The 2SC3604 is an NPN epitaxial transistor designed for lownoise amplification at 1.0 to 6.0 GHz. This transistor has low-noise
and high-gain characteristics in a wide collector current region, and
has a wide dynamic range.
FEATURES
• Low noise: NF = 1.6 dB TYP. @ f = 2.0 GHz
• High power gain: G
ABSOLUTE MAXIMUM RATINGS (TA = 25
PARAMETERSYMBOLRATINGUNIT
Collector to Base VoltageVCBO20V
Collector to Emitter VoltageVCEO10V
Emitter to Base VoltageVEBO1.5V
Collector CurrentIC65mA
Total Power DissipationPT (TC = 25 °C)580mW
Junction TemperatureTj200°C
Storage TemperatureTstg
A = 12 dB TYP. @ f = 2.0 GHz
°°
°C)
°°
-
65 to +150°C
PACKAGE DIMENSIONS (in mm)
E
3.8 MIN.
3.8 MIN.
CB
E
2.55 ± 0.2
2.1
φ
3.8 MIN.
3.8 MIN.
0.5 ± 0.05
0.5 ± 0.05
45 °
PIN CONNECTIONS
E: Emitter
C: Collector
B: Base
0.55
1.8 MAX.
+0.06
-0.03
0.1
ELECTRICAL CHARACTERISTICS (TA = 25
PARAMETERSYMBOLTEST CONDITIONSMIN.TYP.MAX.UNIT
Collector Cut-off CurrentICBOVCB = 10 V, IE = 01.0
Emitter Cut-off CurrentIEBOVEB = 1 V, IC = 01.0
DC Current GainhFEVCE = 8 V, IC = 20 mA Pulse50100250
Gain Bandwidth ProductfTVCE = 8 V, IC = 20 mA8GHz
Reverse Transfer CapacitanceCreVCB = 10 V, IE = 0, f = 1 MHz0.20.7pF
Noise FigureNF
Insertion Gain|S21e|2VCE = 8 V, IC = 20 mA, f = 2.0 GHz9.011dB
Maximum Available GainMAGVCE = 8 V, IC = 20 mA, f = 2.0 GHz13dB
Power GainGAVCE = 8 V, IC = 7 mA, f = 2.0 GHz12dB
Document No. P11675EJ2V0DS00 (2nd edition)
Date Published August 1996 P
Printed in Japan
The export of this product from Japan is prohibited without governmental license. To export or re-export this product from
a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
“Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on
a customer designated “quality assurance program“ for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact NEC Sales Representative in advance.
Anti-radioactive design is not implemented in this product.
M4 94.11
6
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