Datasheet 2SJ484 Datasheet (HIT)

Page 1
Features
Low on-resistance
R
= 0.18 typ. (at V
Low drive current
High speed switching
4V gate drive devices.
Outline
2SJ484
Silicon P-Channel MOS FET
High Speed Power Switching
= –10V, ID = –1A)
GS
ADE-208-501 A
2nd. Edition
UPAK
G
1
2
3
4
D
1. Gate
2. Drain
3. Source
4. Drain
S
Page 2
2SJ484
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body to drain diode reverse drain current I Channel dissipation Pch*
DSS
GSS
D
D(pulse)
DR
1
*
2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Notes: 1. PW 100µs, duty cycle 10 %
2. When using aluminium ceramic board (12.5 x 20 x 0.7 mm)
–30 V ±20 V –2 A –4 A –2 A 1W
2
Page 3
2SJ484
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Zero gate voltege drain
I
DSS
current Gate to source leak current I Gate to source cutoff voltage V Static drain to source on state
R
GSS
GS(off)
DS(on)
resistance
R
DS(on)
Forward transfer admittance |yfs| 1.2 2.0 S ID = –1A, VDS = –10V* Input capacitance Ciss 230 pF VDS = –10V Output capacitance Coss 140 pF VGS = 0 Reverse transfer capacitance Crss 50 pF f = 1MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body to drain diode forward
V
d(on)
r
d(off)
f
DF
voltage Body to drain diode reverse
t
rr
recovery time Notes: 1. Pulse test
2. Marking is “WY”.
–30 V ID = –10mA, VGS = 0
±20——V I
–10 µAV
——±10 µAV
= ±100µA, VDS = 0
G
= –30 V, VGS = 0
DS
= ±16V, VDS = 0
GS
–1.0 –2.0 V ID = –1mA, VDS = –10V — 0.18 0.23 ID = –1A, VGS = –10V*
0.3 0.45 ID = –1A, VGS = –4V*
10 ns ID = –1A, RL = 30 30 ns VGS = –10V —35—ns —30—ns — –0.95 V IF = –2A, VGS = 0
60 ns IF = –2A, VGS = 0
diF/ dt = 50A/µs
1
1
1
3
Page 4
2SJ484
Main Characteristics
Power vs. Temperature Derating
2.0 Test Condition :
When using the aliminium Ceramic board (12.5 x 20 x 70 mm)
1.5
1.0
0.5
Channel Dissipation Pch (W)
0
50 100 150 200
Ambient Temperature Ta (°C)
Typical Output Characteristics
–5
–10 V
–6 V
–5 V
–4.5 V
–4
D
–3
–4 V
–3.5 V
–10
Maximum Safe Operation Area
100 µs
–3
D
–1
DC Operation
1 ms
PW = 10 ms
(1 shot)
–0.3
Operation in
–0.1
Drain Current I (A)
this area is limited by R
DS(on)
–0.03
–0.01
Ta = 25 °C
–0.1 –0.3 –1 –3 –10 –30 –100
Drain to Source Voltage V (V)
Typical Transfer Characteristics
–5
V = –10 V
DS
Pulse Test
–4
D
–3
DS
–2
Drain Current I (A)
–1
0
Drain to Source Voltage V (V)
4
–3 V
V = –2.5 V
GS
Pulse Test
–2 –4 –6 –8 –10
DS
–2
Drain Current I (A)
–1
0
Tc = 75°C
–1 –2 –3 –4 –5
Gate to Source Voltage V (V)
25°C
–25°C
GS
Page 5
2SJ484
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–1.0
–0.8
DS(on)
V (V)
–0.6
–0.4
–0.2
Drain to Source Saturation Voltage
0
–4
–8
–12 –16 –20
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
0.5 Pulse Test
0.4
DS(on)
R ( )
0.3
V = –10 V
GS
0.2
Pulse Test
I = –2 A
D
–1 A
–0.5 A
GS
I = –2 A
D
–0.5, –1.0 A
Static Drain to Source on State Resistance
vs. Drain Current
2
Pulse Test
1
DS(on)
R ( )
0.5 V = –4 V
GS
0.2
Drain to Source On State Resistance
0.1
–0.1 –0.2 –0.5 –1 –2 –5 –10
–10 V
Drain Current I (A)
D
Forward Transfer Admittance vs.
Drain Current
5
fs
2
Tc = –25 °C
1
0.5
0.2
75 °C
25 °C
–20
0.1
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
0.1
Forward Transfer Admittance |y | (S)
0.05
–0.02 –0.2 –0.5 –1 –2 –5
–0.01
–0.1–0.05
Drain Current I (A)
V = –10 V
DS
Pulse Test
D
5
Page 6
2SJ484
Body to Drain Diode Reverse
Recovery Time
500
200
100
50
20 10
Reverse Recovery Time trr (ns)
5
–0.1
–0.2
di / dt = 50 A / µs V = 0, Ta = 25 °C
GS
–0.5 –1 –2 –5 –10
Reverse Drain Current I (A)
DR
Typical Capacitance vs. Drain to Source Voltage
1000
500
Ciss
200
Coss
100
50
Capacitance C (pF)
Crss
20
10
0 –10 –20 –30 –40 –50
Drain to Source Voltage V (V)
V = 0
GS
f = 1 MHz
DS
Dynamic Input Characteristics
0
V = –5 V
DD
–10 V
DS
–10
–25 V
V
GS
–20
V = –5 V
DD
–10 V –25 V
–30
V
DS
–40
Drain to Source Voltage V (V)
–50
I = –2 A
0
D
4 8 12 16 20
Gate Charge Qg (nc)
0
500
V = –10 V, V = –10 V
GS
duty < 1 %
Switching Characteristics
GS
200
–4
100
–8
t
d(off)
t
f
–12
–16
50
20
Switching Time t (ns)
10
Gate to Source Voltage V (V)
–20
5
–0.1 –0.2 –0.5 –1 –2 –5 –10
Drain Current I (A)
DD
t
r
t
d(on)
D
6
Page 7
DR
2SJ484
Reverse Drain Current vs.
Source to Drain Voltage
–5
–4
–3
–2
–10 V
–5 V
V = 0, 5 V
GS
–1
Reverse Drain Current I (A)
0
–0.4 –0.8 –1.2 –1.6 –2.0
Source to Drain Voltage V (V)
Pulse Test
SD
Switching Time Test Circuit Switching Time Waveform
R
Vout Monitor
L
Vin
10%
Vin Monitor
D.U.T.
90%
Vin 10 V
50
V
DD
= –10 V
Vout
td(on)
10%
90%
tr
td(off)
90%
10%
t
f
7
Page 8
2SJ484
Package Dimensions
4.5 ± 0.1
1.8 max
4
0.53 max
0.48 max
1
1.5
f
1
23
1.5
3.0
0.4
2.5 ± 0.1
4.25 max
0.8 min
Unit: mm
1.5 ± 0.1
0.44 max
0.44 max
Hitachi Code
EIAJ
JEDEC
UPAK
SC–62
UPAK
8
Page 9
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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