Datasheet 100322QIX, 100322QI, 100322QCX, 100322QC, 100322PC Datasheet (Fairchild Semiconductor)

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© 2000 Fairchild Semiconductor Corporation DS010608 www.fairchildsemi.com
October 1989 Revised August 2000
100322 Low Power 9-Bit Buffer
100322 Low Power 9-Bit Buffer
General Description
The 100322 is a monolithic 9-bit buffer. The device con­tains nine non-inver ting buffer gates with s ingle input and output. All inputs h ave 50 k
Ω pull-down resistors and all
outputs are buffered.
Features
■ 30% power reduction of the 100122
■ 2000V ESD protection
■ Pin/function compatible with 100122
■ Voltage compensated operating range
= −4.2V to −5.7V
■ Available to MIL-STD-883
■ Available to industrial grade temperature range
(PLCC package only)
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbol
Pin Descriptions
Truth Table
H = HIGH Voltage Level L = LOW Voltage Level
Connection Diagrams
24-Pin DIP
28-Pin PLCC
Order Number Package Number Package Description
100322PC N24E 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide 100322QC V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square 100322QI V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Industrial Temperature Range (
−40°C to +85°C)
Pin Names Description
D
1
, D
9
Data Inputs
O
1
, O
9
Data Outputs
Inputs Outputs
D
1
- D
9
O1 - O
9
LL
HH
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100322
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: The “Absolute Maximum Ratings” are those values beyon d which
the safety of the dev ice cannot be guaranteed. T he device sh ould not be operated at these limit s. The parametric values defin ed in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recomme nded O peratin g Cond itions ” table will defin e the condition s for actual device operation.
Note 2: ESD testing conf orm s t o M I L-STD-883, Method 3015.
Commercial Version DC Electrical Characteristics
(Note 3)
VEE = −4.2V to −5.7V, VCC = V
CCA
= GND, TC = 0°C to +85°C
Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the all owable syste m opera ti ng r ange s. Co ndi ti ons fo r t est ing shown in the ta ble s are cho­sen to guarantee operation under “worst case” conditions.
DIP AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = V
CCA
= GND
Note 4: The propagation dela y sp ec if ied is for single output swit c hing. Delays may vary up to 200 ps with multiple outpu ts s w it c hing.
Storage Temperature (T
STG
) −65°C to +150°C
Maximum Junction Temperature (T
J
) +150°C
V
EE
Pin Potential to Ground Pin −7.0V to +0.5V
Input Voltage (DC) V
EE
to +0.5V
Output Current (DC Output HIGH)
−50 mA
ESD (Note 2)
≥ 2000V
Case Temperature (T
C
)
Commercial 0
°C to +85°C
Industrial
−40°C to +85°C
Supply Voltage (V
EE
) −5.7V to −4.2V
Symbol Parameter Min Typ Max Units Conditions
V
OH
Output HIGH Voltage −1025 −955 −870
mV
VIN =V
IH (Max)
Loading with
V
OL
Output LOW Voltage −1830 −1705 −1620 or V
IL (Min)
50Ω to −2.0V
V
OHC
Output HIGH Voltage −1035
mV
VIN = V
IH(Min)
Loading with
V
OLC
Output LOW Voltage −1610 or V
IL (Max)
50Ω to −2.0V
V
IH
Input HIGH Voltage −1165 −870 mV Guaranteed HIGH Signal
for All Inputs
V
IL
Input LOW Voltage −1830 −1475 mV Guaranteed LOW Signal
for All Inputs
I
IL
Input LOW Current 0.50 µAVIN = V
IL (Min)
I
IH
Input HIGH Current 240 µAVIN = V
IH (Max)
I
EE
Power Supply Current −65 −30 mA Inputs Open
Symbol Parameter
T
C
= 0°CT
C
= +25°CT
C
= +85°C
Units Conditions
Min Max Min Max Min Max
t
PLH
Propagation Delay
0.45 1.45 0.45 1.45 0.45 1.55 ns
Figures 1, 2
t
PHL
Data to Output (Note 4)
t
TLH
Transition Time
0.35 1.20 0.35 1.20 0.35 1.20 ns Figures 1, 2
t
THL
20% to 80%, 80% to 20%
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100322
Commercial Version (Continued) PLCC AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = V
CCA
= GND
Note 5: The propagation delay s pec ified is for single output swit c hing. Delays may vary up to 200 ps with multiple outpu ts s witching. Note 6: Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same pack-
aged device. The sp ecifica tions a pply to an y outp uts swit ching in the sam e direc tion eithe r HIGH to LOW (t
OSHL
), or LOW to HIGH (t
OSLH
), or in opposite
directions both HL and LH (t
OST
). Parameters t
OST
and tPS guaranteed by de s ign.
Industrial Version PLCC DC Electrical Characteristics
(Note 7)
VEE = −4.2V to −5.7V, VCC = V
CCA
= GND, TC = −40°C to +85°C
Note 7: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasin g the al l owable syste m opera ti ng ran ge s. Cond it i ons fo r t estin g sho w n in the tabl es are cho­sen to guarantee operation under “worst case” conditions.
PLCC AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = V
CCA
= GND
Note 8: The propagation delay s pec ified is for single output swit c hing. Delays may vary up to 200 ps with multiple outpu ts s witching.
Symbol Parameter
T
C
= 0°CT
C
= +25°CT
C
= +85°C
Units Conditions
MinMaxMinMaxMinMax
t
PLH
Propagation Delay
0.45 1.25 0.45 1.25 0.45 1.35 ns
Figures 1, 2
t
PHL
Data to Output (Note 5)
t
TLH
Transition Time
0.35 1.10 0.35 1.10 0.35 1.10 ns Figures 1, 2
t
THL
20% to 80%, 80% to 20%
t
OSHL
Maximum Skew Common Edge Output-to-Output Variation 200 200 200 ps (Note 6) Data to Output Path
t
OSLH
Maximum Skew Common Edge Output-to-Output Variation 200 200 200 ps (Note 6) Data to Output Path
t
OST
Maximum Skew Opposite Edge Output-to-Output Variation 260 260 260 ps (Note 6) Data to Output Path
t
PS
Maximum Skew Pin (Signal) Transition Variation 200 200 200 ps (Note 6) Data to Output Path
Symbol Parameter
TC = −40°CT
C
= 0°C to +85°C
Units Conditions
Min Max Min Max
V
OH
Output HIGH Voltage −1085 −870 −1025 −870
mV
VIN =V
IH (Max)
Loading with
V
OL
Output LOW Voltage −1830 −1575 −1830 −1620 or V
IL (Min)
50Ω to −2.0V
V
OHC
Output HIGH Voltage −1095 −1035
mV
VIN = V
IH (Min)
Loading with
V
OLC
Output LOW Voltage −1565 −1610 or V
IL (Max)
50Ω to −2.0V
V
IH
Input HIGH Voltage −1170 −870 −1165 −870 mV Guaranteed HIGH Signal
for All Inputs
V
IL
Input LOW Voltage −1830 −1480 −1830 −1475 mV Guaranteed LOW Signal
for All Inputs
I
IL
Input LOW Current 0.50 0.50 µAVIN = V
IL (Min)
I
IH
Input HIGH Current 300 240 µAVIN = V
IH (Max)
I
EE
Power Supply Current −65 −30 −65 −30 mA Inputs Open
Symbol Parameter
TC = −40°CT
C
= +25°CT
C
= +85°C
Units Conditions
MinMaxMinMaxMinMax
t
PLH
Propagation Delay
0.45 1.25 0.45 1.25 0.45 1.35 ns
Figures 1, 2
t
PHL
Data to Output (Note 8)
t
TLH
Transition Time
0.30 1.20 0.35 1.10 0.35 1.10 ns Figures 1, 2
t
THL
20% to 80%, 80% to 20%
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100322
Test Circuit
Notes:
V
CC
, V
CCA
= +2V, VEE = −2.5V
L1 and L2 = equal length 50Ω impedance lines R
T
= 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to V
CC
and V
EE
All unused outputs are loaded with 50Ω to G ND C
L
= Fixture and stray capacitance ≤ 3 pF
FIGURE 1. AC Test Circuit
Switching Waveforms
FIGURE 2. Propagation Delay and Transition Times
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100322
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide
Package Number N24E
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100322 Low Power 9-Bit Buffer
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Package Number V28A
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component in any compon ent of a lif e supp ort device or system whose failure t o perform can be rea­sonably expected to ca use the failure of the life supp ort device or system, or to affect its safety or effectiveness.
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