Datasheet 2SJ462 Datasheet (NEC)

Page 1
DATA SHEET
5.7 ±0.1
2.0 ±0.2
213
1.5 ±0.1
0.4 ±0.05
4.2
0.85 ±0.1
2.1
0.5 ±0.1
1.0
0.55
0.5 ±0.1
3.65 ±0.1
5.4 ±0.25
MOS FIELD EFFECT TRANSISTOR
2SJ462
P-CHANNEL MOS FIELD EFFECT TRANSISTOR
FOR HIGH SPEED SWITCHING

DESCRIPTION

by an IC operating at 3 V.
The 2SJ462 features a low on-state resistance and can be driven by a low voltage power source, so it is suitable for applica­tions such as power management.

FEATURES

• Can be driven by a 2.5 V power source.
• New-type compact package.
Has advantages of packages for small signals and for power
transistors, and compensates those disadvantages.
• Low on-state resistance.
DS(ON) : 0.29 MAX. @VGS = –2.5 V, ID = –0.5 A
R
RDS(ON) : 0.19 MAX. @VGS = –4.0 V, ID = –1.0 A
ABSOLUTE MAXIMUM RATINGS (TA = +25 ˚C)
Drain to Source Voltage VDSS –12 V Gate to Source Voltage V Drain Current (DC) ID(DC) ±2.5 A Drain Current (pulse) ID(pulse) ±5.0* A Total Power Dissipation P Channel Temperature Tch 150 ˚C Storage Temperature Tstg –55 to +150 ˚C
* PW 10 ms, Duty Cycle 1 %
** Mounted on ceramic board of 7.5 cm
GSS ±8.0 V
T 2.0** W
2
× 0.7 mm
Package Drawings (unit : mm)

Equivalent Circuit

Electrode Connection
1. Source
2. Drain
3. Gate
Internal Diode
Gate
Gate Protect Diode
Drain
Source
Marking : UA3
Document No. D11449EJ1V0DS00 (1st edition) Date Published April 1996 P Printed in Japan
©
1996
Page 2
ELECTRICAL SPECIFICATIONS (TA = +25 ˚C)
Parameter Symbol MIN. TYP. MAX. Unit Conditions Drain Cut-off Current IDSS –10 Gate Leakage Current IGSS ±10 Gate Cut-off Voltage VGS(off) –0.7 –1.0 –1.3 V VDS = –3.0 V, ID = –1.0 mA Forward Transfer Admittance |yfs| 1.5 S VDS = –3.0 V, ID = –1.0 A Drain to Source On-State RDS(on)1 195 290 m VGS = –2.5 V, ID = –0.5 A
Resistance Drain to Source On-State RDS(on)2 135 190 m VGS = –4.0, ID = –1.0 A
Resistance Input Capacitance Ciss 940 pF VDS = –3.0 V, VGS = 0 Output Capacitance Coss 835 pF f = 1.0 MHz Reverse Transfer Capacitance Crss 495 pF Turn-On Delay Time td(on) 45 ns VDD = –3.0 V, ID = –1.0 A Rise Time tr 225 ns Turn-Off Delay Time td(off) 140 ns Fall Time tf 195 ns Total Gate Charge QG 12 nC VDS = –8 V, ID = –2.5 A Gate to Source Charge QGS 2nC Gate to Drain Charge QGD 7nC Diode Forward Voltage VF(S–D) –0.86 V IF = –2.5 A, VGS = 0 Reverse Recovery Time trr 150 ns IF = –2.5 A, VGS = 0 Reverse Recovery Charge Qrr 160 nC
µ
AVDS = –12 V, VGS = 0
µ
AVGS = ±8.0 V, VDS = 0
VGS(on) = –3.0 V, RG = 10 RL = 3.0
VGS = –3.0 V, IG = –2 mA
di/dt = 50 A/µs
2SJ462
2
Page 3
2SJ462
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
100
80
60
40
dT - Derating Factor - %
20
0
0 30 60 90 120 150
A - Ambient Temperature - ˚C
T
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE
–5
–4
–5 V
–4 V
–3 V
FORWARD BIAS SAFE OPERATING AREA
–10
1 ms
10 ms
PW = 100 ms
–1
DC
ID - Drain Current - A
Single Pulse
–0.1
–1 –10 –100
DS - Drain to Source Voltage - V
V
TRANSFER CHARACTERISTICS
–10
VDS = –3 V
–1
–3
–2
ID - Drain Current - A
–1
–2 V
VGS = –1 V
0
0 –2 –4 –6 –8 –10
V
DS - Draint to Source Voltage - V
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT
10
VDS = –3 V
1
TA = –25 ˚C
25 ˚C
0.1
75 ˚C
125 ˚C
–0.1
TA = 125 ˚C
TA = 75 ˚C
TA = 25 ˚C
–0.01
TA = –25 ˚C
ID - Drain Current - A
–0.001
–0.0001
0 –0.5 –1.0 –1.5 –2.0 –2.5
V
GS - Gate to Source Voltage - V
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
0.6 VGS = –2.5 V
0.5
0.4
0.3
TA = 125 ˚C
75 ˚C
0.2
25 ˚C
–25 ˚C
0.1
IyfsI - Forward Transfer Admittance - S
0.01 –0.0001 –0.001 –0.01 –0.1 –1
D - Drain Current - A
I
0
–0.001 –0.01 –0.1 –1 –10
RDS(on) - Drain to Source On-State Resistance -
D - Drain Current - A
I
3
Page 4
2SJ462
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
0.6 VGS = –4 V
0.5
0.4
0.3 TA = 125 ˚C
0.2
75 ˚C 25 ˚C
0.1
–25 ˚C
- Drain to Source On-State Resistance -
0
DS(on)
–0.001 –0.01 –0.1 –1 –10
R
I
D
- Drain Current - A
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
10
VGS = 0 f = 1 MHz
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE
0.3 ID = –2.5 A
0.2
–1.0 A
–0.5 A
0.1
- Drain to Source On-State Resistance -
0
DS(on)
R
0 –2 –4 –6 –8 –10
VGS - Gate to Source Voltage - V
SWITCHING CHARACTERISTICS
1000
VDD = –3 V
GS(on)
= –3 V
V Rin = 10
t
r
1
Ciss,Coss,Crss - Capacitance - pF
0.1 –0.1 –1 –10
DS
- Drain to Source Voltage - V
V
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
–10
–1
–0.1
–0.01
- Reverse Drain Current - A
D
I
–0.001
–0.4 –0.6 –0.8 –1.0 –1.2 –1.4
SD
- Source to Drain Voltage - V
V
Ciss
Coss
Crss
t
f
t t
d(off)
d(on)
100
- Switching Time - ns
f
,t
d(off)
,t
r
,t
d(on)
t
10
–0.1 –1 –10
D
- Draint Current - A
I
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
12
VDS = –8 V
V
D
= –2.5 A
I
GS
8
V
DS
4
- Drain to Source Voltage - V
DS
V
0
0 8 16 24 32 40
G
- Gate Charge - nC
Q
8
4
2
- Gate to Source Voltage - V
GS
V
0
4
Page 5
2SJ462

REFERENCE

Document Name Document No. NEC semiconductor device reliability/quality control system TEI-1202 Quality grade on NEC semiconductor devices IEI-1209 Semiconductor device mounting technology manual C10535E Guide to quality assurance for semiconductor devices MEI-1202 Semiconductor selection guide X10679E
5
Page 6
2SJ462
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: “Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on a customer designated “quality assurance program“ for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application.
Standard:Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support)
Specific:Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc. The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance. Anti-radioactive design is not implemented in this product.
M4 94.11
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