Datasheet 2SJ555 Datasheet (HIT)

Page 1
Features
Low on-resistance
= 0.017Ω typ.
DS(on)
Low drive current.
4V gate drive devices.
High speed switching.
Outline
2SJ555
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-634A (Z)
2nd. Edition
Jun 1998
G
TO–3P
D
1. Gate
1
S
2
3
2. Drain (Flange)
3. Source
Page 2
2SJ555
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Avalanche current I Avalanche energy E Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note3
Note3
AR
Note1
Note2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg 50
Electrical Characteristics (Ta = 25°C)
–60 V ±20 V –60 A –240 A –60 A –60 A 308 mJ 125 W
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V Gate to source breakdown voltage V Zero gate voltege drain current I Gate to source leak current I Gate to source cutoff voltage V Static drain to source on state R resistance R
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
DS(on)
DS(on)
–60 V ID = –10mA, VGS = 0 ±20——V I
= ±100µA, VDS = 0
G
–10 µAVDS = –60 V, VGS = 0 ——±10 µAVGS = ±16V, VDS = 0 –1.0 –2.0 V ID = –1mA, VDS = –10V — 0.017 0.022 ID = –30A, VGS = –10V
0.024 0.036 ID = –30A, VGS = –4V Forward transfer admittance |yfs| 2745—S ID = –30A, VDS = –10V Input capacitance Ciss 4100 pF VDS = –10V Output capacitance Coss 2100 pF VGS = 0 Reverse transfer capacitance Crss 450 pF f = 1MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body–drain diode forward voltage V Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
32 ns VGS = –10V, ID = –30A
270 ns RL = 1
570 ns
360 ns
–1.1 V IF = –60A, VGS = 0
115 ns IF = –60A, VGS = 0
diF/ dt =50A/µs
Note: 4. Pulse test
Note4
Note4
Note4
2
Page 3
Main Characteristics
2SJ555
Power vs. Temperature Derating
200
150
100
50
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
–10 V
–100
–4.5 V
–5 V
–80
D
–8 V
–60
–40
PulseTest
–4 V
–3.5 V
–1000
Maximum Safe Operation Area
–300 –100
D
–30 –10
Operation in
–3
this area is
–1
limited by R
Drain Current I (A)
–0.3
Ta = 25 °C
–0.1
–0.1 –0.3 –1 –3 –10
Drain to Source Voltage V (V)
–100
–80
D
Typical Transfer Characteristics
V = –10 V
DS
Pulse Test
–60
–40
10 µs
100 µs
PW = 10 ms (1 shot)
DC Operation (Tc = 25 °C)
DS(on)
1 ms
–30 –100
DS
25 °C
Drain Current I (A)
–20
0
–4 –8 –12 –16 –20
Drain to Source Voltage V (V)
–3 V
V = –2.5 V
GS
DS
Drain Current I (A)
–20
75 °C
Tc = –25 °C
0 –1–2–3–4–5
Gate to Source Voltage V (V)
GS
3
Page 4
2SJ555
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–2
–1.6
DS(on)
V (V)
–1.2
–0.8
–0.4
Drain to Source Saturation Voltage
–5 A
0
–4 –8 –12 –16 –20
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
50
PulseTest
I = –50 A
D
40
DS(on)
R (m )
V = –4 V
GS
30
20
PulseTest
I = –50 A
D
–20 A –10 A
GS
–50 A
–10 A
–10,–20A
–20 A
Static Drain to Source on State Resistance
100
vs. Drain Current
50
V = –4 V
20
DS(on)
R ( m )
GS
10
5
2
Drain to Source On State Resistance
1
–1 –3
–30 –100 –300
–10
Drain Current I (A)
PulseTest
D
Forward Transfer Admittance vs.
Drain Current
Tc = –25 °C
fs
100
30
10
3
75 °C
1
–10 V
–1000
25 °C
V = –10 V
10
GS
0.3
V = –10 V
DS
PulseTest
Forward Transfer Admittance |y | (S)
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
0.1 –0.1 –1 –10 –100
–0.3
Drain Current I (A)
–3 –30
D
4
Page 5
2SJ555
Body–Drain Diode Reverse
1000
Recovery Time
500
200
100
50
20
Reverse Recovery Time trr (ns)
10
–0.3
–0.1
di / dt = 50 A / µs V = 0, Ta = 25 °C
GS
–10
–3
–1
Reverse Drain Current I (A)
Dynamic Input Characteristics
0
V = –10 V
DD
–25 V
DS
–20
–50 V
–40
V
–60
GS
V = –50 V
DD
–80
Drain to Source Voltage V (V)
I = –60 A
D
0
80 160 240
Gate Charge Qg (nc)
–30
DR
V
DS
–25 V –10 V
320
–100
0
–4
–8
–12
–16
–20–100
400
Typical Capacitance vs.
Drain to Source Voltage
50000
20000 10000
5000
Ciss
2000 1000
Capacitance C (pF)
500
200
Coss
Crss
100
0 –10 –20 –30 –40 –50
Drain to Source Voltage V (V)
Switching Characteristics
1000
500
GS
t
f
200
t
t
d(on)
r
100
50
Switching Time t (ns)
20
Gate to Source Voltage V (V)
10
–0.1
V = –10 V, V = –30 V
GS
PW = 10 µs, duty < 1 %
–0.3 –1
–3
Drain Current I (A)
t
DD
–10
V = 0
GS
f = 1 MHz
DS
d(off)
=
–30 –100
D
5
Page 6
2SJ555
Reverse Drain Current vs.
Source to Drain Voltage
–100
–80
DR
–60
–40
–10 V
–5 V
V = 0
–20
Reverse Drain Current I (A)
0
–0.4 –0.8 –1.2 –1.6 –2.0
Source to Drain Voltage V (V)
Avalanche Test Circuit Avalanche Waveform
V
DS
Monitor
Rg
Vin –15 V
50
PulseTest
GS
SD
L
I
AP
Monitor
D. U. T
Maximum Avalanche Energy vs.
Channel Temperature Derating
500
400
AR
300
200
100
0
Repetive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
I = –60 A
AP
V = –25 V
DD
duty < 0.1 % Rg > 50
V – V
V
DSS
DSS DD
V
V
DS
(BR)DSS
6
Page 7
Normalized Transient Thermal Impedance vs. Pulse Width
3
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01 10 µ
100 µ 1 m 10 m 100 m 1 10
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 1.0 °C/W, Tc = 25 °C
P
DM
Pulse Width PW (S)
PW
T
Tc = 25°C
PW
D =
T
2SJ555
Switching Time Test Circuit Waveform
Vin Monitor
Vin
-10 V
D.U.T.
50
Vout Monitor
R
L
V
DD
= –30 V
Vin
Vout
td(on)
10%
90%
10%
tr
td(off)
90%
90%
10%
t
f
7
Page 8
2SJ555
Package Dimensions
16.0 max
0.5 typ
φ
3.2 ± 0.2
1.0 typ
Unit: mm
5.0 max
1.5 typ
5.0 ± 0.3
1.6 typ
1.4 max
3.6 typ
5.45 ± 0.2 5.45 ± 0.2
2.0 typ
2.0 typ
1.0 ± 0.2
0.9 typ
1.0 typ
20.1 max18.0 ± 0.5
14.9 ± 0.2
0.3 typ
2.8 typ
0.6 ± 0.2
Hitachi Code
EIAJ
JEDEC
TO–3P
SC–65
8
Page 9
Cautions
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4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
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7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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