This product is P-Channel MOS Field Effect Transistor
designed for high current switching applications.
FEATURES
• Super Low On-State Resistance
DS(on)1
R
= 50 m: Max. (VGS = –10 V, ID = –10 A)
DS(on)2
R
= 88 m: Max. (VGS = –4 V, ID = –10 A)
• Low C
issCiss
= 2360 pF Typ.
• Built-in Gate Protection Diode
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source VoltageV
Gate to Source Voltage*V
Gate to Source VoltageV
Drain Current (DC)I
Drain Current (pulse)**I
Total Power Dissipation (TC = 25 °C) P
Total Power Dissipation (TA = 25 °C) P
Channel TemperatureT
Storage TemperatureT
* f = 20 kHz, Duty Cycle d 10% (+Side)
** PW d 10 Ps, Duty Cycle d 1%
DSS
GSS (AC)
GSS (DC)
D (DC)
D (pulse)
T
T
ch
stg
THERMAL RESISTANCE
Channel to CaseR
Channel to AmbientR
th (ch-C)
th (ch-A)
3.57 °C/W
62.5 °C/W
–60V
–
+20V
–20, 0V
–
+20A
–
+80A
35W
2.0W
150°C
–55 to +150°C
PACKAGE DIMENSIONS
(in millimeter)
10.0±0.3
15.0±0.3
2.54
123
3.2±0.2
3±0.1
4±0.2
13.5 MIN.12.0±0.2
1.3±0.20.7±0.1
1.5±0.2
2.54
ISOLATED TO-220 (MP-45F)
Gate
Gate Protection
Diode
4.5±0.2
2.7±0.2
2.5±0.1
0.65±0.1
1. Gate
2. Drain
3. Source
Drain
Body
Diode
Source
The diode connected between the gate and source of the transistor serves as a protector against ESD. When this
device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage
may be applied to this device.
Document No. D11266EJ2V0DS00 (2nd edition)
Date Published January 1998 N CP(K)
Printed in Japan
Gate to Source Cutoff VoltageV
Forward Transfer Admittance| yfs |V
Drain Leakage CurrentI
Gate to Source Leakage CurrentI
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Turn-On Delay Timet
Rise Timet
Turn-Off Delay Timet
Fall Timet
Total Gate ChargeQ
Gate to Source ChargeQ
Gate to Drain ChargeQ
Body Diode Forward VoltageV
Reverse Recovery Timet
Reverse Recovery ChargeQ
P
A
P
A
2360pF
1060pF
350pF
25ns
160ns
310ns
240ns
74nC
12nC
16nC
130ns
P
s
290nC
Test Circuit 1 Switching TimeTest Circuit 2 Gate Charge
PG.
VGS
0
t
µ
t = 1 s
Duty Cycle ≤ 1 %
RG
G = 10 Ω
R
D.U.T.
R
VDD
VGS
Wave Form
ID
Wave Form
VGS
10 %
0
ID
90 %
10 %
0
td (on)trtd (off)tf
tontoff
VGS (on)
ID
90 %
PG.
90 %
10 %
L
G
= 2 mA
I
50 Ω
D.U.T.
R
L
V
DD
2
Page 3
2SJ494
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
20406080 100 120 140 160
C
- Case Temperature - ˚C
T
FORWARD BIAS SAFE OPERATING AREA
–1000
–100
RDS(on) Limited
(at VGS =10 V)
–10
- Drain Current - A
D
I
Tc = 25 ˚C
Single Pulse
–1
–0.1
DS
- Drain to Source Voltage - V
V
ID(pulse)
ID(DC)
Power Dissipation Limited
–1–10–100
500 s
µ
10 ms
100 ms
1 ms
DC
300 s
µ
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
35
30
25
20
15
10
- Total Power Dissipation - W
5
T
P
0
20
406080 100 120 140 160
C
- Case Temperature - ˚C
T
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
–100
–80
VGS= –10 V
–60
–40
- Drain Current - A
D
I
–20
0
–4
DS
- Drain to Source Voltage - V
V
–8
V
GS
= –4 V
–12
Pulsed
–16
FORWARD TRANSFER CHARACTERISTICS
–1 000
T
ch
= –25 ˚C
–100
125 ˚C
–10
- Drain Current - A
D
I
–1
0
–5
GS
- Gate to Source Voltage - V
V
–10
25 ˚C
V
DS
Pulsed
= –10 V
–15
3
Page 4
1 000
100
10
1
0.1
0.01
- Transient Thermal Resistance - ˚C/W
th(t)
r
0.001
µµ
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
1 m10 m100 m1101001 000 10
PW - Pulse Width - s
Single Pulse
R
R
th(ch-a)
th(ch-c)
2SJ494
= 62.5 ˚C/W
= 3.57 ˚C/W
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
100
Tch = –25 ˚C
10
25 ˚C
75 ˚C
125 ˚C
1
| - Forward Transfer Admittance - S
fs
0.1
| y
–0.1
–1.0
D
- Drain Current - A
I
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
150
100
V
DS
= –10 V
Pulsed
–10–100
Pulsed
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
150
Pulsed
100
ID = –20 A
50
- Drain to Source On-State Resistance - mΩ
0–5
DS(on)
R
GS
- Gate to Source Voltage - V
V
GATE TO SOURCE CUTOFF VOLTAGE vs.
CHANNEL TEMPERATURE
–2.0
–10–20
VDS = –10 V
I
D
= –1 mA
–1.5
V
GS
= –4 V
V
GS
= –10 V
–1.0
50
–0.5
- Drain to Source On-State Resistance - mΩ
DS(on)
R
0
–1
–10–100
ID - Drain Current - A
- Gate to Source Cutoff Voltage - V
0
GS(off)
V
–50
050100150
ch
- Channel Temperature - ˚C
T
4
Page 5
2SJ494
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
160
120
- Drain to Source On-State Resistance - mΩ
DS(on)
R
80
40
0
–50
V
GS
= –4 V
V
GS
= –10 V
0
T
ch
- Channel Temperature - ˚C
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
50
100150
10 000
1 000
- Capacitance - pF
rss
100
, C
oss
, C
iss
C
10
–0.1
–1–10–100
V
DS
- Drain to Source Voltage - V
D
= –10 A
I
VGS = 0
f = 1 MHz
C
iss
C
C
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
Pulsed
–100
V
GS
= –4 V
–10
V
GS
= 0
–1
- Diode Forward Current - A
–0.1
SD
I
0
–1.0
V
SD
- Source to Drain Voltage - V
–2.0
–3.0
SWITCHING CHARACTERISTICS
1 000
t
d(off)
t
f
100
oss
t
rss
- Switching Time - ns
f
, t
10
d(off)
, t
r
, t
d(on)
t
1
–0.1
r
t
d(on)
–1–10–100
I
D
- Drain Current - A
DD
V
V
GS
R
G
= 10 Ω
= –30 V
= –10 V
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1000
100
10
- Reverse Recovery Time - ns
rr
t
1
–0.1
–1–10–100
I
F
- Diode Current - A
di/dt = 50 A/ s
GS
V
= 0
µ
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
–80
I
D
–60
V
DD
= –48 V
–40
–24 V
–12 V
–20
- Drain to Source Voltage - V
DS
V
0
V
DS
20406080
Q
G
- Gate Charge - nC
= –20 A
V
GS
–14
–12
–10
–8
–6
–4
- Gate to Source Voltage - V
–2
GS
V
0
5
Page 6
Document NameDocument No.
NEC semiconductor device reliability/quality control systemC11745E
Power MOS FET features and application to switching power supplyD12971E
Application circuits using Power MOS FETTEA-1035
Safe operating area of Power MOS FETTEA-1037
Guide to prevent damage for semiconductor devices by electrostatic discharge (EDS)C11892E
2SJ494
6
Page 7
[MEMO]
2SJ494
7
Page 8
2SJ494
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on
a customer designated "quality assurance program" for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96. 5
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