Datasheet 2SJ483 Datasheet (HIT)

Page 1
Features
Low on-resistance
R
= 0.08typ (at VGS = –10 V, ID = –2.5 A)
4V gate drive devices.
Large current capacitance
ID = –5 A
Outline
2SJ483
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-519
1st. Edition
TO-92MOD.
G
D
3
2
1
S
1. Source
2. Drain
3. Gate
Page 2
2SJ483
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body to drain diode reverse drain current I
DSS
GSS
D
D(pulse)
DR
Note1
Channel dissipation Pch 0.9 W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
–30 V ±20 V –5 A –20 A –5 A
2
Page 3
2SJ483
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Zero gate voltege drain current I Gate to source leak current I Gate to source cutoff voltage V Static drain to source on state
R
DSS
GSS
GS(off)
DS(on)
resistance
R
DS(on)
Forward transfer admittance |yfs| 35—SI
Input capacitance Ciss 630 pF VDS = –10V Output capacitance Coss 390 pF VGS = 0 Reverse transfer capacitance Crss 135 pF f = 1MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body to drain diode forward
V
d(on)
r
d(off)
f
DF
voltage Body to drain diode reverse
t
rr
recovery time Note: 1. Pulse test
–30 V ID = –10mA, VGS = 0
±20——V I
= ±100µA, VDS = 0
G
–10 µAVDS = –30 V, VGS = 0 ——±10 µAVGS = ±16V, VDS = 0 –1.0 –2.0 V ID = –1mA, VDS = –10V — 0.08 0.11 ID = –2.5A
V
= –10V*
GS
0.12 0.17 ID = –2.5A
V
= –4V*
GS
= –2.5A,
D
V
= –10V*
DS
1
1
1
15 ns VGS = –10V, ID = –2.5A — 70 ns RL = 4 —65—ns —60—ns — –1.0 V ID = –5A, VGS = 0
60 ns IF = –5A, VGS = 0
diF/ dt = 20A/µs
3
Page 4
2SJ483
Main Characteristics
Power vs. Temperature Derating
1.6
1.2
0.8
0.4
Channel Dissipation Pch (W)
0
50 100 150 200
Ambient Temperature Ta (°C)
Typical Output Characteristics
–10 V
–6 V
–10
–5 V
–8
D
–4 V
–3.5 V
–6
–3 V
–100
–30 –10
D
Maximum Safe Operation Area
10 µs
–3
DC Operation
–1
–0.3
Operation in
Drain Current I (A)
–0.1
this area is limited by R
DS(on)
–0.03 –0.01
Ta = 25 °C
–0.01–0.03 –0.1 –0.3 –1 –3 –10
Drain to Source Voltage V (V)
Typical Transfer Characteristics
–10
V = –10 V
DS
Pulse Test
–8
D
–6
100 µs
1 ms
PW = 10 ms
(1 shot)
–30 –100
DS
–4
Drain Current I (A)
–2
0
Drain to Source Voltage V (V)
4
V = –2.5 V
GS
Ta = 25°C Pulse Test
–2 –4 –6 –8 –10
DS
–4
Tc = 75 °C
Drain Current I (A)
–2
25 °C
–25 °C
0 –1–2–3–4–5
Gate to Source Voltage V (V)
GS
Page 5
2SJ483
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
–1.0
Ta = 25°C Pulset Test
–0.8
DS(on)
V (V)
–0.6
I = –5 A
–0.4
D
–0.2
Drain to Source Saturation Voltage
0
–4 –8 –12 –16 –20
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
0.5 Pulse Test
0.4
DS(on)
R ( )
0.3
I = –5 A
D
0.2
V = –4 V
GS
0.1
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
–10 V
–1, 2, 5 A
Case Temperature Tc (°C)
–2 A –1 A
GS
–1, 2 A
Static Drain to Source on State Resistance
vs. Drain Current
10
Ta = 25°C Pulset Test
3
1
DS(on)
R ( )
0.3 V = –4 V
GS
0.1
–10 V
0.03
Drain to Source on State Resistance
0.01
–0.1 –0.3 –1 –3 –10 –30 –100
Drain Current I (A)
D
Forward Transfer Admittance vs.
Drain Current
50
V = –10 V
DS
Pulse Test
fs
20
10
Ta = –25 °C
5
2
75 °C
1
Forward Transfer Admittance |y | (S)
0.5
–0.1 –1 –10
–0.2 –0.5 –2 –5
Drain Current I (A)
D
25 °C
5
Page 6
2SJ483
Body to Drain Diode Reverse
Recovery Time
500
200
100
50
20
10
Reverse Recovery Time trr (ns)
5
–0.1 –0.2 –1 –5 –10
Reverse Drain Current I (A)
di / dt = 20 A / µs V = 0, Ta = 25 °C
GS
–0.5 –2
DR
Typical Capacitance vs. Drain to Source Voltage
5000
2000 1000
500
200
Capacitance C (pF)
100
50
0 –4 –8 –12 –16 –20
Drain to Source Voltage V (V)
V = 0
GS
f = 1 MHz
Ciss
Crss
Coss
DS
Dynamic Input Characteristics
0
–10
DS
V = –5V
DD
–10 V –25 V
I = –5 A
–20
V
V
DS
–30
V = –25 V
DD
–40
Drain to Source Voltage V (V)
0
–10 V
–5 V
81624
GS
Gate Charge Qg (nc)
D
32
0
500
V = –10 V, V = –10 V
GS
duty < 1 %
Switching Characteristics
GS
200
–4
100
–8
50
t
f
–12
20
–16
Switching Time t (ns)
10
Gate to Source Voltage V (V)
–20–50
40
5 –0.1 –0.2 –0.5 –1 –2 –5
Drain Current I (A)
t
d(off)
DD
t
r
t
d(on)
–10
D
6
Page 7
–10
–8
DR
–6
Reverse Drain Current vs.
Source to Drain Voltage
–10 V
V = 0, 5 V
GS
2SJ483
–4
–5 V
–2
Reverse Drain Current I (A)
0
–0.4 –0.8 –1.2 –1.6 –2.0
Source to Drain Voltage V (V)
Pulse Test
SD
Switching Time Test Circuit Switching Time Waveforms
Vin Monitor
Vin –10 V
D.U.T.
50
Vout Monitor
R
L
V
DD
= –10 V
Vin
10%
90%
90%
90%
Vout
td(on)
10%
10%
tr
td(off)
t
f
7
Page 8
2SJ483
Package Dimensions
Unit: mm
0.70 max
0.75 max
0.60 max
0.55 max
5.2 max
0.7
8.5 max
2.3 max
10.1 min
4.2 max
0.5 max
TO–92Mod.
SC–51
2.54
1.27
Hitachi Code
EIAJ
JEDEC
8
Page 9
Cautions
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2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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