Datasheet 5962-9152801VYA, 5962-9152801VXA, 5962-9152801MYA, 5962-9152801MXA, 100301MW8 Datasheet (NSC)

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100301 Low Power Triple 5-Input OR/NOR Gate
General Description
The 100301 is a monolithic triple 5-input OR/NOR gate. All inputs have 50 kpull-down resistors and all outputs are buffered.
Features
n 23%power reduction of the 100101
n 2000V ESD protection n Pin/function compatible with 100101 n Voltage compensated operating range=−4.2V to −5.7V n Standard Microcircuit Drawing
(SMD) 5962-9152801
Logic Symbol
Pin Names Description
D
na,Dnb,Dnc
Data Inputs
O
a,Ob,Oc
Data Outputs
O
a,Ob,Oc
Complementary Data Outputs
DS100302-1
August 1998
100301 Low Power Triple 5-Input OR/NOR Gate
© 1998 National Semiconductor Corporation DS100302 www.national.com
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Connection Diagrams
24-Pin DIP
DS100302-2
24-Pin Quad Cerpak
DS100302-3
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature (T
STG
) −65˚C to +150˚C
Maximum Junction Temperature (T
J
)
Ceramic +175˚C
V
EE
Pin Potential to
Ground Pin −7.0V to +0.5V
Input Voltage (DC) V
EE
to +0.5V
Output Current (DC Output HIGH) −50 mA
ESD (Note 2) 2000V
Recommended Operating Conditions
Case Temperature (TC)
Military −55˚C to +125˚C
Supply Voltage (V
EE
) −5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the de­vice may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND, T
C
=
−55˚C to +125˚C
Symbol Parameter Min Max Units T
C
Conditions Notes
V
OH
Output HIGH Voltage −1025 −870 mV 0˚C to +125˚C
−1085 −870 mV −55˚C V
IN
=
V
IH(Max)
Loading with
(Notes 3, 4, 5)
V
OL
Output LOW Voltage −1830 −1620 mV 0˚C to +125˚C or VIL(Min) 50to −2.0V
−1830 −1555 mV −55˚C
V
OHC
Output HIGH Voltage −1035 mV 0˚C to +125˚C
−1085 mV −55˚C V
IN
=
V
IH(Min)
Loading with
(Notes 3, 4, 5)
V
OLC
Output LOW Voltage −1610 mV 0˚C to +125˚C or VIL(Max) 50to −2.0V
−1555 mV −55˚C
V
IH
Input HIGH Voltage −1165 −870 mV −55˚C to +125˚C Guaranteed HIGH Signal
(Notes 3, 4, 5,
for All Inputs
V
IL
Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C Guaranteed LOW Signal
(Notes 3, 4, 5,
for All Inputs
I
IL
Input LOW Current 0.50 µA −55˚C to +125˚C V
EE
=
−4.2V (Notes 3, 4, 5)
V
IN
=
V
IL(Min)
I
IH
Input HIGH Current 240 µA 0˚C to +125˚C V
EE
=
−5.7V (Notes 3, 4, 5)
340 µA −55˚C V
IN
=
V
IH
(Max)
I
EE
Power Supply −32 −12 mA −55˚C to +125˚C Inputs Open (Notes 3, 4, 5) Current
Note 3: F100K 300 Seriescold temperature testing is performed bytemperature soaking (to guarantee junction temperature equals−55˚C), then testing immediately without allowing for thejunction temperature to stabilize dueto heat dissipation after power-up. This provides“cold start” specs which canbe considered a worst case condition at cold temperatures.
Note 4: Screen tested 100%on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing V
OH/VOL
.
AC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND
Symbol Parameter T
C
=
−55˚C T
C
=
+25˚C T
C
=
+125˚C Units Conditions Notes
Min Max Min Max Min Max
t
PLH
Propagation Delay 0.25 1.70 0.30 1.50 0.30 1.80 ns
(Notes 7, 8, 9,
11)
t
PHL
Data to Output
Figures 1, 2
t
TLH
Transition Time 0.30 1.20 0.30 1.20 0.30 1.20 ns (Note 10)
t
THL
20%to 80%,80%to 20
Note 7: F100K 300 Series cold temperature testing is performed bytemperature soaking (to guarantee junction temperature equals−55˚C), then testing immediately after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100%on each device at +25˚C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
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AC Electrical Characteristics (Continued)
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data). Note 11: The propagation delay specified is for single output switching. Delays may vary up to 100 ps with multiple outputs switching.
Test Circuitry
Switching Waveforms
DS100302-5
Notes:
V
CC,VCCA
=
+2V, V
EE
=
−2.5V L1 and L2=equal length 50impedance lines R
T
=
50terminator internal to scope
Decoupling 0.1 µF from GND to V
CC
and V
EE
All unused outputs are loaded with 50to GND C
L
=
Fixture and stray capacitance 3pF
FIGURE 1. AC Test Circuit
DS100302-6
FIGURE 2. Propagation Delay and Transition Times
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Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Ceramic Dual-In-Line Package (0.400" Wide) (D)
NS Package Number J24E
24-Lead Quad Cerpak (F)
NS Package Number W24B
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LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE­VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI­CONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or sys-
tems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose fail­ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user.
2. A critical component in any component of a life support device or system whose failure to perform can be rea­sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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100301 Low Power Triple 5-Input OR/NOR Gate
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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