Datasheet 100360QIX, 100360QI, 100360QCX, 100360QC, 100360PC Datasheet (Fairchild Semiconductor)

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© 2000 Fairchild Semiconductor Corporation DS010611 www.fairchildsemi.com
March 1998 Revised August 2000
100360 Low Power Dual Parity Checker/Generator
100360 Low Power Dual Parity Checker/Generator
General Description
The 100360 is a du al parity checker/gener ator. Each half has nine inputs; the o utput is HIGH whe n an e ven nu mber of inputs are HIGH. One of the nine inputs (I
a
or Ib) has the
shorter through-p ut dela y and is th erefo re pr eferre d as t he expansion input for gene rating parity for 16 or more bits. The 100360 also has a Comp are (C
) output which allows
the circuit to compare two 8-bit words. The C
output is LOW when the two wor ds mat ch, bi t f or bit. A ll in pu ts ha ve 50 k
pull-down resistors.
Features
Lower power than 100160
2000V ESD protection
Pin/function compatible with 100160
Voltage compensated operating range
= −4.2V to 5.7V
Min to Max propagation delay 35% tight er tha n 1001 60
Available to industrial grade temperature range
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbol
Pin Descriptions
Truth Table
(Each Half)
Comparator Function
C = (I0a I1a) + (I2a I3a) + (I4a I5a) + (I6a I7a) +
(I
0b
I1b) + (I2b I3b) + (I4b I5b) + (I6b I7b)
Connection Diagrams
24-Pin DIP
28-Pin PLCC
Order Number Package Number Package Description
100360PC N24E 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide 100360QC V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square 100360QI V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Industrial Temperature Range (
40°C to +85°C)
Pin Names Description
I
a
, Ib, Ina, I
nb
Data Inputs
Z
a
, Z
b
Parity Odd Outputs
C
Compare Output
Sum of Output
HIGH Inputs Z
Even HIGH
Odd LOW
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100360
Logic Diagram
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100360
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: The Absolute Maximum Ratings are those value s beyond which
the safety of the dev ice cannot b e guaranteed . The device sh ould not be operated at these limit s. The parametric values defi ned in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The Recomm ended O peratin g Cond itions table will defin e the condition s for actual device operation.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version DC Electrical Characteristics
(Note 3)
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND, T
C
= 0°C to +85°C
Note 3: The specified limits represent the ''wors t case value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasin g the al l owable syste m opera ti ng ran ge s. Cond it i ons fo r t estin g sho w n in the tabl es are cho­sen to guarantee operation under worst case conditions.
DIP AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND
Storage Temperature (T
STG
) 65°C to +150°C
Maximum Junction Temperature (T
J
) +150°C
V
EE
Pin Potential to Ground Pin 7.0V to +0.5V
Input Voltage (DC) V
EE
to +0.5V
Output Current (DC Output HIGH)
50 mA
ESD (Note 2)
2000V
Case Temperature (T
C
)
Commercial 0
°C to +85°C
Industrial
40°C to +85°C
Supply Voltage (V
EE
) 5.7V to 4.2V
Symbol Parameter Min Typ Max Units Conditions
V
OH
Output HIGH Voltage −1025 −955 −870
mV
VIN = VIH (Max) Loading with
V
OL
Output LOW Voltage −1830 −1705 1620 or V
IL (Min)
50 to 2.0V
V
OHC
Output HIGH Voltage −1035
mV
VIN = VIH (Min) Loading with
V
OLC
Output LOW Voltage 1610 or V
IL (Max)
50 to 2.0V
V
IH
Input HIGH Voltage −1165 870 mV Guaranteed HIGH Signal
for All Inputs
V
IL
Input LOW Voltage −1830 1475 mV Guaranteed LOW Signal
for All Inputs
I
IL
Input LOW Current 0.50 µAVIN = VIL (Min)
I
IH
Input HIGH Current
I
a
, I
b
340 µAVIN = VIH (Max)
I
na
, I
nb
240
I
EE
Power Supply Current −100 50 mA Inputs OPEN
Symbol Parameter
T
C
= 0°CT
C
= +25°CT
C
= +85°C
Units Conditions
Min Max Min Max Min Max
t
PLH
Propagation Delay
1.10 2.75 1.10 2.75 1.10 2.75 ns
t
PHL
Ina, Inb to Za, Z
b
t
PLH
Propagation Delay
1.10 2.80 1.10 2.80 1.10 2.80 ns
t
PHL
Ina, Inb to C Figures 1, 2
t
PLH
Propagation Delay
0.50 1.20 0.60 1.30 0.60 1.30 ns
t
PHL
Ia, Ib to Za, Z
b
t
TLH
Transition Time
0.35 1.10 0.35 1.10 0.35 1.10 ns
t
THL
20% to 80%, 80% to 20%
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100360
Commercial Version (Continued) PLCC AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND
Industrial Version PLCC DC Electrical Characteristics
(Note 4)
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND, T
C
= 40°C to +85°C
Note 4: The specified limits represent the worst case value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the all owable syste m opera ti ng r ange s. Co ndi ti ons fo r t est ing shown in the ta ble s are cho­sen to guarantee operation under worst case” conditions.
PLCC AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND
Symbol Parameter
T
C
= 0°CT
C
= +25°CT
C
= +85°C
Units Conditions
Min Max Min Max Min Max
t
PLH
Propagation Delay
1.10 2.75 1.10 2.75 1.10 2.75 ns
t
PHL
Ina, Inb to Za, Z
b
t
PLH
Propagation Delay
1.10 2.80 1.10 2.80 1.10 2.80 ns
t
PHL
Ina, Inb to C
Figures 1, 2
t
PLH
Propagation Delay
0.50 1.20 0.60 1.30 0.60 1.30 ns
t
PHL
Ia, Ib to Za, Z
b
t
TLH
Transition Time
0.35 1.10 0.35 1.10 0.35 1.10 ns
t
THL
20% to 80%, 80% to 20%
Symbol Parameter
TC = 40°CTC = 0°C to +85°C
Units Conditions
Min Max Min Max
V
OH
Output HIGH Voltage −1085 −870 −1025 −870 mV VIN =VIH (Max) Loading with
V
OL
Output LOW Voltage −1830 −1575 −1830 1620 mV or VIL (Min) 50 to −2.0V
V
OHC
Output HIGH Voltage −1095 −1035 mV VIN = VIH (Min) Loading with
V
OLC
Output LOW Voltage −1565 1610 mV or VIL (Max) 50 to −2.0V
V
IH
Input HIGH Voltage −1170 −870 −1165 870 mV Guaranteed HIGH Signal
for All Inputs
V
IL
Input LOW Voltage −1830 −1480 −1830 1475 mV Guaranteed LOW Signal
for All Inputs
I
IL
Input LOW Current 0.50 0.50 µAVIN = VIL (Min)
I
IH
Input HIGH Current
I
a
, I
b
340 340 µAVIN = VIH (Max)
I
na
, I
nb
240 240
I
EE
Power Supply Current −100 −50 −100 50 mA Inputs OPEN
Symbol Parameter
TC = 40°CT
C
= +25°CT
C
= +85°C
Units Conditions
Min Max Min Max Min Max
t
PLH
Propagation Delay
1.00 2.75 1.10 2.75 1.10 2.75 ns
t
PHL
Ina, Inb to Za, Z
b
t
PLH
Propagation Delay
1.00 2.80 1.10 2.80 1.10 2.80 ns
t
PHL
Ina, Inb to C
Figures 1, 2
t
PLH
Propagation Delay
0.50 1.20 0.60 1.30 0.60 1.30 ns
t
PHL
Ia, Ib to Za, Z
b
t
TLH
Transition Time
0.35 1.10 0.35 1.10 0.35 1.10 ns
t
THL
20% to 80%, 80% to 20%
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100360
Test Circuitry
Notes:
V
CC
, V
CCA
= +2V, VEE = 2.5V
L1 and L2 = equal length 50 impedanc e lines R
T
= 50 terminator internal to scope
Decouplin g 0.1 µF from GND to V
CC
and V
EE
All unused outputs are loaded with 50Ω to GND C
L
= Fixture and stray capacitance 3 pF
FIGURE 1. AC Test Circuit
Switching Waveforms
FIGURE 2. Propagation Delay and Transition Times
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100360
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide
Package Number N24E
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100360 Low Power Dual Parity Checker/Generator
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Package Number V28A
Fairchild does not assume any responsibility for use of any circuitry described , no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are dev ic es or syste ms
which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provide d in the labe l ing, can be re a­sonably expected to result in a significant injury to the user.
2. A critical compo nent in any com ponen t of a life s upp ort device or system whose failure to perform can be rea­sonably expected to cause the failure of the l ife support device or system, or to affect its safety or effectiveness.
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