Datasheet 2SJ529-S, 2SJ529-L Datasheet (HIT)

Page 1
2SJ529(L),2SJ529(S)
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-654A (Z)
2nd. Edition
Jun 1998
Features
R
DS(on)
= 0.12 typ.
4 V gete drive devices
High speed switching
Outline
1
2
3
4
4
1
2
3
1. Gate
2. Drain
3. Source
4. Drain
DPAK–2
D
G
S
Page 2
2SJ529(L),2SJ529(S)
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
DSS
–60 V
Gate to source voltage V
GSS
±20 V
Drain current I
D
–10 A
Drain peak current I
D(pulse)
Note1
–40 A
Body-drain diode reverse drain current I
DR
–10 A
Avalenche current I
AP
Note3
–10 A
Avalenche energy E
AR
Note3
8.5 mJ
Channel dissipation Pch
Note2
20 W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg 50
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V
(BR)DSS
–60 V ID = –10mA, VGS = 0
Gate to source breakdown voltage V
(BR)GSS
±20——V I
G
= ±100µA, VDS = 0
Zero gate voltege drain current I
DSS
–10 µAVDS = –60 V, VGS = 0
Gate to source leak current I
GSS
——±10 µAVGS = ±16V, VDS = 0
Gate to source cutoff voltage V
GS(off)
–1.0 –2.0 V ID = –1mA, VDS = –10V
Static drain to source on state R
DS(on)
0.12 0.16 ID = –5A, VGS = –10V
Note4
resistance R
DS(on)
0.17 0.24 ID = –5A, VGS = –4V
Note4
Forward transfer admittance |yfs| 4.5 7.5 S ID = –5A, VDS = –10V
Note4
Input capacitance Ciss 580 pF VDS = –10V Output capacitance Coss 300 pF VGS = 0 Reverse transfer capacitance Crss 85 pF f = 1MHz Turn-on delay time t
d(on)
10 ns VGS = –10V, ID = –5A
Rise time t
r
40 ns RL = 6
Turn-off delay time t
d(off)
—85—ns
Fall time t
f
—60—ns
Body–drain diode forward voltage V
DF
–1.2 V IF = –10A, VGS = 0
Body–drain diode reverse recovery time
t
rr
60 ns IF = –10A, VGS = 0
diF/ dt = 50A/µs
Note: 4. Pulse test
Page 3
2SJ529(L),2SJ529(S)
3
Main Characteristics
40
30
20
10
0
50 100 150 200
–10
–8
–6
–4
–2
0
–2 –4 –6 –8 –10
–5 V –4 V
0 –1–2–3–4–5
–10 V
–3.5 V
–3 V
–10
–8
–6
–4
–2
–2.5 V
–25 °C
25 °CTc = 75 °C
V = –2 V
GS
DS
Pulse Test
V = –10 V
–0.1 –0.3 –1 –3 –10 –30 –100
–100
–20 –10
–2 –1
–0.2 –0.1
1 ms
Ta = 25 °C
100 µs
10 µs
–0.5
–5
–50
PW = 10 ms (1 shot)
DC Operation (Tc=25°C)
Pulse Test
Channel Dissipation Pch (W)
Case Temperature Tc (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Operation in this area is limited by R
DS(on)
Page 4
2SJ529(L),2SJ529(S)
4
–1.0
–0.8
–0.6
–0.4
–0.2
0
–4 –8 –12 –16 –20
0.5
0.4
0.3
0.2
0.1
–40 0 40 80 120 160
0
–10 V
I = –5 A
D
GS
V = –4 V
–0.1 –1 –10
0.1
10
20
5
1
0.5
–0.2 –0.5 –2 –5
1
0.5
0.05
0.02
0.01
–0.1 –0.3 –1 –3 –10 –30 –100
–1, –2 A
I = –5 A
D
–2 A
–1 A
0.2
0.1
–10 V
V = –4 V
GS
–1 A
–2 A
–5 A
2
75 °C
25 °C
Ta = –25 °C
Pulse Test
Pulse Test
Pulse Test
V = –10 V
DS
Pulse Test
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
Static Drain to Source on State Resistance
vs. Temperature
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance vs.
Drain Current
Page 5
2SJ529(L),2SJ529(S)
5
500
200
100
20
50
10
5
–0.1 –0.2 –1 –5 –10
0 –10 –20 –30 –40 –50
2000 1000
500
200 100
50
0
–20
–40
–60
–80
0
0
–4
–8
–12
–16
–20–100
81624
32
40
1000
100
300
30
3
10
1 –0.1 –0.2 –0.5 –1 –2 –5
–10
–0.5 –2
di / dt = 50 A / µs V = 0, Ta = 25 °C
GS
20 10
V = 0 f = 1 MHz
GS
Ciss
Coss
Crss
DS
V
GS
V
V = –10 V
–25 V –50 V
DD
D
I = –10 A
V = –10 V
–25 V –50 V
DD
t
f
r
t
d(off)
t
d(on)
t
DD
V = –10 V, V = –30 V Pw = 5 µs, duty < 1 %
GS
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs. Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
Page 6
2SJ529(L),2SJ529(S)
6
–10
–8
–6
–4
–2
0
–0.4 –0.8 –1.2 –1.6 –2.0
D. U. T
Rg
I Monitor
AP
V Monitor
DS
V
DD
50
Vin –15 V
0
I
D
V
DS
I
AP
V
(BR)DSS
L
V
DD
E = • L • I •
2
1
V
V – V
AR
AP
DSS
DSS DD
2
V = 0, 5 V
GS
–10 V
–5 V
Pulse Test
20
16
12
8
4
25 50 75 100 125 150
0
I = –10 A V = –25 V duty < 0.1 % Rg 50
AP
DD
Repetitive Avalanche Energy E (mJ)
AR
Maximum Avalanche Energy vs.
Channel Temperature Derating
Avalanche Test Circuit Avalanche Waveform
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Source to Drain Voltage
Channel Temperature Tch (°C)
Page 7
2SJ529(L),2SJ529(S)
7
Vin Monitor
D.U.T.
Vin –10 V
R
L
V = –30 V
DD
tr
td(on)
Vin
90%
90%
10%
10%
Vout
td(off)
Vout Monitor
50
90%
10%
t
f
Switching Time Test Circuit Waveform
3
1
0.3
0.1
0.03
0.01 10 µ
100 µ 1 m 10 m
100 m 1 10
DM
P
PW
T
D =
PW
T
ch – c(t) = s (t) • ch – c ch – c = 6.25 °C/W, Tc = 25 °C
θ γ θ θ
D = 1
0.5
0.2
0.01
0.02
0.1
0.05
1 shot Pulse
Tc = 25°C
Pulse Width PW (S)
Normalized Transient Thermal Impedance
s (t)
γ
Normalized Transient Thermal Impedance vs. Pulse Width
Page 8
2SJ529(L),2SJ529(S)
8
Package Dimensions
Unit: mm
6.5 ± 0.5
5.4 ± 0.5
1.15 ± 0.1
2.3 ± 0.2
0.55 ± 0.1
2.29 ± 0.5
0.55 ± 0.1 1.2 typ
1.7 ± 0.5
5.5 ± 0.53.1 ± 0.5
16.2 ± 0.5
2.29 ± 0.5
6.5 ± 0.5
5.4 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.3 ± 0.5
0.55 ± 0.1
1.7 ± 0.5
5.5 ± 0.5
9.5 ± 0.5
2.5 ± 0.5
2.29 ± 0.5
2.29 ± 0.5
1.2 Max
0.55 ± 0.1
0 ~ 0.25
0.8 ± 0.1
type
L
S
type
4.7 ± 0.5
Hitachi
EIAJ ( L type)
EIAJ ( S type)
JEDEC
DPAK–2
SC–63 SC–64
Page 9
Cautions
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2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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