Datasheet 2SC1317 Datasheet (Panasonic)

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Transistors
2SC1317, 2SC1318
Silicon NPN epitaxial planar type
For low-frequency power amplification and driver amplification
Complementary to 2SA0719 and 2SA0720
■ Features
• Complementary pair with 2SA0719 and 2SA0720
■ Absolute Maximum Ratings Ta = 25°C
Parameter Symbol Rating Unit
Collector-base voltage
(Emitter open)
Collector-emitter voltage
(Base open)
Emitter-base voltage (Collector open) V
Collector current I
Peak collector current I
Collector power dissipation P
Junction temperature T
Storage temperature T
2SC1317 V
2SC1318 60
2SC1317 V
2SC1318 50
CE(sat)
CBO
CEO
EBO
C
CP
C
j
−55 to +150 °C
stg
30 V
25 V
7V
0.5 A
1A
625 mW
150 °C
0.45
0.7
2.5
+0.15 –0.1
±0.1
+0.6 –0.2
123
5.0
±0.2
2.5
+0.6 –0.2
±0.2
0.7
±0.2
2.3
4.0
±0.2
5.1
±0.5
12.9
+0.15
0.45
–0.1
1: Emitter 2: Collector 3: Base
TO-92-B1 Package
Unit: mm
±0.2
■ Electrical Characteristics Ta = 25°C ± 3°C
Parameter Symbol Conditions Min Typ Max Unit
Collector-base voltage
(Emitter open)
Collector-emitter voltage
(Base open)
Emitter-base voltage (Collector open) V
Collector-base cutoff current (Emitter open)
Forward current transfer ratio
Collector-emitter saturation voltage
Base-emitter saturation voltage
2SC1317 V
CBOIC
2SC1318 60
2SC1317 V
CEOIC
2SC1318 50
EBOIE
I
1
*
CBO
h
FE1
h
FE2
V
CE(sat)IC
V
BE(sat)IC
1
*
1
*
Transition frequency f
Collector output capacitance C
(Common base, input open circuited)
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2.*1: Pulse measurement
2: Rank classification
*
Rank Q R S
h
FE1
85 to 170 120 to 240 170 to 340
= 10 µA, IE = 030V
= 10 mA, IB = 025V
= 10 µA, IC = 07V
VCB = 20 V, IE = 0 0.1 µA
2
*
VCE = 10 V, IC = 150 mA 85 340
VCE = 10 V, IC = 500 mA 40
= 300 mA, IB = 30 mA 0.35 0.60 V
= 300 mA, IB = 30 mA 1.1 1.5 V
VCB = 10 V, IE = −50 mA, f = 200 MHz
T
VCB = 10 V, IE = 0, f = 1 MHz 6 15 pF
ob
200 MHz
Publication date: March 2003 SJC00100CED
1
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2SC1317, 2SC1318
PC T
800
(mW)
600
C
400
200
a
Collector power dissipation P
0
0 16040 12080
Ambient temperature Ta (°C)
V
I
100
CE(sat)
C
IC / IB = 10
(V)
CE(sat)
10
1
0.1
Collector-emitter saturation voltage V
0.01
0.01 0.1 1 10
Ta = 75°C
25°C
−25°C
Collector current IC (A)
IC V
9 mA
8 mA
7 mA
6 mA
CE
5 mA
4 mA
0.8
0.7
0.6
(A)
C
0.5
0.4
0.3
Collector current I
0.2
0.1
0
IB = 10 mA
020164128
Collector-emitter voltage VCE (V)
V
I
100
BE(sat)
C
(V)
BE(sat)
10
25°C
1
0.1
Ta = 75°C
−25°C
Base-emitter saturation voltage V
0.01
0.01 0.1 1 10
Collector current IC (A)
Ta = 25°C
3 mA
2 mA
1 mA
IC / IB = 10
IC I
0.8
0.7
0.6
(A)
C
0.5
0.4
0.3
Collector current I
0.2
0.1
0
0108264
B
Base current IB (mA)
hFE I
300
250
FE
Ta = 75°C
200
150
100
Forward current transfer ratio h
25°C
−25°C
50
0
0.01 0.1 1 10
C
VCE = 10 V
Collector current IC (A)
VCE = 10 V
= 25°C
T
a
fT I
240
200
(MHz)
160
T
120
80
Transition frequency f
40
0
−1 −10 −100
Emitter current IE (mA)
2
E
VCB = 10 V
= 25°C
T
a
Cob V
12
(pF)
ob
10
C
8
6
4
2
Collector output capacitance
(Common base, input open circuited)
0
1 10 100
CB
IE = 0 f = 1 MHz T
a
Collector-base voltage VCB (V)
SJC00100CED
= 25°C
V
R
120
100
(V)
CER
V
80
60
40
20
Collector-emitter voltage
(Resistor between B and E)
0
1 10 100 1 000
CER
2SC1318
2SC1317
Base-emitter resistance RBE (kΩ)
BE
IC = 2 mA T
= 25°C
a
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)
a
(T
CEO
I
= 25°C)
a
(T
CEO
I
2SC1317, 2SC1318
I
T
4
10
3
10
2
10
10
CEO
a
VCE = 10 V
(A)
C
Collector current I
Safe operation area
10
1
0.1
0.01
Single pulse
= 25ºC
T
a
I
CP
I
C
t = 10 ms
t = 1 s
DC
1
0 20016040 12080
Ambient temperature Ta (°C)
0.001
0.1 1 10 100
Collector-emitter voltage VCE (V)
SJC00100CED
3
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and semiconductors described in this material
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(6) When designing your equipment, comply with the guaranteed values, in particular those of maxi-
mum rating, the range of operating power supply voltage, and heat radiation characteristics. Other­wise, we will not be liable for any defect which may arise later in your equipment. Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
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permission of Matsushita Electric Industrial Co., Ltd.
2002 JUL
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