
Features
• Low on-resistance
R
 = 0.042Ω typ.
DS(on)
• Low drive current.
• 4V gate drive devices.
• High speed switching.
Outline
2SJ543
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-652B (Z)
 3rd. Edition
Jun 1998
TO–220AB
G
D
3
1. Gate
2. Drain 
  (Flange)
3. Source
1
2
S
 

2SJ543
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V 
Gate to source voltage V 
Drain current I 
Drain peak current I 
Body-drain diode reverse drain current I 
Avalanche current I 
Avalanche energy E 
Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
 Note3
AP
 Note3
AR
Note1
 Note2
Channel temperature Tch 150 °C 
Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
Electrical Characteristics (Ta = 25°C)
–60 V 
±20 V 
–20 A 
–80 A 
–20 A 
–20 A 
34 mJ 
75 W
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V 
Gate to source breakdown voltage V 
Zero gate voltege drain current I 
Gate to source leak current I 
Gate to source cutoff voltage V 
Static drain to source on state R 
resistance R
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
DS(on)
DS(on)
–60 — — V ID = –10mA, VGS = 0 
±20——V I
 = ±100µA, VDS = 0
G
— — –10 µAVDS = –60 V, VGS = 0 
——±10 µAVGS = ±16V, VDS = 0 
–1.0 — –2.0 V ID = –1mA, VDS = –10V 
— 0.042 0.055 Ω ID = –10A, VGS = –10V
— 0.065 0.095 Ω ID = –10A, VGS = –4V 
Forward transfer admittance |yfs| 1016—S ID = –10A, VDS = –10V 
Input capacitance Ciss — 1750 — pF VDS = –10V 
Output capacitance Coss — 800 — pF VGS = 0 
Reverse transfer capacitance Crss — 180 — pF f = 1MHz 
Turn-on delay time t 
Rise time t 
Turn-off delay time t 
Fall time t 
Body–drain diode forward voltage V 
Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
— 16 — ns VGS = –10V, ID = –10A
— 100 — ns RL = 3Ω
— 230 — ns
— 140 — ns
— –1.0 — V IF = –20A, VGS = 0
— 100 — ns IF = –20A, VGS = 0
diF/ dt =50A/µs
Note: 4. Pulse test
 Note4
 Note4
 Note4
2
 

Main Characteristics
2SJ543
Power vs. Temperature Derating
80
60
40
20
Channel Dissipation  Pch (W)
0
50 100 150 200
 Case Temperature  Tc (°C)
Typical Output Characteristics
D
–50
–40
–10 V 
–8 V
–4.5 V
–6 V
–5 V
–30
–20
Pulse Test
–4 V
–3.5 V
–1000
Maximum Safe Operation Area
–300 
–100
D
–30 
–10
–3 
–1
Operation in 
this area is
Drain Current  I   (A)
limited by R
–0.3
Ta = 25 °C
–0.1
–0.1 –0.3 –1 –3 –10
Drain to Source Voltage  V    (V)
Typical Transfer Characteristics
–50
V   = –10 V
DS
Pulse Test
–40
D
–30
–20
PW = 10 ms (1 shot)
DC Operation
      (Tc = 25 °C)
DS(on)
Tc = –25 °C
25 °C
10 µs
100 µs
1 ms
–30 –100
DS
Drain Current  I   (A)
–10
0
–2 –4 –6 –8 –10
Drain to Source Voltage  V    (V)
–3 V
V   = –2.5 V
GS
DS
Drain Current  I    (A)
–10
75 °C
0 –1–2–3–4–5
Gate to Source Voltage  V    (V)
GS
3
 

2SJ543
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–2.0
Pulse Test
–1.6
DS(on)
V       (V)
–1.2
I  = –20 A
–0.8
–0.4
D
–10 A
Drain to Source Saturation Voltage
0
–4 –8 –12 –16 –20
Gate to Source Voltage  V    (V)
Static Drain to Source on State Resistance
vs. Temperature
0.2 
Pulse Test
Ω
0.16
DS(on)
R       (  )
0.12
0.08
V   = –4 V
GS
0.04
I  = –20 A
D
–10 A
–5, –10 A
–10 V
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature  Tc  (°C)
–5 A 
–2 A
GS
–5 A
–20 A
Static Drain to Source on State Resistance
vs. Drain Current
1
0.5
0.2
DS(on)
R        (  )Ω
0.1 
V   = –4 V
GS
0.05
0.02
Drain to Source On State Resistance
0.01
–1 –2
–5
–10 –20
Drain Current  I   (A)
Pulse Test
D
Forward Transfer Admittance vs.
Drain Current
100
fs
30
Tc = –25 °C
10
3
25 °C
75 °C
1
0.3
Forward Transfer Admittance |y  | (S)
0.1
–0.1 –1 –10 –100
–0.3
Drain Current  I   (A)
V   = –10 V
DS
Pulse Test
–3 –30
D
–10 V
–50
–100
4
 

2SJ543
Body–Drain Diode Reverse
Recovery Time
1000
Pulse Test
500
200
100
50
20
Reverse Recovery Time  trr (ns)
di / dt = 50 A / µs 
V   = 0, Ta = 25 °C
GS
10
–0.1 –0.3 –1 –3 –10 –30 –100
Reverse Drain Current  I    (A)
DR
Dynamic Input Characteristics
0
V   = –10 V
DD
DS
–20
V
–40
DS
–60
–80
Drain to Source Voltage  V    (V)
I  = –20 A
D
0
16 32 48
–25 V 
–50 V
V   = –10 V
DD
–25 V 
–50 V
V
GS
64
Gate Charge   Qg  (nc)
Typical Capacitance vs. 
Drain to Source Voltage
10000
3000
1000
300
100
Capacitance  C (pF)
30
V   = 0
GS
f = 1 MHz
10
0 –10 –20 –30 –40 –50
Drain to Source Voltage  V    (V)
0
–4
1000
500
GS
Switching Characteristics
200
–8
100
–12
–16
50
Switching Time  t (ns)
20
Gate to Source Voltage  V    (V)
–20–100
80
10
–0.1 –0.3
Ciss
Coss
Crss
DS
V   = –10 V, V   = –30 V
GS
DD
PW = 10 µs, duty < 1 %
td(off)
tf
tr
td(on)
–1 –10 –30
–3
Drain Current  I   (A)
D
–100
5
 

2SJ543
Reverse Drain Current vs.
–50
–40
DR
–30
–20
Source to Drain Voltage
–10 V
V   = 0, 5 V
–5 V
–10
Reverse Drain Current  I    (A)
0
–0.4 –0.8 –1.2 –1.6 –2.0
Source to Drain Voltage  V    (V)
Avalanche Test Circuit Avalanche Waveform
V
DS
Monitor
Rg
Vin 
–15 V
50Ω
GS
Pulse Test
SD
L
I
AP
Monitor
D. U. T
Maximum Avalanche Energy vs.
Channel Temperature Derating
50
AR
40
30
20
10
0
Repetitive Avalanche Energy  E    (mJ)
25 50 75 100 125 150
Channel Temperature  Tch (°C)
1
E   =    • L • I    •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
I   = –20 A
AP
V   = –25 V
DD
duty < 0.1 % 
Rg > 50
V    – V
Ω
V
DSS
DSS DD
V
V
DS
(BR)DSS
6
 

2SJ543
3
Normalized Transient Thermal Impedance vs. Pulse Width
s  (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01 
10 µ
100 µ 1 m 10 m
Pulse Width  PW  (S)
Tc = 25°C
θ          γ      θ
ch – c(t) =  s (t) •  ch – c
θ
ch – c = 1.67 °C/W, Tc = 25 °C
P
DM
PW
T
D =
100 m 1 10
PW
T
Switching Time Test Circuit  Waveform
Vin Monitor
Vin 
–10 V
D.U.T.
50Ω
Vout 
Monitor
R
L
V
DD
= –30 V
Vin
Vout
10%
90%
10%
td(on)
90%
90%
10%
tr
td(off)
t
f
7
 

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