Datasheet 100329APC, 100329ADC Datasheet (Fairchild Semiconductor)

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© 2000 Fairchild Semiconductor Corporation DS500047 www.fairchildsemi.com
August 1989 Revised August 2000
100329A Low Power Octal ECL/TTL Bidirectional Translator with Register
100329A Low Power Octal ECL/TTL Bidirectional Translator with
Register
General Description
The cut-off state is designe d to be more negative than a normal ECL LOW l evel. This allows the output emi tter-fol­lowers to turn off when the termination supply is
2.0V, pre-
senting a high impedance to the data bus. This high impedance reduces the termination power and prevents loss of low state noise margin when several loads share the bus.
The 100329A is designe d with FAST
TTL output buffers,
featuring optimal DC drive an d capabl e of quickly cha rging and discharging highly capacitive loads. All inputs have 50 k
pull-down resistors.
Features
Bidirectional translation
ECL high impedance outputs
Registered outputs
FAST TTL outputs
3-STATE outputs
Voltage compensated operating range
= −4.2V to 5.7V
High drive IOS
Ordering Code:
Logic Symbol
Pin Descriptions
All pins function at 100K ECL levels except for T0–T7.
Connection Diagram
FAST is a registered trademark of Fairc hild Semiconductor Corporation.
Order Number Package Number Package Description
100329APC N24E 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide
Pin Names Description
E
0–E7
ECL Data I/O
T
0–T7
TTL Data I/O OE Output Enable Input CP Clock Pulse Input
(Active Rising Edge) DIR Direction Control Input
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100329A
Truth Table
H = HIGH Voltage Level L = LOW Voltage Level X = Dont Care Z = High Impedance [N] = LOW-to-HIGH Clock Transit ion NC = No Change
Functional Diagram
Note: DIR and OE use ECL lo gic lev els
Detail
Note 1: ECL input to TTL out put mode. Note 2: TTL input to ECL output mode. Note 3: Retains data present before CP.
OE DIR CP
ECL TTL
Notes
Port Port
L L X Input Z 1, 3 L H X LOW Input 2, 3
(Cut-Off) HL[N]LL1 HL[N]HH1 HLLXNC1, 3 HH[N]LL 2 HH[N]HH2 HHLNCX2, 3
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100329A
Absolute Maximum Ratings(Note 4) Recommended Operating
Conditions
Note 4: The Absolute Maximum Ratings are those value s beyond which
the safety of the dev ice cannot b e guaranteed . The device sh ould not be operated at these limit s. The parametric values defi ned in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The Recomm ended O peratin g Cond itions table will defin e the condition s for actual device operation.
Note 5: ESD testing conforms to MIL-STD-883, Method 3015. Note 6: Either voltage lim it or c urrent limit is sufficient to pro te c t in puts.
TTL-to-ECL DC Electrical Characteristics (Note 7)
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND, TC = 0°C to +85°C, V
TTL
= +4.5V to +5.5V
Note 7: The specified limits represent the worst case value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasin g the al l owable syste m opera ti ng ran ge s. Cond it i ons fo r t estin g sho w n in the tabl es are cho­sen to guarantee operation under worst case conditions.
Storage Temperature (T
STG
) 65°C to +150°C
Maximum Junction Temperature (T
j
) +150°C
V
EE
Pin Potential to Ground Pin 7.0V to +0.5V
V
TTL
Pin Potential to Ground Pin 0.5V to +6.0V
ECL Input Voltage (DC) V
EE
to +0.5V
ECL Output Current
(DC Output HIGH)
50 mA
TTL Input Voltage (Note 6)
0.5V to +6.0V
TTL Input Current (Note 6)
30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State 3-STAT E Output
0.5V to +5.5V
Current Applied to TTL Output
in LOW State (Max) twice therated I
OL
(mA)
ESD (Note 5)
2000V
Case Temperature (T
C
)0°C to +85°C
ECL Supply Voltage (V
EE
) 5.7V to 4.2V
TTL Supply Voltage (V
TTL
) +4.5V to +5.5V
Symbol Parameter Min Typ Max Units Conditions
V
OH
Output HIGH Voltage −1025 −955 −870 mV VIN = VIH (Max) or VIL (Min)
V
OL
Output LOW Voltage −1830 −1705 1620 mV Loading with 50Ω to −2V Cutoff Voltage OE or DIR LOW,
2000 1950 mV VIN = VIH (Max) or VIL (Min) Loading with 50Ω to −2V
V
OHC
Output HIGH Voltage
1035
mV VIN = VIH (Min) or VIL (Max)
Corner Point HIGH Loading with 50Ω to −2V
V
OLC
Output LOW Voltage
1610 mV
Corner Point LOW
V
IH
Input HIGH Voltage 2.0 5.0 V Over V
TTL
, VEE, TC Range
V
IL
Input LOW Voltage 0 0.8 V Over V
TTL
, VEE, TC Range
I
IH
Input HIGH Current 70 µAVIN = +2.7V Breakdown Test 1.0 mA VIN = +5.5V
I
IL
Input LOW Current −700 µAVIN = +0.5V
V
FCD
Input Clamp
1.2 V I
IN
= 18 mA
Diode Voltage
I
EE
VEE Supply Current LE LOW, OE and DIR HIGH
Inputs OPEN
189 94 mA V
EE
= 4.2V to 4.8V
199 94 VEE = 4.2V to 5.7V
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100329A
ECL-to-TTL DC Electrical Characteristics (Note 8)
V
EE
= 4.2V to 5.7V, VCC = V
CCA
= GND, TC = 0°C to +85°C, CL = 50 pF, V
TTL
= +4.5V to +5.5V
Note 8: The specified limits represent the worst case value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the all owable syste m opera ti ng r ange s. Co ndi ti ons fo r t est ing shown in the ta ble s are cho­sen to guarantee operation under worst case” conditions.
DIP TTL-to-ECL AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
TTL
= +4.5V to +5.5V, VCC = V
CCA
= GND
DIP ECL-to-TTL AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
TTL
= +4.5V to +5.5V, VCC = V
CCA
= GND, C
L
= 50.pF
Symbol Parameter Min Typ Max Units Conditions
V
OH
Output HIGH Voltage 2.7 3.1 V IOH = 3 mA, V
TTL
= 4.75V
2.4 2.9 V IOH = 3 mA, V
TTL
= 4.50V
V
OL
Output LOW Voltage 0.3 0.5 V IOL = 24 mA, V
TTL
= 4.50V
V
IH
Input HIGH Voltage −1165 870 mV Guaranteed HIGH Signal for All Inputs
V
IL
Input LOW Voltage −1830 1475 mV Guaranteed LOW Signal for All Inputs
I
IH
Input HIGH Current 350 µAVIN = VIH (Max)
I
IL
Input LOW Current 0.50 µAVIN = VIL (Min)
I
OZHT
3-STATE Current Output HIGH 70 µAV
OUT
= +2.7V
I
OZLT
3-STATE Current Output LOW −700 µAV
OUT
= +0.5V
I
OS
Output Short-Circuit Current −225 −100 mA V
OUT
= 0.0V, V
TTL
= +5.5V
I
TTL
V
TTL
Supply Current 74 mA TTL Outputs LOW
49 mA TTL Outputs HIGH 67 mA TTL Outputs in 3-STATE
Symbol Parameter
T
C
= 0°CT
C
= 25°CT
C
= 85°C
Units Conditions
Min Max Min Max Min Max
f
MAX
Max Toggle Frequency 350 350 350 MHz
t
PLH
CP to E
n
1.7 3.6 1.7 3.7 1.9 3.9 ns Figures 1, 2
t
PHL
t
PZH
OE to E
n
1.3 4.2 1.5 4.4 1.7 4.8 ns Figures 1, 2
(Cut-off to HIGH)
t
PHZ
OE to E
n
1.5 4.5 1.6 4.5 1.6 4.6 ns Figures 1, 2
(HIGH to Cut-off)
t
PHZ
DIR to E
n
1.6 4.3 1.6 4.3 1.7 4.5 ns Figures 1, 2
(HIGH to Cut-off)
t
set
Tn to CP 1.1 1.1 1.1 ns Figures 1, 2
t
hold
Tn to CP 1.7 1.7 1.9 ns Figures 1, 2 tpw(H) Pulse Width CP 2.1 2.1 2.1 ns Figures 1, 2 t
TLH
Transition Time
0.6 1.6 0.6 1.6 0.6 1.6 ns Figures 1, 2
t
THL
20% to 80%, 80% to 20%
Symbol Parameter
TC = 0°CT
C
= 25°CT
C
= 85°C
Units Conditions
Min Max Min Max Min Max
f
MAX
Max Toggle Frequency 125 125 125 MHz t
PLH
CP to T
n
3.1 7.2 3.1 7.2 3.3 7.7 ns Figures 3, 4
t
PHL
t
PZH
OE to T
n
3.4 8.45 3.7 8.95 4.0 9.7 ns Figures 3, 5
t
PZL
(Enable Time) 3.8 9.2 4.0 9.2 4.3 9.95
t
PHZ
OE to T
n
3.2 8.95 3.3 8.95 3.5 9.2 ns Figures 3, 5
t
PLZ
(Disable Time) 3.0 7.7 3.4 8.7 4.1 9.95
t
PHZ
DIR to T
n
2.7 8.2 2.8 8.7 3.1 8.95 ns Figures 3, 6
t
PLZ
(Disable Time) 2.8 7.45 3.1 7.95 4.0 9.2
t
set
En to CP 1.1 1.1 1.1 ns Figures 3, 4
t
hold
En to CP 2.1 2.1 2.6 ns Figures 3, 4
tpw(H) Pulse Width CP 4.1 4.1 4.1 ns Figures 3, 4
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100329A
Test Circuitry (TTL-to-ECL)
Note: RT = 50 termination res is t iv e load. When an input or outp ut is b eing monitored by a scope, RTis supplied by the scopes 50 input resistance. When
an input or output is not being monitored, an external 50 resistance must be applied to serve as R
T
.
Note: TTL and ECL force signals are brought to the DUT v ia 50 coax lines. Note: V
TTL
is decoupled to ground with 0.1 µF, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground.
FIGURE 1. TTL-to-ECL AC Test Circuit
Switching Waveforms (TTL-to-ECL)
FIGURE 2. TTL to ECL Transition—Propagation Delay and Transition Times
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100329A
Test Circuitry (ECL-to-TTL)
Note: RT = 50 termination resistive load . Wh en an input or outp ut is being monit ored by a scope, RTis supplied by the scopes 50 input resistance. When
an input or output is not being monitored, an external 50 resistance must be app lied to serve as R
T
.
Note: The TTL 3-STATE pull-up switch is connecte d to +7V only for ZL and LZ test s. Note: TTL and ECL force signals are brought to the DU T v ia 50 coax lines. Note: V
TTL
is decoupled to ground with 0.1 µF, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground.
FIGURE 3. ECL-to-TTL AC Test Circuit
Switching Waveforms (ECL-to-TTL)
Note: DIR is LOW, OE is HIGH
FIGURE 4. ECL-to-TTL TransitionPropagation Delay and Transition Times
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100329A
Switching Waveforms (Continued)
Note: DIR is LOW
FIGURE 5. ECL-to-TTL T ransition, OE to TTL Output, Enable and Disable Times
Note: OE is HIGH
FIGURE 6. ECL-to-TTL Transition, DIR to TTL Output, Disable Time
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100329A Low Power Octal ECL/TTL Bidirectional Translator with Register
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide
Package Number N24E
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component in any compon ent of a lif e supp ort device or system whose failure t o perform can be rea­sonably expected to ca use the failure of the life supp ort device or system, or to affect its safety or effectiveness.
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