Datasheet 2SJ494 Datasheet (NEC)

Page 1
DATA SHEET
MOS FIELD EFFECT POWER TRANSISTORS
2SJ494
SWITCHING P-CHANNEL POWER MOS FET INDUSTRIAL USE
This product is P-Channel MOS Field Effect Transistor
designed for high current switching applications.

FEATURES

• Super Low On-State Resistance
DS(on)1
R
= 50 m: Max. (VGS = –10 V, ID = –10 A)
DS(on)2
R
= 88 m: Max. (VGS = –4 V, ID = –10 A)
• Low C
issCiss
= 2360 pF Typ.
• Built-in Gate Protection Diode
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage V Gate to Source Voltage* V Gate to Source Voltage V Drain Current (DC) I Drain Current (pulse)** I Total Power Dissipation (TC = 25 °C) P Total Power Dissipation (TA = 25 °C) P Channel Temperature T Storage Temperature T
* f = 20 kHz, Duty Cycle d 10% (+Side) ** PW d 10 Ps, Duty Cycle d 1%
DSS GSS (AC)
GSS (DC) D (DC) D (pulse)
T
T
ch
stg

THERMAL RESISTANCE

Channel to Case R Channel to Ambient R
th (ch-C) th (ch-A)
3.57 °C/W
62.5 °C/W
–60 V –
+20 V
–20, 0 V
+20 A –
+80 A
35 W
2.0 W
150 °C
–55 to +150 °C

PACKAGE DIMENSIONS

(in millimeter)
10.0±0.3
15.0±0.3
2.54
123
3.2±0.2
3±0.1
4±0.2
13.5 MIN. 12.0±0.2
1.3±0.20.7±0.1
1.5±0.2
2.54
ISOLATED TO-220 (MP-45F)
Gate
Gate Protection Diode
4.5±0.2
2.7±0.2
2.5±0.1
0.65±0.1
1. Gate
2. Drain
3. Source
Drain
Body Diode
Source
The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.
Document No. D11266EJ2V0DS00 (2nd edition) Date Published January 1998 N CP(K) Printed in Japan
1998©
Page 2
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
2SJ494
R
DSS
GSS
d(on)
r
d(off)
f
rr
DS(on)1
DS(on)2
GS (off)
iss
oss
rss
G
GS
GD
F(S-D)
rr
VGS = –10 V, ID = –10 A 39 50 m: VGS = –4 V, ID = –10 A 61 88 m: VDS = –10 V, ID = –1 mA –1.0 –1.5 –2.0 V
DS
= –10 V, ID = –10 A 8.0 15 S VDS = –60 V, VGS = 0 –10 VGS = +20 V, VDS = 0 +10 VDS = –10 V
GS
V
= 0 f = 1 MHz
D
= –10 A
I
GS(on)
V
= –10 V
DD
V
= –30 V
G
R
= 10 :
D
= –20 A
I
DD
V
= –48 V
GS
V
= –10 V
IF = 20 A, VGS = 0 1.0 1.5 V
F
= 20 A, VGS = 0
I di/dt = 100 A/
Drain to Source On-state Resistance R
Gate to Source Cutoff Voltage V Forward Transfer Admittance | yfs |V Drain Leakage Current I Gate to Source Leakage Current I Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C Turn-On Delay Time t Rise Time t Turn-Off Delay Time t Fall Time t Total Gate Charge Q Gate to Source Charge Q Gate to Drain Charge Q Body Diode Forward Voltage V Reverse Recovery Time t Reverse Recovery Charge Q
P
A
P
A 2360 pF 1060 pF
350 pF
25 ns 160 ns 310 ns 240 ns
74 nC
12 nC
16 nC
130 ns
P
s
290 nC
Test Circuit 1 Switching Time Test Circuit 2 Gate Charge
PG.
VGS 0
t
µ
t = 1 s Duty Cycle 1 %
RG
G = 10
R
D.U.T.
R
VDD
VGS
Wave Form
ID
Wave Form
VGS
10 %
0
ID
90 %
10 %
0
td (on) tr td (off) tf
ton toff
VGS (on)
ID
90 %
PG.
90 %
10 %
L
G
= 2 mA
I
50
D.U.T.
R
L
V
DD
2
Page 3
2SJ494
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
20 40 60 80 100 120 140 160
C
- Case Temperature - ˚C
T
FORWARD BIAS SAFE OPERATING AREA
–1000
–100
RDS(on) Limited
(at VGS =10 V)
–10
- Drain Current - A
D
I
Tc = 25 ˚C Single Pulse
–1
–0.1
DS
- Drain to Source Voltage - V
V
ID(pulse)
ID(DC)
Power Dissipation Limited
–1 –10 –100
500 s
µ
10 ms
100 ms
1 ms
DC
300 s
µ
TOTAL POWER DISSIPATION vs. CASE TEMPERATURE
35
30
25
20
15
10
- Total Power Dissipation - W
5
T
P
0
20
40 60 80 100 120 140 160
C
- Case Temperature - ˚C
T
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE
–100
–80
VGS= –10 V
–60
–40
- Drain Current - A
D
I
–20
0
–4
DS
- Drain to Source Voltage - V
V
–8
V
GS
= –4 V
–12
Pulsed
–16
FORWARD TRANSFER CHARACTERISTICS
–1 000
T
ch
= –25 ˚C
–100
125 ˚C
–10
- Drain Current - A
D
I
–1
0
–5
GS
- Gate to Source Voltage - V
V
–10
25 ˚C
V
DS
Pulsed
= –10 V
–15
3
Page 4
1 000
100
10
1
0.1
0.01
- Transient Thermal Resistance - ˚C/W
th(t)
r
0.001
µµ
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
1 m 10 m 100 m 1 10 100 1 000 10
PW - Pulse Width - s
Single Pulse
R
R
th(ch-a)
th(ch-c)
2SJ494
= 62.5 ˚C/W
= 3.57 ˚C/W
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT
100
Tch = –25 ˚C
10
25 ˚C 75 ˚C
125 ˚C
1
| - Forward Transfer Admittance - S
fs
0.1
| y
–0.1
–1.0
D
- Drain Current - A
I
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
150
100
V
DS
= –10 V
Pulsed
–10 –100
Pulsed
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
150
Pulsed
100
ID = –20 A
50
- Drain to Source On-State Resistance - m
0–5
DS(on)
R
GS
- Gate to Source Voltage - V
V
GATE TO SOURCE CUTOFF VOLTAGE vs. CHANNEL TEMPERATURE
–2.0
–10 –20
VDS = –10 V I
D
= –1 mA
–1.5
V
GS
= –4 V
V
GS
= –10 V
–1.0
50
–0.5
- Drain to Source On-State Resistance - m
DS(on)
R
0
–1
–10 –100
ID - Drain Current - A
- Gate to Source Cutoff Voltage - V
0
GS(off)
V
–50
0 50 100 150
ch
- Channel Temperature - ˚C
T
4
Page 5
2SJ494
DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE
160
120
- Drain to Source On-State Resistance - m
DS(on)
R
80
40
0
–50
V
GS
= –4 V
V
GS
= –10 V
0
T
ch
- Channel Temperature - ˚C
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
50
100 150
10 000
1 000
- Capacitance - pF
rss
100
, C
oss
, C
iss
C
10
–0.1
–1 –10 –100
V
DS
- Drain to Source Voltage - V
D
= –10 A
I
VGS = 0 f = 1 MHz
C
iss
C
C
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
Pulsed
–100
V
GS
= –4 V
–10
V
GS
= 0
–1
- Diode Forward Current - A
–0.1
SD
I
0
–1.0
V
SD
- Source to Drain Voltage - V
–2.0
–3.0
SWITCHING CHARACTERISTICS
1 000
t
d(off)
t
f
100
oss
t
rss
- Switching Time - ns
f
, t
10
d(off)
, t
r
, t
d(on)
t
1 –0.1
r
t
d(on)
–1 –10 –100
I
D
- Drain Current - A
DD
V V
GS
R
G
= 10
= –30 V = –10 V
REVERSE RECOVERY TIME vs. DRAIN CURRENT
1000
100
10
- Reverse Recovery Time - ns
rr
t
1
–0.1
–1 –10 –100
I
F
- Diode Current - A
di/dt = 50 A/ s
GS
V
= 0
µ
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
–80
I
D
–60
V
DD
= –48 V
–40
–24 V –12 V
–20
- Drain to Source Voltage - V
DS
V
0
V
DS
20 40 60 80
Q
G
- Gate Charge - nC
= –20 A
V
GS
–14 –12
–10
–8 –6 –4
- Gate to Source Voltage - V
–2
GS
V
0
5
Page 6
Document Name Document No. NEC semiconductor device reliability/quality control system C11745E Power MOS FET features and application to switching power supply D12971E Application circuits using Power MOS FET TEA-1035 Safe operating area of Power MOS FET TEA-1037 Guide to prevent damage for semiconductor devices by electrostatic discharge (EDS) C11892E
2SJ494
6
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[MEMO]
2SJ494
7
Page 8
2SJ494
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product.
M4 96. 5
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