
Features
• Low on-resistance
R
= 0.017Ω typ.
DS(on)
• Low drive current.
• 4V gate drive devices.
• High speed switching.
Outline
2SJ555
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-634A (Z)
2nd. Edition
Jun 1998
G
TO–3P
D
1. Gate
1
S
2
3
2. Drain
(Flange)
3. Source

2SJ555
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
Gate to source voltage V
Drain current I
Drain peak current I
Body-drain diode reverse drain current I
Avalanche current I
Avalanche energy E
Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note3
AP
Note3
AR
Note1
Note2
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
Electrical Characteristics (Ta = 25°C)
–60 V
±20 V
–60 A
–240 A
–60 A
–60 A
308 mJ
125 W
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V
Gate to source breakdown voltage V
Zero gate voltege drain current I
Gate to source leak current I
Gate to source cutoff voltage V
Static drain to source on state R
resistance R
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
DS(on)
DS(on)
–60 — — V ID = –10mA, VGS = 0
±20——V I
= ±100µA, VDS = 0
G
— — –10 µAVDS = –60 V, VGS = 0
——±10 µAVGS = ±16V, VDS = 0
–1.0 — –2.0 V ID = –1mA, VDS = –10V
— 0.017 0.022 Ω ID = –30A, VGS = –10V
— 0.024 0.036 Ω ID = –30A, VGS = –4V
Forward transfer admittance |yfs| 2745—S ID = –30A, VDS = –10V
Input capacitance Ciss — 4100 — pF VDS = –10V
Output capacitance Coss — 2100 — pF VGS = 0
Reverse transfer capacitance Crss — 450 — pF f = 1MHz
Turn-on delay time t
Rise time t
Turn-off delay time t
Fall time t
Body–drain diode forward voltage V
Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
— 32 — ns VGS = –10V, ID = –30A
— 270 — ns RL = 1Ω
— 570 — ns
— 360 — ns
— –1.1 — V IF = –60A, VGS = 0
— 115 — ns IF = –60A, VGS = 0
diF/ dt =50A/µs
Note: 4. Pulse test
Note4
Note4
Note4
2

Main Characteristics
2SJ555
Power vs. Temperature Derating
200
150
100
50
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
–10 V
–100
–4.5 V
–5 V
–80
D
–8 V
–60
–40
PulseTest
–4 V
–3.5 V
–1000
Maximum Safe Operation Area
–300
–100
D
–30
–10
Operation in
–3
this area is
–1
limited by R
Drain Current I (A)
–0.3
Ta = 25 °C
–0.1
–0.1 –0.3 –1 –3 –10
Drain to Source Voltage V (V)
–100
–80
D
Typical Transfer Characteristics
V = –10 V
DS
Pulse Test
–60
–40
10 µs
100 µs
PW = 10 ms (1 shot)
DC Operation (Tc = 25 °C)
DS(on)
1 ms
–30 –100
DS
25 °C
Drain Current I (A)
–20
0
–4 –8 –12 –16 –20
Drain to Source Voltage V (V)
–3 V
V = –2.5 V
GS
DS
Drain Current I (A)
–20
75 °C
Tc = –25 °C
0 –1–2–3–4–5
Gate to Source Voltage V (V)
GS
3

2SJ555
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–2
–1.6
DS(on)
V (V)
–1.2
–0.8
–0.4
Drain to Source Saturation Voltage
–5 A
0
–4 –8 –12 –16 –20
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
50
Ω
PulseTest
I = –50 A
D
40
DS(on)
R (m )
V = –4 V
GS
30
20
PulseTest
I = –50 A
D
–20 A
–10 A
GS
–50 A
–10 A
–10,–20A
–20 A
Static Drain to Source on State Resistance
100
Ω
vs. Drain Current
50
V = –4 V
20
DS(on)
R ( m )
GS
10
5
2
Drain to Source On State Resistance
1
–1 –3
–30 –100 –300
–10
Drain Current I (A)
PulseTest
D
Forward Transfer Admittance vs.
Drain Current
Tc = –25 °C
fs
100
30
10
3
75 °C
1
–10 V
–1000
25 °C
V = –10 V
10
GS
0.3
V = –10 V
DS
PulseTest
Forward Transfer Admittance |y | (S)
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
0.1
–0.1 –1 –10 –100
–0.3
Drain Current I (A)
–3 –30
D
4

2SJ555
Body–Drain Diode Reverse
1000
Recovery Time
500
200
100
50
20
Reverse Recovery Time trr (ns)
10
–0.3
–0.1
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
–10
–3
–1
Reverse Drain Current I (A)
Dynamic Input Characteristics
0
V = –10 V
DD
–25 V
DS
–20
–50 V
–40
V
–60
GS
V = –50 V
DD
–80
Drain to Source Voltage V (V)
I = –60 A
D
0
80 160 240
Gate Charge Qg (nc)
–30
DR
V
DS
–25 V
–10 V
320
–100
0
–4
–8
–12
–16
–20–100
400
Typical Capacitance vs.
Drain to Source Voltage
50000
20000
10000
5000
Ciss
2000
1000
Capacitance C (pF)
500
200
Coss
Crss
100
0 –10 –20 –30 –40 –50
Drain to Source Voltage V (V)
Switching Characteristics
1000
500
GS
t
f
200
t
t
d(on)
r
100
50
Switching Time t (ns)
20
Gate to Source Voltage V (V)
10
–0.1
V = –10 V, V = –30 V
GS
PW = 10 µs, duty < 1 %
–0.3 –1
–3
Drain Current I (A)
t
DD
–10
V = 0
GS
f = 1 MHz
DS
d(off)
=
–30 –100
D
5

2SJ555
Reverse Drain Current vs.
Source to Drain Voltage
–100
–80
DR
–60
–40
–10 V
–5 V
V = 0
–20
Reverse Drain Current I (A)
0
–0.4 –0.8 –1.2 –1.6 –2.0
Source to Drain Voltage V (V)
Avalanche Test Circuit Avalanche Waveform
V
DS
Monitor
Rg
Vin
–15 V
50Ω
PulseTest
GS
SD
L
I
AP
Monitor
D. U. T
Maximum Avalanche Energy vs.
Channel Temperature Derating
500
400
AR
300
200
100
0
Repetive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
I = –60 A
AP
V = –25 V
DD
duty < 0.1 %
Rg > 50
V – V
Ω
V
DSS
DSS DD
V
V
DS
(BR)DSS
6

Normalized Transient Thermal Impedance vs. Pulse Width
3
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01
10 µ
100 µ 1 m 10 m 100 m 1 10
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 1.0 °C/W, Tc = 25 °C
P
DM
Pulse Width PW (S)
PW
T
Tc = 25°C
PW
D =
T
2SJ555
Switching Time Test Circuit Waveform
Vin Monitor
Vin
-10 V
D.U.T.
50Ω
Vout
Monitor
R
L
V
DD
= –30 V
Vin
Vout
td(on)
10%
90%
10%
tr
td(off)
90%
90%
10%
t
f
7

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