The 2SK3053 is N-Channel MOS Field Effect Transistor
designed for high current switching applications in consumer
instruments.
FEATURES
• Low On-State Resistance
= 45 mΩ MAX. (VGS = 10 V, ID = 13 A)
RDS(on)1
R
= 70 mΩ MAX. (VGS = 4.0 V, ID = 13 A)
DS(on)2
• Low C
: C
iss
iss
= 790 pF TYP.
• Built-in Gate Protection Diode
• Isolated TO-220 package
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)
Drain to Source VoltageV
Gate to Source VoltageV
Gate to Source VoltageV
Drain Current (DC)I
Drain Current (Pulse)
Total Power Dissipation (T
Total Power Dissipation (T
Note1
= 25°C)P
C
= 25°C)P
A
Channel TemperatureT
Storage TemperatureT
Single Avalanche Current
Single Avalanche Energy
Note2
Note2
DSS
GSS(AC)
GSS(DC)
D(DC)
I
D(pulse)
T
T
ch
stg
I
AS
E
AS
+20, −10V
–55 to +150°C
ORDERING INFORMATION
PART NUMBERPACKAGE
2SK3053Isolated TO-220
(Isolated TO-220)
60V
±20V
±25A
±75A
30W
2.0W
150°C
12.5A
15.6mJ
Notes 1.
!
Document No. D12912EJ3V0DS00 (3rd edition)
Date Published May 2001 NS CP(K)
Printed in Japan
PW ≤ 10
Starting Tch = 25 °C, VDD = 30 V, RG = 25 Ω, VGS = 20 V → 0 V
2.
s, Duty cycle ≤ 1 %
µ
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
CHARACTERISTICSSYMBOLTEST CONDITIONSMIN.TYP. MAX. UNIT
2SK3053
Drain to Source On-state Resi stanceR
Gate to Source Cut-off VoltageV
DS(on)1VGS
DS(on)2VGS
R
GS(off)VDS
= 10 V, ID = 13 A2845mΩ
= 4.0 V, ID = 13 A4670mΩ
= 10 V, ID = 1 mA1.01.62.0V
Forward Transfer Admittance| yfs |VDS = 10 V, ID = 13 A8.016S
Drain Leakage CurrentI
Gate to Source Leakage CurrentI
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Turn-on Delay Timet
!
Rise Timet
Turn-off Delay Timet
Fall Timet
Total Gate ChargeQ
Gate to Source ChargeQ
!
Gate to Drain ChargeQ
Body Diode Forward VoltageV
Reverse Recovery Timet
Reverse Recovery ChargeQ
DSS
VDS = 60 V, VGS = 0 V10
GSS
VGS = ±20 V, VDS = 0 V±10
iss
VDS = 10 V790pF
oss
VGS = 0 V240pF
rss
f = 1 MHz100pF
d(on)ID
d(off)
GS
GD
F(S-D)IF
rr
= 13 A20ns
r
VGS = 10 V200ns
VDD = 30 V65ns
f
RG = 10 Ω95ns
G
ID = 25 A20nC
VDD = 48 V3.0nC
VGS = 10 V6.5nC
= 25 A, VGS = 0 V1.0V
IF = 25 A, VGS = 0 V40ns
rr
di/dt = 100 A/µs45nC
A
µ
A
µ
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
L
V
DD
PG.
RG = 25 Ω
50 Ω
VGS = 20 → 0 V
DSS
BV
I
AS
V
I
D
V
DD
DS
Starting T
ch
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
PG.
IG = 2 mA
50 Ω
R
L
V
DD
!
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
R
PG.
V
GS
G
0
τ
τ = 1 s
µ
Duty Cycle ≤ 1 %
V
GS
L
R
V
GS
Wave Form
V
DD
I
D
Wave Form
10 %
0
90 %
I
D
10 %
0
t
d(on)
r
t
on
t
I
D
t
d(off)
t
off
90 %
90 %
10 %
t
f
2
Data Sheet D12912EJ3V0DS
Page 3
TYPICAL CHARACTERISTICS (TA = 25 °C )
2SK3053
!
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
040206010014080120160
T
ch
- Channel Temperature -
FORWARD BIAS SAFE OPERATING AREA
1000
100
I
D(pulse)
100
ms
Power Dissipation Limited
10
ms
10
R
DS(on)
(at V
Limited
= 10 V)
GS
I
D(DC)
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
35
30
25
20
15
10
- Total Power Dissipation - W
T
5
P
0
0
˚C
PW
=
10
µs
100
µs
1
ms
TC - Case Temperature - ˚C
80204060100140120160
- Drain Current - A
- Drain Current - A
D
D
I
I
1
C
= 25˚C
T
Single Pulse
0.1
0.1
DS
V
1000
100
10
1
0.1
- Transient Thermal Resistance - ˚C/W
th(t)
r
0.01
10
110100
- Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
µ
100
1 m10 m100 m1101001000
µ
PW - Pulse Width - s
Single Pulse
R
R
th(ch-A)
th(ch-C)
= 62.5 ˚C/W
= 4.17 ˚C/W
Data Sheet D12912EJ3V0DS
3
Page 4
2SK3053
FORWARD TRANSFER CHARACTERISTICS
1000
Pulsed
100
10
TA = −50˚C
- Drain Current - A
D
1
I
0.1
0123
V
GS
- Gate to Source Voltage - V
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
100
V
DS
= 10 V
150˚C
Pulsed
10
TA = 150˚C
75˚C
25˚C
1
−50˚C
25˚C
75˚C
V
DS
4
= 10 V
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
100
80
V
GS
60
40
- Drain Current - A
D
I
=10 V
4.0 V
20
5
0
0
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
1.0
V
DS
- Drain to Source Voltage - V
2.0
75
3.0
Pulsed
4.0
Pulsed
50
ID = 13 A
25
| - Forward Transfer Admittance - S
fs
0.1
| y
75
0.1
Pulsed
1
I
D
- Drain Current - A
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
50
V
GS
= 4.0 V
10 V
25
- Drain to Source On-state Resistance - mΩ
0
DS(on)
R
I
D
- Drain Current - A
10100
1010.1
100
- Drain to Source On-state Resistance - mΩ
0
0
DS(on)
R
V
GS
- Gate to Source Voltage - V
GATE TO SOURCE THRESHOLD VOLTAGE vs.
CHANNEL TEMPERATURE
1020
2.0
1.5
1.0
0.5
- Gate to Source Threshold Voltage - V
0
GS(th)
V
−50
050100150
T
ch
- Channel Temperature - ˚C
VDS = 10 V
D
= 1 mA
I
4
Data Sheet D12912EJ3V0DS
Page 5
2SK3053
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
80
V
GS
60
40
= 4.0 V
10 V
20
ID = 13 A
- Drain to Source On-state Resistance - mΩ
DS(on)
R
0
10000
−50
0
50
T
ch
- Channel Temperature - ˚C
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
Pulsed
100150
VGS = 0 V
f = 1 MHz
1000
- Capacitance - pF
rss
100
, C
oss
, C
iss
C
10
0.1
110100
VDS - Drain to Source Voltage - V
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
1000
Pulsed
100
V
GS
= 10 V
10
V
GS
= 0 V
1
- Diode Forward Current - A
SD
I
0.1
0
0.5
1.0
1.5
VSD - Source to Drain Voltage - V
SWITCHING CHARACTERISTICS
1000
t
r
C
iss
C
oss
C
rss
100
- Switching Time - ns
f
, t
10
d(off)
, t
r
, t
d(on)
t
1
I
t
d(off)
t
f
10.1
D
- Drain Current - A
t
d(on)
10100
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1000
100
10
- Reverse Recovery Time - ns
rr
t
1
0.1
1.010100
I
F
- Drain Current - A
di/dt = 100 A/ s
GS = 0 V
V
µ
80
60
40
20
- Drain to Source Voltage - V
DS
V
Data Sheet D12912EJ3V0DS
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
V
DD
= 48 V
30 V
12 V
V
DS
0
0
84122028162432
Q
G
- Gate Charge - nC
V
GS
ID = 25 A
16
12
8
4
- Gate to Source Voltage - V
GS
V
5
Page 6
2SK3053
!
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
100
IAS = 12.5 A
10
1
VDD = 30 V
V
GS
0.1
10
= 20 V → 0 V
R
G
= 25 Ω
Starting T
µ
ch
= 25˚C
100
µ
- Single Avalanche Current - A
AS
I
L - Inductive Load - H
E
AS
=
15.6
mJ
1
m10
SINGLE AVALANCHE ENERGY
DERATING FACTOR
160
140
120
VDD = 30 V
G
= 25 Ω
R
GS
= 20 V → 0 V
V
AS
≤ 12.5 A
I
100
80
60
40
Energy Derating Factor - %
20
0
m
2550
Starting T
75100
ch
- Starting Channel Temperature - ˚C
125150
6
Data Sheet D12912EJ3V0DS
Page 7
PACKAGE DRAWING
Isolated TO-220 (MP-45F)
2SK3053
0.3
±
15.0
0.7 ± 0.1
2.54
10.0 ± 0.3
123
φ
3.2
0.1
±
3
0.2
±
4
1.3 ± 0.2
2.54
1.Gate
2.Drain
3.Source
±
0.2
±
12.0
MIN.
13.5
0.2
4.5 ± 0.2
±
0.65
±
0.2
2.7
EQUIVALENT CIRCUIT
Drain (D)
Body
Gate (G)
Gate
Protection
2.5
±
0.1
0.11.5 ± 0.2
Diode
Source (S)
Diode
Remark 1. This product is designed for consumer application and isn’t suitable for automotive application.
2.
The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
Data Sheet D12912EJ3V0DS
7
Page 8
2SK3053
•
The information in this document is current as of May, 2001. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
•
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
•
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
•
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
•
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
•
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4
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