Drain to source voltageV
Gate to source voltageV
Drain currentI
Drain peak currentI
Body-drain diode reverse drain current I
Avalanche currentI
Avalanche energyE
Channel dissipationPch
DSS
GSS
D
D(pulse)
DR
Note3
AP
Note3
AR
Note1
Note2
Channel temperatureTch150°C
Storage temperatureTstg–55 to +150°C
Note:1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
Electrical Characteristics (Ta = 25°C)
–60V
±20V
–20A
–80A
–20A
–20A
34mJ
30W
ItemSymbolMinTypMaxUnitTest Conditions
Drain to source breakdown voltage V
Gate to source breakdown voltage V
Zero gate voltege drain currentI
Gate to source leak currentI
Gate to source cutoff voltageV
Static drain to source on stateR
resistanceR
—0.0650.095ΩID = –10A, VGS = –4V
Forward transfer admittance|yfs| 1016—S ID = –10A, VDS = –10V
Input capacitanceCiss—1750—pFVDS = –10V
Output capacitanceCoss—800—pFVGS = 0
Reverse transfer capacitanceCrss—180—pFf = 1MHz
Turn-on delay timet
Rise timet
Turn-off delay timet
Fall timet
Body–drain diode forward voltage V
Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
—16—nsVGS = –10V, ID = –10A
—100—nsRL = 3Ω
—230—ns
—140—ns
—–1.0—VIF = –20A, VGS = 0
—100—nsIF = –20A, VGS = 0
diF/ dt =50A/µs
Note:4. Pulse test
Note4
Note4
Note4
2
Page 3
Main Characteristics
2SJ532
Power vs. Temperature Derating
40
30
20
10
Channel Dissipation Pch (W)
0
50100150200
Case Temperature Tc (°C)
Typical Output Characteristics
D
–50
–40
–10 V
–8 V
–4.5 V
–6 V
–5 V
–30
–20
Pulse Test
–4 V
–3.5 V
–1000
Maximum Safe Operation Area
–300
–100
D
–30
–10
DC Operation (Tc = 25 °C)
–3
–1
Operation in
this area is
Drain Current I (A)
limited by R
–0.3
Ta = 25 °C
–0.1
–0.1 –0.3–1–3–10
Drain to Source Voltage V (V)
Typical Transfer Characteristics
–50
V = –10 V
DS
Pulse Test
–40
D
–30
–20
PW = 10 ms (1 shot)
DS(on)
Tc = –25 °C
25 °C
10 µs
100 µs
1 ms
–30–100
DS
Drain Current I (A)
–10
0
–2–4–6–8–10
Drain to Source Voltage V (V)
–3 V
V = –2.5 V
GS
DS
Drain Current I (A)
–10
75 °C
0 –1–2–3–4–5
Gate to Source Voltage V (V)
GS
3
Page 4
2SJ532
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–2.0
Pulse Test
–1.6
DS(on)
V (V)
–1.2
I = –20 A
–0.8
–0.4
D
–10 A
Drain to Source Saturation Voltage
0
–4–8–12–16–20
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
0.2
Pulse Test
Ω
0.16
DS(on)
R ( )
0.12
0.08
V = –4 V
GS
0.04
I = –20 A
D
–10 A
–5, –10 A
–10 V
0
Static Drain to Source on State Resistance
–4004080120160
Case Temperature Tc (°C)
–5 A
–2 A
GS
–5 A
–20 A
Static Drain to Source on State Resistance
vs. Drain Current
1
0.5
0.2
DS(on)
R ( )Ω
0.1
V = –4 V
GS
0.05
0.02
Drain to Source On State Resistance
0.01
–1–2
–5
–10–20
Drain Current I (A)
Pulse Test
D
Forward Transfer Admittance vs.
Drain Current
100
fs
30
Tc = –25 °C
10
3
25 °C
75 °C
1
0.3
Forward Transfer Admittance |y | (S)
0.1
–0.1–1–10–100
–0.3
Drain Current I (A)
V = –10 V
DS
Pulse Test
–3–30
D
–10 V
–50
–100
4
Page 5
2SJ532
Body–Drain Diode Reverse
Recovery Time
1000
Pulse Test
500
200
100
50
20
Reverse Recovery Time trr (ns)
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
10
–0.1 –0.3–1–3–10–30–100
Reverse Drain Current I (A)
DR
Dynamic Input Characteristics
0
V = –10 V
DD
DS
–20
V
–40
DS
–60
–80
Drain to Source Voltage V (V)
I = –20 A
D
0
163248
–25 V
–50 V
V = –10 V
DD
–25 V
–50 V
V
GS
64
Gate Charge Qg (nc)
Typical Capacitance vs.
Drain to Source Voltage
10000
3000
1000
300
100
Capacitance C (pF)
30
V = 0
GS
f = 1 MHz
10
0–10–20–30–40–50
Drain to Source Voltage V (V)
0
–4
1000
500
GS
Switching Characteristics
200
–8
100
–12
–16
50
Switching Time t (ns)
20
Gate to Source Voltage V (V)
–20–100
80
10
–0.1 –0.3
Ciss
Coss
Crss
DS
V = –10 V, V = –30 V
GS
DD
PW = 10 µs, duty < 1 %
td(off)
tf
tr
td(on)
–1–10–30
–3
Drain Current I (A)
D
–100
5
Page 6
2SJ532
Reverse Drain Current vs.
–50
–40
DR
–30
–20
Source to Drain Voltage
–10 V
V = 0, 5 V
–5 V
–10
Reverse Drain Current I (A)
0
–0.4–0.8–1.2–1.6–2.0
Source to Drain Voltage V (V)
Avalanche Test CircuitAvalanche Waveform
V
DS
Monitor
Rg
Vin
–15 V
50Ω
GS
Pulse Test
SD
L
I
AP
Monitor
D. U. T
Maximum Avalanche Energy vs.
Channel Temperature Derating
50
AR
40
30
20
10
0
Repetitive Avalanche Energy E (mJ)
255075100125150
Channel Temperature Tch (°C)
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
I = –20 A
AP
V = –25 V
DD
duty < 0.1 %
Rg > 50
V – V
Ω
V
DSS
DSSDD
V
V
DS
(BR)DSS
6
Page 7
s (t)
γ
0.3
0.1
2SJ532
Normalized Transient Thermal Impedance vs. Pulse Width
3
Tc = 25°C
1
D = 1
0.5
0.2
θ γ θ
0.1
ch – c(t) = s (t) • ch – c
θ
ch – c = 4.17°C/W, Tc = 25°C
0.05
0.03
Normalized Transient Thermal Impedance
0.01
10 µ
0.02
0.01
1shot pulse
100 µ1 m10 m
Switching Time Test Circuit
Vin Monitor
Vout
Monitor
D.U.T.
R
L
V
Vin
–10 V
50Ω
DD
= –30 V
P
DM
Pulse Width PW (S)
Vin
10%
Vout
PW
D =
T
PW
T
100 m110
Waveform
90%
90%
10%
90%
10%
td(on)
tr
td(off)
t
f
7
Page 8
2SJ532
Package Dimensions
Unit: mm
1.0 ± 0.2
1.15 ± 0.2
0.6 ± 0.1
2.54 ± 0.5
10.0 ± 0.3
φ
3.2 ± 0.2
4.1 ± 0.312.0 ± 0.3
2.54 ± 0.5
4.5 ± 0.3
2.5 ± 0.2
2.7 ± 0.2
15.0 ± 0.3
13.6 ± 1.0
0.7 ± 0.1
Hitachi Code
EIAJ
JEDEC
TO–220CFM
—
—
8
Page 9
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URLNorthAmerica : http:semiconductor.hitachi.com/
For further information write to:
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
Europe: http://www.hitachi-eu.com/hel/ecg
Asia (Singapore): http://www.has.hitachi.com.sg/grp3/sicd/index.htm
Asia (Taiwan): http://www.hitachi.com.tw/E/Product/SICD_Frame.htm
Asia (HongKong): http://www.hitachi.com.hk/eng/bo/grp3/index.htm
Japan: http://www.hitachi.co.jp/Sicd/indx.htm
Hitachi Asia Ltd.
Taipei Branch Office
3F, Hung Kuo Building. No.167,
Tun-Hwa North Road, Taipei (105)
Tel: <886> (2) 2718-3666
Fax: <886> (2) 2718-8180
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
Hitachi Asia (Hong Kong) Ltd.
Group III (Electronic Components)
7/F., North Tower, World Finance Centre,
Harbour City, Canton Road, Tsim Sha Tsui,
Kowloon, Hong Kong
Tel: <852> (2) 735 9218
Fax: <852> (2) 730 0281
Telex: 40815 HITEC HX
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