Datasheet 2SJ587 Datasheet (HIT)

Page 1
Silicon P Channel MOS FET
High Speed Switching
Features
Low on-resistance
RDS = 8.5 typ. (VGS = -4 V , ID = -25 mA) RDS = 15 typ. (VGS = -2.5 V , ID = -10 mA)
2.5 V gate drive device.
Small package (SMPAK)
Outline
2SJ587
ADE-208-801 (Z)
1st.Edition.
June 1999
SMPAK
2
G
3
1
2
D
3
1. Source
2. Gate
3. Drain
1
S
Page 2
2SJ587
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note1
Note 2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10 µs, duty cycle 1%
2. Value on the alumina ceramic board (12.5x 20 x0.7 mm)
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source leak current I Zero gate voltege drain
GSS
I
DSS
current Gate to source cutoff voltage V Static drain to source on state R resistance R
GS(off)
DS(on)
DS(on)
Forward transfer admittance |yfs| 32.5 50 mS I Input capacitance Ciss 13 pF VDS = -10 V Output capacitance Coss 10 pF VGS = 0 Reverse transfer capacitance Crss 1.8 pF f = 1 MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t
d(on)
r
d(off)
f
Note: 3. Pulse test
4. Marking is DP
-20 V ID = -100 µA, VGS = 0
±10 V IG = ±100 µA, VDS = 0
——±5 µAV ——-1µAV
-0.8 -1.8 V ID = -10µA, VDS = -5 V — 4.1 5.0 I 6.0 8.5 I
—22—nsI —48—nsR —50—ns —60—ns
-20 V ±10 V
-50 mA
-200 mA
-50 mA 100 mW
= ±8 V, VDS = 0
GS
= -20 V, VGS = 0
DS
= -25 mA,VGS = -4 V
D
= -10 mA,VGS = -2.5 V
D
= -25 mA, VDS = -10 V
D
= -25 mA, VGS = -4 V
D
= 400
L
Note 3
Note 3
Note 3
2
Page 3
Main Characteristics
2SJ587
Power vs.Temperature Derating
200
150
100
50
Channel Dissipation *Pch (mW)
0
50 100 150 200
Ambient Temperature Ta ( °C)
*Value on the alumina ceramic board.(12.5x20x0.7mm)
Typical Output Characteritics
-0.2
-6 V
-5 V
-4 V
Pulse Test
-0.16
D
-0.12
-3 V
-0.08
Maximum Safe Operation Area
-5
-2
-1.0
-0.5
-0.2
D
-0.1
-0.05
-0.02
-0.01
-0.005
Drain Current I (A)
-0.002
-0.001
-0.0005
-0.05
Operation in this area is limited by RDS(on)
Ta=25 °C
-0.1 -1.0
-0.2 -0.5
Drain to Source Voltage V (V)
Value on the alumina ceramic board.(12.5x20x0.7mm)
DC Operation
-2 -5
-10 DS
PW = 10 ms
(1 shot)
-20
Typical Transfer Characteristics
-0.2
-0.16
D
-0.12
-0.08
10 µs
100 µs
1 ms
-50
Drain Current I (A)
-0.04
0
-2 -4- -6 -8 -10
Drain to Source Voltage V (V)
V = -2V
GS
DS
Drain Current I (A)
-0.04 75 °C
0
-1 -2 -3 -4 -5
Gate to Source Voltage V (V)
Tc = –25 °C
V = -10 V
25 °C
Pulse Test
DS
GS
3
Page 4
2SJ587
Drain to Source Saturation Voltage
vs. Gate to Source Voltage
2.0 Pulse Test
1.6
1.2
DS(on)
V (V)
0.8
I = -50mA
0.4
Drain to Source Saturation Voltage
D
-25mA
-10m A
0
-2 -4
0
Gate to Source Voltage V (V)
-6
-8 -10 -0.01 -0.05-0.02
GS
Static Drain to Source on State
25
Resistance vs. Temperature
I = -25m A
D
20
()
15
DS(on)
10
R
-2.5V
V = -4V
-10m A, -25m A
GS
-10m A
5
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Pulse Test
Case Temperature Tc ( °C)
Static Drain to Sourceon State
Resistance vs. Drain Current
50
Pulse Test
-2.5 V
20
V = -4 V
GS
()
10
5
DS(on)
R
2
1.0
0.05
Static Drain to Source on State Resistance
Drain Current I (A)
D
Forward TransferAdmittance
vs. Drain Current
0.5 VDS=-10V
0.2
Pulse Test
Tc = -25 °C
|yfs| (S)
0.1
0.05
25 °C
75 °C
0.02
0.01
Forward Transfer Admittance
0.005
-0.01
-0.02 -0.05 Drain Current I (A)
D
-0.1
-0.1
4
Page 5
2SJ587
Typical capacitance vs.
100
Drain to Source Voltage
VGS=0 f=1MHz
50
20
10
5
Capacitance C (pF)
2
1
0 -4 -8 -12 -16 -20
Drain to Source Voltage V (V)
Reverse Drain Current vs.
Source to Drain Voltage
-0.2 V = 0,5V
-0.16
DR
-10 V
-0.12
Coss
DS
GS
-5 V
Ciss
Crss
1000
Switching Characteristics
500
200 100
50 20
10
5
Switching Time t (ns)
V = -4 V, V = -10 V
2 1
-0.01 -0.1
-0.02
GS
PW = 5 µs, duty < 1 %
Drain Current I (A)
DD
-0.05
D
t
d(on)
t
r
t
f
t
d(off)
-0.08
-0.04
Reverse Drain Current I (A)
0
-0.4 -0.8 -1.2 -1.6 -2.0
Source to Drain Voltage V (V)
Pulse Test
SD
5
Page 6
2SJ587
Switching Time Test Circuit Waveforms
Vin Monitor
Vin
-4 V
D.U.T.
50
Vout Monitor
R
L
V
DD
= –10 V
Vin
10%
90%
90%
90%
Vout
td(on)
10%
10%
tr
td(off)
t
f
6
Page 7
Package Dimensions
2SJ587
Unit: mm
0.2
+ 0.1 – 0.05
0.5
1.0 .1.6
0.3
+ 0.1 – 0.1
+ 0.2 – 0.2
0.5
+ 0.1 – 0.05
0.2
+ 0.1 – 0.0.5
0.15
+ 0.1
– 0.1
0.7
+ 0.1
0.4
– 0.1
0.8
0.4
+ 0.2
1.6
– 0.2
0.15
0 ~ 0.1
+ 0.1 – 0.05
Hitachi Code
EIAJ
JEDEC
SMPAK
– –
7
Page 8
2SJ587
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
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7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
8
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