Datasheet 5962-9165501MYA, 5962-9165501MXA, 100363DM-MLS Datasheet (NSC)

100363
Low Power Dual 8-Input Multiplexer

General Description

The 100363 is a dual 8-input multiplexer. The Data Select
(S

n

) inputs determine which bit (Anand Bn) will be presented

at the outputs (Z

a

and Zbrespectively). The same bit (0–7)

will be selectedfor both the Z

a

and Zboutput.All inputs have

50 kΩ pulldown resistors.

Features

n 50%power reduction of the 100163

n 2000V ESD protection
n Pin/function compatible with 100163
n Voltage compensated operating range=−4.2V to −5.7V
n Standard Microcircuit Drawing

(SMD) 5962-9165501

Logic Symbol

Pin Names Description

S

0–S2

Data Select Inputs

A

0–A7

A Data Inputs

B

0–B7

B Data Inputs

Z

a,Zb

Data Outputs

Connection Diagrams

DS100310-1

24-Pin Quad Cerpak

DS100310-3

24-Pin DIP

DS100310-2

August 1998

100363 Low Power Dual 8-Input Multiplexer

© 1998 National Semiconductor Corporation DS100310 www.national.com

Logic Diagram

DS100310-5

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Truth Table

Inputs Outputs

Select Data

S

2S1S0A7A6A5A4A3A2A1A0

Z

a

B7B6B5B4B3B2B1B

0

Z

b

LLL L L
LLL H H
LLH L L
LLH H H
LHL L L
LHL H H
LHH L L
LHH H H
HLL L L
HLL H H
HLH L L
HLH H H
HHL L L
HHL H H
HHHL L
HHHH H

H=HIGH Voltage Level
L=LOW Voltage Level
Blank=X=Don’t Care

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Absolute Maximum Ratings (Note 1)

If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.

Above which the useful life may be impared
Storage Temperature (T

STG

) −65˚C to +150˚C

Maximum Junction Temperature (T

J

)

Ceramic +175˚C

V

EE

Pin Potential to Ground Pin −7.0V to +0.5V

Input Voltage (DC) V

EE

to + 0.5V

Output Current (DC Output HIGH) −50 mA

ESD (Note 2) ≥2000V

Recommended Operating
Conditions

Case Temperature (TC)

Military −55˚C to +125˚C

Supply Voltage (V

EE

) −5.7V to −4.2V

Note 1: Absolute maximum ratings are those values beyond which the de­vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

Military Version
DC Electrical Characteristics

V

EE

=

−4.2V to −5.7V, V

CC

=

V

CCA

=

GND, T

C

=

−55˚C to +125˚C

Symbol Parameter Min Max Units T

C

Conditions Note

V

OH

Output HIGH Voltage −1025 −870 mV 0˚C to

+125˚C

−1085 −870 mV −55˚C V

IN

=

V

IH

(Max) Loading with (Notes 3, 4, 5)

V

OL

Output LOW Voltage −1830 −1620 mV 0˚C to or VIL(Min) 50Ω to −2.0V

+125˚C

−1830 −1555 mV −55˚C

V

OHC

Output HIGH Voltage −1035 mV 0˚C to

+125˚C

−1085 mV −55˚C V

IN

=

V

IH

(Min) Loading with (Notes 3, 4, 5)

V

OLC

Output LOW Voltage −1610 mV 0˚C to or VIL(Max) 50Ω to −2.0V

+125˚C

−1555 mV −55˚C

V

IH

Input HIGH Voltage

−1165 −870 mV

−55˚C to Guaranteed HIGH Signal for All
Inputs

(Notes 3, 4, 5, 6)

+125˚C

V

IL

Input LOW Voltage −1830 −1475 mV −55˚C to Guaranteed LOW Signal for All Inputs (Notes 3, 4, 5, 6)

+125˚C

I

IL

Input LOW Current 0.50 µA −55˚C to V

EE

=

−4.2V (Notes 3, 4, 5)

+125˚C V

IN

=

V

IL

(Min)

I

IH

Input HIGH Current

S

n

265 µA 0˚C to

A

n,Bn

340 +125˚C V

EE

=

−5.7V (Notes 3, 4, 5)

S

n

385 µA −55˚C V

IN

=

V

IH

(Max)

A

n,Bn

490

I

EE

Power Supply
Current

−87 −30 mA

−55˚C to Inputs Open

(Notes 3, 4, 5)

+125˚C

Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperatureto stabilizedue to heat dissipation after power-up. This provides “cold start” specs which canbe considered a worst case
condition at cold temperatures.

Note 4: Screen tested 100%on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V

OH/VOL

.

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AC Electrical Characteristics

V

EE

=

−4.2V to −5.7V, V

CC

=

V

CCA

=

GND

Symbol Parameter

T

C

=

−55˚C T

C

=

+25˚C T

C

=

+125˚C

Units Conditions Notes

Min Max Min Max Min Max

t

PLH

Propagation Delay 0.50 2.40 0.60 2.30 0.70 3.00 ns

t

PHL

A0–A7,B0–B7to Output (Notes 7, 8, 9)

t

PLH

Propagation Delay 0.80 3.00 0.90 2.80 0.80 3.40 ns

Figure 1

and

t

PHL

S0–S2to Output

Figure 2

t

TLH

Transition Time 0.30 1.90 0.30 1.80 0.30 2.10 ns (Note 10)

t

THL

20%to 80%,80%to 20

%

Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.

Note 8: Screen tested 100%on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C, temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).

Test Circuitry

DS100310-6

Notes:

V

CC,VCCA

=

+2V, V

EE

=

−2.5V
L1 and L2=equal length 50Ω impedance lines
R

T

=

50Ω terminator internal to scope

Decoupling 0.1 µF from GND to V

CC

and V

EE

All unused outputs are loaded with 50Ω to GND
C

L

=

Fixture and stray capacitance ≤ 3pF

Pin numbers shown are for flatpak; for DIP see logic symbol

FIGURE 1. AC Test Circuit

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Switching Waveforms

DS100310-7

FIGURE 2. Propagation Delay and Transition Times

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Physical Dimensions inches (millimeters) unless otherwise noted

24-Pin Ceramic Dual-In-Line Package (D)

NS Package Number J24E

24-Pin Quad Cerpak (F)

NS Package Number W24B

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LIFE SUPPORT POLICY

NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE­VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI­CONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or sys­tems which, (a) are intended for surgical implant into
the body, or (b) supportorsustainlife, and whose fail­ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.

2. A critical component in any component of a life support
device or system whose failure to perform can be rea­sonably expected to cause the failure of the life support
device or system, or to affect its safety oreffectiveness.

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100363 Low Power Dual 8-Input Multiplexer

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