Dallas Semiconductor DS2016S, DS2016 Datasheet

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FEATURES
§ Low-power CMOS design
§ Standby current
50 nA max at tA = 25°C VCC = 3.0V
100 nA max at tA = 25°C VCC = 5.5V
1 µA max at tA = 60°C VCC = 5.5V
§ Full operation for VCC = 5.5V to 2.7V
§ Data retention voltage = 5.5V to 2.0V
§ Fast 5V access time
DS2016 - 100 100 ns
DS2016 - 150 150 ns
§ Reduced-speed 3V access time
DS2016 - 100 250 ns
DS2016 - 150 250 ns
§ Operating temperature range of -40°C to
+85°C
§ Full static operation
§ TTL compatible inputs and outputs over
voltage range of 5.5V to 2.7 volts.
§ Available in 24-pin DIP and 24-pin SOIC
packages
§ Suitable for both battery operated and battery
backup applications
PIN ASSIGNMENT
PIN DESCRIPTION
A0 - A10 - Address Inputs DQ0 - DQ7 - Data Input/Output
CE - Chip Enable Input WE - Write Enable Input OE - Output Enable Input
V
CC
- Power Supply Input 2.7V - 5.5V
GND - Ground
DESCRIPTION
The DS2016 2k x 8 3V/5V Operation Static RAM is a 16,384-bit, low-power, fully static random access memory organized as 2048 words by 8 bits using CMOS technology. The device operates from a single
power supply with a voltage input between 2.7 and 5.5 volts. The chip enable input (CE ) is used for device selection and can be used in order to achieve the minimum standby current mode, which facilitates both battery operated and battery backup applications. The device provides access times as fast as 100 ns when operated from a 5-volt power supply input and also provides relatively good performance of 250 ns access while operating from a 3-volt input. The device maintains TTL-level inputs and outputs over the input voltage range of 2.7 to 5.5 volts. The DS2016 is most suitable for low-power applications where battery operation or battery backup for nonvolatility is required. The DS2016 is a JEDEC-standard 2k x 8 SRAM and is pin-compatible with ROM and EPROM of similar density.
DS2016
2k x 8 3V/5V Operation Static RAM
www.dalsemi.com
123456789101112132423222120191817161514VCCA8A9WEOEA10CEDQ7
DQ6
DQ5
DQ4
DQ3
A7A6A5A4A3A2A1A0DQ0
DQ1
DQ2
GND
DS2016 24-Pin DIP (600-mil)
DS2016R 24-Pin SOIC (300-mil)
DS2016
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OPERATION MODE
MODE
CE
OE WE
A0-A10 DQ-DQ7 POWER
READ L L H STABLE DATA OUT I
CCO
WRITE L X L STABLE DATA IN I
CCO
DESELECT L H H X HIGH-Z I
CCO
STANDBY H X X X HIGH-Z I
CCS
ABSOLUTE MAXIMUM RATINGS
SYMBOL PARAMETER RATING
V
CC
Power Supply Voltage -0.3V to +7.0V
V
IN
, V
I/O
Input, Input/Output Voltage -0.3 to VCC +0.3V
T
STG
Storage Temperature -55°C to +125°C
T
OPR
Operating Temperature -40°C to +85°C
T
SOLDER
Soldering Temperature/Time 260 °C for 10 seconds
CAPACITANCE (TA= 25°C)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Input Capacitance C
IN
5 10 pF
Input/Output Capacitance C
I/O
5 12 pF
+5-VOLT OPERATION
RECOMMENDED DC OPERATING CONDITIONS (TA= -40°C to +85°C)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Power Supply Voltage V
CC
4.5 5.0 5.5 V
Input High Voltage V
IH
2.0 VCC+0.3 V
Input Low Voltage V
IL
-0.3 0.8 V
Data Retention Voltage V
DR
2.0 5.5 V
DC CHARACTERISTICS (TA= -40°C to +85°C; VCC = 5V ±10%)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Input Leakage Current I
IL
0V VIN V
CC
±
0.1 µA
I/O Leakage Current I
LO
CE = V
IH
, 0V VIO V
CC
±
0.5 µA
Output High Current I
OH
VOH = 2.4V -1.0 mA
Output Low Current I
OL
VOL = 0.4V 4.0 mA
Standby Current I
CCS1
CE = 2.0V
0.3 mA
Standby Current I
CCS2
CE V
CC
-0.5V tA =60°C
1 µA
Standby Current I
CCS2
CE V
CC
-0.5V tA =25°C
100 nA
Operating Current I
CCO
CE = 0.8V, 200 ns cycle
55 mA
DS2016
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AC CHARACTERISTICS READ CYCLE (TA= -40°C to +85°C; VCC = 5V ±10%)
DS2016-100 DS2016-150
PARAMETER SYMBOL
MIN TYP MAX MIN TYP MAX
UNITS NOTES
Read Cycle Time t
RC
100 150 ns
Access Time t
ACC
100 150 ns
OE to Output Valid
t
OE
50 70 ns
CE to Output Valid
t
CO
100 150 ns
CE or OE to Output
Active
t
COE
5 5 ns
Output High-Z from Deselection
t
OD
5 35 10 60 ns
Output Hold from Address Change
t
OH
5 10 ns
AC CHARACTERISTICS WRITE CYCLE (TA= -40°C to +85°C; VCC = 5V±10%)
DS2016-100 DS2016-150
PARAMETER SYMBOL
MIN TYP MAX MIN TYP MAX
UNITS NOTES
Write Cycle Time t
WC
100 150 ns
Write Pulse Width t
WP
75 120 ns
Address Setup Time t
AW
0 0 ns
Write Recovery Time
t
WR
10 10 ns
Output High-Z from
WE
t
ODW
35 70 ns
Output Active from
WE
t
OEW
5 5 ns
Data Setup Time t
DS
40 60 ns
Data Hold Time t
DH
0 0 ns
DATA RETENTION CHARACTERISTICS (TA = -40°C to +85°C)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Data Retention Supply Voltage
V
DR
CE ≥ V
CC
- 0.5V
2.0 5.5 V
Data Retention Current at 5.5V
I
CCR1
CE ≥ V
CC
- 0.5V
0.1* 1 µA
Data Retention Current at 2.0V
I
CCR2
CE ≥ V
CC
- 0.5V
50* 750 nA
Chip Deselect to Data Retention
t
CDR
0 µs
Recovery Time t
R
2 ms
* Typical values are at 25°C
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