
5-TAP SMD DELAY LINE
TD/TR = 3
(SERIES 1518)
delay
devices, inc.
FEATURES PACKAGES
• 5 taps of equal delay increment
• Delays to 200ns
• Low profile
• Epoxy encapsulated
• Meets or exceeds MIL-D-23859C
N/C
N/C
GND
IN
1
2
T2
3
4
T4
5
T5
6
7
N/C
14
T1
13
N/C
12
T3
11
N/C
10
N/C
9
N/C
8
IN Signal Input
T1-T5 Tap Outputs
GND Ground
Note: Standard pinout shown
Alt. pinout available
FUNCTIONAL DESCRIPTION
The 1518-series device is a fixed, single-input, fiveoutput, passive delay line. The signal input (IN) is
reproduced at the outputs (T1-T5) in equal increments.
The delay from IN to T5 (TD) and the characteristic
impedance of the line (Z) are determined by the dash
number. The rise time (TR) of the line is 30% of TD, and
the 3dB bandwidth is given by 1.05 / TD. The device is
available in a 14-pin SMD with two pinout options.
Part numbers are constructed according to the scheme
shown at right. For example, 1518-101-500A is a 100ns,
50Ω delay line with pinout code A. Similarly, 1518-151501 a is 150ns, 500Ω delay line with standard pinout.
DELAY TIME
Expressed in nanoseconds (ns)
First two digits are significant figures
Last digit specifies # of zeros to follow
IMPEDANCE
Expressed in nanoseconds (ns)
First two digits are significant figures
Last digit specifies # of zeros to follow
1518 - xxx - zzz p
PINOUT CODE
See Table
Omit for STD pinout
SERIES SPECIFICATIONS
• Dielectric breakdown: 50 Vdc
• Distortion @ output: 10% max.
• Operating temperature: -55°C to +125°C
• Storage temperature: -55°C to +125°C
• Temperature coefficient: 100 PPM/°C
T1 T2 T3 T4
IN T5
GND
Functional Diagram
.018
814
.290
1 7
Package Dimensions
GND
.425
DELAY SPECIFICATIONS
T
T
D
(ns) (ns) (ns)
5 1.0 3.0 N/A 5 N/A N/A N/A
10 2.0 4.0 3 5 5 N/A N/A
15 3.0 5.0 3 5 5 N/A N/A
20 4.0 6.0 3 5 5 5 N/A
25 5.0 7.0 3 5 5 5 7
30 6.0 10.0 3 5 5 5 7
40 8.0 13.0 3 5 5 5 7
50 10.0 15.0 3 5 5 7 7
60 12.0 20.0 3 5 6 7 8
75 15.0 25.0 3 5 6 7 8
80 16.0 26.0 4 5 6 7 8
100 20.0 30.0 4 5 6 7 8
110 22.0 32.0 4 5 6 7 8
125 25.0 40.0 4 5 6 7 8
150 30.0 50.0 N/A 5 8 10 10
180 36.0 60.0 N/A 7 8 10 10
200 50.0 70.0 N/A 8 10 12 12
Notes: TI represents nominal tap-to-tap delay increment
Tolerance on TD = ±±5% or ±±2ns, whichever is greater
Tolerance on TI = ±±5% or ±±1ns, whichever is greater
“N/A” indicates that delay is not available at this Z
T
I
R
ATTENUATION (%) TYPICAL
Z=50ΩΩ Z=100ΩΩ Z=200ΩΩ Z=300ΩΩ Z=500ΩΩ
PINOUT CODES
CODE IN T1 T2 T3 T4 T5 GND
STD 1 13 3 11 5 6 7
A 1 12 4 10 6 7 8,14
1997 Data Delay Devices
Doc #97030 DATA DELAY DEVICES, INC. 1
2/7/97 3 Mt. Prospect Ave. Clifton, NJ 07013

PASSIVE DELAY LINE TEST SPECIFICATIONS
TEST CONDITIONS
INPUT: OUTPUT:
Ambient Temperature: 25oC ± 3oC R
Input Pulse: High = 3.0V typical C
Low = 0.0V typical Threshold: 50% (Rising & Falling)
Source Impedance: 50Ω Max.
Rise/Fall Time: 3.0 ns Max. (measured
at 10% and 90% levels)
Pulse Width (TD <= 75ns): PWIN = 100ns
Period (TD <= 75ns): PERIN = 1000ns
Pulse Width (TD > 75ns): PWIN = 2 x T
Period (TD > 75ns): PERIN = 10 x T
D
D
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
PER
PW
IN
T
RISE
: 10MΩ
load
: 10pf
load
IN
T
FALL
INPUT
SIGNAL
OUTPUT
SIGNAL
PULSE
GENERATOR
R
50 Ω
V
IH
T
RISE
T
RISE
V
OH
Timing Diagram For Testing
IN
DEVICE UNDER
TEST (DUT)
RIN = R
OUT
= Z
LINE
T
FALL
V
IL
T
FALL
V
OL
R
OUT
Doc #97030 DATA DELAY DEVICES, INC. 2
2/7/97 Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com
Test Setup