
Features
• Low on-resistance
R
= 0.050Ω typ.
DS(on)
• Low drive current.
• 4V gate drive devices.
• High speed switching.
Outline
2SJ542
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-591B (Z)
3rd. Edition
Jun 1998
TO–220AB
G
D
3
1. Gate
2. Drain
(Flange)
3. Source
1
2
S

2SJ542
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
Gate to source voltage V
Drain current I
Drain peak current I
Body-drain diode reverse drain current I
Avalanche current I
Avalanche energy E
Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note3
AP
Note3
AR
Note1
Note2
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
Electrical Characteristics (Ta = 25°C)
–60 V
±20 V
–18 A
–72 A
–18 A
–18 A
27 mJ
60 W
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V
Gate to source breakdown voltage V
Zero gate voltege drain current I
Gate to source leak current I
Gate to source cutoff voltage V
Static drain to source on state R
resistance R
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
DS(on)
DS(on)
–60 — — V ID = –10mA, VGS = 0
±20——V I
= ±100µA, VDS = 0
G
— — –10 µAVDS = –60 V, VGS = 0
——±10 µAVGS = ±16V, VDS = 0
–1.0 — –2.0 V ID = –1mA, VDS = –10V
— 0.050 0.065 Ω ID = –9A, VGS = –10V
— 0.070 0.110 Ω ID = –9A, VGS = –4V
Forward transfer admittance |yfs|1016—S ID = –9A, VDS = -10V
Input capacitance Ciss — 1300 — pF VDS = –10V
Output capacitance Coss — 650 — pF VGS = 0
Reverse transfer capacitance Crss — 180 — pF f = 1MHz
Turn-on delay time t
Rise time t
Turn-off delay time t
Fall time t
Body–drain diode forward voltage V
Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
— 14 — ns VGS = –10V, ID = –9A
— 95 — ns RL =3.33Ω
— 190 — ns
— 135 — ns
— –1.0 — V IF = –18A, VGS = 0
— 70 — ns IF = –18A, VGS = 0
diF/ dt =50A/µs
Note: 4. Pulse test
Note4
Note4
Note4
2

Main Characteristics
2SJ542
Power vs. Temperature Derating
80
60
40
20
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
–6 V
–10 V
–20
–4 V
–16
D
–3.5 V
–12
–8
Drain Current I (A)
–4
0
–2 –4 –6 –8 –10
Drain to Source Voltage V (V)
Pulse Test
–3 V
–2.5 V
V = –2 V
GS
DS
1000
Maximum Safe Operation Area
300
100
D
30
10
3
1
Operation in
this area is
Drain Current I (A)
limited by R
0.3
Ta = 25 °C
0.1
0.1 0.3 1
Drain to Source Voltage V (V)
Typical Transfer Characteristics
–20
V = –10 V
DS
Pulse Test
–16
D
–12
–8
Drain Current I (A)
–4
0
Tc = 75°C
–1 –2 –3 –4 –5
Gate to Source Voltage V (V)
10 µs
10
100 µs
1 ms
30
DS
100
PW = 10 ms (1shot)
DC Operation (Tc = 25°C)
DS(on)
3
25°C
–25°C
GS
3

2SJ542
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–3.0
–2.5
DS(on)
–2.0
V (V)
–1.5
–1.0
–0.5
Drain to Source Saturation Voltage
0
–4 –8
–12
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
0.30
Ω
Pulse Test
0.25
DS(on)
0.20
R ( )
I = –20 A
0.15
0.10
V = –4 V
GS
D
Static Drain to Source on State Resistance
vs. Drain Current
Pulse Test
1
Pulse Test
0.5
DS(on)
0.2
R ( )Ω
I = –20 A
D
0.1
0.05
V = –4 V
GS
–10 V
–10 A
–5 A
0.02
Drain to Source On State Resistance
0.01
–16 –20 –1 –5 –20 –100–2 –10 –50
GS
Drain Current I (A)
Forward Transfer Admittance vs.
Drain Current
100
fs
30
Tc = –25 °C
10
–5, –10 A
3
25 °C
75 °C
1
D
0.05
–10 V
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
4
–5, –10, –20 A
0.3
Forward Transfer Admittance |y | (S)
0.1
–0.1 –1 –10 –100
–0.3
Drain Current I (A)
V = –10 V
DS
Pulse Test
–3 –30
D

2SJ542
Body–Drain Diode Reverse
Recovery Time
100
50
20
di / dt = 50 A / µs
Reverse Recovery Time trr (ns)
10
–0.2
–0.1
V = 0, Ta = 25 °C
GS
–0.5
–1 –2 –10 –20
–5
Reverse Drain Current I (A)
Dynamic Input Characteristics
0
V = –10 V
DD
–25 V
DS
–20
–40
V
DS
–60
–80
Drain to Source Voltage V (V)
–100
V = –50 V
DD
–25 V
–10 V
I = –18 A
D
0
16 32 48 64 80
–50 V
V
GS
Gate Charge Qg (nc)
DR
Typical Capacitance vs.
10000
Drain to Source Voltage
3000
1000
300
100
Capacitance C (pF)
30
10
0 –10 –20 –30 –40 –50
Drain to Source Voltage V (V)
Switching Characteristics
0
–4
GS
1000
V = –10 V, V = –30 V
GS
PW = 5 µs, duty < 1 %
500
200
–8
100
–12
–16
50
Switching Time t (ns)
20
Gate to Source Voltage V (V)
–20
10
–0.1
–0.2
–0.5
Drain Current I (A)
V = 0
f = 1 MHz
Ciss
Coss
Crss
DD
t
d(off)
t
f
t
r
t
d(on)
–1 –2 –10 –20–5
D
GS
DS
5

2SJ542
Reverse Drain Current vs.
–20
Source to Drain Voltage
–10 V
–16
DR
–12
–5 V
V = 0, 5 V
GS
–8
–4
Reverse Drain Current I (A)
0
–0.4 –0.8 –1.2 –1.6 –2.0
Source to Drain Voltage V (V)
Avalanche Test Circuit Avalanche Waveform
V
DS
Monitor
Rg
Vin
–15 V
50Ω
Pulse Test
SD
L
I
AP
Monitor
D. U. T
Maximum Avalanche Energy vs.
Channel Temperature Derating
50
I = –18 A
AR
40
V = –25 V
duty < 0.1 %
Rg > 50
30
20
10
0
Repetitive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
AP
DD
V – V
DSS DD
V
Ω
DSS
V
DS
V
(BR)DSS
6

2SJ542
3
Normalized Transient Thermal Impedance vs. Pulse Width
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01
10 µ
100 µ 1 m 10 m
Pulse Width PW (S)
Tc = 25°C
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 2.08 °C/W, Tc = 25 °C
P
DM
PW
T
D =
100 m 1 10
PW
T
Switching Time Test Circuit Waveform
Vin Monitor
Vin
–10 V
D.U.T.
50Ω
Vout
Monitor
R
L
V
DD
= –30 V
Vin
Vout
10%
90%
10%
td(on)
90%
90%
10%
tr
td(off)
t
f
7

Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL NorthAmerica : http:semiconductor.hitachi.com/
For further information write to:
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
Europe : http://www.hitachi-eu.com/hel/ecg
Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm
Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm
Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm
Japan : http://www.hitachi.co.jp/Sicd/indx.htm
Hitachi Europe GmbH
Electronic components Group
Dornacher Stra§e 3
D-85622 Feldkirchen, Munich
Germany
Tel: <49> (89) 9 9180-0
Fax: <49> (89) 9 29 30 00
Hitachi Europe Ltd.
Electronic Components Group.
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA, United Kingdom
Tel: <44> (1628) 585000
Fax: <44> (1628) 778322
Hitachi Asia Pte. Ltd.
16 Collyer Quay #20-00
Hitachi Tower
Singapore 049318
Tel: 535-2100
Fax: 535-1533
Hitachi Asia Ltd.
Taipei Branch Office
3F, Hung Kuo Building. No.167,
Tun-Hwa North Road, Taipei (105)
Tel: <886> (2) 2718-3666
Fax: <886> (2) 2718-8180
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
Hitachi Asia (Hong Kong) Ltd.
Group III (Electronic Components)
7/F., North Tower, World Finance Centre,
Harbour City, Canton Road, Tsim Sha Tsui,
Kowloon, Hong Kong
Tel: <852> (2) 735 9218
Fax: <852> (2) 730 0281
Telex: 40815 HITEC HX