Datasheet 2SK2075 Datasheet (HIT)

Page 1
Silicon N-Channel MOS FET
Application
High speed power switching
Features
Low on-resistance
Low Drive Current
No secondary breakdown
Suitable for Switching regulator
2SK2075
ADE-208-074
1st. Edition
Outline
TO-3P
G
D
1
2
3
1. Gate
2. Drain
S
(Flange)
3. Source
Page 2
2SK2075
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body to drain diode reverse drain current I Channel dissipation Pch*
DSS
GSS
D
D(pulse)
DR
1
*
2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Notes 1. PW 10 µs, duty cycle 1 %
2. Value at Tc = 25°C
250 V ±30 V 20 A 80 A 20 A 100 W
2
Page 3
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source leak current I Zero gate voltage drain current I Gate to source cutoff voltage V Static drain to source on state
R
GSS
DSS
GS(off)
DS(on)
resistance Forward transfer admittance |yfs| 9 14 S ID = 10 A
Input capacitance Ciss 2400 pF VDS = 10 V Output capacitance Coss 970 pF VGS = 0 Reverse transfer capacitance Crss 145 pF f = 1 MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body to drain diode forward
V
d(on)
r
d(off)
f
DF
voltage Body to drain diode reverse
t
rr
recovery time Note 1. Pulse Test
250 V ID = 10 mA, VGS = 0
±30 V IG = ±100 µA, VDS = 0
——±10 µAVGS = ±25 V, VDS = 0 — 250 µAVDS = 200 V, VGS = 0
2.0 3.0 V ID = 1 mA, VDS = 10 V — 0.105 0.13 ID = 10 A
V
= 10 V*
GS
V
= 10 V*
DS
1
1
30 ns ID = 10 A — 110 ns VGS = 10 V — 220 ns RL = 3 —95—ns — 1.3 V IF = 20 A, VGS = 0
330 ns IF = 20 A, VGS = 0,
di
/ dt = 100 A / µs
F
2SK2075
3
Page 4
2SK2075
160
Power vs. Temperature Derating
120
80
40
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
50
Pulse Test
40
D
10 V
30
8 V
6 V
100
D
Maximum Safe Operation Area
30
PW = 10 ms (1shot)
DC Operation (Tc = 25 °C)
10
Operation in this area is
3
limited by R
DS(on)
100 µs
1 ms
10 µs
1
Drain Current I (A)
0.3 Ta = 25 °C
0.1
1 3 10 30 100 300 1000
Drain to Source Voltage V (V)
Typical Transfer Characteristics
50
40
V = 10 V
DS
Pulse Test
D
30
DS
20
Drain Current I (A)
10
0
246810
Drain to Source Voltage V (V)
5 V
4.5 V
V = 4 V
GS
DS
20
–25 °C
Drain Current I (A)
10
Tc = 25 °C
75 °C
0 246810
Gate to Source Voltage V (V)
GS
4
Page 5
2SK2075
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
5
4
DS(on)
Pulse Test
3
I = 20 A
D
2
10 A
1
5 A
Drain to Source Voltage V (V)
048121620
Gate to Source Voltage V (V)
GS
Static Drain to Source on State Resistance
vs. Temperature
0.5
Pulse Test
0.4
DS(on)
R ( )
0.3 I = 20 A
D
0.2
10 A
5 A
0.1
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
Static Drain to Source on State Resistance
vs. Drain Current
5
Pulse Test
2
DS(on)
1
R ( )
0.5
0.2
0.1
Drain to Source On State Resistance
0.05
V = 15 V
1 2 5 10 20 50 100
Drain Current I (A)
Forward Transfer Admittance vs.
Drain Current
100
30
–25 °C
10
3
Tc = 25 °C
75 °C
1
0.3
V = 10 V Pulse Test
Forward Transfer Admittance |yfs| (S)
0.1
0.1 0.3 1 3 10 30 100 Drain Current I (A)
10 V
GS
D
DS
D
5
Page 6
2SK2075
Body to Drain Diode Reverse
Recovery Time
500
200 100
50
20
di / dt = 100 A / µs V = 0, Ta = 25 °C
GS
10
Reverse Recovery Time trr (ns)
5
0.05 0.1 0.2 0.5 10 20 50 Reverse Drain Current I (A)
DR
Dynamic Input Characteristics
500
I = 20 A
D
400
DS
300
200
100
Drain to Source Voltage V (V)
V
DS
V = 50 V
DD
100 V 200 V
V = 200 V
DD
100 V
50 V
V
GS
0 20406080100
Gate Charge Qg (nc)
Typical Capacitance vs. Drain to Source Voltage
10000
1000
100
Capacitance C (pF)
V = 0
GS
f = 1 MHz
10
01020304050
Drain to Source Voltage V (V)
Switching Characteristics
GS
500
200
20
16
100
12
50
t
r
8
20
Switching Time t (ns)
4
Gate to Source Voltage V (V)
0
10
5
0.5 1 2 5 10 20 50 Drain Current I (A)
Ciss
Coss
Crss
DS
t
d(off)
t
f
t
d(on)
V = 10 V, V = 30 V
GS
DD
PW = 5 µs, duty < 1 %
D
6
Page 7
DR
50
40
30
20
2SK2075
Reverse Drain Current vs.
Source to Drain Voltage
Pulse Test
10
10 V
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
Normalized Transient Thermal Impedance vs. Pulse Width
3
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01 10 µ
100 µ 1 m 10 m
Pulse Width PW (S)
5 V
V = 0, –5 V
GS
SD
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 1.25 °C/W, Tc = 25 °C
P
DM
PW T
100 m 1 10
Tc = 25°C
PW
D =
T
7
Page 8
2SK2075
Switching Time Test Circuit Waveform
Vin Monitor
Vin 10 V
50
D.U.T.
R
L
V
DD
= 30 V
Vout Monitor
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
8
Page 9
1.6
0.5
15.6 ± 0.3
φ3.2 ± 0.2
1.0
2.0
Unit: mm
4.8 ± 0.2
1.5
5.0 ± 0.3
19.9 ± 0.2
14.9 ± 0.2
0.3
1.4 Max
3.6
2.0
0.9
1.0
1.0 ± 0.2
5.45 ± 0.55.45 ± 0.5
18.0 ± 0.5
2.8
0.6 ± 0.2
Hitachi Code JEDEC EIAJ Weight
(reference value)
TO-3P — Conforms
5.0 g
Page 10
Cautions
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2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
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7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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