Cypress Semiconductor PALC22V10D-25JI, PALC22V10D-25KMB, PALC22V10D-25LMB, PALC22V10D-25PC, PALC22V10D-25PI Datasheet

...
For new designs, please refer to the PALCE22V10
PALC22V10D
Flash Erasable, Reprogrammable CMOS PAL® Device

Features

•Low power —90 mA max. commercial ( 10 ns) —130 mA max. com me rcial (7.5 n s)
• CMOS Flash EPROM technolog y for electric al erasabil-
ity and reprogrammabilit y
• Variable product terms —2 x(8 through 16) product terms
• User-programmable macrocell —Output polarity control —Individually selectable for registered or combinato-
rial operation
• Up to 22 input terms and 10 outputs
• DIP, LCC, and PLCC available —7.5 ns commercial ver sion
5 ns t
CO
5 ns t
S
7.5 ns t 133-MHz state machine
—10 ns military and industrial ver sions
6 ns t 6 ns t 10 ns t 110-MHz state machine
—15-ns comme rc ia l an d m ilitary
versions
—25-ns comme rc ia l an d m ilitary
versions
• High reliability —Proven Flash EPROM technology

100% programming and functional testing

PD
CO S
PD

Functional Description

The Cypress PALC22V10D is a CMOS Flash Erasable sec­ond-generation programmable array logic device. It is imple­mented with the familiar sum-of-products (AND-OR) logic structure and the programmable macrocell.
The PALC22V10D is e x e cuted in a 24- pin 300- mil mol ded DIP, a 300-mil cerDIP, a 28-lead square ceramic leadless chip car­rier , a 28-le ad square pl astic leaded chi p carrier, and provides up to 22 in puts and 10 output s. The 2 2V10D can b e electrical ly
erased and repr ogr ammed. The prog r ammab le m acroc ell pro­vides the capability of defining the archit ecture of each output individually. Each of the 10 potential outputs may be specified as “registered” or “combin atorial. ” P o larit y of each out put ma y also be individually selected, allowing complete flexibility of output configuration. Further configurability is provided through “array” configurable “output enable” for each pot ential output. This feature allows the 10 outputs to be reconfigured as inputs on an individual basis , or alternatel y used as a com­bination I/O controlled by the prog rammable array.
PALC22V10D features a variable product term architecture. There are 5 pair s of pr oduct t erm sums beg innin g at 8 pr oduc t terms per output and incrementing by 2 to 16 product terms per output. By providing this variable structure, the PAL C 22V10D is optimized to t he configurations found in a majority of applications without creating devices that burden the prod­uct term structures with unusab le product terms and low er per­formance.
Additional features of the Cypress PALC22V10D include a synchronous prese t and an asynchron ous r eset pro duct term. These product terms are common to all macrocells, eliminat­ing the need to dedicate standard product terms for initial iza­tion function s. T he devi ce autom atically resets upo n powe r-up .
The PALC22V10D, featuring programmable macrocells and variabl e product terms, provides a device with the flexibility to implement logic funct ions in the 500- to 800-gate-array com­plexity. Since each of the 10 output pins may be individually configured as i nputs on a tempo rary or permanent basi s, func ­tions requiring up to 21 inputs and only a single output and down to 12 inputs and 10 outputs are possible. The 10 poten­tial outputs are enabled using product terms. Any output pin may be permanently selected as an output or arbitrarily en­abled as an output and an input through the selective use of individual product terms associated with each output. Each of these outputs is achie v ed through an indivi dual progr ammabl e macrocell. These macrocells are programmable to prov ide a combinatorial or registe red in verting or non-in ve rting output. In a registered mode of ope ration, the out put of the regist er is fed back into t he array, providing current status information to the array. This information is available for establishing the next re­sult in applicat ions such as control stat e machines. In a com­binatorial confi guration, the combinatorial output or, if the out­put is disabled, the signal present on the I/O pin is made available to the arr ay. The flexibility provided by both program ­mable product t erm control of the output s and variab le produc t terms allows a significan t gain i n functi onal densi ty throu gh the use of programmable logic.
Along with this increase in functional density, the Cypress PALC22V10D provides l ower-p ower oper ation t hrough the use of CMOS technology, and increased testability with Flash re­programmabili ty.
PAL is a registered trademark of Advanced Micro Devices
Cypress Semiconductor Corporation
3901 North First Street San Jose CA 95134 408-943-2600 July 1991 - Revised October 1995
LogicBlockDiagram(PDIP/CDIP)
V
SS
IIIIIIIIIICP/I
1110987 65432112
8
Reset
10 12 14 16 16 14 12 10 8
PROGRAMMABLE
AND ARRAY
(132 X 44)
PALC22V10D
Macrocell
13 14 15 16 17 18 19 20 21 22 23 24
I I/O
Macrocell Macrocell Macrocell Macrocell Macrocell Macrocell Macrocell Macrocell Macrocell
9
I/O
8
I/O
7
I/O
6
I/O
5
I/O
4
I/O
3
I/O
2
I/O
1
I/O
0
PinConfiguration
PLCC
Top View
I9I
CP/I
4 3 2 2827 261
5 6 7 8 9 10 11
121314 1516 1718
I
I
SS
V
NC
NC
0
1
CC
V
I/O
I/O8
I/O
25
2
I/O
24
3
I/O
23
4
N/C
22
I/O
21
5
I/O
20
6
I/O
19
7
I
I/O
I/O
V10D–3
NC
I I I
I I I
LCC
Top View
I9I
CP/I
4 3 2 282726 5 6 7 8 9 10 11
12131415161718
I
I
SS
V
0
1
CC
V
I/O
I/O
NC
1
25
I/O
NC
2
24
I/O
3
23
I/O
4
22
N/C
21
I/O
5
20
I/O
6
19
I/O
7
I/O
V10D–2
8
I
I/O
NC
I I I
I I I
Configuration Table
Configuration Table
Registered/Combinatorial
C
1
0 0 Registered/Active LOW 0 1 Registered/Active HIGH
C
0
Configuration
C
1
1 0 Combinatorial/Active LOW 1 1 Combinatorial/Active HIGH
Registered/Combinatorial
C
0
Configuration
Preset
V
CC
V10D–1
2

Macrocell

AR
PALC22V10D
OUTPUT SELECT
QD
MUX
CP
INPUT/
FEEDBACK
MUX
S
1
C
1
C
0
Q
SP
MACROCELL
SS
10
V10D–4

Maximum Ratings

(Abov e which the useful lif e ma y be impai red. F or user guide­lines, not tested.)
Storage Temperature .....................................−65
°
C to +150°C
Ambient Te mperature with
Power Applied..................................................−55
°
C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12).................................................−0.5V to +7.0V
DC Voltage Applied to Outp uts
in High Z State.....................................................−0.5V to +7.0V
DC Input Voltage............................................. -0.5V to +7.0V
Output C ur re n t in to O u tp u ts (LOW) ..... ................. .......16 mA
DC Programming Voltage .............................................12.5V
Electrical Characteristics
Over the Operating Range
Parameter Description T est Conditions Min. Max. Unit
V
OH
V
OL
V
IH
[2]
V
IL
I
IX
I
OZ
I
SC
Output HIGH Voltage VCC = Min.,
V
= VIH or V
IN
IL
Output LOW Voltage VCC = Min.,
V
= VIH or V
IN
IL
Input HIGH Level Guaranteed Input Logical HIGH Voltage for All Inputs Input LOW Level Guaranteed Input Logical LOW Voltage for All Inputs Input Leakage Current VSS < VIN < VCC, VCC = Max. -10 10 Output Leakage Current VCC = Max., VSS < V Output Short Circuit Current VCC = Max., V
Latch-Up Current .....................................................>200 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) .............. ............ ...>2001V

Operating Range

Ambient
Range
Commercial 0°C to +75°C 5V ±5%
[1]
Military Industrial
Note:
1. T
is the instant on case temperature.
A
]]
[2]
IOH = -3.2 mA Com’l 2.4 V IOH = -2 mA Mil/Ind IOL = 16 mA Com’l 0.5 V IOL = 12 mA Mil/Ind
< V
OUT
OUT
= 0.5V
CC
[5,6]
Temperature
55°
C to +125°C 5V ±10%
40°
C to +85°C 5V ±10%
[3]
[3]
2.0 V
-0.5 0.8 V
-40 40
-30 -90 mA
V
CC
µA µA
3
PALC22V10D
Electrical Characteristics
Over the Operating Range
[2]
Parameter Description T est Conditions Min. Max. Unit
I
CC1
[6]
I
CC2
Notes:
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V
IL
5. Not more than one output sho uld be t ested at a ti me. Du r ation of the short ci rcuit should not b e more tha n one sec ond. V caused by tester g round deg r adation.
6. Tested initially and after any design or process changes that may affect these parameters.
Capacitance
Standby Power Supply Current
VCC = Max., V
= GND,
IN
Outputs Open in Unprogrammed De­vice
Operating Power Supply Current
VCC = Max., VIL = 0V, V
= 3V,
IH
Output Open, De­vice Program m ed as a 10-Bit Counter, f = 25 MHz
(Min.) is equal to -3.0V for pulse durations less than 20 ns.
[6]
10, 15, 25 ns Com’l 90 mA
7.5 ns Com’l 130 mA 15, 25 ns Mil/Ind 120 mA 10 ns Mil/Ind 120 mA 10, 15, 25 ns Com’l 110 mA
7.5 ns Com’l 140 mA 15, 25 ns Mil/Ind 130 mA 10 ns Mil/Ind 130 mA
= 0.5V has been c hosen t o a void tes t prob l ems
OUT
Parameter Description T est Conditions Min. Max. Unit
C
IN
C
OUT
Endurance Characteristics
Input Capacitance VIN = 2.0V @ f = 1 MHz 10 pF Output Capacitance V
= 2.0V @ f = 1 MHz 10 pF
OUT
[6]
Parameter Description Test Conditions Min. Max. Unit
N Minimum Reprogramming Cycles Normal Programming Conditions 100 Cycles
AC Test Loads and Waveforms
R1238
5V
OUTPUT
INCLUDING JIG AND SCOPE
(319ΩMIL)
C
L
R2170
(236ΩMIL)
5V
OUTPUT
INCLUDING JIG AND SCOPE
(a) (b)
3.0V
GND
<2ns <2ns
Equivalent to: THÉ VENIN EQUIVALENT(Commercial) Equivalent to: THÉ VENIN EQUIVALENT(Military)
99
OUTPUT
2.08V=V
thc
ALL INPUT PULSES
90%
10%
V10D–6
(319ΩMIL)
(d)
R1238
5pF
90%
OUTPUT
R2170
(236ΩMIL)
10%
V10D–5
OUTPUT
136
2.13V=V
(c)
C
L
thm
V10D–7
750 (1.2K MIL)
4
Loading...
+ 8 hidden pages