V
GS
ID = 30 A
10203040
G
- Gate Charge - nC
Q
16
12
8
4
- Gate to Source Voltage - V
GS
V
5
Page 6
2SK3055
SINGLE AVALANCHE ENERGY vs.
INDUCTIVE LOAD
100
I
AS
= 15 A
10
1
R
G
= 25 Ω
VDD = 30 V
| - Single Avalanche Energy - mJ
AS
| I
GS
= 20 V → 0 V
V
Starting Tch = 25 ˚C
0.1
µ
10
µ
100
L
- Inductive Load - H
E
AS
= 22.5 mJ
1 m10 m
SINGLE AVALANCHE ENERGY
DERATING FACTOR
160
140
120
VDD = 30 V
G
= 25 Ω
R
V
GS
= 20 V → 0 V
AS
≤ 15 A
I
100
80
60
40
Energy Derating Factor - %
20
0
2550
75100
125150
Starting Tch - Starting Channel Temperature - ˚C
6
Data Sheet
D13094EJ1V0DS00
Page 7
PACKAGE DRAWING (Unit : mm)
Isolated TO-220 (MP-45F)
2SK3055
0.3
±
15.0
0.7 ± 0.1
2.54
10.0 ± 0.3
123
φ
1.3
2.54
±
3.2
0.1
0.2
±
±
3
12.0
0.2
±
MIN.
4
13.5
±
0.2
1.Gate
2.Drain
3.Source
0.2
4.5 ± 0.2
±
0.65
2.7
±
0.2
EQUIVALENT CIRCUIT
Drain (D)
Body
Gate (G)
Gate
Protection
±
0.1
2.5
0.11.5 ± 0.2
Diode
Source (S)
Diode
Remark
The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
Data Sheet
D13094EJ1V0DS00
7
Page 8
2SK3055
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8
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